• 제목/요약/키워드: High oxygen transmission rate film

검색결과 19건 처리시간 0.036초

Effect of O2 Partial Pressure on AlOx Thin Films Prepared by Reactive Ion Beam Sputtering Deposition

  • Seong, Jin-Wook;Yoon, Ki-Hyun;Kim, Ki-Hwan;Beag, Young-Whoan;Koh, Seok-Keun
    • 한국세라믹학회지
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    • 제41권5호
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    • pp.364-369
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    • 2004
  • The barrier and optical properties of AlO$_{x}$ thin films on polycarbonate deposited by Reactive Ion Beam Sputtering (RIBS) were investigated at different oxygen partial pressure. We measured the deposition rate of AlO$_{x}$ thin films. As the oxygen partial pres-sure increased, the deposition rate increased then decreased. The changes of deposition rate are associated with the properties of deposited films. The properties of deposited AlO$_{x}$ thin films were studied using X-ray Photoelectron Spectroscopy (XPS), Scan-ning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM). Optimum deposition parameters were found for fabricat-ing aluminum oxide thin films with high optical transparency for visible light and low Oxygen Transmission Rate (OTR). The optical transmittance of AlO$_{x}$ thin film deposited on polycarbonate (PC) showed the same value of bare PC.bare PC.

산소투과도를 달리한 MA 필름으로 포장한 딸기 '매향'의 모의 수출 조건에서 품질 고찰 (Study on Strawberry 'Maehyang' Qualities Packed with MA film of Different Oxygen Transmission Rate during Simulated Export Distribution Conditions)

  • 윤혁성;최인이;한수정;김주영;최가은;윤재수;강호민
    • 한국포장학회지
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    • 제23권2호
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    • pp.83-87
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    • 2017
  • 본 연구는 딸기(cv. 'Maehyang')의 모의 선박 수출 온도조건($2^{\circ}C$(10일${\sim}8^{\circ}C$(11일))에서 MA 저장에 적합한 고 산소투과율(OTR) 필름 종류 구명과 이에 따른 품질 변화를 알아보기 위해 실시하였다. MA 저장 처리는 산소투과율이 각각 1,300, 10,000, 20,000, 그리고 $30,000cc/m^2{\cdot}day{\cdot}atm$ OTR 필름으로 하였고, 관행 유통 처리는 유공 필름으로 포장한 대조구로 두었다. 저장 중 생체중 감소율은 유공 필름을 제외한 모든 MA 저장 처리에서 0.5% 미만이었다. 포장 내 이산화탄소와 산소 농도는 10,000 cc, 20,000 cc, 그리고 30,000 cc OTR 필름에서 딸기의 적정 CA/MA 조건(이산화탄소 15~20%, 산소 농도 5~10%)을 유지하였다. 에틸렌 농도는 처리간 차이를 보이지 않았다. 이취는 1,300 cc OTR 필름은 관능 평가를 통해 높은 이취와 가장 낮은 곰팡이 발생률을 보였다. 경도, 당도, 그리고 외관상 품질은 10,000 cc OTR 필름에서 가장 높게 유지되었다. 결론적으로, 10,000 cc OTR 필름은 가장 높은 품질과 관행 유통 조건보다 저장 수명을 13일 정도 연장할 수 있었다.

필러 네트워크 형성 및 배향이 복합소재 열전도도와 산소투과도에 미치는 영향 고찰 (Impact of Filler Aspect Ratio on Oxygen Transmission and Thermal Conductivity using Hexagonal Boron Nitride-Polymer Composites)

  • 신하은;김채빈
    • Composites Research
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    • 제34권1호
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    • pp.63-69
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    • 2021
  • 일체형 방열 및 기체 차단 재료 개발을 위하여 신규 고분자를 합성하고 판상형 육방정 질화 붕소(hBN) 필러를 포함하는 복합소재를 제조하였다. 복합소재는 필러의 크기 및 함량에 따라 열전도도 및 산소투과도 조절이 가능하였다. 복합소재는 최대 28.0 W·m-1·K-1의 높은 열전도도를 지녔으며 필러 미포함 샘플 대비 산소투과도는 62% 감소하였다. 열전도도 및 기체투과도 실험 측정값과 모델 예측값 비교를 통해 복합소재 내 필러의 종횡비를 계산하였다. 이러한 결과를 토대로 높은 열전도도 및 낮은 기체투과도는 필러 간 효과적인 네트워크 형성 때문이며 이는 복합소재 제조 시 전단 응력 극대화가 가능한 신규 수지의 특성으로부터 유래된것으로 사료된다. 또한, 열전도도로부터 계산된 필러 종횡비와 산소 투과도로부터 계산된 필러 종횡비 값이 서로 다름을 확인하였고 이에 관련하여 복합소재에서 열 전달 및 기체 투과 메커니즘에 대하여 고찰하였다. 본 연구에서 개발된 높은 열전도도 및 낮은 산소투과도를 갖는 고분자 복합소재는 전자 제품의 일체형 방열 및 산화 방지 재료로 사용 될 수 있다.

Oxygen Barrier Coating with Carbon Interlayer on Polypropylene

  • 김성진;송은경;조경식;윤태경;문명운;이광렬
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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    • pp.210-210
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    • 2012
  • Gas barrier coating from dense thin film deposition has been one of the important applications such as food-packaging and organic display. Especially for food-packaging, plastic container has been widely used due to its low price and high through-put in mass production. However, the plastic container with low surface energy like polypropylene (PP) has been limited to apply gas barrier coating. That is because a gas barrier coating could not adhere to PP due to its too low surface energy and high porosity of PP. In this research, we applied carbon coating consisting of Si and O as an interlayer between silicon oxide (SiOx) and PP. A carbon layer was found to provide better adhesion, which was experimentally proved by oxygen transmission rate (OTR) and SEM images. However, we also found that there is a limitation in the maximum thickness of a carbon layer and SiOx film due to their high stress level. For this conflict, we obtain the optimal thickness of a carbon layer and SiOx film showing optimal gas barrier property.

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Flexible Thin Film Encapsulation and Planarization Effectby Low Temperature Flowable Oxide Process

  • Yong, Sang Heon;Kim, Hoonbea;Chung, Ho Kyoon;Chae, Heeyeop
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.431-431
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    • 2013
  • Flexible Organic Light Emitting Diode (OLED) displays are required for future devices. It is possible that plastic substrates are instead of glass substrates. But the plastic substrates are permeable to moisture and oxygen. This weak point can cause the degradation of fabricated flexible devices; therefore, encapsulation process for flexible substrate is needed to protect organic devices from moisture and oxygen. Y.G. Lee et al.(2009) [1] reported organic and inorganic multilayer structure as an encapsulation barrier for enhanced reliability and life-time.Flowable Oxide process is a low-temperature process which shows the excellent gap-fill characteristics and high deposition rate. Besides, planarization is expected by covering dust smoothly on the substrate surface. So, in this research, Bi-layer structured is used for encapsulation: Flowable Oxide Thin film by PECVD process and Al2O3 thin film by ALD process. The samples were analyzed by water vapor transmission rate (WVTR) using the Calcium test and film cross section images were obtained by FE-SEM.

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New Approaches for Overcoming Current Issues of Plasma Sputtering Process During Organic-electronics Device Fabrication: Plasma Damage Free and Room Temperature Process for High Quality Metal Oxide Thin Film

  • Hong, Mun-Pyo
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.100-101
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    • 2012
  • The plasma damage free and room temperature processedthin film deposition technology is essential for realization of various next generation organic microelectronic devices such as flexible AMOLED display, flexible OLED lighting, and organic photovoltaic cells because characteristics of fragile organic materials in the plasma process and low glass transition temperatures (Tg) of polymer substrate. In case of directly deposition of metal oxide thin films (including transparent conductive oxide (TCO) and amorphous oxide semiconductor (AOS)) on the organic layers, plasma damages against to the organic materials is fatal. This damage is believed to be originated mainly from high energy energetic particles during the sputtering process such as negative oxygen ions, reflected neutrals by reflection of plasma background gas at the target surface, sputtered atoms, bulk plasma ions, and secondary electrons. To solve this problem, we developed the NBAS (Neutral Beam Assisted Sputtering) process as a plasma damage free and room temperature processed sputtering technology. As a result, electro-optical properties of NBAS processed ITO thin film showed resistivity of $4.0{\times}10^{-4}{\Omega}{\cdot}m$ and high transmittance (>90% at 550 nm) with nano- crystalline structure at room temperature process. Furthermore, in the experiment result of directly deposition of TCO top anode on the inverted structure OLED cell, it is verified that NBAS TCO deposition process does not damages to the underlying organic layers. In case of deposition of transparent conductive oxide (TCO) thin film on the plastic polymer substrate, the room temperature processed sputtering coating of high quality TCO thin film is required. During the sputtering process with higher density plasma, the energetic particles contribute self supplying of activation & crystallization energy without any additional heating and post-annealing and forminga high quality TCO thin film. However, negative oxygen ions which generated from sputteringtarget surface by electron attachment are accelerated to high energy by induced cathode self-bias. Thus the high energy negative oxygen ions can lead to critical physical bombardment damages to forming oxide thin film and this effect does not recover in room temperature process without post thermal annealing. To salve the inherent limitation of plasma sputtering, we have been developed the Magnetic Field Shielded Sputtering (MFSS) process as the high quality oxide thin film deposition process at room temperature. The MFSS process is effectively eliminate or suppress the negative oxygen ions bombardment damage by the plasma limiter which composed permanent magnet array. As a result, electro-optical properties of MFSS processed ITO thin film (resistivity $3.9{\times}10^{-4}{\Omega}{\cdot}cm$, transmittance 95% at 550 nm) have approachedthose of a high temperature DC magnetron sputtering (DMS) ITO thin film were. Also, AOS (a-IGZO) TFTs fabricated by MFSS process without higher temperature post annealing showed very comparable electrical performance with those by DMS process with $400^{\circ}C$ post annealing. They are important to note that the bombardment of a negative oxygen ion which is accelerated by dc self-bias during rf sputtering could degrade the electrical performance of ITO electrodes and a-IGZO TFTs. Finally, we found that reduction of damage from the high energy negative oxygen ions bombardment drives improvement of crystalline structure in the ITO thin film and suppression of the sub-gab states in a-IGZO semiconductor thin film. For realization of organic flexible electronic devices based on plastic substrates, gas barrier coatings are required to prevent the permeation of water and oxygen because organic materials are highly susceptible to water and oxygen. In particular, high efficiency flexible AMOLEDs needs an extremely low water vapor transition rate (WVTR) of $1{\times}10^{-6}gm^{-2}day^{-1}$. The key factor in high quality inorganic gas barrier formation for achieving the very low WVTR required (under ${\sim}10^{-6}gm^{-2}day^{-1}$) is the suppression of nano-sized defect sites and gas diffusion pathways among the grain boundaries. For formation of high quality single inorganic gas barrier layer, we developed high density nano-structured Al2O3 single gas barrier layer usinga NBAS process. The NBAS process can continuously change crystalline structures from an amorphous phase to a nano- crystalline phase with various grain sizes in a single inorganic thin film. As a result, the water vapor transmission rates (WVTR) of the NBAS processed $Al_2O_3$ gas barrier film have improved order of magnitude compared with that of conventional $Al_2O_3$ layers made by the RF magnetron sputteringprocess under the same sputtering conditions; the WVTR of the NBAS processed $Al_2O_3$ gas barrier film was about $5{\times}10^{-6}g/m^2/day$ by just single layer.

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FTS 장치를 이용한 가스 차단막용 SiOx 및 SiOxNy 박막의 공정특성 (Process Characteristics of SiOx and SiOxNy Films on a Gas Barrier Layer using Facing Target Sputtering (FTS) System)

  • 손진운;박용진;손선영;김화민
    • 한국전기전자재료학회논문지
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    • 제22권12호
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    • pp.1028-1032
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    • 2009
  • In this study, the influences of silicon-based gas barrier films fabricated by using a facing target sputtering(FTS) system on the gas permeability for flexible displays have been investigated. Under these optimum conditions on the $SiO_x$ film with oxygen concentration($O_2/Ar+O_2$) of 3.3% and the $SiO_xN_y$ film with nitrogen concentration($N_2/Ar+O_2+N_2$) of 30% deposited by the FTS system, it was found that the films were grown about 4 times higher deposition rate than that of the conventional sputtering system and showed high transmittance about 85% in the visible light range. Particularly, the polyethylene naphthalate(PEN) substrates with the $SiO_x$ and/or $SiO_xN_y$ films showed the enhanced properties of decreased water vapor transmission rate (WVTR) over $10^{-1}\;g/m^2{\cdot}day$ compared with the PEN substrate without any gas barrier films, which was due to high packing density in the Si-based films with high plasma density by FTS process and/or the denser chemical structure of Si-N bond in the $SiO_xN_y$ film.

Characterization of Al2O3 Thin Film Encasulation by Plasma Assisted Spatial ALD Process for Organic Light Emitting Diodes

  • Yong, Sang Heon;Cho, Sung Min;Chung, Ho Kyoon;Chae, Heeyeop
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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    • pp.234.2-234.2
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    • 2014
  • Organic light emitting diode (OLED) is considered as the next generation flat panel displays due to its advantages of low power consumption, fast response time, broad viewing angle and flexibility. For the flexible application, it is essential to develop thin film encapsulation (TFE) to protect oxidation of organic materials from oxidative species such as oxygen and water vapor [1]. In many TFE research, the inorganic film by atomic layer deposition (ALD) process demonstrated a good barrier property. However, extremely low throughput of ALD process is considered as a major weakness for industrial application. Recently, there has been developed a high throughput ALD, called 'spatial ALD' [2]. In spatial ALD, the precursors and reactant gases are supplied continuously in same chamber, but they are separated physically using a purge gas streams to prevent mixing of the precursors and reactant gases. In this study, the $Al_2O_3$ thin film was deposited by spatial ALD process. We characterized various process variables in the spatial ALD such as temperature, scanning speed, and chemical compositions. Water vapor transmission rate (WVTR) was determined by calcium resistance test and less than $10-^3g/m^2{\cdot}day$ was achieved. The samples were analyzed by x-ray photoelectron spectroscopy (XPS) and field emission scanning electron microscope (FE-SEM).

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포장재가 무순의 저장 중 품질특성에 미치는 영향 (Effect of Packaging Materials on the Quality of Radish Sprout during Storage)

  • 이현정;장지현;권중호;문광덕
    • 한국식품저장유통학회지
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    • 제16권2호
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    • pp.147-154
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    • 2009
  • 무순의 포장재에 따른 저장기간 중 품질특성 변화를 알아보기 위해 PET 포장재는 통기구멍의 유무에 따라 PO 및 PC 포장재를 사용하였고, 방담OPP film은 산소투과도에 따라 LO, LM 및 LH 포장재를 이용하였다. 포장 내 가스 조성의 경우 PO 포장재에서는 비교적 높은 $O_2$ 농도와 낮은 $CO_2$ 농도를 나타내었다. 중량감소율은 PO 포장재 경우 가장 높았으며, 가용성고형분의 함량은 PO 포장재의 경우가 가장 많았으며, 저장기간에 따라 증가하는 경향을 보였다. pH의 경우 유의적으로 증가하였으며 대체로 산소투과도가 높을수록 pH의 값이 더 낮았다. b value는 LO 포장재에서 다른 포장재에 비해 높게 나타났고, 저장 7일째 LO 포장재에서 ${\Delta}E$ value가 높게 나타나 다른 포장재에 비해 색변화가 컸다. 뚜렷한 경향을 보이지 않았으나 저장기간 동안 PC과 LO 포장재의 총 페놀함량 및 전자공여능이 다른 포장재에 비해 더 높게 측정되었다. 총균수는 저장기간에 따라 증가하였으며, PC 및 LO 포장재의 미생물수가 다른 포장재에 비해 상대적으로 많았으며 관능검사 결과, 종합적 기호도에서 LM 포장재가 저장 7일까지 다른 포장재에 비해 높은 관능적 평가를 받았다.

What Is the Key Vacuum Technology for OLED Manufacturing Process?

  • 백충렬
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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    • pp.95-95
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    • 2014
  • An OLED(Organic Light-Emitting Diode) device based on the emissive electroluminescent layer a film of organic materials. OLED is used for many electronic devices such as TV, mobile phones, handheld games consoles. ULVAC's mass production systems are indispensable to the manufacturing of OLED device. ULVAC is a manufacturer and worldwide supplier of equipment and vacuum systems for the OLED, LCD, Semiconductor, Electronics, Optical device and related high technology industries. The SMD Series are single-substrate sputtering systems for deposition of films such as metal films and TCO (Transparent Conductive Oxide) films. ULVAC has delivered a large number of these systems not only Organic Evaporating systems but also LTPS CVD systems. The most important technology of thin-film encapsulation (TFE) is preventing moisture($H_2O$) and oxygen permeation into flexible OLED devices. As a polymer substrate does not offer the same barrier performance as glass substrate, the TFE should be developed on both the bottom and top side of the device layers for sufficient lifetimes. This report provides a review of promising thin-film barrier technologies as well as the WVTR(Water Vapor Transmission Rate) properties. Multilayer thin-film deposition technology of organic and inorganic layer is very effective method for increasing barrier performance of OLED device. Gases and water in the organic evaporating system is having a strong influence as impurities to OLED device. CRYO pump is one of the very useful vacuum components to reduce above impurities. There for CRYO pump is faster than conventional TMP exhaust velocity of gases and water. So, we suggest new method to make a good vacuum condition which is CRYO Trap addition on OLED evaporator. Alignment accuracy is one of the key technologies to perform high resolution OLED device. In order to reduce vibration characteristic of CRYO pump, ULVAC has developed low vibration CRYO pumps to achieve high resolution alignment performance between Metal mask and substrate. This report also includes ULVAC's approach for these issues.

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