• Journal of Microbiology and Biotechnology
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• 제30권5호
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• pp.633-641
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• 2020

Microbial rhodopsins are a superfamily of photoactive membrane proteins with the covalently bound retinal cofactor. Isomerization of the retinal chromophore upon absorption of a photon triggers conformational changes of the protein to function as ion pumps or sensors. After the discovery of proteorhodopsin in an uncultivated γ-proteobacterium, light-activated proton pumps have been widely detected among marine bacteria and, together with chlorophyll-based photosynthesis, are considered as an important axis responsible for primary production in the biosphere. Rhodopsins and related proteins show a high level of phylogenetic diversity; we focus on a specific class of bacterial rhodopsins containing the '3 omega motif.' This motif forms a stack of three non-consecutive aromatic amino acids that correlates with the B-C loop orientation and is shared among the phylogenetically close ion pumps such as the NDQ motif-containing sodium-pumping rhodopsin, the NTQ motif-containing chloride-pumping rhodopsin, and some proton-pumping rhodopsins including xanthorhodopsin. Here, we reviewed the recent research progress on these 'omega rhodopsins,' and speculated on their evolutionary origin of functional diversity.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.31-31
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• 2010

The growth of the high-quality GaN epilayers is of significant technological importance because of their commercializedoptoelectronic applications as high-brightness light-emitting diodes (LEDs) and laser diodes (LDs) in the visible and ultraviolet spectral range. The GaN-based heterostructural epilayers have the polar c-axis of the hexagonal structure perpendicular to the interfaces of the active layers. The Ga and N atoms in the c-GaN are alternatively stacked along the polar [0001] crystallographic direction, which leads to spontaneous polarization. In addition, in the InGaN/GaN MQWs, the stress applied along the same axis contributes topiezoelectric polarization, and thus the total polarization is determined as the sum of spontaneous and piezoelectric polarizations. The total polarization in the c-GaN heterolayers, which can generate internal fields and spatial separation of the electron and hole wave functions and consequently a decrease of efficiency and peak shift. One of the possible solutions to eliminate these undesirable effects is to grow GaN-based epilayers in nonpolar orientations. The polarization effects in the GaN are eliminated by growing the films along the nonpolar [$11\bar{2}0$] ($\alpha$-GaN) or [$1\bar{1}00$] (m-GaN) orientation. Although the use of the nonpolar epilayers in wurtzite structure clearly removes the polarization matters, however, it induces another problem related to the formation of a high density of planar defects. The large lattice mismatch between sapphiresubstrates and GaN layers leads to a high density of defects (dislocations and stacking faults). The dominant defects observed in the GaN epilayers with wurtzite structure are one-dimensional (1D) dislocations and two-dimensional (2D) stacking faults. In particular, the 1D threading dislocations in the c-GaN are generated from the film/substrate interface due to their large lattice and thermal coefficient mismatch. However, because the c-GaN epilayers were grown along the normal direction to the basal slip planes, the generation of basal stacking faults (BSFs) is localized on the c-plane and the generated BSFs did not propagate into the surface during the growth. Thus, the primary defects in the c-GaN epilayers are 1D threading dislocations. Occasionally, the particular planar defects such as prismatic stacking faults (PSFs) and inversion domain boundaries are observed. However, since the basal slip planes in the $\alpha$-GaN are parallel to the growth direction unlike c-GaN, the BSFs with lower formation energy can be easily formed along the growth direction, where the BSFs propagate straightly into the surface. Consequently, the lattice mismatch between film and substrate in $\alpha$-GaN epilayers is mainly relaxed through the formation of BSFs. These 2D planar defects are placed along only one direction in the cross-sectional view. Thus, the nonpolar $\alpha$-GaN films have different atomic arrangements along the two orthogonal directions ($[0001]_{GaN}$ and $[\bar{1}100]_{GaN}$ axes) on the $\alpha$-plane, which are expected to induce anisotropic biaxial strain. In this study, the anisotropic strain relaxation behaviors in the nonpolar $\alpha$-GaN epilayers grown on ($1\bar{1}02$) r-plane sapphire substrates by metalorganic chemical vapor deposition (MOCVO) were investigated, and the formation mechanism of the abnormal zigzag shape PSFs was discussed using high-resolution transmission electron microscope (HRTEM).

• 한국전자통신학회논문지
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• 제19권1호
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• pp.47-52
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• 2024

본 연구에서는 유리 기판 위에 BZO박막을 제작한 후, 열처리 온도가 박막의 전기적 및 광학적 특성에 미치는 영향을 조사하였다. XRD 분석 결과, 열처리 온도에 무관하게 모든 박막이 c-축 배향성을 나타내었다. 열처리 온도가 400에서 600℃ 로 증가함에 따라 반가폭(FWHM)은 1.65에서 1.07° 로 감소하였다. 가시광 영역(400-800nm)에서의 평균 투과도는 열처리 온도에 큰 영향 없이 85% 이상의 높은 값을 나타내었다. Hall 측정결과, 열처리 온도에 따라 캐리어 농도와 이동도는 증가하였고 비저항은 감소하였다. 600℃ 에서 열처리한 BZO박막의 비저항과 캐리어 농도는 각각 9.75 × 10^-2 Ω·cm 과 4.21×10¹⁹ cm^-3 로 가장 우수한 값을 나타내었다. 향후 BZO박막의 공정 조건과 열처리 조건을 최적화시킨다면, 차세대 광전자 소자에 응용될 수 있는 매우 유망한 재료로 주목받을 것으로 기대된다.

• 한국자기학회지
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• 제2권1호
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• pp.44-49
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• 1992

단롤법 급속응고기술을 이용하여 $Nd_{12}Fe_{80}B_{6}(Nb,\;M)$ (M=Ti/Cu/Ga) 리본을 제작하고 이의 자기특성 및 미세조작에 관한 연구를 하였다. X-선 회절 및 TEM을 이용한 미세조직 조사 결과, 리본의 이방화에 Ga이 효과적이며, 디스크표면속도 17.9 m/s로 제작한 $Nd_{12}Fe_{80}B_{6}(Nb,\;Ca)$ 리본은 약 30 nm의 미세한 결정립으로 구성되고 자유표면이 이방화된 조직으로 형성됨을 알았다. 이 리본을 분쇄하여 자장중에서 정렬시킨 분말의 잔류자속밀도는 0.87 T의 높은 값을 보였으며, 분쇄하기전 리본의 잔류자속밀도에 비하여 약 5% 정도 높았다. 이상의 결과로 부터 리본의 자유표면은 이방화가 되고 나머지 부분은 HIREM 특성을 나타내는 새로운 형태의 고특성 급속응고리본의 제조가 가능할 것으로 사료된다.

• 한국재료학회지
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• 제20권1호
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• pp.47-50
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• 2010

Various thicknesses of Al-doped ZnO (AZO) films were deposited on glass substrate using pulsed dc magnetron sputtering with a cylindrical target designed for large-area high-speed deposition. The structural, electrical, and optical properties of the films of various thicknesses were characterized. All deposited AZO films have (0002) preferred orientation with the c-axis perpendicular to the substrate. Crystal quality and surface morphology of the films changed according to the film thickness. The samples with higher surface roughness exhibited lower Hall mobility. Analysis of the measured data of the optical band gap and the carrier concentration revealed that there were no changes for all the film thicknesses. The optical transmittances were more than 85% regardless of film thickness within the visible wavelength region. The lowest resistivity, $4.13\times10^{-4}\Omega{\cdot}cm^{-1}$ was found in 750 nm films with an electron mobility $(\mu)$ of $10.6 cm^2V^{-1} s^{-1}$ and a carrier concentration (n) of $1.42\times10^{21} cm^{-3}$.

• 한국재료학회지
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• 제9권5호
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• pp.484-490
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• 1999

Pt/SiOz!Si의 기판위에 $(Pb,La)TiO_3$(PLT) 박막을 졸-겔 방법으로 제작하여 La 첨가량 및 후속열처리 온도에 따른 결정학적, 전기적 특성율 조사하였다. $600^{\circ}C$ 이상의 온도에서 열처리된 PLT 박막 시료의 경우 La 도핑량에 관계없이 전형적인 perovskite 결정구조를 보여 주었다. La이 전혀 첨가되지 않은 $(Pb,La)TiO_3$(PT) 시료에 10 mole% La을 첨가할 경우 (PLT-I0 시료) c축 배향도는 약 63%에서 26%로 크게 감소하였다. PLT-1O 박막시료의 깊이에 따른 AES 분석결과 박막내의 각 성분원소 들이 비교척 균일하게 분포되어 았고 하부전극(Pt)과 PLT 박막층 사이에는 상호반응없이 비교적 안정된 막을 형성하고 있음을 알 수 있었다. $600^{\circ}C$에서 열처리된 PLT-1O 박막의 유전상수$({\varepsilon}r)$ 와 유전정접 (tan$\delta$) 은 약 193과 0.02의 값을 나타내였다. 후속열처리 온도를 $600^{\circ}C 에서 700^{\circ}C$로 증가함에 따라 잔류분극$(2Pr,Pr_+-Pr_-)$은 약 $4\muC\textrm{cm}^2 에서 약 16\muC\textrm{cm}^2$로 크게 증가하였으며 잔류 분극값의 증가는 후속열처리에 의해 결정성이 개선되었기 때문이라 판단된다. $30^{\circ}C$ 온도부근에셔 초전계수($\gamma$)는 약 $4.0nC/\textrm{cm}^2{\cdot}^{\circ}C$의 값을 냐타내었다.

• 한국자기학회지
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• 제8권3호
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• pp.156-160
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• 1998

고주파 마그네트론 스퍼링법에 의하여 두께 약 2000$\AA$으로 제조한 (Mn0.5-ZSb0.5+Z)100-yPty(0$0^{\circ}C$의 진공중에서 열처리한 후, X-선회질장치, 토크자려계, kerr 효과 즉정장치를 이용하여 결정구조 및 자기광학적 특성을 조사하였다. 열처리 후, MnSbPt 합금막은 FDD의 Clb-형구조를 갖으나, MnSbAg 합금막은 HCP의 NiAs-형구조를 갖고 c-축이 막면에 수직하여 배향하는 이방성조직이 형성되나 열처리시간이 길어지면 등방성조직으로 바뀐다. 30$0^{\circ}C$에서 3시간 동안 dufcjflgksMnSbAg 합금막에서 우수한 수직자기이방성이 관측되었으며 Mn47.4Sb47.5Ag5.1 합금막으로부터 K1=6.6$\times$105 erg/cm3, K2=1.9$\times$105 erg/cm3의 수직자기이방성값을 얻었다. 입사파장 700~100nm 범위에서 MnSbpt 합금막의 Kerr 회전각은 입사파장이 감소할수록 증가하나 MnSgAg 합금막은 반대경향을 보인다. 입사파장 λ=700nm에서 Mn41.1Sb44.9Pt14.0 및 Mn47.4Sb47.5Pt5.1 합금막의 Kerr 회전각 $\theta$k는 각각 1.7$^{\circ}$와 0.2$^{\circ}$이고 λ=1000nm에서는 각각 0.6$^{\circ}$와 0.97$^{\circ}$이다.

• 한국세라믹학회지
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• 제53권4호
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• pp.417-428
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• 2016

In this review, an attempt is made to calculate one-dimensional (1-D) electron density profiles from experimentally determined (00l) XRD intensities and possible structural models as well in an effort to understand the collective intracrystalline structures of intercalant molecules of two-dimensional (2-D) nanohybrids with heterostructures. 2-D ceramics, including layered metal oxides and clays, have received much attention due to their potential applicability as catalysts, electrodes, stabilizing agents, and drug delivery systems. 2-D nanohybrids based on such layered ceramics with various heterostructures have been realized through intercalation reactions. In general, the physico-chemical properties of such 2-D nanohybrids are strongly correlated with their heterostructures, but it is not easy to solve the crystal structures due to their low crystallinity and high anisotropic nature. However, the powder X-ray diffraction (XRD) analysis method is thought to be the most powerful means of understanding the interlayer structures of intercalant molecules. If a proper number of well-developed (00l) XRD peaks are available for such 2-D nanohybrids, the 1-D electron density along the crystallographic c-axis can be calculated via a Fourier transform analysis to obtain structural information about the orientations and arrangements of guest species in the interlayer space.

• Applied Microscopy
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• 제25권2호
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• pp.73-79
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• 1995

The oxidation of silicon wafers is an essential step in the fabrication of semiconductor devices. It is known to induce degradation of electrical properties and lattice strain of Si substrate from thermal oxidation process due to charged interface and thermal expansion mismatch from thermally grown SiO, film. In this study, convergent beam electron diffraction technique is employed to directly measure the lattice strains in Si(100) and $4^{\circ}$ - off Si(100) substrates with thermally grown oxide layer at $1200^{\circ}C$ for three hours. The ratios of {773}-{973}/{773}-{953} Higher Order Laue Zone lines were used at [012] zone axis orientation. Lattice parameters of the Si substrate as a function of distance from the interface were determined from the computer simulation of diffraction patterns. Correction value for the accelerating voltage was 0.2kV for the kinematic simulation of the [012]. HOLZ patterns. The change in the lattice strain profile before and after removal of oxide films revealed the magnitudes of intrinsic strain and thermal strain components. It was shown that $4^{\circ}$ -off Si(100) had much lower intrinsic strain as surface steps provide effective sinks for the free Si atoms produced during thermal oxidation. Thermal strain in the Si substrate was in compression very close to the interface and high concentration of Si interstitials appeared to modify the thermal expansion coefficient of Si.

• 센서학회지
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• 제15권3호
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• pp.216-221
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• 2006

ZnO thin films prepared by PLD method exhibit an excellent optical property, but may have some problems such as incomplete surface roughness and crystallinity. In this study, undoped ZnO buffer layers were deposited on (0001) sapphire substrates by ultra high vacuum pulse laser deposition (UHV-PLD) and molecular beam epitaxy (MBE) methods, respectively. After post annealing of ZnO buffer layer, undoped ZnO thin films were deposited under different oxygen pressure ($35{\sim}350$ mtorr) conditions. The Arsenic-doped (1, 3 wt%) ZnO thin layers were deposited on the buffer layer of undoped ZnO by UHV-PLD method. The optical property of the ZnO thin films was analyzed by photoluminescence (PL) measurement. The ${\theta}-2{\theta}$ XRD analysis exhibited a strong (002)-peak, which indicates c-axis preferred orientation. Field emission-scanning electron microscope (FE-SEM) revealed that microstructures of the ZnO thin films were varied by oxygen partial pressure, Arsenic doping concentration, and deposition method of the undoped ZnO buffer layer. The denser and smoother films were obtained when employing MBE-buffer layer under lower oxygen partial pressure. It was also found that higher Arsenic concentration gave the enhanced growing of columnar structure of the ZnO thin films.