• Title/Summary/Keyword: Hall effects

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On Practical Choice of Smoothing Parameter in Nonparametric Classification (베이즈 리스크를 이용한 커널형 분류에서 평활모수의 선택)

  • Kim, Rae-Sang;Kang, Kee-Hoon
    • Communications for Statistical Applications and Methods
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    • v.15 no.2
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    • pp.283-292
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    • 2008
  • Smoothing parameter or bandwidth plays a key role in nonparametric classification based on kernel density estimation. We consider choosing smoothing parameter in nonparametric classification, which optimize the Bayes risk. Hall and Kang (2005) clarified the theoretical properties of smoothing parameter in terms of minimizing Bayes risk and derived the optimal order of it. Bootstrap method was used in their exploring numerical properties. We compare cross-validation and bootstrap method numerically in terms of optimal order of bandwidth. Effects on misclassification rate are also examined. We confirm that bootstrap method is superior to cross-validation in both cases.

Preparation of Bismuth Thin Films by RF Magnetron Sputtering and Study on Their Electrical Transport Properties (RF 마그네트론 스퍼터링을 이용한 Bismuth 박막의 제조와 그 전기적 특성 연구)

  • Kim Dong-Ho;Lee Gun-Hwan
    • Journal of the Korean institute of surface engineering
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    • v.38 no.1
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    • pp.7-13
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    • 2005
  • Bismuth thin films were prepared on glass substrate with RF magnetron sputtering and effects of substrate temperature on surface morphology and their electrical transport properties were investigated. Grain growth of bismuth after nucleation and the onset of coalescense of grains at 393 K were observed with field emission secondary electron microscopy. Continuous thin films could not be obtained above 473 K because of grain segregation and island formation. Hall effect measurements showed that substrate heating yields the decrease of carrier density and the increase of mobility. Resistivity of bismuth film has its minimum (about 0.7 x 10/sup -3/ Ωcm) in range of 403~433 K. Annealing of bismuth films deposited at room temperature was carried out in a radiation furnace with flowing hydrogen gas. The change of resistivity was not significant due to cancellation of the decrease of carrier density and the increase of mobility. The abrupt change of electrical properties of film annealed above 523 K was found to be caused by partial oxidation of bismuth layer in x-ray diffraction analysis.

Properties of CulnSe$_{2}$ thin films selenizing indium/copper layers prepared by D.C. magnetron sputtering (D.C. magnetron sputtering에 의해 indium/copper 층이 selenizing된 $CuInSe_2$막의 특성)

  • Han, Sang-Kyu;Kim, Sun-Jae;Lee, Hyung-Bock;Lee, Byung-Ha;Park, Sung
    • Electrical & Electronic Materials
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    • v.8 no.3
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    • pp.298-305
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    • 1995
  • Copper-indium diselenide, $CuInSe_2$, thin films have been fabricated by selenizing Cu/In stacked layers with different sputtered Cu/(Cu+ln) mole ratios at 450.deg. C for 1hr on alumina substrates. The selenium source was selenium vapor. Microstructure, crystallization, and composition of the selenized $CuInSe_2$ films were examined by using scanning electron microscope, X-ray diffraction, Auger electron spectroscopy, and secondary ion mass spectrometry. Electrical resistivity and hall effects were also measured to investigate the electrical properties. As the sputtered Cu/(Cu+In) mole ratio of In/Cu layer increased, the amounts of void and CuSe phase in the selenized films increased but the composition of $CuInSe_2$ phase was the same regardless of the sputtered mole ratio. Comparing the electrical properties of $CuInSe_2$ thin film before and after the chemical etching, it was seen that the electrical resistivity, carrier concentration, and carrier mobility of the selenized films were affected by the amount of CuSe phase which seemed to increase primarily the hole concentration of the selenized films.

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The analysis on TMA gas-sensing characteristics of ZnO thin film sensors (ZnO 막막 센서의 TMA 가스 검지 특성 분석)

  • 류지열;박성현;최혁환;김진섭;이명교;권태하
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.34D no.12
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    • pp.46-53
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    • 1997
  • The TMA gas sensors are fabricated with the ZnO-based thin films grown by a RF magnetron sputtering method. The hall effect measurement and AES analysis are carried out to investigate the effects of the sputtering gases and dopants which effect on the electrical resistivity and sensitivity to TMA gas. We measure the cfhanges of the surface carrier concentration, haall electron mobility, electrical resistivity, surface condition, and depth profile of the films. The ZnO-based thin film sensors sputtered in oxygen, or added with dopants showed a high sruface carrier concentration, film sensors sputtered in oxygen and doped with 4.0 wt.% $Al_{2}$O$_{3}$, 1.0 wt.% TiO$_{2}$, and 0.2 wt% v$_{2}$O$_{5}$ showed the highest surface carrier concentration of 5.952 * 10$^{20}$ cm$^{-3}$ , hall electron mobility of 176.7 cm$^{2}$/V.s, lowest electrical resistivity of 6*10$^{-5}$ .ohm.cm and highest sensitivity of 12. These results were measured at a working temperature of 300.deg. C to 8 ppm TMA gas.

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Post-earthquake Assessment of Mission-Gothic Undercrossing

  • Lou, K.Y.;Ger, J.F.;Yang, R.J.;Cheng, F.Y.
    • Computational Structural Engineering : An International Journal
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    • v.1 no.1
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    • pp.1-9
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    • 2001
  • Collapse behavior of Mission-Gothic Undercrossing under Northridge earthquake is studied by performing nonlinear time-history analysis and three-dimensional nonlinear finite element method for flared columns. Bridge structural model is characterized as three-dimensional with consideration of columns, superstructures, and abutment conditions. Three components of ground motion, corresponding to bridge's longitudinal, transverse, and vertical direction and their combinations are used to investigate bridge collapse. Studies indicate that bridge collapse is dominantly caused by transverse ground motion and the consideration of three-dimensional ground motion leads to a more accurate assessment. Failure mechanism of flared columns is analyzed applying nonlinear finite element method. Reduction of column capacity is observed due to orientation of flare. Further investigation demonstrates that the effects of flare play an important role in predicting of bridge failure mechanism. Suggestions are offered to improve the performance of bridges during severe earthquake.

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A Study on the Exhibition Characteristics of the Digital Signage in Corporate Exhibition Hall (기업홍보관의 디지털 사이니지 전시연출특성에 관한 연구)

  • Jang, Hyun-Ha;Han, Hae-Ryon
    • Korean Institute of Interior Design Journal
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    • v.20 no.5
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    • pp.114-124
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    • 2011
  • The development in modern world media made information expansion and conversion much easier. These changes in media environment required a lot of companies to quickly respond to the overall environment and come up with new appropriate marketing strategies. Companies use experiential exhibition halls to enhance their images. The goal of the research is to set the basis for digital signage exhibition production characteristics as a spatial mechanism by presenting the need to use the digital signage as a tool. Digital signage expands senses and connects internal and external space. There are many types of digital signage (display, projection, special media, etc) and they are informative, aesthetic, inductive, and amusing. For research methods, Korean companies' exhibition halls sample analysis and surveys were executed to analyze the awareness, expression characteristics, effects, and usage status of digital signage. In conclusion, corporate exhibition halls should: 1. be an interesting and comfortable space that can be used as a communication tool between the company and consumers 2. increase corporate potentials and faith by expanding human senses and inducing new experiences 3. continue to capture the interest of spectators through diversity.

Characteristics of IGZO Films Formed by Room Temperature with Thermal Annealing Temperature (상온에서 증착된 IGZO 박막의 열처리 온도에 따른 특성)

  • Lee, Seok-Ryeol;Lee, Kyong-Taik;Kim, Jae-Yeal;Yang, Myoung-Su;Kang, In-Byeong;Lee, Ho-Seong
    • Journal of the Korean institute of surface engineering
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    • v.47 no.4
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    • pp.181-185
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    • 2014
  • We investigated the structural, electrical and optical characteristics of IGZO thin films deposited by a room-temperature RF reactive magnetron sputtering. The thin films deposited were annealed for 2 hours at various temperatures of 300, 400, 500 and $600^{\circ}C$ and analyzed by using X-ray diffractometer, transmission electron microscopy, atomic force microscope and Hall effects measurement system. The films annealed at $600^{\circ}C$ were found to be crystallized and their surface roughness was decreased from 0.73 nm to 0.67 nm. According to XPS measurements, concentration of oxygen vacancies were decreased at $600^{\circ}C$. Optical band gap were increased to 3.31eV. The carrier concentration and Hall mobility were sharply increased at 600oC. Our results indicate that the IGZO films deposited at a room temperature can show better thin film properties through a heat treatment.

As BEP Effects on the Properties of InAs Thin Films Grown on Tilted GaAs(100) Substrate (기울어진 GaAs(100) 기판 위에 성장된 InAs 박막 특성에 대한 As BEP 효과)

  • Kim, Min-Su;Leem, Jae-Young
    • Journal of the Korean institute of surface engineering
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    • v.43 no.4
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    • pp.176-179
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    • 2010
  • The InAs thin films were grown on GaAs(100) substrate with $2^{\circ}C$ tilted toward [$0\bar{1}\bar{1}$] with different As beam equivalent pressure (BEP) by using molecular beam epitaxy. Growth temperature and thickness of the InAs thin films were $480^{\circ}C$ and 0.5 ${\mu}m$, respectively. We studied the relation between the As BEP and the properties of InAs thin films. The properties of InAs thin films were observed by reflection high-energy electron diffraction (RHEED), optical microscope, and Hall effect. The growth, monitored by RHEED, was produced through an initial 2D (2-dimensional) nucleation mode which was followed by a period of 3D (3-dimensional) island growth mode. Then, the 2D growth recovered after a few minutes and the streak RHEED pattern remained clear till the end of growth. The crystal quality of InAs thin films is dependent strongly on the As BEP. When the As BEP is $3.6{\times}10^{-6}$ Torr, the InAs thin film has a high electron mobility of 10,952 $cm^2/Vs$ at room temperature.