• Title/Summary/Keyword: Half shaded square pattern

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Surface Encoder Based on the Half-shaded Square Patterns (HSSP)

  • Lee, Sang-Heon;Jung, Kwang-Suk;Park, Eui-Sang;Shim, Ki-Bon
    • International Journal of Precision Engineering and Manufacturing
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    • v.9 no.3
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    • pp.82-84
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    • 2008
  • A surface encoder based on the Half-shaded square pattern (HSSP) is presented. The HSSP working as reference grid is composed of the straight lines which are easy to be fabricated and make measuring time short. Since the periodic cell is separated in ON/OFF by the $45^{\circ}$ straight line, the duration from the starting point of scanning to the first rising edge and the duty cycle of the pulse train vary with respect to the position of the starting point. And the relationship between X and Y position and the duration, and duty cycle is described in the simple linear equation. Therefore, it is possible to measure X and Y position with the measured duration and duty cycle without calculating load. Through the test set-up, the feasibility of the proposed surface encoder was verified. Also the future works for improvement of performance were suggested.

Measuring Methods for Two-dimensional Position Referring to the Target Pattern (참조패턴 기반의 2차원 변위 측정 방법론)

  • Jung, Kwang Suk;Lee, Sang Heon;Park, Sung-Jun
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.22 no.1
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    • pp.77-84
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    • 2013
  • In this paper, we review two-dimensional measuring methods referring to target patterns. The patterns consist of two linearly-repeated patterns or is designed repeatedly in two-dimension. The repeated properties are reflectivity, refractivity, air-gapping distance, capacitance, magnetic reluctance, electrical resistance and sloping gradient, etc. However, the optical methods are generally used for high speed processing and density, and their encoding principles are treated here. In case of two-dimensional pattern, as there is not inherently error between single units encoding the pattern except for the metrology frame errors, the end-effector position of an object accompanying the pattern can be measured with respect of the global frame without via error. Therefore, it is regarded as a substitute for laser interferometer with severe environmental constraints and has been applied to the high-accurate planar actuator.