• 산업경영시스템학회지
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• 제29권1호
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• pp.34-40
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• 2006

Many producers put sampling inspection policy into the way of their convenience. Examples of the convenience are irregular lot size and too small sample size. Because they don't use a standard sampling inspection policy, they can not guarantee the quality level of their products. In this study, we developed a user-centered design program which can calculate the AOQL of their products to their buyers in the case of irregular lot size and too small sample size. Also this program propose a linear inspection cost by Hald's model.

• 품질경영학회지
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• 제10권2호
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• pp.25-33
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• 1982

We discuss a model for acceptance/rejection decision regarding finite populations. The model is based on a beta-binomial prior distribution and additive costs -- relative sampling costs, relative sorting costs and costs of accepted defectives. A substantial part of the paper is devoted to constructing a Bayes sequential sampling acceptance plan (BSSAP) for attributes under the model. It is shown that the Bayes fixed size sampling acceptance plans (BFSAP) are better than the Hald's (1960) single sampling acceptance plans based on a uniform prior. Some tables and examples are provided for comprisons of the minimum Bayes risks of the BSSAP and those of the BFSAP based on a uniform prior and the model.

• Journal of the Korean Statistical Society
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• 제7권1호
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• pp.27-43
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• 1978

This paper deals with the problem of obtaining a minimum cost acceptance sampling plan for destructive testing. The cost model is constructed under the assumption that the sampling procedure takes the following form; 1) lots rejected on the first sample are acreened with a non-destructive testing, 2) the screening is assumed to be imperfect, and therefore, after the screening, a second sample is taken to determine whether to accept the lot of to scrap it. The usual sampling procedures for destructive testing can be regarded as special cases of the above one. Utilizing Hald's Bayesian approach, procedures for finding the global optimal sampling plans are given. However, when the lot size is large, the global plan is very different to obtain even with the aid of an electronic computer. Therefore a method of finding suboptimal plan is suggested. An example with uniform prior is also given.

• 품질경영학회지
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• 제30권1호
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• pp.74-96
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• 2002

The objectives of this study is to suggest the rectifying sampling inspection plan considering quality cost. Limiting quality level(LQL) plans(also called LTPD plans) and outgoing quality(OQ) plans are considered. The Hald's linear cost model is discussed with and without a beta prior for the distribution of the fraction of nonconforming items in a lot. It is assumed that the sampling inspection is error free. We consider the design of reliability acceptance sampling plan (RASP) for failure rate level qualification at selected confidence level. The lifetime distribution of products is assumed to be exponential. MIL-STD-690C and K C 6032 standards provide this procedures. But these procedures have some questions to apply in the field. The cost of test and confidence level(1-$\beta$ risk) are the problem between supplier and user. So, we suggest that the optimal life test sampling inspection plans using simple linear cost model considering product cost, capability of environment chamber, environmental test cost, and etc. Especially, we consider a reliability of lots that contain some nonconforming items. In this case we assumed that a nonconforming item fail after environmental life test. Finally, we develope the algorithm of the optimal sampling inspection plan based on minimum costs for rectifying inspection and RASP. And computer application programs are developed So, it is shown how the desired sampling plan can be easily found.