• Title/Summary/Keyword: Glass sealing

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Effect of an Additive on the Physical and Electrical Properties of the B2O3-ZnO-Bi2O3 Glass System for a Sheath Heater Module (Sheath Heater 모듈 실링용 B2O3-ZnO-Bi2O3계 유리소재 및 첨가제에 따른 물성 변화)

  • Choi, Jinsam;Shin, Dong Woo;Bae, Won Tae
    • Journal of the Korean Ceramic Society
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    • v.50 no.1
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    • pp.57-62
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    • 2013
  • We investigated the thermal and electrical properties of the $B_2O_3-ZnO-Bi_2O_3$ glass system as a sealing material in sheath heater modules. A composition with over 90 wt% $Bi_2O_3$ in the $B_2O_3-ZnO-Bi_2O_3$ system was glassified by controlling the cooling rate. The glass transition temperature and thermal expansion coefficient in bismate glass could be controlled by the minor ingredients of ZnO, $SiO_2$, $BaO_2$, and $K_2O$. The $B_2O_3-ZnO-Bi_2O_3$ glass system bonded well to metal, and bismate glass insulating properties were comparable to those of bismate glass $B_2O_3-ZnO-PbO$ glass system in a sheath heater module.

Wafer-level Vacuum Packaging of a MEMS Resonator using the Three-layer Bonding Technique (3중 접합 공정에 의한 MEMS 공진기의 웨이퍼레벨 진공 패키징)

  • Yang, Chung Mo;Kim, Hee Yeoun;Park, Jong Cheol;Na, Ye Eun;Kim, Tae Hyun;Noh, Kil Son;Sim, Gap Seop;Kim, Ki Hoon
    • Journal of Sensor Science and Technology
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    • v.29 no.5
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    • pp.354-359
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    • 2020
  • The high vacuum hermetic sealing technique ensures excellent performance of MEMS resonators. For the high vacuum hermetic sealing, the customization of anodic bonding equipment was conducted for the glass/Si/glass triple-stack anodic bonding process. Figure 1 presents the schematic of the MEMS resonator with triple-stack high-vacuum anodic bonding. The anodic bonding process for vacuum sealing was performed with the chamber pressure lower than 5 × 10-6 mbar, the piston pressure of 5 kN, and the applied voltage was 1 kV. The process temperature during anodic bonding was 400 ℃. To maintain the vacuum condition of the glass cavity, a getter material, such as a titanium thin film, was deposited. The getter materials was active at the 400 ℃ during the anodic bonding process. To read out the electrical signals from the Si resonator, a vertical feed-through was applied by using through glass via (TGV) which is formed by sandblasting technique of cap glass wafer. The aluminum electrodes was conformally deposited on the via-hole structure of cap glass. The TGV process provides reliable electrical interconnection between Si resonator and aluminum electrodes on the cap glass without leakage or electrical disconnection through the TGV. The fabricated MEMS resonator with proposed vacuum packaging using three-layer anodic bonding process has resonance frequency and quality factor of about 16 kHz and more than 40,000, respectively.

Glass to Metal Bonding by Electric Field (전장에 의한 유리와 금속의 접합)

  • 정우창;김종희
    • Journal of the Korean Ceramic Society
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    • v.20 no.1
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    • pp.70-78
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    • 1983
  • This paper discusses the application of Si-Borosilicate glass sealing to a new sealing method which utilizes a large electrostatic field to pormote bound formation at relatively low temperature. Bonding mechanism and the effect of bonding time bonding temperature glass thickness and surface roughness on the bond strength were investigated. Application of a de voltage across bonded specimen gradually produced a layer of glass adjacent silicon which was depleted of mobile ions. As a consequence a n increasingly larger fraction of the applied voltage appeared across the depleted region and very large electric field resulted This field accompanyed by large electrostatic force acted as driving force the of strong bond. And stronger bond was formed with increasing bonding time and temperature. A low temperature preoxidation is advantageous for the Si surface having a rougher surface finish that 1 microinch.

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Microwave Sealing of Alumina Substrate with Sealing Glass (봉착용 유리를 이용한 알루미나 기판의 마이크로파 봉착)

  • Park, Seong-Su;Cha, Mu-Gyeong;Ryu, Bong-Gi;Sin, Hak-Gi;Park, Chan-Yeong;Min, Seong-Gi;Min, Seong-Gi
    • Korean Journal of Materials Research
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    • v.9 no.2
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    • pp.149-154
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    • 1999
  • Alumina substrate was sealed by PbO-ZnO-$B_2O_3$glass using microwave heating. The crystallization behaviour of sealing glass and the state of sealing joint were investigated and were compared with those of conventionally sealed one. Compared to the conventional one, the microwave heat-treated sample had well-grown $\textrm{PbTiO}_3$ crystals and high degree of crystallinity even though it had shorter heat-treatment time and lower heat-treatment temperature. Also, the microwave sealed sample exhibited relatively a good sealing state and almost same bending strength.

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Manufacturing Process of Self-Luminous Glass Tube (SLGT) Utilizing Tritium Gas (I) (삼중수소 활용을 위한 자발광유리관 (SLGT) 제조기술)

  • Kim Kwangsin;Kim Kyeongsook;Chung Eun-Su;Son Soon Hwan;Nam Gi-Jung
    • Proceedings of the Korean Radioactive Waste Society Conference
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    • 2005.11a
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    • pp.87-95
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    • 2005
  • Laser sealing/cutting technique, one of the 4 core technologies to manufacture self-luminous glass tubes (SLGTs) has been developed. Through the analysis of commercial products it is found that Pyrex Is used for SLGTs. A CO2 laser, which is commonly used for glass work was used for the study The factors affecting the sealing/cutting were laser intensity, duration. Irradiation method, and pressure inside the tube. The whole Process is composed of 2 stages. In the first stage. both ends of the tubes are sealed while tritium is insected in the tubes. And the tritium sealed tubes are cut in the desired size in the second stage. Defocused beam was used for seal ing and focused beam was used for cutting. After the sealing/cutting, the tubes were heat treated to prevent fracture due to the residual heat stress.

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Study on the Stress and Displacement Distribution in the Glass Plate for Vacuum-sealed Flat Panel Displays (평판디스플레이용 진공패널에서 유리기판이 받는 응력 및 변위분포에 관한 연구)

  • Kim, Hui-Su;Jo, Yeong-Rae;Mun, Je-Do;O, Jae-Yeol;Jeong, Tae-Eun;Jeong, Hyo-Su
    • Korean Journal of Materials Research
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    • v.8 no.12
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    • pp.1121-1126
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    • 1998
  • For vacuum seated panel, stresses and displacements in the glass plate were calculated. The geometric variables for our experiment were the thickness of glass plate, the size of panel and the width of sealing line. The fracture behaviors and displacements of its under the vacuum were measured. From the measurement of strains and fracture, it was considered that the maximum stress acted at the middle of the sides of the panel. The stresses and displacement distribution of manufactured panels were greatly dependent on the width of the sealing line in the panel. The measured values are more similar to the values which were calculated from the condition of built-in edge as the width of the sealing line is larger. The measured displacement of the panel, made of 3mm thick glass plate, with size of $80\Times120\textrm{mm}^2$ and 20mm sealing line was $57\mu\textrm{m}$. This value is similar to calculated value, $54\mu\textrm{m}$, from built- in edge condition in the finite element method.

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A Study on Panel Manufacture and Packaging Method for Digital FED (디지털 FID용 패널제작과 패키 방법에 관한 연구)

  • Kim, Soo-Yong
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.23 no.5
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    • pp.29-35
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    • 2009
  • Field emission displays(FED) are currently being study as a potential flat technology. The purpose of this project shows the research result of vacuum packaging technology for the development of FED. For FED vacuum packaging, the bonding of glass/glass, the exhaust of vacuum and getter technology have been studied for vacuum packaging technology The simulation and vacuum sealing, and glass/glass bonding are also extensively studied. The glass/glass bonding is formed by using the frit glass and the Inside pressure of complete panel showed of $2{\times}10^{-5}$[Torr]. As a getter result, the increase of pressure has been showed the decrease of outgassing effect by using thin film getter.

Temperature Distribution According to the Structure of a Conductive Layer during Joule-heating Induced Encapsulation for Fabrication of OLED Devices (OLED 소자 제조를 위한 주울 가열 봉지 공정 시 도전층 구조에 따르는 열분포)

  • Jang, Ingoo;Ro, Jae-Sang
    • Journal of the Korean institute of surface engineering
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    • v.46 no.4
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    • pp.162-167
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    • 2013
  • Encapsulation is required since organic materials used in OLED devices are fragile to water vapor and oxygen. Laser sealing method is currently used where IR laser is scanned along the glass-frit coated lines. Laser method is, however, not suitable to encapsulating large-sized glass substrate due to the nature of sequential scanning. In this work we propose a new method of encapsulation using Joule heating. Conductive layer is patterned along the sealing lines on which the glass frit is screen printed and sintered. Electric field is then applied to the conductive layer resulting in bonding both the panel glass and the encapsulation glass by melting glass-frit. In order to obtain uniform bonding the temperature of a conductive layer having a shape of closed loop should be uniform. In this work we conducted simulation for heat distribution according to the structure of a conductive layer used as a Joule-heat source. Uniform temperature was obtained with an error of 5% by optimizing the structure of a conductive layer. Based on the results of thermal simulations we concluded that Joule-heating induced encapsulation would be a good candidate for encapsulation method especially for large area glass substrate.

The Oxidation of Kovar in Humidified $N_2$/H$_2$ Atmosphere (가습된 $N_2$/H$_2$혼합가스 분위기에서의 Kovar 산화 거동)

  • 김병수;김민호;김상우;최덕균;손용배
    • Journal of the Microelectronics and Packaging Society
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    • v.8 no.2
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    • pp.1-7
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    • 2001
  • In order to form a uniform oxidation layer of spinel phase on Kovar which helps the strong bonding in Kovar-to-glass sealing, the humidified $N_2/H_2$ was used as an oxidation atmosphere. The oxidation of Kovar was controlled by diffusion mechanism and the activation energy was 31.61 kacl/mol at 500~$800^{\circ}C$. After oxidation at $600^{\circ}C$, the external oxidation layer was below 0.5 $\mu \textrm{m}$ thick. According to TEM analysis, oxidized Kovar was spinel its lattice parameter of 7.9 $\AA$. Oxidation of under $600^{\circ}C$ and in a humidified $N_2/H_2$ atmosphere, Kovar was found to be appropriate for the Kovar-to-glass sealing.

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