• 제목/요약/키워드: Fusing current

검색결과 42건 처리시간 0.026초

과전류에 의한 동 전선의 용단 아크 특성 및 금속조직 분석 (The Analysis of Metallurgical Structure and Arc Properties of Copper Wire Due to Over-current)

  • 김영석;송길목;김동욱;이기연;최충석
    • 한국전기전자재료학회:학술대회논문집
    • /
    • 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
    • /
    • pp.554-555
    • /
    • 2005
  • In this paper, we analyzed a metallurgical structure and arc properties of copper wire when the over-current flows on electric wire. From the results, The fusing current was related to the fusing time(current rising rate per second). In case of the shorter the fusing time, the fusing current was high, and the fusing time of ac type was larger than that of dc type. The copper wire was bent by the increase of current and heated, the beads were scattered around wire with a flash. We could observed the dendrite structure in 'molten wire at ac and dc current type. According as the current rising rate per second is short, the dendrite structure is distributed in surface of wire.

  • PDF

탄소섬유의 용단전류 및 차폐 케이블의 과전류 특성 (The Characteristics of the Over-current of Shielded Cable and the Fusing Current of Carbon Fiber)

  • 김영석;김택희;김종민;송길목
    • 전기학회논문지
    • /
    • 제65권10호
    • /
    • pp.1761-1766
    • /
    • 2016
  • In this paper, we investigated the fusing current of carbon fiber and thermal properties of carbon fiber and metal shielded cable due to over-current. The fusing current value for the metal-coated carbon fiber was 5.3A in 3K, 7.4K and 13.05A in 12K. And if it exceeds 50% of the fusing current was broken with a rapid voltage rise. In the case of carbon fiber shielded cable, the temperature of the PVC sheath increased somewhat in the allowable current range. However, the temperature of PVC sheath rapidly increased to $128.1^{\circ}C$ in the 2 time allowable current range. This value is $10^{\circ}C$ higher than the temperature of PVC sheath on the metal screen cable, because the resistance of the carbon fiber is high and heat transfer rate is slow.

The Characteristics of Arc Scattering and Fusing Current of Copper Wire in the Fault Process DB System of Cables in a PL Environment

  • Kim, Young-Seok;Shong, Kil-Mok;Kim, Sun-Gu
    • 조명전기설비학회논문지
    • /
    • 제22권3호
    • /
    • pp.52-58
    • /
    • 2008
  • The importance of. identifying the causes of electrical faults cannot be overstated because of the accidents caused by over-current that take place at the home, the office and electrical facilities due to misuse, poor products and system faults. It is necessary to gather objective, scientific data pertaining to electrical fault investigation in a product liability(PL) environment. To date, no database(DB) has been built concerning the accurate cause analysis of faultyfacilities. In this paper, accident hazard and arc scattering when over-current flows in copper wire was investigated. It was found that when over-current flows in a copper wire, the copper wire became heated and bent and beads were scattered around the wire with a flash. It was determinedthat the fusing current and time was related to the current rise per second. For example, when the current rise per second was largethe fusing current was higher than when the current rise per second was small, and the beads dispersed along a wide area. Fusing time, however, was shorter. The possibility of electrical fault became highest when the fusing current was higher. As the current rise per second is short, the dendrite structure is distributed in the surface of the copper wire. These experimental results can be utilized for a fault process DB system in the investigation and the prevention of electrical faults.

온도 및 절연체에 따른 케이블의 단선시간 특성 해석 (Fusing Time Characteristics Analysis of Cable according to Temperature and Insulator)

  • 김주희;강신동;김재호
    • 한국안전학회지
    • /
    • 제33권5호
    • /
    • pp.15-20
    • /
    • 2018
  • This paper describes the fusing time characteristics of Light PVC Sheathed Circular Cord(VCTF) and Tray Frame Retardant(TFR) cables according to increased temperature under over current condition. The experimental equation will be used to determine the validity and reliability of the test results. The over current flowed 3, 5 and 10 times higher than the amount of allowable current using DC power supply with DAQ(Data Acquisition) measurement system. An infrared radiation heater, which was controlled by a variable AC auto transformer, was used to increase the temperature from room temperature to 50, 100 and 150 degrees Celsius. First, two type of cables were analyzed those with different cross-sectional areas with in the same structure and those with different structures with in the same cross-sectional areas. Then, it was determined how fusing time had been influenced according to the cross-sectional areas and different structures, respectively. The cable resistance was increased by joule heating according to increasing temperature. Therefore, the allowable current of cable is decreased. Finally, the fusing time of the cable was decreased due to increased temperatures at current flow, which were 3 times the amount of allowable current. The instantaneous breakdown was observed when current flow was 5 and 10 times over the amount of allowable current. The fusing time is directly affected by the structure of cable insulation.

절연절단 방식의 프로브 빔 제작

  • 홍표환;공대영;표대승;이종현;이동인;김봉환;조찬섭
    • 한국진공학회:학술대회논문집
    • /
    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
    • /
    • pp.449-449
    • /
    • 2013
  • 최근 반도체 소자의 집적회로는 점점 복잡해지고 있는 반면, 소자의 크기는 작아지고 있으며 그로 인해 패드의 크기가 작아지고 패드사이의 간격 또한 협소해지고 있다. 따라서 웨이퍼 단계에서 제조된 집적회로의 불량여부를 판단하기위한 검사 장비인 프로브카드(Probe Card)의 높은 집적도가 요구되고 있다. 하지만 기존의 MEMS 공법으로 제작되는 프로브 빔은 복잡한 제조 공정과 높은 생산비용, 낮은 집적도의 문제점을 가지고 있다. 본 연구에서는 이러한 문제점을 해결하기 위하여 간단한 제조 공정과 낮은 생산비용, 높은 집적도를 가지는 프로브 빔을 개발하기 위하여 절연절단 방식으로 BeCu (Beryllium-Copper) 프로브 빔을 제작하였다. 낮은 소비 전력으로 우수한 프로브 빔 어레이를 제작하기 위해서 가장 고려해야할 대상은 프로브 빔의 재료와 구조(형상)이다. 절연전단 방식으로 프로브 빔을 형성할 때 요구되는 Fusing current는 프로브 빔의 구조(형상)에 크게 영향을 받는다. 낮은 Fusing current는 소비 전력을 줄여주고, 절연절단으로 형성되는 프로브 빔의 단면(끝)을 날카롭게 하여 프로브 빔과 집적회로의 패드 간의 접촉 저항을 감소시킨다. 프로브 빔의 제작은 BeCu 박판을 빔 형태로 식각하여 제작하였으며, 실리콘 비아 홀(Via hole) 구조의 기판위에 정렬하여 soldering 공정을 통해 실리콘 기판과 BeCu 박판을 접합시켰다. 접합된 프로브 빔의 끝부분을 들어 올린 상태로 전류를 인가하여 stress free 상태로 만들어 내부 응력을 제거하였으며, BeCu 박판에 fusing current를 인가하여 BeCu 박판 프레임으로부터 제거를 하였다. 제작된 프로브 빔의 길이는 1.7 mm, 폭은 $50{\mu}m$, 두께는 $15{\mu}m$, 절단부의 단면적은 1$50{\mu}m^2$로 제작되었다. 그리고 프로브 빔의 절단부의 길이는 $50{\mu}m$ 부터 $90{\mu}m$까지 $10{\mu}m$ 증가시켜 제작되었다. 이후에 절연절단 공정에 요구되는 Fusing current를 측정하였고, 절연절단 후의 절단면의 형상을 SEM (Scanning Electron Microscope)장비를 통하여 확인하였다. 절단부의 길이가 $50{\mu}m$일 때 5.98A의 fusing current를 얻었으며, 절연절단 후 절단부 상태 또한 가장 우수했다. 본 연구에서 제안된 프로브 빔 제작 방법은 프로브카드 및 테스트 소켓(Test socket) 생산에 응용이 가능하리라 기대한다.

  • PDF

전선의 용단전류 특성에 근거한 단락과 과부하 판별에 관한 연구 (A Study on Discrimination between Short-Circuit and Overload based on the Characteristics of the Fusing Current of an Electrical Wire)

  • 송길목;노영수
    • 조명전기설비학회논문지
    • /
    • 제21권10호
    • /
    • pp.176-180
    • /
    • 2007
  • 단락 또는 과부하에 의하여 전선에 과전류가 흐를 경우 전선은 용단되고 이것은 전기화재를 발생시킬 수 있다. 본 논문에서는 단락과 과부하를 판별하기 위하여 전선의 용단전류 특성을 연구하였다. 실험에서는 여러 가지 직경의 나전선에 프리스 식에 근거하여 정한 용단전류를 공급하고 용단시간을 측정하였다. 실험 결과 측정한 용단전류는 온더동크 식을 잘 만족하였다. 측정결과와 국제전기기술표준에서 제시하는 단락전류를 비교하여 나동선에 대한 단락전류를 결정하는 변수 k값이 약 300임을 보였다. 이 값에 근거하여 5초 이내에 단락되는 전선의 용단전류를 직경의 함수로 표현할 수 있다. 결과적으로 이 용단전류의 식은 단락과 과부하를 판별할 수 있는 기준을 제공한다.

니켈기 자융성 합금 코팅의 방식특성에 미치는 후열처리의 영향 (Effect of Fusing Treatment on Anti-Corrosion Characteristics of Ni-based Self-flux Alloy Coating)

  • 김태용;김재동;김영식
    • 동력기계공학회지
    • /
    • 제17권4호
    • /
    • pp.79-85
    • /
    • 2013
  • This study aims at investigating the effect of a fusing treatments on anti-corrosion characteristics of Ni-based self-flux alloy coating. Ni-based coatings were fabricated by flame spray process on steel substrates, and fusing treatments were performed using a vacuum furnace at $800^{\circ}C$ $900^{\circ}C$, $1000^{\circ}C$ and $1100^{\circ}C$. After fusing treatments, corrosion tests were carried out using potentiostat/galvanostat at solution with pH 2 and pH 6. Corrosion potential(Ecorr) and corrosion current density(Icorr) could be analyzed from polarization curve. Fusing-treated coating at $1100^{\circ}C$ showed more favorable anti-corrosion characteristics than as-sprayed coating. Anticorrosive effect of fusing-treated coating at solution with pH 2 was relatively greater than at solution with pH 6. Fusing-treated coating at $1100^{\circ}C$ showed the most excellent anti-corrosion characteristics.

과전류 열화에 의해 용단된 전선의 수지상 조직 성장특성에 관한 연구 (A Study on the Growing Characteristics of Dendrite Structure of Melted Wire Deteriorated by Over Current)

  • 송길목;최충석;김동우;곽희로
    • 대한전기학회:학술대회논문집
    • /
    • 대한전기학회 2003년도 하계학술대회 논문집 C
    • /
    • pp.1463-1465
    • /
    • 2003
  • In this paper, we studied on the growing characteristics of dendrite structure of melted wire deteriorated by over current. Electric wire was melted by Jolue's heat. By using HSIS(High Speed Imaging System), we found out a lot of melted parts of wire were dispersed and radiated. Electric wire had narrow melted areas in case of short fusing time. A lot of very small dots generated around the grain of copper cross-section and they were changed into dendrite structure. Dendrite structure appeared at the values lower than 2.5[A/sec]. In case of very short fusing time, fusing current was calculated by empirical formula. The Preece equation was not enough to analyze a variety of characteristics of melted wire because it did not consider melting time, atmosphere, etc.

  • PDF

AC 전류에 의해 용융된 나전선의 발열 특성 (The Heating Characteristics of Electric Bare Wire Melted by AC Current)

  • 송길목;최충석;김향곤;김영석
    • 조명전기설비학회논문지
    • /
    • 제20권1호
    • /
    • pp.77-84
    • /
    • 2006
  • 이 논문은 화재원인판정에 있어서, 교류전류에 의해 용융된 나전선의 발열특성을 기술한 것이다. 실험을 위해 동전선은 1.2[mm], 1.6[mm], 2.0[mm]의 직경인 것을 준비하였다. 단면분석을 통해 용단전류가 전선에 공급되었을 때, 수지상 조직은 약40[$^{\circ}$] 또는 60[$^{\circ}$]의 각도로 성장하는 것을 확인하였다. 용단전류가 커지면 커질수록 수지상 조직의 성장각도는 줄어들었다. 그것은 주상조직과 유사하다는 것을 확인하였다.

절연절단법을 이용한 프로브 빔의 제작 (Fabrication of Probe Beam by Using Joule Heating and Fusing)

  • 홍표환;공대영;이동인;김봉환;조찬섭;이종현
    • 센서학회지
    • /
    • 제22권1호
    • /
    • pp.89-94
    • /
    • 2013
  • In this paper, we developed a beam of MEMS probe card using a BeCu sheet. Silicon wafer thickness of $400{\mu}m$ was fabricated by using deep reactive ion etching (RIE) process. After forming through silicon via (TSV), the silicon wafer was bonded with BeCu sheet by soldering process. We made BeCu beam stress-free owing to removing internal stress by using joule heating. BeCu beam was fused by using joule heating caused by high current. The fabricated BeCu beam measured length of 1.75 mm and width of 0.44 mm, and thickness of $15{\mu}m$. We measured fusing current as a function of the cutting planes. Maximum current was 5.98 A at cutting plane of $150{\mu}m^2$. The proposed low-cost and simple fabrication process is applicable for producing MEMS probe beam.