• Title/Summary/Keyword: Free silicon

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A Wire-overhead-free Reset Propagation Scheme for Millimeter-scale Sensor Systems

  • Lee, Inhee;Bang, Suyoung;Kim, Yejoong;Kim, Gyouho;Sylvester, Dennis;Blaauw, David;Lee, Yoonmyung
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.17 no.4
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    • pp.524-533
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    • 2017
  • This paper presents a novel reset scheme for mm-scale sensing systems with stringent volume and area constraints. In such systems, multi-layer structure is required to maximize the silicon area per volume and minimize the system size. The multi-layer structure requires wirebonding connections for power delivery and communication among layers, but the area overhead for wirebonding pads can be significant. The proposed reset scheme exploits already existing power wires and thus does not require additional wires for system-wide reset operation. To implement the proposed reset scheme, a power management unit is designed to impose reset condition, and a reset detector is designed to interpret the reset condition indicated by the power wires. The reset detector uses a coupling capacitor for the initial power-up and a feedback path to hold the developed supply voltage. The prototype reset detector is fabricated in a $180-{\mu}m$ CMOS process, and the measurement results with the prototype mm-scale system confirmed robust reset operation over a wide range of temperatures and voltages.

Characteristic of Oxide CMP with the Various Temperatures of Silica Slurry (실리카 슬러리의 온도 변화에 따른 산화막의 CMP 특성)

  • Ko, Pil-Ju;Park, Sung-Woo;Kim, Nam-Hoon;Seo, Yong-Jin;Chang, Eui-Goo;Lee, Woo-Sun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.11a
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    • pp.707-710
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    • 2004
  • Chemical mechanical polishing (CMP) process has been widely used to planarize dielectric layers, which can be applied to the integrated circuits for sub-micron technology. Despite the increased use of CMP process, it is difficult to accomplish the global planarization of in the defect-free inter-level dielectrics (ILD). In this paper, we have investigated slurry properties and CMP performance of silicon dioxide (oxide) as a function of different temperature of slurry. Thermal effects on the silica slurry properties such as pH, particle size, conductivity and zeta potential were studied. Moreover, the relationship between the removal rate (RR) with WIWNU and slurry properties caused by changes of temperature were investigated. Therefore, the understanding of these temperature effects provides a foundation to optimize an oxide CMP Process for ULSI multi-level interconnection technology.

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Fabrication and Crystallization Behavior of BNN Thin Films by H-MOD Process

  • Lou, Jun-Hui;Lee, Dong-Gun;Lee, Hee-Young;Lee, Joon-Hyung;Cho, Sang-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07b
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    • pp.739-743
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    • 2003
  • [ $Ba_2NaNb_5O_{15}$ ], hereafter BNN, thin films are attractive candidates for nonvolatile memory and electro-optic devices. In the present work, thin films that have different contents of Ba, Nb and Na have been prepared by H-MOD technique on silicon and Pt substrates. XRD and SEM were used to investigate the phase evolution behavior and the microstructure of the films. It was found that the films of about 500nm thick were crack-free and uniform in microstructure. Nb content strongly influenced the phase formation of the films, where unwanted phases were always formed at the stoichiometric BNN composition. However, the unwanted phases decreased with the increase of excess Nb content, and the single phase (tetragonal tungsten bronze structure) BNN thin film was obtained when the niobium content reached some point. From this study, the sub-solidus phase diagram below $850^{\circ}C$ for $BaO-Na_2O-Nb_2O_5$ ternary system is proposed.

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4H-SiC Planar MESFET for Microwave Power Device Applications

  • Na, Hoon-Joo;Jung, Sang-Yong;Moon, Jeong-Hyun;Yim, Jeong-Hyuk;Song, Ho-Keun;Lee, Jae-Bin;Kim, Hyeong-Joon
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.5 no.2
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    • pp.113-119
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    • 2005
  • 4H-SiC planar MESFETs were fabricated using ion-implantation on semi-insulating substrate without recess gate etching. A modified RCA method was used to clean the substrate before each procedure. A thin, thermal oxide layer was grown to passivate the surface and then a thick field oxide was deposited by CVD. The fabricated MESFET showed good contact properties and DC/RF performances. The maximum oscillation frequency of 34 GHz and the cut-off frequency of 9.3 GHz were obtained. The power gain was 10.1 dB and the output power of 1.4 W was obtained for 1 mm-gate length device at 2 GHz. The fabricated MESFETs showed the charge trapping-free characteristics and were characterized by the extracted small-signal equivalent circuit parameters.

Transparent Conducting Multilayer Electrode (GTO/Ag/GTO) Prepared by Radio-Frequency Sputtering for Organic Photovoltaic's Cells

  • Pandey, Rina;Kim, Jung Hyuk;Hwang, Do Kyung;Choi, Won Kook
    • Journal of Sensor Science and Technology
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    • v.24 no.4
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    • pp.219-223
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    • 2015
  • Indium free consisting of three alternating layers GTO/Ag/GTO has been fabricated by radio-frequency (RF) sputtering for the applications as transparent conducting electrodes and the structural, electrical and optical properties of the gallium tin oxide (GTO) films were carefully studied. The gallium tin oxide thin films deposited at room temperature are found to have an amorphous structure. Hall Effect measurements show a strong influence on the conductivity type where it changed from n-type to p-type at $700^{\circ}C$. GTO/Ag/GTO multilayer structured electrode with a few nm of Ag layer embedded is fabricated and show the optical transmittance of 86.48% in the visible range (${\lambda}$ = 380~770 nm) and quite low electrical resistivity of ${\sim}10^{-5}{\Omega}cm$. The resultant power conversion efficiency of 2.60% of the multilayer based OPV (GAG) is lower than that of the reference commercial ITO. GTO/Ag/GTO multilayer is a promising transparent conducting electrode material due to its low resistivity, high transmittance, low temperature deposition and low cost components.

Effective electromechanical coupling coefficient of adaptive structures with integrated multi-functional piezoelectric structural fiber composites

  • Koutsawa, Yao;Tiem, Sonnou;Giunta, Gaetano;Belouettar, Salim
    • Smart Structures and Systems
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    • v.13 no.4
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    • pp.501-515
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    • 2014
  • This paper presents a linear computational homogenization framework to evaluate the effective (or generalized) electromechanical coupling coefficient (EMCC) of adaptive structures with piezoelectric structural fiber (PSF) composite elements. The PSF consists of a silicon carbide (SiC) or carbon core fiber as reinforcement to a fragile piezo-ceramic shell. For the micro-scale analysis, a micromechanics model based on the variational asymptotic method for unit cell homogenization (VAMUCH) is used to evaluate the overall electromechanical properties of the PSF composites. At the macro-scale, a finite element (FE) analysis with the commercial FE code ABAQUS is performed to evaluate the effective EMCC for structures with the PSF composite patches. The EMCC is postprocessed from free-vibrations analysis under short-circuit (SC) and open-circuit (OC) electrodes of the patches. This linear two-scale computational framework may be useful for the optimal design of active structure multi-functional composites which can be used for multi-functional applications such as structural health monitoring, power harvest, vibration sensing and control, damping, and shape control through anisotropic actuation.

Ultra shallow function Formation of Low Sheet Resistance Using by Laser Annealing (레이져 어닐링을 이용한 낮은 면저항의 극히 얕은 접합 형성)

  • 정은식;배지철;이용재
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2001.05a
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    • pp.349-352
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    • 2001
  • In this paper, novel device structure in order to realize ultra fast and ultra small silicon devices are investigated using ultra-high vacuum chemical vapor deposition(UHVCVD) and Excimer Laser Annealing (ELA) for ultra pn junction formation. Based on these fundamental technologies for the deep sub-micron device, high speed and low power devices can be fabricated. These junction formation technologies based on damage-free process for replacing of low energy ion implantation involve solid phase diffusion and vapor phase diffusion. As a result, ultra shallow junction depths by ELA are analyzed to 10~20 nm for arsenic dosage (2$\times$10$^{14}$ $\textrm{cm}^2$), excimer laser source(λ=248nm) is KrF, and sheet resistances are measured to 1k$\Omega$/$\square$ at junction depth of 15nm.

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OPTIMAL SPUTTERING CONDITIONS FOR HIGH-DENSITY MAGNETIC RECORDING MEDIA BY FTS

  • Noda, Kohki;Kawanabe, Takashi;Naoe, Masahiko
    • Journal of the Korean institute of surface engineering
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    • v.29 no.6
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    • pp.824-828
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    • 1996
  • Co-based alloy thin films ddeposited by fcing targets sputtering(FTS) were investigated for use in high-density magnetic recording media to determine how their magnetic properties are dependent on the sputtering conditions, and thus to find appropriate parameters that allow the sputtering and thin films to meet the specificiations for magnetic properties. FTS can discharge at lower working gas pressure than other sputtering methods such as dcmagnetron sputteing because the plasma is sufficiently confined by a magnetic field applied perpendicular to both of the target planes, which results in plasma-free substrates. Co-Cr-Ta films were deposited by FTS on glass and silicon substrates at substrate temperature between room temperature and $350^{\circ}C$, and at argon gas pressure between 0.1 and 10mTorr. The films were also deposited on polyimide tapes at substrate temperature of $130^{\circ}C$ and argon gas pressure of 1 mTorr. The effective advantages of Ta as an additional element were investigated, using the same films on the tapes. As a result of the experiment, it was found that better magnetic properties were obtained in the ranges of higher temperature and lower argon gas pressure with background pressure in thr range of $1.5 \times 10^{-6}$ Torr. Ta addition at 2 to 4 atomic percent almost havled the Co-Cr grain sizes, indicating that Ta addition at an appropriate atomic percent is effective for improving the microstructure and characteristics of Co-Cr films.

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Influence of Cu and Zn Contents on the Properties of Al-Fe-Cu-Mg Based Casting Alloys (Cu 및 Mg 첨가량에 따른 Al-Fe-Cu-Mg계 주조합금의 특성변화)

  • Kim, Jeong-Min;Kim, Nam-Hoon;Shin, Je-Sik;Kim, Ki-Tae;Ko, Se-Hyun
    • Journal of Korea Foundry Society
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    • v.34 no.4
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    • pp.130-135
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    • 2014
  • Efforts have been made to develop new silicon-free aluminum casting alloys that possess high electrical and thermal conductivity. In this research Al-Fe-Cu-Mg alloys with various Cu and Mg contents were investigated for their various properties. As the Cu or Mg content was increased, the electrical conductivity gradually decreased, while the tensile strength of the Al-Fe-Cu-Mg alloy tended to be improved. It was found that fluidity was generally inversely proportional to the Cu content, but the alloys containing 1%Mg showed considerably low fluidity, regardless of the Cu content.

Power 및 temperature에 의한 증착률 변화와 Al-doped ZnO의 특성변화에 관한 연구

  • An, Si-Hyeon;Park, Cheol-Min;Jo, Jae-Hyeon;Jang, Gyeong-Su;Baek, Gyeong-Hyeon;Lee, Jun-Sin
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.107-107
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    • 2011
  • 오늘 날 transparent conductive oxide는 다양한 분야에서 활용되고 있다. 최근에는 태양전지 분야에서도 많이 활용되고 있으며, 초기에는 transmittance 및 낮은 sheet resistance 특성을 가지는 ITO가 많이 활용되었지만 thin film solar cell와 같이 hydrogenation 공정에 약한 ITO보다는 Al-doped ZnO가 사용되기 시작하면서 많은 연구가 진행되고 있다. 본 연구에서는 thin film solar cell 및 silicon heterojunction solar cell에 적용 가능한 Al-doped ZnO에 관한 연구로써 a-Si:H의 Si-H bonds에 영향을 주지 않는 낮은 영역의 substrate temperature와 power로 Al-doped ZnO를 형성하고 상기 parameter에 따른 Al-doped ZnO의 특성 변화에 대해서 분석하였다. 특히 substrate temperature가 변화할수록 carrier concentration 및 sheet resistance가 많은 변화를 보였으며 이로 인하여 transmittance 특성이 온도에 따라 좋아지다가 너무 높은 온도에서는 오히려 좋지 않게 되었다. 이는 너무 높은 carrier concentration은 free carrier absorption에 의해 transmittance 특성을 오히려 좋지 않게 한다. 우리는 본 연구를 통해 92.677% (450 nm), 90.309% (545 nm), 94.333% (800 nm)의 transmittance를 얻을 수 있었다.

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