• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2007.05a
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• pp.55-59
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• 2007

Technologies of super-precision micro pattern mold machining and high-performance optical films manufacturing using thereof forms the basis of recent display industries which have developed remarkably. Especially, it is the light guide plates and high luminous intensity prism sheets at BLU or FLU in LCD and lenses at virtual keyboard's display to be manufactured by micro machining technology. One way the industry requires to do that is by developing high-performance light guide plates or films which are existing light guide plates, diffusion films and luminance enhancement prism films all in one. In this research effort, basic processing of the micro pyramid structure by shaping method is proposed. Experiments of mold machining of pitch $20{\mu}m$ tetrahedral pyramid and pitch $100{\mu}m$ trihedral pyramid using a $90^{\circ}$ diamond tool were conducted to identify a variety of machining features, such as cutting forces, conditions of the surface, shapes of chips, and influence of materials.

• Transactions on Electrical and Electronic Materials
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• v.7 no.1
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• pp.30-35
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• 2006

We have studied the motion of charged micro-particles that are immersed in a nematic liquid crystal (LC) and controlled by in-plane field. The LC is an anisotropic liquid such that the viscosity of the LC depends on flow direction, phase of the LC, and temperature, which affects the motion of the charged particles under the influence of electric field. This study shows that the motion of charged particles mainly depends on the applied voltage and the LC phase, but does not show any significant influence from the initial alignment of LC, although one may expect directional difference in drag force due to interaction between LC and particle. The viscosity changes due to temperature variations in nematic phase also show no signification influence on particle velocity when compared to the effect from varying in-plane field strength.

• Transactions on Electrical and Electronic Materials
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• v.17 no.3
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• pp.146-149
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• 2016

The CrN/TiN/Al thin films for solar selective absorber were prepared by dc reactive magnetron sputtering with multi targets. The binary nitride CrN layer deposited with change in N₂ gas flow rates. The gas mixture of Ar and N2 was an important parameter during sputtering deposition because the metal volume fraction (MVF) was controlled by the N2 gas flow rate. In this study, the crystallinity and surface properties of the CrN/TiN/Al thin films were estimated by X-ray diffraction (XRD), atomic force microscopy (AFM) and field emission scanning electron microscopy (FESEM). The composition and depth profile of thin films were investigated using Auger electron spectroscopy (AES). The absorptance and reflectance with wavelength spectrum were recorded by UV-Vis-NIR spectrophotometry at a range of 300~1,100 nm.

• Journal of the Semiconductor & Display Technology
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• v.6 no.4
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• pp.11-15
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• 2007

As preparing electrode for the OLED with the sputtering process, in order to be lower damage of the bottom organic layer and increase the life-time of the OLED, we prepared Al electrode for that by using Facing Targets Sputtering (FTS) system. Al electrode directly deposited on the cell (LiF/EML/HTL/Bottom electrode). Deposition condition was the working gas (Ar, Kr and Ar+Kr) and working gas pressure (1 and 6 mTorr). The film thickness and I-V curve of Al/cell were evaluated by a $\acute{a}$-step profiler and a semiconductor parameter (HP4156A) measurement. The thin film surface image was observed by a Atomic Force Microscope (AFM). In result, in comparison with about 11 [V] of the turn-on voltage of Al/cell with using the pure Ar gas, when Al thin film was deposited using the Ar-Kr mixture gas, the surface morphology was improved in some region and the turn-on voltage of Al/cell could be decreased to about 7 [V].

• Journal of the Korean Society for Precision Engineering
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• v.17 no.12
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• pp.76-81
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• 2000

Analysis on failure of the panel glass under mechanical shock is the main topic of this study. Since the glass for the LCD panel is thin, it needs to be designed to have enough toughness against mechanical shock. In this paper, a process of estimating fracture of the panel glass is proposed to guarantee reliability of the product. The fracture toughness of the panel glass is used as a criterion of the fracture based on an experimental approach. The stress intensity factor was calculated considering a model with the largest initial crack size on a cut surface and with the boundary force obtained from a dynamic finite element analysis. Critical surface roughness on the cut surface of a typical glass panel, to prevent fracture in case of bending mode, is obtained.

• Applied Science and Convergence Technology
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• v.26 no.3
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• pp.52-54
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• 2017

An InGaN/GaN multiple quantum well (MQW) structure is grown on a GaN/sapphire template using a plasma-assisted molecular beam epitaxy (PA-MBE). The fluctuation of the quantum well thickness formed from roughly-grown InGaN layer results in a disordered photoluminescence (PL) spectrum. The surface morphologies of the InGaN layers with various In compositions are investigated by reflection high energy electron diffraction (RHEED) and atomic force microscopy (AFM). A blurred InGaN/GaN hetero-interface and the non-uniform QW size is confirmed by high resolution transmission electron microscopy (HR-TEM). Inhomogeneity of the quantum confinement results in a degradation of the quantum efficiency even though the InGaN layer has a uniform In composition.

• Journal of Information Display
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• v.7 no.2
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• pp.6-11
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• 2006

New photopolymers were designed and prepared using the photosensitive polymer binders. Holographic gratings were successfully fabricated in these photopolymer samples by a conventional optical interference method. We also investigated the effect of photocrosslink in the polymer binder on the diffraction behavior of a new photopolymer. The dynamic behavior of the grating formation was monitored by changing exposure intensity in terms of the diffraction efficiency. Particularly, we focused our efforts in observing the variation of diffraction efficiency during a post UV curing process. The surface topographical change of photopolymer layer before and after Vis/UV light exposure was observed by atomic force microscope (AFM). We inscribed the gratings of the glass diffuser on the surface of the photopolymer and investigated their diffusing properties. The diffusers with photopolymer with the main chain polymer binder showed relatively good viewing angle of around ${\pm}30{\circ}$. Two kinds of photopolymer showed similar uniformity of around 47-54%.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.1454-1457
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• 2003

This study was carried out to minimize the lifting force of a two hinge type stand mechanism. This unit is designed for the display devices in order to enhance the ergonomics for effective height adjustment and maintenance at any preferred position. The unit will be very useful for the mechanism fabricated with a coil spring and disc springs as a torque generator. The maximum and the minimum torque value should be calculated initially for the smooth lift. And the reasonable torque distribution is necessary to prevent any AUTO LIFT and AUTO Drooping at any position because the torque generated by coil spring is more sensitive than disc spring in tilting the position. Therefore, the analysis of the coil spring is requisite to issue the specific torque value depending on the distorted angle with securing reliability of a long time storage condition. After the theoretical torque value was calculated, the evaluation was carried out by making a proto-type sample, then distorted angle was updated by experiment. The result of this study can readily be applied to various units for the optimization of the smooth lift.

• Journal of the Semiconductor & Display Technology
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• v.9 no.1
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• pp.29-33
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• 2010

Recently, the growth of ZnO thin film on glass substrate has been investigated extensively for transparent thin film transistor. We have studied the phase transition of ZnO thin films from metal to semiconductor by changing RF power in the deposition process by RF magnetron sputtering system. The structural, electric, and optical properties of the ZnO thin films were investigated. The film deposited with 75 watt of RF power showed n-type semiconductor characteristic having suitable resistivity $-3.56\;{\times}\;10^{+1}\;{\Omega}cm$, carrier concentration $-2.8\;{\times}\;10^{17}\;cm^{-3}$, and mobility $-0.613\;cm^2V^{-1}s^{-1}$ while other films by 25, 50, 100 watt of RF power closed to metallic films. From the surface analysis (AFM), the number of crystal grain of ZnO thin film increased as RF power increased. The transmittance of the film was over 88% in the visible region regardless of the change in RF power.

• Journal of the Semiconductor & Display Technology
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• v.8 no.4
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• pp.49-52
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• 2009

We have investigated the effect of the surface roughness of TCO substrate on the characteristics of OLED (organic light emitting diodes) devices. In order to control the surface roughness of ITO thin films, we have processed photolithography and reactive ion etching. The micro-size patterned mask was used, and the etching depth was controlled by changing etching time. The surface morphology of the ITO thin film was observed by FESEM and atomic force microscopy (AFM). And then, organic materials and cathode electrode were sequentially deposited on the ITO thin films. Device structure was ITO/$\alpha$-NPD/DPVB/Alq3/LiF/Al. The DPVB was used as a blue emitting material. The electrical characteristics such as current density vs. voltage and luminescence vs. voltage of OLED devices were measured by using spectrometer (minolta CS-1000A). The current vs. voltage and luminance vs. voltage characteristics were systematically degraded with increasing surface roughness. Furthermore, the retention test clearly presented that the reliability of OLED devices was directly influenced with the surface roughness, which could be interpreted in terms of the concentration of the electric field on the weak and thin organic layers caused by the poor step coverage.