• 제목/요약/키워드: Ferroelectric film

검색결과 513건 처리시간 0.024초

Random-Oriented (Bi,La)4Ti3O12 Thin Film Deposited by Pulsed-DC Sputtering Method on Ferroelectric Random Access Memory Device

  • Lee, Youn-Ki;Ryu, Sung-Lim;Kweon, Soon-Yong;Yeom, Seung-Jin;Kang, Hee-Bok
    • Transactions on Electrical and Electronic Materials
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    • 제12권6호
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    • pp.258-261
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    • 2011
  • A ferroelectric $(Bi,La)_4Ti_3O_{12}$ (BLT) thin film fabricated by the pulsed-DC sputtering method was evaluated on a cell structure to check its compatibility to high density ferroelectric random access memory (FeRAM) devices. The BLT composition in the sputtering target was $Bi_{4.8}La_{1.0}Ti_{3.0}O_{12}$. Firstly, a BLT film was deposited on a buried Pt/$IrO_x$/Ir bottom electrode stack with W-plug connected to the transistor in a lower place. Then, the film was finally crystallized at $700^{\circ}C$ for 30 seconds in oxygen ambient. The annealed BLT layer was found to have randomly oriented and small ellipsoidal-shaped grains (long direction: ~100 nm, short direction: ~20 nm). The small and uniform-sized grains with random orientations were considered to be suitable for high density FeRAM devices.

비정질실리콘 박막 트랜지스터 (Hydrogenated a-Si TFT Using Ferroelectrics)

  • 허창우
    • 한국정보통신학회논문지
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    • 제9권3호
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    • pp.576-581
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    • 2005
  • 강유전체$(SrTiO_3)$ 박막을 게이트 절연층으로 하여 수소화 된 비정질 실리콘 박막 트랜지스터를 유리 기판 위에 제조하였다. 강유전체는 기존의 $SiO_2,\;SiN$ 등과 같은 게이트 절연체에 비하여 유전특성이 매우 뛰어나 TFT의 ON 전류를 증가시키고 문턱전압을 낮추며 항복특성을 개선하여 준다. PECVD에 의하여 증착된 a-Si:H는 FTIR 측정 결과 $2,000cm^{-1}$$876cm^{-1}$에서 흡수 밴드가 나타났으며, $2,000cm^{-1}$$635cm^{-1}$$SiH_1$의 stretching과 rocking 모드에 기인한 것이며 $876cm^{-1}$의 weak 밴드는 $SiH_2$ vibration 모드에 의한 것이다. a-SiN:H는 optical bandgap이 2.61 eV이고 굴절률은 $1.8\~2.0$, 저항률은 $10^{11}\~10^{15}\Omega-cm$ 정도로 실험 조건에 따라 약간 다르게 나타난다. 강유전체$(SrTiO_3)$ 박막의 유전상수는 $60\~100$ 정도이고 항복전계는 IMV/cm 이상으로 우수한 절연특성을 갖고 있다. 강유전체를 이용한 TFT의 채널 길이는 $8~20{\mu}m$, 채널 넓이는 $80~200{\mu}m$로서 드레인 전류가 게이트 전압 20V에서 $3.4{\mu}A$이고 $I_{on}/I_{off}$ 비는 $10^5\~10^8,\;V_{th}$$4\~5\;volts$이다.

Fabrication of Thin Film Transistor Using Ferroelectrics

  • Hur, Chang-Wu;Kim, Jung-Tae
    • Journal of information and communication convergence engineering
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    • 제2권2호
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    • pp.93-96
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    • 2004
  • The a-Si:H TFT using ferroelectric of $SrTiO_3$ as a gate insulator is fabricated on glass. Dielectric characteristics of ferroelectric are superior to $SiO_2$ and $Si_{3}N_{4}$. Ferroelectric increases on-current, decreases threshold voltage of TFT and also improves breakdown characteristics. The a-SiN:H has optical band gap of 2.61 eV, retractive index of 1.8∼2.0 and resistivity of $10^{13}$~$10^{15}$ $\Omega$cm, respectively. Insulating characteristics of ferroelectrics are excellent because dielectric constant of ferroelectric is about 60∼100 and breakdown strength is over 1MV/cm. TFT using ferroelectric has channel length of 8∼20 $\mu\textrm{m}$ and channel width of 80∼200 $\mu\textrm{m}$. And it shows that drain current is 3.4$\mu\textrm{A}$ at 20 gate voltage, $I_{on}$/$I_{off}$ is a ratio of $10^5$~$10^8$ and $V_{th}$ is 4∼5 volts, respectively. In the case of TFT without ferroelectric, it indicates that the drain current is 1.5 $\mu\textrm{A}$ at 20 gate voltage and $V_{th}$ is 5∼6 volts. With the improvement of the ferroelectric thin film properties, the performance of TFT using this ferroelectric has advanced as a gate insulator fabrication technology is realized.

비휘발성 메모리용 대체 강유전체 박막 (Ferroelectric Thin Film as a substitute for Non-volatile Memory)

  • 김창영;장승우;우동찬;남효덕;이희영
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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    • pp.509-512
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    • 1999
  • Ferroelectric Sr$_2$(Nb, Ta)$_2$O$_{7}$(SNTO), La$_2$Ti$_2$O$_{7}$(LTO) thin films were prepared by sol-gel processes. SNTO, LTO thin films were spin-coated on Pt/TiO$_2$/SiO$_2$/Si(100). Pt/Ti/SiO$_2$/Si(100). PT/ZrO$_2$/SiO$_2$/Si(100) substrates. After multiple coating, dried thin films were heat-treated for decomposition of residual organics and crystallization. Dielectric and other relevant electrical properties were measured and the results showed a little possibility in ferroelectric gate random access memory devices.ces.

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강유전성 $PbTiO_3$ 박막의 형성 및 계면특성 (Preparation and Interface Characteristics of $PbTiO_3$ Ferroelectric Thin Film)

  • 허창우;이문기;김봉열
    • 대한전자공학회논문지
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    • 제26권7호
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    • pp.83-89
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    • 1989
  • 강유전성 $PbTiO_3$ 박막을 rf스터링으로 기판온도 $100{\sim}150^{\circ}C$에서 형성시켰다. 이 박막의 구조는 X선 회절결과 비정질 형태로 파이로클로어 구조를 갖고 있었다. 이 박막을 열에 의해 어닐링한 경우는 $550^{\circ}C$에서, 레이저의 주사로 어닐링한 경우는 레이저 출력이 50watts일때 가장 우수한 결정 구조를 구할 수 있었다. 집합에서의 계면 특성을 구하기 위하여 MFS(metal-ferroelectric-semiconductor)및 MFOS(metal-ferroelectric-oxide-semiconductor) 구조를 형성하여 C-V특성을 조사하였다. 이때 MFS보다 MFOS의 경우가 Si표면에 sputter에 의한 결함이 작음을 알 수 있었다.

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펄스 레이저 증착법으로 층착된 강유전 박막의 수소후열처리에 관한 효과 연구 (Hydrogen annealing effect of ferroelectric films fabricated by pulsed laser deposition)

  • 한경보;전창훈;전희석;이상렬
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 하계학술대회 논문집
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    • pp.395-397
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    • 2002
  • Dielectric thin films of Pb$\_$0.72/La$\_$0.28/Ti$\_$0.93/O$_3$(PLT(28)) have been deposited on Pt(111)/Ti/SiO$_2$/Si(100) substrates in-situ by pulsed laser deposition using different annealing and deposition processes. We have investigated the effect of hydrogen annealing on the ferroelectric properties of PLT thin films and found that the annealing process causes the diffusion of hydrogen into the ferroelectric film resulting in the destruction of polarization. Two-step process to grow PLT films was adopted and verified to be useful to enlarge the grain size of the film. Structural properties including dielectric constant, and ferroelectric characteristics of PLT thin films were shown to be strongly influenced by grain size. The film deposited by using two-step process including pre-annealing treatment has a strong (111) orientation. However, the films deposited by using single-step process with hydrogen annealing process shows the smallest grain size.

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상부전극 두께가 우선방위를 갖는 $Pb(Zr, Ti)O_3$ 박막의 강유전체 특성에 미치는 영향 (Effects of Top Electrode Thickness on Ferroelectric Properties of Preferentially Oriented $Pb(Zr, Ti)O_3$Thin Films)

  • 고가연;이은구;이종국;박진성;김선재
    • 한국세라믹학회지
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    • 제36권10호
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    • pp.1035-1039
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    • 1999
  • Ferroelectric properties and reliability characteristics of(111) and (100) preferentially oriented tetragonal Pb(Zr0.2Ti0.8)O3 (PZT) thin film capacitors have been investigated as a function of the top electrode thickness. The (111) preferentially oriented film exhibits 180$^{\circ}$domain switching process with better squareness of hysterisis loop and abrupt change of small singal capacitance-voltage comparing to the (100) preferentially oriented film having 90$^{\circ}$ domain switching process. The domain swithcing process of tetragonal phase PZT is different from that of rhobohedral phase. The film with thinner top electrode shows less initial switching polarization due to less compressive stress but it exhibits better endurance characteristics due to enhancing partial switching region.

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Highly Efficient, Flexible Thin Film Nanogenerator

  • 이건재
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2011년도 춘계학술발표대회
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    • pp.10.1-10.1
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    • 2011
  • Energy harvesting technologies converting external sources (such as thermal energy, vibration and mechanical energy from the nature sources of wind, waves or animal movements) into electrical energy is recently a highly demanding issue in the materials science community for making sustainable green environments. In particular, fabrication of usable nanogenerator attract the attention of many researchers because it can scavenge even the biomechanical energy inside the human body (such as heart beat, blood flow, muscle stretching, or eye blinking) by converging harvesting technology with implantable bio-devices. Herein, we describe procedure suitable for generating and printing a lead-free microstructured $BaTiO_3$ thin film nanogenerator on plastic substrates to overcome limitations appeared in conventional flexible ferroelectric devices. Flexible $BaTiO_3$ thin film nanogenerator was fabricated and the piezoelectric properties and mechanically stability of ferroelectric devices were characterized. From the results, we demonstrate the highly efficient and stable performance of $BaTiO_3$ thin film nanogenerator and the integration of bio-eco-compatible ferroelectric materials may enable innovative opportunities for artificial skin and energy harvesting system.

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AFM팁/강유전박막/전극 시스템에서의 스위칭 영역의 형성 (Formation of Switching Zones in an AFM Tip/Ferroelectric Thin Film/BE System)

  • 김상주;신준호;김윤재
    • 대한기계학회논문집A
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    • 제27권6호
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    • pp.849-856
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    • 2003
  • A three-dimensional constitutive model for polarization switching in ferroelectric materials is used to predict the formation of switching zones in an atomic force microscopy(AFM) tip/ferroelectric thin film/bottom electrode system via finite element simulation. Initially the ferrolectric film is poled upward and the bottom electrode is grounded. A strong dc field is imposed on a fixed point of the top surface of the film through the AFM tip. A small switching zone with downward polarization is nucleated and grows with time. It is found that initially the shape of the switched zone is that of a bulgy dagger, but later turn to the shape of a reversed cup with the lower part wider than the upper part. It can also be concluded that the size of switching zones increases with the period of applied electric potential. The present results are qualitatively consistent with experimental observations.

FRAM 응용을 위한 건조온도에 따른 BLT 박막의 강유전 특성 (Ferroelectric Properties of Bi3.25La0.75Ti3O12 Thin Films with Various Drying Temperature for FRAM Applications)

  • 김경태;김동표;김창일;김태형;강동희;심일운
    • 한국전기전자재료학회논문지
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    • 제16권4호
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    • pp.265-271
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    • 2003
  • Ferroelectric lanthanum-substituted Bi$_4$Ti$_3$O$_{12}$(BLT) thin films were fabricated by spin-coating onto a Pt/Ti/SiO$_2$/Si substrate by metalorganic decomposition technique. The grain size in BLT thin films were prepared with controlled by various drying process. The effect of grain size on the crystallization and ferroelectric properties were investigated by x-ray diffraction and field emission scanning electron microscope. The dependence of crystallization and electrical properties are related to the grain size in BLT thin films with different drying temperature. The remanent polarization of BLT thin film increases with the increasing grain size. The value of 2P$_{r}$ and E$_{c}$ of BLT thin film dried at 45$0^{\circ}C$ were 25.9 $\mu$C/$\textrm{cm}^2$ and 85 kV/cm, respectively. The BLT thin film with larger grain size has better fatigue properties. The fatigue properties revealed that small grained film showed more degradation of switching charge than large grained films.lms.s.