• 제목/요약/키워드: Epoxy molding compound

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The Characteristics of Viscosity Behavior of EMC for Semi-conductor Encapsulant -The Prediction of Viscosity by Mooney Equation- (반도체 봉지제용 EMC의 점도거동 특성 연구 -Mooney식을 이용한 점도예측-)

  • Kim, In Beom;Bae, Doo Han;Lee, Myung Cheon;Lee, Euy Soo;Yun, Hyo Chang;Lim, Jong Chan
    • Applied Chemistry for Engineering
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    • v.10 no.6
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    • pp.949-953
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    • 1999
  • Because epoxy molding compound(EMC) for semi-conductor encapsulants contains high concentrations of fillers, its flow behaviors are affected much by the concentrations and properties of those fillers. This paper reports the effects of a filler concentration, shape, size, and size distributions on the viscosity behavior of EMC(epoxy/silica). In addition, the prediction of viscosity behavior was performed using the Mooney equation. The maximum packing volume in the Mooney equation was calculated by Ouchiyama's packing model and Taguchi's optimization method, while the shpae factor was determined by fitting the experimental data. The results showed that the Mooney equation predicted the viscosity behavior of EMC very well.

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Analyses of Fracture Surfaces after Pull-out Test: Brown Oxide (Pull-out 시험 후의 표면분석 : 갈색산화물)

  • Lee, H.Y.;Kim, S.R.
    • Journal of the Korean institute of surface engineering
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    • v.34 no.2
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    • pp.142-150
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    • 2001
  • Due to naturally formed copper oxides, the adhesion strength between copper and epoxy resin is often very poor. To improve the adhesion strength between copper and epoxy resin, Cu-based leadframe sheets were oxidized in a brown-oxide forming solution. Then the effect of brown-oxide formation on the adhesion strength of leadframe to epoxy molding compound (EMC) was studied using pull-out specimens. After the pull-out test, fracture surfaces were analyzed using SEM, AES and EDS to determine failure path. The results showed that the failure path lay over inside the CuO and inside the EMC irrespective of the pull strength.

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Cure Properties of Novel Epoxy Resin Systems for WLP (Wafer Level Package) According to the Change of Hardeners (경화제 변화에 따른 WLP(Wafer Level Package)용 신규 Epoxy Resin System의 경화특성)

  • Kim, Whan Gun
    • Journal of the Semiconductor & Display Technology
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    • v.21 no.2
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    • pp.57-67
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    • 2022
  • The curing characteristics of naphthalene type epoxy resin systems according to the change of curing agent were investigated to develop a new next-generation EMC(Epoxy Molding Compound) with excellent warpage characteristics, low thermal expansion, and excellent fluidity for WLP(Wafer Level Package). As epoxy resins, DGEBA, which are representative bisphenol type epoxy resins, NE-16, which are the base resins of naphthalene type epoxy resins, and NET-OH, NET-MA, and NET-Epoxy resins newly synthesized based on NE-16 were used. As a curing agent, DDM (Diamino Diphenyl Methane) and CBN resin with naphthalene moiety were used. The curing reaction characteristics of these epoxy resin systems with curing agents were analyzed through thermal analysis experiments. In terms of curing reaction mechanism, DGEBA and NET-OH resin systems follow the nth curing reaction mechanism, and NE-16, NET-MA and NET-Epoxy resin systems follow the autocatalytic curing reaction mechanism in the case of epoxy resin systems using DDM as curing agent. On the other hand, it was found that all of them showed the nth curing reaction mechanism in the case of epoxy resin systems using CBN as the curing agent. Comparing the curing reaction rate, the epoxy resin systems using CBN as the curing agent showed a faster curing reaction rate than them with DDM as a hardener in the case of DGEBA and NET-OH epoxy resin systems following the same nth curing reaction mechanism, and the epoxy resin systems with a different curing mechanism using CBN as a curing agent showed a faster curing reaction rate than DDM hardener systems except for the NE-16 epoxy resin system. These reasons were comparatively explained using the reaction rate parameters obtained through thermal analysis experiments. Based on these results, low thermal expansion, warpage reduction, and curing reaction rate in the epoxy resin systems can be improved by using CBN curing agent with a naphthalene moiety.

Improving Charge Injection Characteristics and Electrical Performances of Polymer Field-Effect Transistors by Selective Surface Energy Control of Electrode-Contacted Substrate (에폭시 개질 한 다관능 아크릴레이트를 포함하는 충격 저항성이 향상된 불포화폴리에스터 SMC (Sheet Molding Compound) 소재제조 및 그의 물성연구)

  • Jang, Jeong Beom;Kim, Taehee;Kim, Hye Jin;Lee, Wonjoo;Seo, Bongkuk;Kim, Yongsung;Kim, Changyoon;Lim, Choong-Sun
    • Journal of Adhesion and Interface
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    • v.21 no.3
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    • pp.101-106
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    • 2020
  • In this study, epoxy-modified acrylate was synthesized. The synthesized acrylate was added to the composition for sheet molding compound (SMC) in the range of 5 phr to 15 phr. The prepared SMC prepreg was molded at high temperature and pressure to produce a glass fiber reinforced composite. Physical properties such as tensile and impact strength of the composite were measured, respectively. Experimental data show that the composite with 5 phr of synthesized acrylate has 20% improved tensile strength and 12% improved impact strength than that of the reference sample.

Study of clean laser decapsulation process (친환경 레이저 디캡슐레이션에 관한 연구)

  • Hong, Yun-Seok;Mun, Seong-Uk;Nam, Gi-Jung;Choe, Ji-Hun;Yun, Myeon-Geun
    • Proceedings of the Korean Society of Laser Processing Conference
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    • 2006.11a
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    • pp.103-107
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    • 2006
  • Decapsulation of EMC(Epoxy Molding Compound) in package device is a method used to inspect inside of device by removing plastic molding. So far, chemical etching and mechanical grinding methods have been used widely. Recently, several works using laser have been carried out. This method has advantages with fast process time and precision than conventional methods because of noncontact process. Also, laser process is a clean process because of removing EMC directly without using toxic chemicals. The wavelength of laser used in this study is 355nm. Key parameters of removing EMC are laser power, scan speed, and number of scans of laser. It if confirmed that laser decapsulation is a useful process to inspect inside a device with a small thermal damage to chip surface.

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Investigation of Adhesion Mechanism at the Metal-Organic Interface Modified by Plasma Part I

  • Sun, Yong-Bin
    • Journal of the Microelectronics and Packaging Society
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    • v.9 no.4
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    • pp.31-34
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    • 2002
  • For the mold die sticking mechanism, the major explanation is that the silica as a filler in EMC (epoxy molding compound) wears die surface to be roughened, which results in increase of adhesion strength. As the sticking behavior, however, showed strong dependency on the EMC models based on the experimental results from different semiconductor manufacturers, chemisorption or acid-base interaction is apt to be also functioning as major mechanisms. In this investigation, the plasma source ion implantation (PSII) using $O_2, N_2$, and $CF_4$ modifies sample surface to form a new dense layer and improve surface hardness, and change metal surface condition from hydrophilic to hydrophobic or vice versa. Through surface energy quantification by measuring contact angle and surface ion coupling state analysis by Auger, major governing mechanism for sticking issue was figured out to be a complex of mechanical and chemical factors.

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Fracture Behavior of Cu-based leadframe/EMC joints (구리계 리드프레임/EMC 접합체의 파괴거동)

  • Lee, Ho-Young;Yu, Jin
    • Korean Journal of Materials Research
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    • v.10 no.8
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    • pp.551-557
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    • 2000
  • Cu-based leadframe sheets were oxidized ic a hot alkaline solution to black-oxide layer on the surface and molded with epoxy molding compound(EMC), and finally machined to form sandwiched double-cantilever beam(SDCB) and sandwiched Brazil-nut(SBN)specimers to measure the adhesion strength of leadframe-EMC interface. The SDCB and the SBN specimens were designed to measure the adhesion strength in terms fracture toughness under puasi-mode I and mixed mode loadinf, respectively. After the tests, fracture surfaces were analyzed paths were observed in the SDCB-tested speciments, failure paths varied with crack speed and loading conditions.

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The Characteriastics of Viscosity Behavior of EMC for Semi-conductor Encapsulant - Containing One Kind of Spherical Silica (반도체 봉지재용 EMC의 점도거동 특성 - 한 종류의 구형 실리카 포함)

  • Kim, In Beom;Lee, Myung Cheon;Lee, Euy Soo
    • Applied Chemistry for Engineering
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    • v.10 no.8
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    • pp.1175-1179
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    • 1999
  • The rheological properties of highly filled epoxy molding compound(EMC) for semi-conductor encapsulants are greatly affected by the content of filler loaded. In this study, the change of viscosity of EMC for semi-conductor encapsulants with the filler content was investigated. Also, both of Cox-Merz and modified Cox-Merz equations were applied to convert the viscosity change as a function of frequency to that of shear rate. It was ovserved that shear thinning and yield stress occured at high filler contents and that the Cox-Merz equation could not be applied at high filler contents because of the difference of viscosity according to the various strains. When the modified Cox-Merz equation was applied, the all the curves having different strain tend to be represented by one master curve, even though some deviation was obseved at high filler content and strain.

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Effect of High Filler Loading on the Reliability of Epoxy Holding Compound for Microelectronic Packaging (반도체 패키지 봉지재용 에폭시 수지 조성물의 신뢰특성에 미치는 실리카 고충전 영향)

  • 정호용;문경식;최경세
    • Journal of the Microelectronics and Packaging Society
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    • v.6 no.3
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    • pp.51-63
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    • 1999
  • The effects of high filler loading technique on the reliability of epoxy molding compound (EMC) as a microelectronic encapsulant was investigated. The method of high filler loading was established by the improvement of maximum packing fraction using the simplified packing model proposed by Ouchiyama, et al. With the maximum packing fraction of filler, the viscosity of EMC wart lowered and the flowability was improved. As the amount of filler in EMC increased, several properties such as internal stress and moisture absorption were improved. However, the adhesive strength with the alloy 42 leadframe decreased when the filler content was beyond the critical value. It was found that the appropriate content of filler was important to improve the reilability of EMC, and the optimum filler combination should be selected to obtain high reliable EMC filled with high volume fraction of filler.

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Effects of Ceramic Fillers on the Physical Properties of Epoxy Moulding Compounds (세라믹 필러가 epoxy molding compound의 물리적 특성에 미치는 영향)

  • 전형조
    • Journal of the Microelectronics and Packaging Society
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    • v.4 no.2
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    • pp.33-40
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    • 1997
  • 본 연구에서는 에폭시 기지에 충진재료 SiC 분말과 SiC 휘스커 AIN분말을 사용하 여 이들 충진재의 함량 및 형상이 복합재료의 열전도도 열팽창계수 및 유전상수에 미치는 영향을 조사하였다. 복합재료의 열전도도는 세라믹 충진재의부피분율이 증가함에 따라 비선 형적으로 증가하였으며 휘스커 형상의 충진재를 첨가한 복합재료의 열전도도는 구형 분말의 충진재를 사용한 복합재료에 비해 높게 관찰 되었다. 이러한 현상은 충진재로 사용한 휘스 커가 구형 분말 충진재에 비하여 동일 부피분율에서 상호 접촉할수 있는 확률이 높기 때문 인 것으로 추정된다. 열팽창 계수는 충진제의 부피분율이 증가함에 따라 감소 하는 경향을 보였으며 충진재의 형상이 휘스커 형상인 경우가 구형에 비하여 감소되는 정도가 크게 관찰 되었다.