• Transactions of the Korean Society of Mechanical Engineers A
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• v.30 no.12 s.255
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• pp.1557-1563
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• 2006

A scanning electron microscope (SEM) is well known as a measurement and analysis equipment in nano technology, being widely used as a crucial one in measuring objects or analyzing chemical components. It is equipped with an electron optical system that consists of an electron beam source, electromagnetic lenses, and a detector. The present work concerns numerical analysis for the electron optical system so as to facilitate design of each component. Through the numerical analysis, we investigate trajectories of electron beams emitted from a nano-scale field emission tip, and compare the result with that of experimental observations. Effects of various components such as electromagnetic lenses and an aperture are also discussed.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.3
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• pp.163-170
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• 2004

Atomic force microscope (AFM) techniques are increasingly used fur tribological studies of engineering surfaces at scales ranging from atomic and molecular to micro-scale. Recently, AFM with suitable tips is being used for nano fabrication/nano machining purposes. In this paper, machining characteristics of silicon were investigated by nano indentation and nano scratch. Nano-scale material removal mechanisms are studied and the Taguchi method was introduced to acquire optimum parameters for nano machining. Also, Acoustic Emission (AR) is used for the monitoring of nano machining.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2012.10a
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• pp.135-136
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• 2012

• Applied Microscopy
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• v.33 no.2
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• pp.93-104
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• 2003

Since the Ptolemaeos' discovery that glass has magnifying power, human desire to see the unseen with naked eyes has lead to the inventions of a series of microscopes. Since the Janssen's first compound microscope in 1595, through the Abbe's non-aberration microscopy, various microscopes using different principles are now being used in various biomedical researches. The discovery of electron by Thompson in 1897 has lead to the first invention of microscope using electron as an illumination source, the electron microscope, in 1931. Now we can see the objects as close as 0.05 nm using 1 MV FE-TEM constructed in 2000. In this review, the authors reviewed the predecessors efforts to develop better microscopes.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.415.2-415.2
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• 2014

Cost-effective, robust devices for solid-state lighting industry that converts electricity to light revolutionize the current lighting industry. Phosphor materials used in these devices should be synthesized in a low-cost and effective method for use in WLEDs. In this presentation, the synthesis of Eu3+ ions doped BaMoO4 phosphor samples by a facile synthesis process for red component of WLEDs will be shown. The tetragonal phase of the host lattice was substantiated by the X-ray diffraction patterns. The morphological studies were carried out by using a field-emission scanning electron microscope and transmission electron microscope. These confirmed the formation of a shuttle like particles with perpendicular protrusions in the middle of the particle. The photoluminescence (PL) properties exhibited good emission with a high asymmetry ratio when excited with ultraviolet B wavelengths (~ 280-315 nm). The cathodoluminescence (CL) spectra showed similar results to the PL spectra, indicating the rich red emission. The results suggest that this phosphor is a good material as red region component in the development of tri-band UV excitation based WLEDs.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.9
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• pp.1694-1698
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• 2007

This study suggests a new fluorescence microscope to observe micro-samples within fluorophore in a variety of biomedical fields including the fluorescence analysis of a biochip, such as a DNA micro-array. A fluorescence microscope is a device for irradiating light onto a micro-object, executing an excitation and fluorescence emission process. In this study, it adopts a total internal reflection fluorescence(TIRF) method to excite a whole micro-sample substrate different from an existing way which uses an evanescent wave resulting from a total internal reflection on the micro-sample surface. Suggested TIRF microscope can reduce optical noise and obtain images with higher sensitivity thus obtain precise information about the density, quantity, location, etc. of a flurophore, and can simultaneously process separate images even when plurality of fluorophores having different excitation and fluorescent wavelength ranges is distributed, thus easily obtain information about the fluorophores.

• Journal of the Semiconductor & Display Technology
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• v.11 no.1
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• pp.61-65
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• 2012

In this study, for use of carbon nanotubes (CNTs) as a cold cathode of x-ray tubes, we examine the effects of selective growth of CNTs on their field emission properties and long-term stability. The selective growth of CNTs was performed by selectively etching the catalyst layer which was used for CNTs' nucleation. CNTs were grown on conical-type tungsten substrates using an inductively-coupled plasma chemical vapor deposition system. For all the grown CNTs, their morphologies and microstructures were analyzed by field-emission scanning electron microscope and Raman spectroscopy. The electron-emission properties of CNTs and the long-term stability of emission currents were measured and characterized according to the CNTs' growth position on the substrate.

• Journal of Energy Engineering
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• v.25 no.1
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• pp.192-197
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• 2016

We have surveyed on technical method of fault analysis of semiconductor device. Fault analysis of semiconductor should first be found the places of fault spots. For this process they are generally used the testers; EB(emission beam tester), EM(emission microscope), OBIRCH(optical beam induced resistance change method) and LVP(laser voltage probing) etc. Therefore we have described about physical interpretation and technical method in using scanning electron microscope, transmission electron microscope, focused ion beam tester and Nano prober.

• Bulletin of the Korean Chemical Society
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• v.35 no.3
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• pp.891-894
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• 2014

The ultrashort electron pulse, laser-emitted from the metal tip apex has been characterized and used as a probing source for a new electron microscope to visualize the morphology of the gold-mesh in the nanometric resolution. As the gap between the tungsten tip and Au-surface is approached within a few nm, the large electromagnetic field enhancement for the incident P-polarized laser pulse with respect to the tip-sample axis is strongly observed. Here, we demonstrate that the time-resolved tip-enhanced electron emission microscope (TEEM) can be implemented on the laboratory table top to give the two-dimensional image, opening lots of challenges and opportunities in the near future.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.643-643
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• 2013

Recently, synthesis of low-dimensional nanostructures is gaining more importance due to their structural properties and growing potential applications. On the other hand, luminescent materials doped with rare earth ions have drawn immense attention. The commercial phosphors are based on many host materials. Among them, tungstates are being currently investigated by many research groups owing to a wide range of applications. Tungstates are formed by different metal cations (e.g., SrWO4, Na2WO4, NiWO4, Cr2WO6, and ZrW2O8) and their structure depends on the size of the metal cation. Tungstates with large bivalent cations (${\gg}0.1\;nm$) have the scheelite structure and the wolframite structure with smaller ions (＜0.1 nm). Strontium tungstate has the scheelite structure which is tetragonal with space group I41/a. The luminescent properties of the tungstate have been extensively explored in application fields such as sensors, detectors, lasers, photoluminiscent devices, photo catalysts, etc. In this work, we synthesized SrWO4 phosphors with different Eu3+ concentrations by using a facile route. The morphology was analyzed by using a field-emission scanning electron microscope, which exhibits the spherical shape. Transmission electron microscope image revealed the spheres composed of nanoparticles. X-ray diffraction patterns confirmed their tetragonal shape. The photoluminescence excitation and emission spectra were analyzed by varying the Eu3+ concentration, which shows a dominant red emission.