• Title/Summary/Keyword: Electronic Engineering

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Diagnosis of Osmidrosis Axillae Using Electronic Nose (전자코를 이용한 액취증의 진단)

  • Kim, Jeong-Do;Jang, Seong-Jin;Lim, Seung-Ju;Park, Sung-Dae;Kim, Dong-Jin;Kim, Jung-Ju
    • Journal of Sensor Science and Technology
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    • v.22 no.4
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    • pp.276-280
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    • 2013
  • The purpose of this paper is to diagnose osmidrosis visually and quantify the extent of osmidrosis. To achieve this, we designed the diagnosis method of osmidrosis using electronic nose system. The developed electronic nose system use principal component analysis for visualization of osmidrosis and fuzzy c-means algorithm for quantification. To confirm the efficiency of electronic nose system for osmidrosis diagnosis, we obtained samples from 34 volunteers and compared our experiment results with the doctor's diagnosis, and we met with successful results.

Liquid Crystal Alignment Effects on Nitrogen-doped Diamond like Carbon Layer by Ion Beam Alignment Method

  • Han, Jeong-Min;Choi, Sung-Ho;Kim, Byoung-Yong;Han, Jin-Woo;Kim, Jong-Hwan;Kim, Young-Hwan;Hwang, Jeoung-Yeon;Lee, Sang-Keuk;Ok, Chul-Ho;Seo, Dae-Shik
    • Transactions on Electrical and Electronic Materials
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    • v.8 no.1
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    • pp.46-50
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    • 2007
  • We have studied the nematic liquid crystal (NLC) alignment effects on a nitrogen-doped diamond-like carbon (NDLC) thin film layer with ion beam irradiation. The pretilt angle for NLC on the NDLC surface with ion beam exposure was observed below 1 degree. Also, we had the good LC alignment characteristics on the NDLC thin films with ion beam exposure of 1800 eV. In thermal stability experiments, the alignment defect of the NLC on the NDLC surface with ion beam irradiation above annealing temperature of $250^{\circ}C$ can be observed. Therefore, the good thermal stability and LC alignment for NLC by ion beam aligned NDLC thin films can be achieved.

Measurement of the radon and thoron exhalation rates from the water surface of Yixin lake

  • Jiulin Wu;Shuaibin Liu;Tao Hu;Fen Lin;Ruomei Xie;Shuai Yuan;Haibo Yi;Yixiang Mo;Jiale Sun;Linquan Cheng;Huiying Li;Zhipeng Liu;Zhongkai Fan;Yanliang Tan
    • Nuclear Engineering and Technology
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    • v.56 no.4
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    • pp.1538-1543
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    • 2024
  • The importance of determining the radon exhalation rate from water surface is emphasized by the increased use of radon and its daughter products as tracers in large-scale circulation studies of the atmosphere. There were many methods to measure radon exhalation from water surface. With the development of radon exhalation rate measurement methods and instruments on the surface of the soil, the rock and building materials, so the radon exhalation rate from water surface can be more accurately measured by applying these improved methods and instruments. In this paper, a cuboid accumulation chamber surrounded by foam boards and a RAD7 were used to measure the radon exhalation rate on the water surface at three different positions by Yixin lake. Each measurement was performed 2 h. The radon exhalation rate from the water surface was about 6 × 10-3 Bq m-2s-1. The thoron exhalation rate from the water surface also can be estimated, it is about 0.16 Bq m-2s-1. These results hint that the radon transmission from the lake bottom soil to water and then into the atmosphere.

Comparative Analysis of Channel Length Dependence of NBTI and CHC Characteristics in PMOSFETs (PMOSFET의 채널 길이에 따른 NBTI 스트레스와 CHC 스트레스의 신뢰성 특성 비교 분석)

  • Yu, Jae-Nam;Kwon, Sung-Kyu;Shin, Jong-Kwan;Oh, Sun-Ho;Lee, Ho-Ryung;Jang, Sung-Yong;Song, Hyung-Sub;Lee, Ga-Won;Lee, Hi-Deok
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.27 no.7
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    • pp.438-442
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    • 2014
  • Channel length dependence of NBTI (negative bias temperature instablilty) and CHC (channel hot carrier) characteristics in PMOSFET is studied. It has been considered that HC lifetime of PMOSFET is larger than NBTI lifetime. However, it is shown that CHC degradation is greater than NBTI degradation for PMOSFET with short channel length. 1/f noise and charge pumping measurement are used for analysis of these degradations.

Improvement of the Beam-Wave Interaction Efficiency Based on the Coupling-Slot Configuration in an Extended Interaction Oscillator

  • Zhu, Sairong;Yin, Yong;Bi, Liangjie;Chang, Zhiwei;Xu, Che;Zeng, Fanbo;Peng, Ruibin;Zhou, Wen;Wang, Bin;Li, Hailong;Meng, Lin
    • Journal of the Korean Physical Society
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    • v.73 no.9
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    • pp.1362-1369
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    • 2018
  • A method aimed at improving the beam-wave interaction efficiency by changing the coupling slot configuration has been proposed in the study of extended interaction oscillators (EIOs). The dispersion characteristics, coupling coefficient and interaction impedance of the high-frequency structure based on different types of coupling slots have been investigated. Four types of coupled cavity structures with different layouts of the coupling slots have been compared to improve the beam-wave interaction efficiency, so as to analyze the beam-wave interaction and practical applications. In order to determine the improvement of the coupling slot to a coupled cavity circuit in an EIO, we designed four nine-gap EIOs based on the coupled cavity structure with different coupling slot configurations. With different operating frequencies and voltages takes into consideration, beam voltages from 27 to 33 kV have been simulated to achieve the best beam-wave interaction efficiency so that the EIOs are able to work in the $2{\pi}$ mode. The influence of the Rb and the ds on the output power is also taken into consideration. The Rb is the radius of the electron beam, and the ds is the width of the coupling slot. The simulation results indicate that a single-slot-type EIO has the best beam-wave interaction efficiency. Its maximum output power is 2.8 kW and the efficiency is 18% when the operating voltage is 31 kV and electric current is 0.5 A. The output powers of these four EIOs that were designed for comparison are not less than 1.7 kW. The improved coupling-slot configurations enables the extended interaction oscillator to meet the different engineering requirements better.