• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.686-689
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• 2012

In this paper, the GaN-based LED characteristics are analyzed using ISE-TCAD. The LED consists of GaN barriers, active region of InGaN quantum well, AlGaN EBL(Electron Blocking Layer) and AlGaN HBL(Hole Blocking Layer) on GaN buffer layer. The output power characteristics of LED considering Auger recombination rate, thickness of quantum well and number of quantum wells are analyzed and some criteria for the design of LED are proposed.

• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.229.2-229.2
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• 2016

본 연구에서는 Host와 Dopant $Ir(ppy)_3$의 도핑 위치 변화에 따른 bottom emission 인광 OLED를 제작하여 발광 효율 및 특성을 분석하였다. 소자의 EML은 $Ir(ppy)_3/CBP$와 $CBP/Ir(ppy)_3$ 순으로 증착하여 제작하였다. $Ir(ppy)_3/CBP$은 낮은 구동 전압에서 큰 전류밀도와 큰 luminance을 측정하였고, 반대로 $CBP/Ir(ppy)_3$은 높은 구동 전압에서 $CBP/Ir(ppy)_3$은 큰 전류밀도와 큰 luminance가 측정되었다. 이는 $Ir(ppy)_3/CBP$에서 HTL과 EML 사이에 hole direct injection이 발생으로 Hole이 증가하지만 charge balance 불일치로 roll-off가 발생하고, $CBP/Ir(ppy)_3$에서 electron direct injection에 의한 electron 증가로 charge balance가 향상된다. EL spectrum 측정에서 $Ir(ppy)_3$은 파장 512nm 발광이 일어나고, CBP와 NPB은 각각 파장 380nm, 433nm로 분석된다. 각 물질의 triplet의 전달은 energy level이 큰 곳에서 작은 곳으로 전달되는데 이러한 이유로 전압에 따른 recombination zone 변화로 각 물질에서 나오는 파장의 intensity가 달라지는 것을 확인하였다. $Ir(ppy)_3/CBP$은 낮은 전류 밀도에서는 CBP의 영향으로 380nm 파장대가 크고, 높은 전류 밀도에서는 $Ir(ppy)_3$의 영향으로 512nm 파장대가 크게 나오는 것을 확인했고, $CBP/Ir(ppy)_3$에서는 낮은 전류 밀도에서 512nm 파장대가 커지고, 큰 전류 밀도에서는 CBP에서 NPB로의 triplet 에너지 전달의 증가로 433nm 파장대가 커지는 것을 확인하였다.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.32 no.2
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• pp.161-164
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• 2019

This study describes the development of graphene-$TiO_2$ conjugates for the enhancement of the photocatalytic efficiency of $TiO_2$. Graphene-based hybrid nanomaterials have attracted considerable attention because of the unique and advantageous properties of graphene. In the proposed hybrid nanomaterial, graphene serves as an electron acceptor to ensure fast charge transfer. Effective charge separation can, therefore, be achieved to slow down electron-hole recombination. This results in an enhancement of the photocatalytic activity of $TiO_2$. In addition, increased adsorption and interactions with the adsorbed reagents also lead to an improvement in the photocatalytic activity of graphene-$TiO_2$ hybrid nanomaterials. The acquired result is encouraging in that the photocatalytic activity of $TiO_2$ was initiated using visible light (630 nm) instead of the typical UV light.

• Journal of the Korean Graphic Arts Communication Society
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• v.29 no.1
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• pp.23-33
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• 2011

This experimental focus to characterize luminescence properties related to CNT (Carbon Nano Tube) element dispersedly implanted in ZnS-based phosphor thin film panel fabricated by a screen printing method. More specifically FE-SEM measurements, L-V(Luminescence vs. Voltage) and photo luminescence were carried out to determine an optimum value of CNT concentration and film thickness for the thin film structure of CNT-ZnS:(Cu, Al) by the screen printing method. We confirmed that an optimum value of CNT concentration in the ZnS:(Cu, Al) film panel is about 0.75 wt% resulting that the electric conductivity is 1.6 times higher than that of pure CNT sample and showing that the luminescence intensity is increasing until the optimum concentration. Clearly, CNT is presenting in the luminescence process providing a pathway for the creation of hot electron and a channel for the electron-hole recombination but overly inserted CNT may hinder to produce the hot electron for making an avalanching process. In case of the overly doped CNT 1.0 wt% in the ZnS-based phosphor, the luminescence intensity is decreasing although the electric conductivity is exponentially increasing. Based on these results, we realized that hot electron occurred by the external electric field or exciton arose by the external photon source are reduced dramatically over the critical value of CNT concentration because CNT element provide various isolated residues in the composites of ZnS based phosphor rather than pathway or channel for the D-A(Donnor to Acceptor) pair transition or the radiative recombination of electron-hole.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.308-311
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• 2000

The organic electroluminescene (EL) device has gathered much interested because of its potential in materials and simple device fabrication. We fabricated EL device which have a mixed single emitting layer containing N,N'-diphenyl-N,N'-(3-methylphenyl)-1,1'-biphenyl-4,4'-diamine [TPD] and poly(3-hexylthiophene) [P3HT]. The molar ratio between P3HT and TPD chaged with 1:1, 3:1, 5:1, 3:2 and 5:2. EL intensity of ITO/P3HT+TPD/Mg:In devices is enhanced by addition of TPD into P3HT. This can be explained that the energy transfer occurs from TPD to P3HT. Recombination probability increases in emitting layer because that TPD as hole transport material plays a role more injection hole and Mg:In (3.7eV) electrode has low work function make easily electron injection. ITO/P3HT+TPD(5:2)/Mg:In devices emit orange-red light at 28V.

• Journal of radiological science and technology
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• v.28 no.4
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• pp.267-272
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• 2005

The effects of As addition in amorphous selenium (a-Se) films for digital X-ray conversion material have been studied using the moving photocarrier grating (MPG) technique. This method utilizes the moving interference pattern generated by the superposition of the two frequency shifted laser beams for the illumination of the sample. This moving intensity grating induces a short circuit current, jsc in a-Se:As film. The transport parameters of the sample are extracted from the grating-velocity dependent short circuit current induced in the sample along the modulation direction. The electron and hole mobility, and recombination lifetime of a-Se films with arsenic (As) additions have been obtained. We have found an increase in hole drift mobility and recombination lifetime, especially when 0.3% As is added into a-Se film, whereas electron mobility decreases with As addition due to the defect density. The transport properties for As doped a-Se films obtained by using MPG technique have been compared with X-ray sensitivity for a-Se:As device. The fabricated a-Se(0.3% As) device film exhibited the highest X-ray sensitivity out of 5 samples.

• Journal of the Korea Safety Management & Science
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• v.15 no.3
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• pp.127-132
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• 2013

This study shows an air-purification test by the UV lamp on which TiO2 catalyst is deposited with glass fiber in the reactor chamber. This test was based on the fundamental data of air-purifier as assessing a removing ability on various contaminants such as CH3COOH, NH3, NO and SO2 as variation of the TiO2 coating, the wave of UV lamp, and the additive CaO. As a result, the highest decomposing removal ratio was shown when 5-times coated glass fiber was used. It can be due to the recombination reaction of electrons and electron-hole in the loaded CaO. Thus, the decomposing removal ratio increased as the recombination ratio decreased. In addition, it was confirmed that the decomposing removal ratio lowered when CaO was considerably deposited because it hided the lamp of OH-1 radical.

• Current Photovoltaic Research
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• v.6 no.1
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• pp.17-20
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• 2018

The dependency of the photovoltaic performance of p-/n-type silicon solar-cells on the metallic contaminant type (Fe, Cu, and Ni) and concentration was investigated. The minority-carrier recombination lifetime was degraded with increasing metallic contaminant concentration, however, the degradation sensitivity of recombination lifetime was lower at n-type than p-type silicon wafer, which means n-type silicon wafer have an immunity to the effect of metallic contamination. This is because heavy metal ions with positive charge have a much larger capture cross section of electron than hole, so that reaction with electrons occurs much more easily. The power conversion efficiency of n-type solar-cells was degraded by 9.73% when metallic impurities were introduced in the silicon bulk, which is lower degradation compared to p-type solar-cells (15.61% of efficiency degradation). Therefore, n-type silicon solar-cells have a potential to achieve high efficiency of the solar-cell in the future with a merit of immunity against metal contamination.

• Bulletin of the Korean Chemical Society
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• v.35 no.8
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• pp.2512-2518
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• 2014

The praseodymium-doped $TiO_2$ photocatalyst samples, which could degrade methyl orange under UV irradiation, were prepared by sol-microwave method for improving the photocatalytic activity of $TiO_2$. The resulting materials were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), Transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), Raman spectra, Fourier transform infrared spectra (FTIR) and Ultraviolet-visible diffuse reflectance spectra (UV-vis DRS). It was found Pr doping retarded the growth of crystalline size and the phase transformation from anatase to rutile, and narrowed the band gap energy. Praseodymium doping brought about remarkable improvement in the photoactivity. The optimal dopant amount of Pr was 2% by molar of cement and the calcination temperature was $500^{\circ}C$ for the best photocatalytic activity. The improvement of photocatalytic activity was ascribed to the occurrence of lattice distortion and the effective containment of the recombination of the electron-hole by $Pr^{3+}$.

• Bulletin of the Korean Chemical Society
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• v.35 no.2
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• pp.353-356
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• 2014

We fabricated organic photovoltaic (OPV) based on ZnO ripple structure on indium tin oxide as electron-collecting layers and PTB7-F20 as donor polymer. In addition, atomic layer deposition (ALD) was used for preparing additional ZnO layers on rippled ZnO. Addition of 2 nm-thick ALD-ZnO resulted in enhanced initial OPV performance and stability. Based on photoluminescence results, we suggest that ALD-ZnO layers reduced number of surface defect sites on ZnO, which can act as electron-hole recombination center of OPV, and increased resistance of ZnO towards surface defect formation.