• 제목/요약/키워드: Electron emission

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탄소나노튜브 밀도의 변화에 따른 전자방출 안정성 연구 (Electron emission stability from CNTs with various densities)

  • 임성훈;윤현식;유제황;문종현;박규창;장진;문병연
    • 한국진공학회지
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    • 제14권4호
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    • pp.258-262
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    • 2005
  • 본 연구는 실리콘 질화막 박막을 덮개층으로 사용하여 탄소나노튜브를 성장하고, 성장된 나노튜브의 전자방출특성을 조사하였다. 탄소 나노튜브는 triode PE-CVD 장치에 의해 성장되었으며, 탄소나노튜브의 밀도는 실리콘 질화막의 두께에 따라 크게 변하였다. 탄소 나노튜브의 밀도가 $10^{4}$/$cm^{2}$에서 전자방출 특성이 가장 우수하였으며, 이때 전자방출특성은 문턱전계 1.2 V/$\mu$m, 전류밀도는 3.6 V/$\mu$n의 전기장에서 0.17 mA/$cm^{2}$으로 측정 되었다. 또한, 진공 챔버에서 질소($N_{2}$) 분위기 하에서 전자방출 안정성을 조사하였으며, 탄소나노튜브의 밀도가 감소함에 따라 전자방출 안정성이 향상되었고, 탄소나노튜브의 밀도가 $10^{4}$/$cm^{2}$ 인 경우 $1\times10^{-4}$ A/$cm^{2}$ 이상의 전류가 흐르는 특성을 보였으며, 이 경우 $1\times$$10^{-5}$ Torr의 압력하에서 방출 전류의 안정도는 최소인 $2\%$를 유지하였다.

Measurement of Ion-induced Secondary Electron Emission Yield of MgO Films by Pulsed Ion Beam Method

  • Lee, Sang-Kook;Kim, Jae-Hong;Lee, Ji-Hwa;Whang, Ki-Woong
    • Journal of Information Display
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    • 제3권1호
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    • pp.17-21
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    • 2002
  • Measurement of the ion-induced secondary electron emission coefficient (${\gamma}_i$) for insulating films is hampered by an unavoidable charging problem. Here, we demonstrate that a pulsed ion beam technique is a viable solution to the problem, allowing for accurate measurement of ${\gamma}_i$ for insulating materials. To test the feasibility of the pulsed ion beam method, the secondary electron emission coefficient from n-Si(100) is measured and compared with the result from the conventional continuous beam method. It is found that the ${\gamma}_i$ from n-Si(100) by the ion pulsed beam measured to be 0.34, which is the same as that obtained by continuous ion beam. However, for the 1000 A $SiO_2$ films thermally deposited on Si substrate, the measurement of ${\gamma}_i$ could be carred out by the pulsed ion method, even though the continuous beam method faced charging problem. Thus, the pulsed ion beam is regarded to be one of the most suitable methods for measuring secondary electron coefficient for the surface of insulator materials without experiencing charging problem. In this report, the dependence of ${\gamma}_i$ on the kinetic energy of $He^+$ is presented for 1000 ${\AA}$ $SiO_2$ films. And the secondary electron emission coefficient of 1000 ${\AA}$ MgO e-beam-evaporated on $SiO_2/Si$ is obtained using the pulsing method for $He^+$ and $Ar^+$ with energy ranging from 50 to 200 eV, and then compared with those from the conventional continuous method.

전도성 고분자 나노튜브와 나노와이어: 합성 및 특성, 트랜지스터와 전계방출 나노 팁에서의 응용 (Conducting Polymer Nanotube and Nanowire: Synthesis, Characteristics, and Applications to Transistor and Field Emission Nano-tip)

  • Joo J.;Kim B.H.;Park K.T.;Kim M.S.;Lee S.Y.;Jeong C.J.;Lee J.K.;Park D.H.;Kim K.G.;Jin J.I.;Yu S.G.;Lee S.H.;Yi W.K.
    • 한국전기화학회:학술대회논문집
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    • 한국전기화학회 2002년도 추계총회 및 학술발표회
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    • pp.26-26
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    • 2002
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Dependence of electron and photon emission during abrasion by surface condition of magnesium oxide crystal

  • Hwang, Do-Jin;Kim, Jong-Min;Park, Eun-Hee;Kim, Myoung-Won
    • Journal of Korean Vacuum Science & Technology
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    • 제5권1호
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    • pp.1-6
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    • 2001
  • We measured the simultaneous, time-resolved spectra of photon emission, electron emission, and frictional force during the abrasion single crystal MgO with a diamond stylus in vacuum. phE and EE signal can be detected with millisecond resolution during the wear of a single crystal MgO substrate with a diamond stylus. The emissions and wear behavior are strong function of surface condition, load and stylus velocity. Measurement on annealed vs as-received material show that the luminescence is primarily due to deformation, and the electron emission is primarily due to fracture. These emissions provide insight into the processes responsible for catastrophic failure of ceramics in wear applications.

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In-situ TEM of Carbon Nanotube Field Emitters and Improvement of Electron Emission from Nanotube Films by Laser Treatment

  • Saito, Yahachi;Seko, Kazuyuki;Kinoshita, Jun-ichi;Ishida, Toshiyuki;Yotani, Junko;Kurachi, Hiroyuki;Uemura, Sashiro
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.II
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    • pp.1081-1086
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    • 2005
  • Dynamic behavior of carbon nanotubes (CNTs) in an electric field is directly observed by in-situ transmission electron microscopy (TEM). The CNT field emitters examined by in-situ TEM are multiwalled, double-walled and single walled CNTs. Threshold fields for electron emission and sustainable emission currents depending on the structure of CNTs are presented, and degradation mechanism of the CNT field emitters is discussed. In addition to the microscopy studies on individual CNTs, our recent development in surface treatment of CNT layers grown by chemical vapor deposition, which brings about high density of emission current and high uniformity, is also presented.

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Pressure Measurement Using Field Electron Emission Phenomena

  • Cho, Boklae
    • Applied Science and Convergence Technology
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    • 제23권2호
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    • pp.83-89
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    • 2014
  • Adsorption of residual gas molecules damped the emission current of a W (310) field electron emission (FE) emitter. The damping speed was linearly proportional to the pressure gauge readings at pressure ranging from ${\sim}10^{-8}Pa$ to ${\sim}10^{-9}Pa$, and the proportionality constant was employed to measure pressure in the $10^{-10}Pa$ range. A time plot of FE current revealed the existence of an "initial stable region" after the flash heating of W(310) FE, during which the FE current damps very slowly. The presence of non-hydrogen gas removed this region from the plot, supplying a means of qualitatively analysing the gas species.

Field Emission Enhancement by Electric Field Activation in Screen-printed Carbon Nanotube Film

  • Lee, Hyeon-Jae;Lee, Yang-Doo;Cho, Woo-Sung;Kim, Jai-Kyeong;Hwang, Sung-Woo;Ju, Byeong-Kwon
    • Journal of Information Display
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    • 제6권4호
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    • pp.45-48
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    • 2005
  • By applying a critical field treatment instead of the conventional surface treatments such as soft rubber roller, ion beam irradiation, adhesive taping, and laser irradiation, electron emission properties of screen-printed carbon nanotubes (CNTs) were enhanced and investigated based on the emission current-voltage characteristics through scanning electron microscopy. After nanotube emitters were activated at the applied electric-field of 2.5 V/um, the electron emission current density with good uniform emission sites reached the value of 2.13 mA/$cm^2$ , which is 400 times higher than that of the untreated sample, and the turn-on voltage decreased markedly from 700 to 460 V. In addition, enhancement of the alignment of CNTs to the vertical direction was observed.

Enhanced Field Electron Emission from Dielectric Coated Highly Emissive Carbon Fibers

  • Almarsi, Ayman M.;Hagmann, Mark J.;Mousa, Marwan S.
    • Applied Microscopy
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    • 제47권1호
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    • pp.55-62
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    • 2017
  • This paper describes experiments aimed at characterizing the behavior of field electron emitters fabricated by coating carbon fibers with epoxylite resin. Polyacrylonitrile carbon fibers of type VPR-19, thermally treated at $2,800^{\circ}C$, were used. Each was initially prepared in a "uncoated" state, by standard electro polishing and cleaning techniques, and was then examined in a scanning electron microscope. The fiber was then baked overnight in a field electron microscope (FEM) vacuum chamber. Current-voltage characteristics and FEM images were recorded on the following day or later. The fiber was then removed from the FEM, coated with resin, "cured" by baking, and replaced in the FEM. After another overnight bake, the FEM characterization measurements were repeated. The coated fibers had significantly better performance than uncoated fibers. This confirms the results of earlier experiments, and is thought to be due in part to the formation of a conducting channel in the resin over layer. For the coated fiber, lower voltages were needed to obtain the same emission current. The coated fibers have current-voltage characteristics that show smoother trends, with greater stability and repeatability. No switch-on phenomena were observed. In addition, the emission images on the phosphor-coated FEM screen were more concentrated, and hence brighter.

Relationship of the Distribution Thickness of Dielectric Layer on the Nano-Tip Apex and Distribution of Emitted Electrons

  • Al-Qudah, Ala'a M.;Mousa, Marwan S.
    • Applied Microscopy
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    • 제46권3호
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    • pp.155-159
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    • 2016
  • This paper analyses the relationship between the distribution of a dielectric layer on the apex of a metal field electron emitter and the distribution of electron emission. Emitters were prepared by coating a tungsten emitter with a layer of epoxylite resin. A high-resolution scanning electron microscope was used to monitor the emitter profile and measure the coating thickness. Field electron microscope studies of the emission current distribution from these composite emitters (Tungsten-Clark Electromedical Instruments Epoxylite resin [Tungsten/CEI-resin emitter]) have been carried out. Two forms of image have been observed: bright single-spot images, thought to be associated with a smooth substrate and a uniform dielectric layer; and multi-spot images, though to be associated with irregularity in the substrate or the dielectric layer.

Electron Field Emission for a Cylindrical Emitter of Single Carbon Nanotube

  • Lee, Youn-Ju;Kim, Chang-Duk;Lee, Hyeong-Rag
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권1호
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    • pp.764-767
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    • 2007
  • We investigated the field emission of single carbon nanotube including the anode effect by calculating the tunneling probability of an electron. The experimental results from this study were in agreement with our theoretical calculations. The constant enhancement factor was calculated using an approximation of the potential barrier.

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