Measurement of Ion-induced Secondary Electron Emission Yield of MgO Films by Pulsed Ion Beam Method |
Lee, Sang-Kook
(Division of Electrical Engineering. Seoul National University)
Kim, Jae-Hong (Division of Chemical Engineering, Seoul National University) Lee, Ji-Hwa (Division of Chemical Engineering, Seoul National University) Whang, Ki-Woong (Division of Electrical Engineering. Seoul National University) |
1 | L. F. Weber, in Flat-Panel Displays and CRTs, edited by L. E. Tannas, Jr. (Van Nostrand Remhold, New York, 1985), Chap. 10 |
2 | T. Nakamura, K. Iseki, Y. Sano, and K. Nunomura, SID'95 Digest, 807 (1995) |
3 | K. S. Moon, J. Lee, and K. W. Whang, J. Appl. Phys., 86, 4049 (1999) DOI |
4 | M. O. Aboelfotoh and J. A. Lorenzen, J. Appl. Phys., 48, 4754 (1977) DOI ScienceOn |
5 | T. Urade, T. lemori, M. Osawa and N. Nakayama, IEEE Trans. Electron Devices 23, 313 (1976) DOI ScienceOn |