• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.2
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• pp.22-27
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• 2009

In this paper, an automatic functional inspection system EVT (Emulated Vision Tester) for LCD drive module PCB has been proposed and implemented. Typical automatic inspection system such as probing methods and vision-based systems are widely known and used, however, there exist undetectable defects due to critical timing factors which they may miss to catch from LCD equipments. Especially typical vision-based systems have inconsistency on acquisition of images so that distinction between gray scales can be difficult which results in low level of performance and reliability on the inspection results. The proposed EVT system is pure hardware solution. It directly compares pattern signals from a pattern generator to output signals from LCD drive module. It also inspects variety of analog signals such as voltage, resistance, wave forms and so forth. The EVT system not only shows high performance in terms of reliability and processing speed but reduces costs on inspection and maintenance. Also, full automation of entire production line can be realized when EVT is applied in in-line inspection processes.

• Journal of the Korean Society of Safety
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• v.33 no.3
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• pp.27-32
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• 2018

Nowadays, to prevent electrical accidents in Korea, inspectors directly performed checking general electrical facilities as a cycle from every one to three years. It is difficult to presuppose an omen because intact conditions of electrical equipments are not kept at the time of inspection. In this paper, in order to ensure effectiveness of an online basis electric inspection, we developed an electrical safety IoT system using LoRa communication technology to enable monitoring mainly electrical safety components such as overcurrent, overvoltage, resistive leakage current, and power. Then we proposed a method for verifying performances of the prosed electrical safety IoT system. Resistive leakage currents are calculated by using difference of phase between voltages and currents. We verified that average errors are 0.97%, which reference goal is ${\pm}5%$ for a device, through reliability test according to conditions. Results of this research can be used as basic study materials to develop technologies for measuring three phase leakage current and for implementing public electrical safety. platform.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.8 s.350
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• pp.1-5
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• 2006

At-wavelength inspection system of extreme Ultra-violet lithography was developed and the inspection results were compared with the optical mask inspection system by cross correlation experiments. In at-wavelength EUV mask inspection system, a raster scan of focused euv light is used to illuminate euv light to mask blank and specularly and non-specularly reflected euv light are detected by photo diode and microchannel plate. The cross correlation results between at-wavelength inspection tool and optical inspection tool shows strong correlation. Far-field scattering fringe pattern from programmed phase and opqque defect, which were detected by phosphor plate and CCD camera shows that distinct diffraction fringes were observed with fringe spacing dependent on the defect size.

• Journal of the Korean Institute of Intelligent Systems
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• v.22 no.6
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• pp.694-699
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• 2012

In this paper, semiconductor package inspection results using white light interferometer with large F.O.V., in order to apply semiconductor product inspection process, are shown. Experimental 3D data repeatability test results for the same special bumps of each substrate are shown. Experimental 3D data repeatability test results for all the bumps in each substrate are also shown. Semiconductor package inspection using white light interferometer with large F.O.V. is very important for the fast 3D data inspection in semiconductor product inspection process. This paper is surely helpful for the development of in-line type fast 3D data inspection machine.

• Proceedings of the KIEE Conference
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• 2005.07e
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• pp.112-114
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• 2005

It is obvious that electrical safety cannot be secured soley by the efforts from public sector including government. With the global trend of deregulation as WTO/TBT agreement comes into effect, foreign countries strive to minimize unnecessary and inefficient regulations in every field by sharing responsibilities with the privae sector to secure international competency in trade. To this same end, in this paper 2 level approach plan is suggested to pave the way to the self-security system in electrical field by introducing self-reliance safety system by stage for pre-service inspection on the electrical installations for private use based on product requirements in terms of performance.

• Journal of Practical Engineering Education
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• v.6 no.1
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• pp.37-42
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• 2014

The automated visual inspection system (machine vision system) for quality assurance is important factory automation equipment in the manufacturing industries, such as display, semiconductor, etc. There is a lot of demand for the machine vision engineers. However, there are no technical training courses for machine vision technologies in vocational schools, colleges and universities. In this paper, we present the implementation of line scan camera based equipment for technical training of the automated visual inspection system. The training system consists of the X-Y stage which is widely used in machine vision industries and its variable image resolution are set to $10-30{\mu}m$. Additionally, this training system can attach the industrial illumination, either the direct illuminator or coaxial illuminator, for verifying the effect of illuminations. This means that the trainee can have a practical training in various equipment conditions and the training system is similar to the automated visual inspection system in industries.

• 제어로봇시스템학회:학술대회논문집
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• 1996.10a
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• pp.350-353
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• 1996

In this paper, based on the performance analysis of serial production lines with quality inspection machines, we develope an buffer size optimization method to maximize the production rate. The total sum of buffer sizes are given and a constant, and under this constraint, using the linear approximation method, we suggest a closed form solution for the optimization problem with an acceptable error. Also, we show that the upstream and downstream buffers of the worst performance machine have a significant effect on the production rate. Finally, the suggested methods are validated by simulations.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2005.05a
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• pp.437-442
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• 2005

In this paper, we proposed the 2-dimensional inspection algorithm for micro-BGA(Ball Grid Array) device using a vision system. The proposed method uses the subpixel algorithm for high precision. The proposed algorithm preferentially extracts the package area of device in the input image. After the extraction of package area, each ball areas are extracted by ball search window method. The parameters for inspection are calculated for the extracted ball area. In the simulation results, we have the average error within $17{\mu}m$.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.66 no.4
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• pp.709-714
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• 2017

The curved panel is widely used for display of TVs and smart phones. This paper proposes a new auto-focusing method for curved panel inspection system. Since the distance between the camera and the panel varies with the curve position, the camera should change its focus at every inspection time. In order to reduce the focusing time, we propose an effective focusing method that considers the mathematical model of panel curve. The Lagrange polynomial equation is applied to modeling the panel curve. The foci of initial three points are used to get the curve equation, and the other foci are calculated automatically from the curve equation. The experiment result shows that the proposed method can reduce the focusing time.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.64 no.5
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• pp.838-844
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• 2015

Latest development of ICT makes building, including houses, factories and public facilities, more intelligent and automatized. It follows that a wide variety of electric and ICT installations are adopted along with micro electronic equipments. Corresponding to such changes, the frequency of lightning increases due to the abnormal climate. The major damage by lightning surge is disconnection and malfunction of facilities. It is necessary, therefore, to make a regulation of inspection and maintenance for lightning protection facilities. This paper deals with main issues of a regulation draft of inspection and maintenance for lightning protection facilities based on IEC 62305