• Title/Summary/Keyword: Electric leakage

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A Study on Auxiliary Control Safety Apparatus for RCD Trip on Electric Arc and Spark Disasters - Using by Power Semiconductor Switching Device - (아크 및 스파크 재해에 대한 누전차단기 트립을 위한 보조제어 전기안전장치에 관한 연구 - 전력용 반도체 스위칭 소자 적용 및 응용 -)

  • Kwak, Dong-Kurl;Shin, Mi-Young;Jung, Do-Young
    • Fire Science and Engineering
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    • v.20 no.1 s.61
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    • pp.71-76
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    • 2006
  • The major causes of electrical fire are classified to short circuit fault, overload fault, electric leakage and electric contact failure. The occurrence factor of the fire is electric arc or spark accompanied with electrical faults. Residual Current Protective Device(RCD) of high sensitivity type used at low voltage wiring cuts off earth leakage and overload, but the RCD can't cut off electric arc or spark to be a major factor of electrical fire. As the RCDs which are applied low voltage distribution panel are prescribed to rated breaking time about 30[ms](KS C 4613), the RCDs can't perceive to the periodic electric arc or spark of more short wavelength level. To be improved on such problem, this paper is proposed to a auxiliary control apparatus for RCD trip on electric arc or spark due to electrical fire. Some experimental results of the proposed apparatus is confirmed to the validity of the analytical results.

Development of electric safety control system for incapable operation of ELB and MCB using the low voltage distribution line (저압 배전선로의 누전 및 배선용 차단기의 오동작 방지를 위한 전기안전 제어장치 개발)

  • Kwak, Dong-Kurl;Shin, Mi-Young;Jung, Do-Young;Kim, Hyo-Jin;Baek, Seong-Hyun;Choi, Byung-Seub
    • Proceedings of the KIEE Conference
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    • 2007.07a
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    • pp.371-372
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    • 2007
  • The major causes of electrical fire are classified to short circuit fault, overload fault, electric leakage and electric contact failure. The occurrence factor of the fire is electric arc or spark accompanied with electrical faults. Residual Current Protective Device (RCD), that is Earth Leakage Circuit Breaker(ELB) and Molded_case Circuit Breaker (MCB), of high sensitivity type used at low voltage wiring cuts off earth leakage and overload, but the RCD can't cut off electric arc or spark to be a major factor of electrical fire. As the RCDs which are applied low voltage distribution panel are prescribed to rated breaking time about 30[ms] (KS C 4613), the RCDs can't perceive to the periodic electric arc or spark of more short wavelength level. To be improved on such problem, this research development is proposed to a auxiliary control apparatus for RCD trip on electric arc or spark due to electrical fire. Some experimental results of the proposed apparatus is confirmed to the validity of the analytical results.

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The Method for detecting leakage current of a electric vehicle (전기 구동 차량의 누설 전류 검출 기법)

  • Park, Hyunseok;Eom, Jeongyong
    • 한국신재생에너지학회:학술대회논문집
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    • 2011.11a
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    • pp.139.1-139.1
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    • 2011
  • Electric vehicle use independent electricity of high voltage. if isolation of electricity is destructed, devices and people are considerably damaged. Therefore, detection of ground fault is necessary for electric vehicle. As the existing detection method of ground fault can not detect ground fault when isolation of both positive side and negative side of electricity is destructed, and change of voltage of electricity. This paper proposed detection method for ground fault of both two sides of electricity and change of voltage. The proposed method is verified by analysis of equivalent circuit.

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Design of Linear Transverse Flux Machine for Stelzer Machine using Equivalent Magnet Circuit and FEM

  • Jeong, Sung-In
    • Journal of Electrical Engineering and Technology
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    • v.13 no.4
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    • pp.1596-1603
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    • 2018
  • This paper presents the new design and validation process of the linear transverse flux machine of the stelzer machine for hybrid vehicle application. A linear transverse flux machine is a novel electric machine that has higher force density and power than conventional electric machine. The process concentrates on 2-dimensional and 3-dimensional analysis using equivalent magnetic circuit method considering leakage elements and it is verified by finite element analysis. Besides the force characteristics of all axis of each direction are analyzed. The study is considered by dividing the transverse flux electric excited type and the transverse flux permanent magnet excited type. Additionally three-dimensional analysis in this machine is accomplished due to asymmetric structure with another three axes. Finally, it suggests the new design and validation process of linear transverse flux machine for stelzer machine.

A Study on Protection Device for Electrical Fire Prevention on Joint/Contact Badness Faults (접속·접촉불량 사고에 의한 전기화재 방지용 보호장치에 관한 연구)

  • Choi, Jung-Kyu;Kwak, Dong-Kurl;Lee, Seung-Chul;Lee, Bong-Seob;Park, Young-Jic
    • Proceedings of the KIPE Conference
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    • 2014.07a
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    • pp.5-6
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    • 2014
  • According to 2013 fire statistical yearbook in the National Emergency Management Agency, the main cause of an electrical fire are classified to short circuit fault, overload fault, electric leakage, partial disconnection, and joint/contact badness. The occurrence factor of fire is electric arc or spark accompanied with electrical faults. Residual Current Protective Devices(RCDs) of high sensitivity type used at single phase (220V) cut off earth leakage and overload but the RCDs can not cut off electric arc or spark to be a main cause of electrical fire. To be improved on such problem, this thesis is proposed to a auxiliary control device for RCD cut off electric arc or spark.

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Introduction of Data Analysis Method for Ageing Diagnosis of Polymer Insulator (복합 고분자 애자의 열화 진단 데이터 분석 기법)

  • Choi, Nam-Ho;Lee, Byoung-Sung;Cho, Sung-Soo;Han, Sang-Ok
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1611-1613
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    • 1999
  • This paper introduces the data processing method and the measurement of the leakage current flowing through polymer insulators. For ageing diagnosis of polymer insulator, data aquisition system was developed to record the leakage current of insulator being tested. Hence, we have gained information for life time from its leakage current. the DAS is protected against over-voltage which would develop in the event of a flashover of the test sample.

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A Dual Gate AlGaN/GaN High Electron Mobility Transistor with High Breakdown Voltages (높은 항복 전압 특성을 가지는 이중 게이트 AlGaN/GaN 고 전자 이동도 트랜지스터)

  • Ha Min-Woo;Lee Seung-Chul;Her Jin-Cherl;Seo Kwang-Seok;Han Min-Koo
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.54 no.1
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    • pp.18-22
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    • 2005
  • We have proposed and fabricated a dual gate AlGaN/GaN high electron mobility transistor (HEMT), which exhibits the low leakage current and the high breakdown voltage for the high voltage switching applications. The additional gate between the main gate and the drain is specially designed in order to decrease the electric field concentration at the drain-side of the main gate. The leakage current of the proposed HEMT is decreased considerably and the breakdown voltage increases without sacrificing any other electric characteristics such as the transconductance and the drain current. The experimental results show that the breakdown voltage and the leakage current of proposed HEMT are 362 V and 75 nA while those of the conventional HEMT are 196 V and 428 nA, respectively.

Mo-tip Field Emitter Array having Modified Gate Insulator Geometry (변형된 게이트 절연막 구조를 갖는 몰리브덴 팁 전계 방출 소자)

  • Ju, Byeong-Kwon;Kim, Hoon;Lee, Nam-Yang
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.49 no.1
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    • pp.59-63
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    • 2000
  • For the Mo-tip field emitter array, the method by which the geometrical structure of the gate insulator wall could be modified in order to improve field emission properties(turn-on voltage and gate leakage current). The device having a gate insulator of complex shape, which means the combined geometrical structure with round shape made by wet etching and vertical shape made by dry etching processes, was fabricated and the field emission properties of the three kinds of devices were compared. As a result, the electric field applied to tip apex could be increased and gate leakage current could be decreased by employing the gate insulator having geometrical wall structure of mixed shape. Finally, the obtained empirical results were analyzed by simulation of electric field distribution at/near the tip apex and gate insulator using SNU-FEAT simulator.

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Properties of Poly-Si TFT's using Oxide-Nitride-Oxide Films as Gate Insulators (Oxide-Nitride-Oxide막을 게이트 절연막으로 사용하여 제조한 다결정실리콘 박막트랜지스티의 특성)

  • 이인찬;마대영
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.16 no.12
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    • pp.1065-1070
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    • 2003
  • HTO(High Temperature Oxide) films are mainly used as a gate insulator for polysilicon thin film transistors(Poly-Si TFT's). The HTO films, however, show the demerits of a high leakage current and a low electric breakdown voltage comparing with conventional thermal oxides even though they have a better surface in roughness than the thermal oxides. In this paper, we propose an ONO(Oxide-Nitride-Oxide) multilayer as the gate insulator for poly-Si TFT's. The leakage current and electric breakdown voltage of the ONO and HTO were measured. The drain current variation of poly-Si TFT's with a variety of gate insulators was observed. The thickness optimization in ONO films was carried out by studying I$\_$on/I$\_$off/ ratio of the poly-Si TFT's as a function of the thickness of ONO film adopted as gate insulator.

Development of mA Level Active Leakage Current Detecting Module (mA급 유효성분 누설전류 감지 모듈 개발)

  • Han, Young-Oh
    • The Journal of the Korea institute of electronic communication sciences
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    • v.12 no.1
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    • pp.109-114
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    • 2017
  • In this study, we have developed the active leakage current detection module based on a MSP430 processor, 16bit signal processor. This module can be operated in a desired trip threshold within 0.03 seconds as specified in KS C 4613. This developed module is expected to be applicable as a module for prevention of electric shock in smart distribution panel of smart grid.