• Title/Summary/Keyword: Edge Diffraction

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MICROSTRUCTURAL STUDY OF $Fe_{1-x}Ti_x$ ALLOYS FORMED BY ION BEAM MIXING

  • Jeon, Y.;Lee, Y.S.;Choi, B.S.;Woo, J.J.;Whang, C.N.
    • Journal of the Korean Vacuum Society
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    • v.6 no.S1
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    • pp.127-132
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    • 1997
  • Microstructure of the Fe-Ti system by ion beam mixing of multilayers at 300 K and 77 K has been studied in a wide composition range. The ion bombardment was carried out using $Ar^+$ ions at 80 keV. Using grazing angle x-ray diffraction we find that the lattice parameters of these bcc solid solutions are very close to that of $\alpha$-Fe. Extended x-ray absorption fine-structure spectroscopy have been performed to investgate the short-range order in the ion-beam-mixed state. The structure parameters, such as the interatomic distance and the coordination number are estmated from the Fe K-edge Fourier filtered EXAFS spectra. The interatomic distance is independent of the alloy concentration and it is almost constant. The study of x-ray absorption near-edge structure gives information on the individual $\rho$components of the partial densityof states of the conduction band of the Fe and Ti We also find that a charge transfer from Ti to Fe atoms takes place.

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Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

  • Chae, Sejung R.;Moon, Juhyuk;Yoon, Seyoon;Bae, Sungchul;Levitz, Pierre;Winarski, Robert;Monteiro, Paulo J.M.
    • International Journal of Concrete Structures and Materials
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    • v.7 no.2
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    • pp.95-110
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    • 2013
  • We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed-a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction.

Estimation of Phase Ratio for TiO2 Powders by XRD and XAS (XRD와 XAS에 의한 TiO2 분말의 상분율 결정)

  • Rha, Sa-Kyun;Lee, Youn Seoung
    • Journal of the Korean Ceramic Society
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    • v.49 no.5
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    • pp.469-474
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    • 2012
  • The crystallinity and phase ratio of anatase to rutile in $TiO_2$ were estimated by x-ray diffraction (XRD) and x-ray absorption spectroscopy (XAS). Traditionally, the structural characterization of $TiO_2$ powders has been carried out by XRD techniques, which are comparatively easy in use and analysis. However, materials with amorphous phase, nano-sized or nano-structured crystallinities cannot be fully characterized by XRD because XRD analysis has a limit for abnormal contributions of the nano-crystal such as the surface contribution. From the comparison with the experimental and calculated Ti K-edge XAS spectra, we found the possibility of efficient estimation in the crystalinites and the phase ratio of anatase to rutile for nano-sized $TiO_2$ mixture.

AQuaKET Overview - A Nano-Accuracy Testing Method for Very Large Optics (AQuaKET 개괄 - 초대구경 나노정밀도 광학측정법)

  • 김영수
    • Proceedings of the Optical Society of Korea Conference
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    • 2002.07a
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    • pp.24-25
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    • 2002
  • 밀레니움을 전후하여 세계적으로 8m급 초대형 망원경들이 만들어지고 있다. ESO (European Southern Observatory)의 VLT (Very Large Telescopes) 4기, 미국 영국 카나다 등의 연합 Gemini telescope 2기, 일본의 Subaru 1기 등, 10여기의 망원경들이 완성되었고, 차세대 망원경들이 50m급으로 디자인되고 있다. 우주망원경도 지름 2.4m인 허블 우주망원경(Nubble Space Telescope)의 뒤를 이어 6m급의 차세대 우주망원경 (Next Generation Space Telescope)이 개발되고 있어서 2010년경에 발사될 예정이다. (중략)

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Acoustic Signal Analysis for Exploration of Buried Objects in the Ocean (해저매몰체 탐사를 위한 음향신호의 분석)

  • Kim, Jin-Hoo;Han, Kun-Mo;Park, Jong-Nam
    • Journal of Ocean Engineering and Technology
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    • v.9 no.2
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    • pp.167-174
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    • 1995
  • The anomlous signal, anomaly, recorded by a sub-bottem profiler is analized for exploration of buried objects in the ocean, This anomaly is known as a signal diffracted from the edge of the buried object. Signals obtained from model that and numerical simulation are analized for investigating characteristics of the diffracted signal. From this study a diffracted signal and a non-diffracted signal can be identified, and the location of the object can be obtained. In order to identify an object in the seafloor the dimension of the object should be greater than the wave length used for exploration, and the acoustic impedance should be much greater than that of sediments. A 2-trace stacking of the signals can enhance the feature of strongly diffracted signals whereas it can diminish weak signals.

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Development of Noise Barrier Analysis Program (방음벽해석 프로그램의 개발)

  • Kim, Hyun-Sil;Kim, Jae-Seung;Kang, Hyun-Ju;Kim, Bong-Ki;Kim, Sang-Ryul
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2007.11a
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    • pp.960-963
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    • 2007
  • In this paper, development of the noise barrier analysis program is described. The upper part of barriers may have complicated shapes like "Y", "T", inverted L, and other shapes. The insertion loss of the barrier is predicted by summation of multiple diffractions occurring at top edge points. In addition, the program considers diffractions occurring at both vertical sides, while reflections from ground due to mirror images are also included. In case of two barriers at both sides of the road, reflections from the other side of barriers are considered, in which magnitudes are decreased by the ratio of absorption coefficient.

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Preparation and Characterization of Ultra Thin TaN Films Prepared by RF Magnetron Sputtering

  • Reddy, Akepati Sivasankar;Jo, Hyeon-Cheol;Lee, Gi-Seon
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2011.10a
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    • pp.32.1-32.1
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    • 2011
  • Ultra thin tantalum nitride (TaNx) films with various thicknesses (10 nm to 40 nm) have been deposited by rf magnetron sputtering technique on glass substrates. The as deposited films were systematically characterized by several analytical techniques such as X-ray diffraction, X-ray photoelectron spectroscopy, field emission scanning electron microscopy, atomic force microscopy, UV-Vis-NIR double beam spectrophotometer and four point probe method. From the XRD results, the as deposited films are in amorphous nature, irrespective of the film thicknesses. The films composition was changed greatly with increasing the film thickness. SEM micrographs exhibited the densely pack microstructure, and homogeneous surface covered by small size grains at lower thickness deposited films. The surface roughness of the films was linearly increases with increasing the films thickness, consequently the transmittance decreased. The absorption edge was shifted towards higher wavelength as the film thickness increases.

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Insertion Loss by Noise Barrier on the Discontinuous Ground (불연속 지면위의 방음벽에 의한 삽입손실에 관한 연구)

  • Kim, Ye-Hyun;Kim, Dong-Ill;Jang, Ho-Kyeong
    • The Journal of the Acoustical Society of Korea
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    • v.14 no.3
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    • pp.114-121
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    • 1995
  • Outdoor experimental study is presented the insertion loss caused by barrier considering discontinuous ground condition. Measurements ware made in 1/3 octave band over the frequency range 315 Hz~3150 Hz with the various geometry of the source, receiver and barriers. The frequency range of the interference pattern depends on the phase difference between path from the edge of barrier to receiver, and hence on the acoustical properties of the ground on the receiver side of the barrier. The insertion loss by barrier, in addition to diffraction, is shown to be dependent on the ground characteristic.

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H-Polarized Scattering by an Inversely Tapered Resistive Half Plane (반비례적으로 변하는 저항율을 갖는 반평면에 의한 H 분극산란)

  • Yang, Seung-In;Ra, Jung-Woong
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.26 no.7
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    • pp.1-7
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    • 1989
  • For H-polarized incident plane wave, an exact integral expression for the scattered field by an inversely tapered resistive half plane is obtained by using Kontorovich-Lebedev transform. Uniform asymptotic results available for all angles are obtained, and non-uniform asymptotic results which provide the ray-optical interpretation of the calculated scattered field are also obtained. The edge diffraction patterns for several values of inverse proportionality of resistivity are shown. We find out that the results are in agreement with physical reasoning.

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A study on the properties of amorphous (Se,S)-system thin films for reversible hologram device development (가역적 Hologram 소자개발을 위한 비정질 (Se,S)계 박막 특성에 관한 연구)

  • 김상덕;이재규;김종빈
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.12
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    • pp.71-79
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    • 1994
  • In this paper, $As_{40}Se_{50-x}S_[x}Ge_{10}$(x=0, 25, 35, at.%) bulk and thin films, to develope device of reversible hologram, proved amorphous by X-RD analysis. On the thin films with composition rate, as Se-doped-quantity increased, absorption edge shifted to long wavelength, and we found that reversible photodarkening effect occurred when thin films are exposed and annealed. Optical energy gap was larger when thin films are annealed than exposed. In this effect thin films structurally stabilized by annealing. It is to formed grating hologram by the bragg method on the $As_{40}Se_{15}S_[35}Ge_{10}$ thisn films with the best transmittance properties As polariging angle grew larger, we found that maximum diffraction efficiency became smaller, and obtained it of 4.5% on the thin fim thicknesss of 0.6 m, polarizing angle of 40$^[\circ}$ and exposing for 20sec.

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