• 조명전기설비학회논문지
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• 제25권11호
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• pp.98-102
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• 2011

This paper describes inverse E class frequency multiplier which is lower inductance and peak switching voltage than E class frequency multiplier. The frequency multiplier is designed to generate 5.8[GHz] frequency by doubling the input frequency 2.9[GHz]. The peak switching voltage of designed inverse E class frequency multiplier with 11[V] is lower 4[V] than that of E class frequency multiplier with 15[V]. The inverse E class frequency multiplier has a conversion gain 6[dB] at output power 21[dBm] and maximum 35[%] power efficiency.

• 한국수산과학회지
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• 제5권4호
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• pp.115-120
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• 1972

The data Presented in this Paper, on the body and Jumping voltage of Penaeus japonicus BATE, are part of a current study on shrimp behaviour in order to improve fishing efficiency of the fishing gear. The experiments concerning electrical stimuli was mostly carried out at the Marine Laboratory of Busan Fisheries College in 1972. The following are the results obtained from the present investigations : 1. When the voltages between a pair of electrodes were fixed constant, the voltage drops between them showed almost constant electrical field. 2. Threshold voltages of the animals varied with body direction to the electrical field, i. e., 200 -500 mV for parallel, 500-1400 mV for vertical and 300-800 mV for diagonal ($45^{\circ}$) settings. 3. Jumping voltages of the animals also varied with the body direction to the electrical field; i. e., 250-1000 mV for parallel, 800-2500 mV for vertical and 400-1300 mV for diagonal settings. 4. The shrimp, in general, were more sensitive to the electrical stimuli when oriented to the cathode rather than the anode. 5. Jumping voltages decreased when the interrupted current was applied to the animals, i. e., less than 200 mV for paralled and 500mV for vertical direction of the body to the electrical field.

• 한국진공학회지
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• 제6권2호
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• pp.136-142
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• 1997

An/n-GaAs(100) Schottky 장벽 diode를 제작하여 변조전압($V_{ac}$) 및 dc 바이어스 전 압($V_{bias}$) 변화에 따른 electroreflectance(ER)를 측정하였다. 관측된 Franz-Keldysh oscillation(FKO) 피크로부터 이 시료의 내부 전기장($E_i$)은 $5.76\times 10^{4}$V/cm였다. $V_{ac}$를 변화시 킴에 따라 ER신호의 모양은 변화가 없고, 진폭만 선형적으로 증가하였다. 순방향 및 역방향 의 $V_{bias}$변화에 따라 ER신호의 진폭은 감소하였으며, $V_{bias}$가 -5.0~0.6V로 증가함에 따라 Ei 는 $19.3\times 10^4\sim4.39\times10^4$V/cm로 감소하였다. 그리고 $V_{bias}$변화에 대한 $E_i^2$의 그래프로부터 built-in 전압(Vbi)은 0.70V였으며, 이 값은 $V_{bias}$변화에 따른 FKO피크의 진폭 관계 그래프 에서 얻은 결과와 잘 일치하였다. 또한 이 시료의 캐리어 농도(N)와 전위장벽($\Phi$)은 300K에 서 각각 $2.4\times 10^{16}\textrm{cm}^{-3}$와 0.78eV의 값을 얻었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 하계학술대회 논문집
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• pp.533-538
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• 2001

The ZnSe sample grown by chemical bath deposition (CBD) method were annealed in Ar gas at 450$^{\circ}C$ Using extrapolation method of X-ray diffraction pattern, it was found to have zinc blend structure whose lattice parameter a$\_$o/ was 5.6687 ${\AA}$. From Hall effect, the mobility was likely to be decreased by impurity scattering at temperature range from 10 K to 150 K and by lattice scattering at temperature range from 150 K to 29 3K. The band gap given by the transmission edge changed from 2.7005 eV at 293 K to 2.8739 eV at 10 K. Comparing photocurrent peak position with transmission edge, we could find that photocurrent peaks due to excition electrons from valence band, $\Gamma$$\_$8/ and $\Gamma$$\_$7/ to conduction band $\Gamma$$\_$6/ were observed at photocurrent spectrum. From the photocurrent spectra by illumination of polarized light on the ZnSe thin film, we have found that values of spin orbit coupling splitting Δso is 0.0981 eV. From the PL spectra at 10 K, the peaks corresponding to free bound excitons and D-A pair and a broad emission band due to SA is identified. The binding energy of the free excitons are determined to be 0.0612 eV and the dissipation energy of the donor -bound exciton and acceptor-bound exciton to be 0.0172 eV, 0.0310 eV, respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 하계학술대회 논문집
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• pp.273-280
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• 2002

The stochiometric mix of evaporating materials for the CuGaTe$_2$ single crystal thin films was prepared from horizontal furnance. For extrapolation method of X-ray diffraction patterns for the CuGaTe$_2$ polycrystal, it was found tetragonal structure whose lattice constant a$\_$0/ and c$\_$0/ were 6.025 ${\AA}$ and 11.931 ${\AA}$, respectively. To obtain the single crystal thin films, CuGaTe$_2$ mixed crystal was deposited on throughly etched semi-insulator GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were 670 $^{\circ}C$ and 410 $^{\circ}C$ respective1y, and the thickness of the single crystal thin films is 2.1 $\mu\textrm{m}$. The crystalline structure of single crystalthin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). Hall effect on this sample was measured by the method of van der Pauw and studied on carrier density and mobility dependence on temperature. The carrier density and mobility of CuGaTe$_2$ single crystal thin films deduced from Hall data are 8.72${\times}$10$\^$23/㎥, 3.42${\times}$10$\^$-2/㎡/V$.$s at 293K, respectively. From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the CuGaTe$_2$ single crystal thin film, we have found that the values of spin orbit coupling Δs.o and the crystal field splitting Δcr were 0.0791 eV and 0/2463eV at 10K, respectively. From the PL spectra at 10K, the peaks corresponding to free bound excitons and D-A pair and a broad emission band due to SA is identified. The binding energy of the free excitons are determined to be 0.0470eV and the dissipation energy of the donor -bound exciton and acceptor-bound exciton to be 0.0490eV, 0.00558eV, respectively.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2002년도 하계학술대회 논문집
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• pp.281-287
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• 2002

The stochiometric composition of AgGaS$_2$ polycrystal source materials for the AgGaS$_2$/GaAs epilayer was prepared from horizontal furnace. From the extrapolation method of X-ray diffraction patterns it was found that the polycrystal AgGaS$_2$ has tetragonal structure of which lattice constant a$\sub$0/ and c$\sub$0/ were 5.756 ${\AA}$ and 10.305 ${\AA}$, respectively. AgGaS$_2$/GaAs epilayer was deposited on throughly etched GaAs(100) substrate from mixed crystal AgGaS$_2$ by the Hot Wall Epitaxy (100) system. The source and substrate temperature were 590$^{\circ}C$ and 440$^{\circ}C$ respectively. The crystallinity of the grown AgGaS$_2$/GaAs epilayer was investigated by the DCRC (double crystal X-ray diffraction rocking curve). The optical energy gaps were found to be 2.61 eV for AgGaS$_2$/GaAs epilayer at room temperature. The temperature dependence of the photocurrent peak energy is well explained by the Varshni equation, then the constants in the Varshni equation are given by ${\alpha}$ : 8.695${\times}$10$\^$-4/ eV/K, and ${\beta}$ = 332 K. From the photocurrent spectra by illumination of polarized light of the AgGaS$_2$/GaAs epilayer, we have found that crystal field splitting ΔCr was 0.28 eV at 20 K. From the PL spectra at 20 K, the peaks corresponding to free and bound excitons and a broad emission band due to D-A pain are identified. The binding energy of the free excitons are determined to be 0.2676 eV and 0.2430 eV and the dissociation energy of the bound excitons to be 0.4695 eV.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 춘계학술대회 논문집 반도체 재료 센서 박막재료 전자세라믹스
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• pp.56-59
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• 2004

The stochiometric composition of $AgGaS_2$ polycrystal source materials for the $AgGaS_2/GaAs$ epilayer was prepared from horizontal furnace. From the extrapolation method of X-ray diffraction patterns it was found that the polycrystal $AgGaS_2$ has tetragonal structure of which lattice constant $a_0$ and $c_0$ were 5.756 ${\AA}$ and 10.305 ${\AA}$, respectively. $AgGaS_2/GaAs$ epilayer was deposited on throughly etched GaAs (100) substrate from mixed crystal $AgGaS_2$ by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were $590^{\circ}C$ and $440^{\circ}C$ respectively. The crystallinity of the grown $AgGaS_2/GaAs$ epilayer was investigated by the DCRC (double crystal X-ray diffraction rocking curve). The optical energy gaps were found to be 2.61 eV for $AgGaS_2/GaAs$ epilayer at room temperature. The temperature dependence of the photocurrent peak energy is well explained by the Varshni equation, then the constants in the Varshni equation are given by ${\alpha}=8.695{\times}10^{-4}eV/K$, and $\beta$=332 K. From the photocurrent spectra by illumination of polarized light of the $AgGaS_2/GaAs$ epilayer, we have found that crystal field splitting $\Delta$ Cr was 0.28 eV at 20 K. From the PL spectra at 20 K, the peaks corresponding to free and bound excitons and a broad emission band due to D-A pairs are identified. The binding energy of the free excitons are determined to be 0.2676 eV and 0.2430 eV and the dissociation energy of the bound excitons to be 0.4695 eV.

• 한국정보전자통신기술학회논문지
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• 제13권4호
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• pp.293-297
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• 2020

본 논문은 multiplex deposition sputter system을 이용하여 ITO 유리에 CdS 박막을 증착하여 태양전지에 적용될 수 있는 가장 좋은 조건을 찾고자 하였다. RF power를 50W, 100W, 150W로 변화주었고 스퍼터링시간은 10분으로 하였다. 투과율을 측정한 결과, 400~800 nm 영역에서 평균 투과율은 60%에서 80% 까지 측정되었으며 150W일 때 84%로 가장 좋은 특성이 측정되었다. 또한 밴드갭은 50W일 때 3.762eV, 100W일 때 4.037eV, 150W일 때 4.052eV로 측정되었다. XRD 분석에서는 RF power가 증가하여도 CdS의 구조인 Wurtzite(hexagonal)로 관찰되었다. 그리고 RF power가 증가할수록 입자가 크고 균일하게 증착 되었나, 100W 일 때 입자들이 조밀하게 구성되었고 밀도가 크다는 것을 알 수 있었다. 그리고 두께 측정 결과 RF power 가 증가할수록 균일성 있게 증가되었다.

• 한국의학물리학회지:의학물리
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• 제12권1호
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• pp.1-8
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• 2001

다이아몬드는 radiation hardness가 크고, 화학적으로 안정하고, 특히 조직 등 물질이기 때문에, 선량계 분야에서 각광을 받고 있다. 화학증착법(CVD)에 의해 다이아몬드 박막을 성장시켰고, 선량계로 응용될 수 있는 열자극발광 특성을 조사하였다. 다이아몬드 박막의 라만 스펙트럼은 1332 cm-1에서 peak를 가졌고, X-선 굴절 패턴은 (111) 면을 보였다. 전자주사사진으로부터 다이아몬드박막은 pyramidal hillock을 가지는 unepitaxial crystallite 로 성장됨을 알았다. X-선 조사된 CVD 다이어몬드 박막의 파장 분해된 열자극발광은 430 nm 및 560 K에서 하나의 봉우리를 가졌다. 560 K에서 주된 봉우리를 가지는 CVD 다이어몬드 박막의 열자극발광 곡선은 1st-order kinetics에 기인한다. 이 봉우리의 활성화 에너지 및 이탈진동수는 각각 0.92 ～ 1.05 eV 및 1.34 $\times$ $10^{7}$ sec$^{-1}$ 이다. 560 K에서 방출되는 스펙트럼은 1.63-eV, 2.60-eV 및 3.07-eV 방출 띠로 분해되며, 이들은 각각 silicon-vacancy center, A center 및 H3 center에 기인한다.

• 한국결정성장학회지
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• 제11권1호
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• pp.6-13
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• 2001

수직 Bridgman 방법으로 $Mg_xZn_{1-x}Te(0{\le}X{\le}0.48)$ 단결정을 성장하였다. 성장된 단결정의 결정구조는 X = 0~ 0.48 범위내에서는 zincblende 이었고, 성분이 증가함에 따라 격자 상수 값이 6.103$\AA$(X = 0.0)으로부터 6.239$\AA$(X = 0.48)까지 a(X)=6.103 + (0.33)X 를 만족하며 선형적으로 증가하였으며, 외사법에 의해 얻어진 zincblende MgTe의 격자상수는 6.433$\pm$0.002$\AA$로 주어졌다. 광전류 스펙트럼 측정 결과 $Mg_xZn_{1-x}Te$(X=0) 단결정의 에너지 띠 간격은 4.2K와 294K에서 각각 2.380 eV와 2.260eV 이었다. X 값에 따른 광전류 스펙트럼은 성분이 증가함에 따라 피크가 단파장 쪽으로 이동하였으며, X 값에 따른 에너지 띠 간격의 변화는 $E_g$(X)=b+(0.8)X를 만족하는 선형적인 변화를 보였다. 외사법으로부터 구한 zincblende MgTe의 에너지 띠 간격은 4.2K와 297K에서 각각 3.18ev와 3.06eV로 주어졌다. 또한 광전류 peak는 온도가 상승함에 따라 장파장 쪽으로 이동하였으며, 100K 이상의 온도에서 온도계수 $dE_g$/dT=-(5.6~$6.1){\times}10^{-4}$eV/K 이었다.