• Title/Summary/Keyword: Dynamic display

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Data Supply Voltage Reduction Scheme for Low-Power AMOLED Displays

  • Nam, Hyoungsik;Jeong, Hoon
    • ETRI Journal
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    • v.34 no.5
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    • pp.727-733
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    • 2012
  • This paper demonstrates a new driving scheme that allows reducing the supply voltage of data drivers for low-power active matrix organic light-emitting diode (AMOLED) displays. The proposed technique drives down the data voltage range by 50%, which subsequently diminishes in the peak power consumption of data drivers at the full white pattern by 75%. Because the gate voltage of a driving thin film transistor covers the same range as a conventional driving scheme by means of a level-shifting scheme, the low-data supply scheme achieves the equivalent dynamic range of OLED currents. The average power consumption of data drivers is reduced by 60% over 24 test images, and power consumption is kept below 25%.

A Study of Nanostructure by Carbon Nanotube Simulation (탄소 나노튜브를 활용한 나노 구조물에 대한 시뮬레이션 연구)

  • Lee Jun Ha;Lee Hoong Joo;Song Young Jin;Yoon Young Sik
    • Journal of the Semiconductor & Display Technology
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    • v.4 no.3 s.12
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    • pp.11-15
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    • 2005
  • This paper shows that carbon nanotubes can be applied to a nanopipette. Nano space in atomic force microscope multi wall carbon nanotube tips is filled with molecules and atoms with charges and then, the tips can be applied to nanopipette when the encapsulated media flow off under applying electrostatic farces. Since the nano space inside the tips can be refilled, the tips can be permanently used in ideal conditions of no chemical reaction and no mechanical deformation. Molecular dynamics simulations for nanopipette applications demonstrated the possibility of nano-lithography or single-metallofullerene-transistor array fabrication.

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A Study on the Dynamic Design of Anti-Vibration Structures for Nano-class Measuring System (나노 측정시스템을 위한 방진 구조물의 동적 설계에 관한 연구)

  • 전종균;김강부;백재호
    • Journal of the Semiconductor & Display Technology
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    • v.2 no.3
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    • pp.37-43
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    • 2003
  • It is necessary to design the anti-vibration system of precision machinery for a quality assurance. However, in general, the allowable vibration limit is not well known. In this paper, the vibration criteria for foundation of sensitive machinery is proposed and anti-vibration system is designed by using vibration measurement results of foundation. Also, the finite element analysis is performed to verify the effectiveness of the designed anti-vibration system and to determine the allowable dynamic loads of precision measuring system. The results of this study will be helpful for the future design of anti-vibration structures with nano scale measuring system.

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Fabrication of the Outer type-Dynamic Microlens Array using Surface-Stabilized Ferroelectric Liquid Crystal

  • Kim, Young-Wook;Gwag, Jin-Seog;Kim, Kyung-Bae;Kang, Tae-Ho;Kim, Jae-Hoon
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.344-347
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    • 2008
  • We fabricated the outer type-dynamic microlens array using a surface-stabilized ferroelectric liquid crystal, UV curable polymer and the stacked liquid crystalline polymer. The outer type-microlens array has a lower driving voltage and fast switching property. It is applicable to a variety of optical systems.

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Electrical Analysis of Bottom Gate TFT with Novel Process Architecture

  • Pak, Sang-Hoon;Jeong, Tae-Hoon;Kim, Si-Joon;Kim, Kyung-Ho;Kim, Hyun-Jae
    • Journal of Information Display
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    • v.9 no.2
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    • pp.5-8
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    • 2008
  • Bottom gate thin film transistors (TFTs) with microcrystalline and amorphous Si (a-Si) double active layers (DAL) were fabricated. Since the process of DAL TFTs can use that of conventional a-Si TFTs, these DAL TFT process has advantages, such as low cost, large substrate, and mass production capacity. In order to analyze the degradation characteristics in saturation region for driving TFTs of active matrix organic light emitting diode, three different dynamic stresses were applied to DAL TFTs and a-Si TFTs. The threshold voltage shift of DAL TFTs and a-Si TFTs during 10,000 second stress is 0.3V and 2V, respectively. DAL TFTs were more reliable than a-Si TFTs.

A Novel Driving Algorithm for Reducing Dynamic False Contour in PDPs

  • Yoon, Seok-Jeong;Choi, Sang-Yoon;Lee, Seung-Yong;Choi, Byong-Deok;Kwon, Oh-Kyong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1269-1272
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    • 2005
  • We propose a simple and efficient driving algorithm to reduce Dynamic False Contour(DFC) in Plasma Display Panels(PDPs) by using both accumulation and combination of light emission periods. Although the accumulative way of light emission in sustain period is regarded as more effective than combinational way to reduce DFC, it takes much addressing time to express high gray-scale. Therefore, we combine accumulative and combinational light emission methods to reduce DFC. In the proposed method, one TV field (16.7ms) is composed of four combinational subfields for expressing small gray scales and fifteen accumulative subfields for large gray scales. In addition, we use some Graphic Signal Processing(GSP) algorithm to get more natural images by reducing DFC.

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Simulation of Domain Growth in Antiferroelctric Liquid Crystal Display

  • Jhun, Chul-Gyu;Ann, Sun-Mo;Moon, Sung-O;Lee, Gi-Dong;Yoon, Tae-Hoon;Kim, Jae-Chang
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.581-584
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    • 2003
  • Most modeling about dynamic behavior of Antiferroelectric Liquid Crystal (AFLC) is limited to the hysteric characteristics of AFLC cells or thresholdless switching of frustrated AFLC cells. In this paper, domain growth of AFLC cells is modeled with extended bilayer model. When driving pulses that consist of a selection voltage, a bias voltage, and a reset voltage are applied to the AFLC cell, its dynamic behavior is simulated.

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Error Compensation of Laser Interferometer for Measuring Displacement Using the Kalman Filter

  • Park, Tong-Jin;Lee, Yong-Woo;Wang, Young-Yong;Han, Chang-Soo;Lee, Nak-Ku;Lee, Hyung-Wok;Choi, Tae-Hoon;Na, Kyung-Whan
    • Journal of the Semiconductor & Display Technology
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    • v.3 no.2
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    • pp.41-46
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    • 2004
  • This paper proposes a robust discrete time Kalman filter (RDKF) for the dynamic compensation of nonlinearity in a homodyne laser interferometer for high-precision displacement measurement and in real-time. The interferometer system is modeled to reduce the calculation of the estimator. A regulator is applied to improve the robustness of the system. An estimator based on dynamic modeling and a zero regulator of the system was designed by the authors of this study. For real measurement, the experimental results show that the proposed interferometer system can be applied to high precision displacement measurement in real-time.

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Molecular Dynamics Simulations Study on Surface Polishing by Spherical Abrasive (구형 연마재에 의한 표면 연마에 관한 분자동역학 시뮬레이션 연구)

  • Park, Byung-Heung;Kang, Jeong-Won
    • Journal of the Semiconductor & Display Technology
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    • v.10 no.4
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    • pp.47-51
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    • 2011
  • We investigated the substrate surface polishing by the spherical rigid abrasive under the compression using classical molecular dynamics modeling. We performed three-dimensional molecular dynamic simulations using the Morse potential functions for the various slide-to-roll ratios, from 0 to 1, and then, the compressive forces acting on the spherical rigid abrasive were calculated as functions of the time and the slide-to-roll ratio. The friction coefficients obtained from the classical molecular dynamics simulations were compared to those obtained from the experiments; and found that the molecular dynamic simulation results with the slide-to-roll ratio of 0 value were in good agreement with the experimental results.

An Analysis on the Material Removal Mechanism of Chemical-Mechanical Polishing Process Part II: Dynamic Simulation (화학-기계적 연마 공정의 물질제거 메커니즘 해석 Part II: 동적 시뮬레이션)

  • Seok, Jong-Won;Oh, Seung-Hee
    • Journal of the Semiconductor & Display Technology
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    • v.6 no.3
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    • pp.1-6
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    • 2007
  • The integrated thermal-chemical-mechanical (TCM) material removal model presented in the companion paper is dynamically simulated in this work. The model is applied to a Cu CMP process for the simulation and the results of the three individual ingredients composing the model are presented separately first. These results are then incorporated to calculate the total material removal rate (MRR) of the Cu CMP. It is shown that the non-linear trend of MRR with respect to the applied mechanical power (i.e., non-Prestonian behavior), which is not well explained with the models established in principle on conventional contact mechanics, may be due to the chemical reaction(s) varying non-linearly with the temperature in the wafer.

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