• Journal of IKEEE
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• v.27 no.3
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• pp.258-264
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• 2023

This paper proposes an LDO regulator with a built-in ESD (Electro Static Discharge) protection circuit to effectively operate and prevent destruction of the LDO (Low Drop Out) regulator according to the load current. The proposed LDO regulator can more effectively adjust the gate node voltage of the pass transistor according to the output voltage of the LDO regulator by using an additional feedback current circuit structure. In addition, it is expected to have high reliability for the ESD situation by embedding a new structure that increases the holding voltage by about 2V by reducing the current gain on the SCR loop by adding a P+ bridge to the existing ESD protection device.

• The Transactions of the Korean Institute of Electrical Engineers P
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• v.60 no.3
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• pp.133-137
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• 2011

The purpose of smart grid is the low $CO_2$ through expansion of renewable energy. To achieve the purpose of smart grid, typical radial power distribution system will be changed to loop power distribution system. The loop power distribution system have many advantages such as low power loss, low voltage drop, and increase of connection of renewable energy. In this paper, the algorithm for minimization of interrupted section of power distribution system is proposed through communication between circuit breaker and recloser in loop power distribution system. The proposed algorithm is proved through case studies about reliability evaluation

• Proceedings of the KIEE Conference
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• 1999.07c
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• pp.1245-1247
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• 1999

This paper describes the optimal reconfiguration of distribution network. The optimal routing of distribution network should provide electricity to customers with quality, and this paper shows that optimal routing of distribution network can be obtained by Neural-Tabu algorithm while keeping constraints such as line power capacity, voltage drop and reliability indices. The Neural-Tabu algorithm is a Tabu algorithm combined with Neural network to find neighborhood solutions. This paper shows that not only the loss cost but also the reliability cost should be considered in distribution network reconfiguration to achieve the optimal routing.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.28 no.9
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• pp.1297-1305
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• 2004

Reliability of MEMS devices is receiving more attention as they are heading towards commercial production. In particular are the reliability and long-term stability of wafer level vacuum packaged MEMS gyroscope sensors subjected to cyclic mechanical stresses at high frequencies. In this study, we carried out several reliability tests such as environmental storage, fatigue, shock, and vibration, and we investigated the failure mechanisms of the anodically bonded vacuum gyroscope sensors. It was found that successful vacuum packaging could be achieved through reducing outgassing inside the cavity by deposition of titanium as well as by pre-taking process. The current gyroscope structure is found to be safe from fatigue failure for 1000 hours of operation test. The gyroscope sensor survives the drop and vibration tests without any damage, indicating robustness of the sensor. The reliability test results presented in this study demonstrate that MEMS gyroscope sensor is very close to commercialization.

• The Transactions of the Korean Institute of Power Electronics
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• v.21 no.5
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• pp.453-456
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• 2016

The major causes of electrical fire in low-voltage distribution lines are classified into short-circuit fault, overload fault, electric leakage, and electric contact failure. The special principal factor of the fire is electric arc or spark accompanied with such electric faults. This paper studies the development of an electric fire prevention system with detection and alarm of that in case of parallel arc fault occurrence in low-voltage distribution lines. The proposed system is designed on algorithm sensing the instantaneous voltage drop of line voltage at arc fault occurrence. The proposed detector has characteristics of high-speed operation responsibility and superior system reliability from composition using a large number of semiconductor devices. A new sensing control method that shows the detection of parallel arc fault is sensed to ripple voltage drop through a diode bridge full-wave rectifier at electrical accident occurrence. Some experimental tests of the proposed system also confirm the practicality and validity of the analytical results.

• KIEE International Transaction on Electrical Machinery and Energy Conversion Systems
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• v.2B no.3
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• pp.81-89
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• 2002

The sensorless AC motor drive is a popular topic of study due to the cost and reliability of speed and position sensors. Most sensorless algorithms are based on the mathematical modeling of motors including electrical variables such as phase current and voltage. Therefore, the accuracy of such variables largely affects the performance of the sensorless AC motor drive. However, the output voltage of the SVPWM-VSI, which is widely used in sensorless AC motor drives, has considerable errors. In particular, the SVPWM-VSI is error-prone in the low speed range because the constant DC link voltage causes poor resolution in a low output voltage command and the output voltage is distorted due to dead time and voltage drop. This paper investigates a novel high-performance strategy for overcoming these problems in a sensorless ac motor drive. In this paper, a variation of the DC link voltage and a direct compensation for dead time and voltage drop are proposed. The variable DC link voltage leads to an improved resolution of the inverter output voltage, especially in the motor's low speed range. The direct compensation for dead time and voltage drop directly calculates the duration of the switching voltage vector without the modification of the reference voltage and needs no additional circuits. In addition, the proposed strategy reduces a current ripple, which deteriorates the accuracy of a monitored current and causes torque ripple and additional loss. Simulation and experimentation have been performed to verify the proposed strategy.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.18 no.5
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• pp.449-454
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• 2009

This paper presents an experimental study on the failure characteristics of SnAgCu lead-free solder balls. To estimate the effect of Ag, three types of SnAgCu balls are first prepared by varying the weight percent of Ag(1.0, 3.0, 4.0 wt%) and then analyzed by reliability tests such as thermal shock, high speed ball shear, and drop tests. Thermal shock test reveals that the higher the weight percent of Ag is, the longer the fatigue lift becomes. To the contrary, high speed ball-shear test and drop test show that the shear strength and the fracture toughness of solder balls are inversely proportional to the weight percent of Ag, respectively, Reasons for these observations will be further investigated In the future work.

• International Journal of Aerospace System Engineering
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• v.3 no.2
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• pp.22-25
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• 2016

This dissertation tried to analyze passenger behaviors after an accident with the possibilities of a variety of accidents open reflecting the phases of the times of increasing interests in safety of passengers as the use of means of transportation such as cars and airplanes is increasing. Because a lot of data on head-on collisions, broadside collisions and reverse side collisions have been gathered through lots of experiments and interpretations, I chose to study a relatively unfamiliar subject, dropping collision. For example, I tried to study passenger behaviors in seating position after a dropping collision in preparation for falling accidents due to recent frequently-occurring sinkholes, driver's carelessness or mechanical problems. I used MADYMO, passenger behavior interpretation program, and experimented with 2 meters high Drop Test device which I made in person to increase the reliability of the results. On the basis of these, I compared the real experiments with interpretations.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.32 no.5
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• pp.366-370
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• 2019

In this paper, a single N+ emitter trench gate-type insulated gate bipolar transistor (IGBT) device was studied using T-CAD, in order to achieve a low on-state voltage drop (Vce-sat) and high breakdown voltage, which would reduce power loss and device reliability. Using the simulation, the threshold voltage, breakdown voltage, and on-state voltage drop were studied as a function of the temperature, the length of time in the diffusion process (drive-in) after implant, and the trench gate depth. During the drive-in process, a $20^{\circ}C$ change in temperature from 1,000 to $1,160^{\circ}C$ over a 150 minute time frame resulted in a 1 to 4 V change in the threshold voltage and a 24 to 2.6 V change in the on-state voltage drop. As a result, a 0.5 um change in the trench depth of 3.5 to 7.5 um resulted in the breakdown voltage decreasing from 802 to 692 V.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.30 no.3
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• pp.148-151
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• 2017

This research concerns field rings for 3.3kV planar gate power insulated-gate bipolar transistors (IGBTs). We design an optimal field ring for a 3.3kV power IGBT and analyze its electrical characteristics according to field ring parameters. Based on this background, we obtained 3.3kV high breakdown voltage and a 2.9V on state voltage drop. To obtain high breakdown voltage, we confirmed that the field ring count was 23, and we obtained optimal parameters. The gap distance between field rings $13{\mu}m$ and the field ring width was $5{\mu}m$. This design technology will be adapted to field stop IGBTs and super junction IGBTs. The thyristor device for a power conversion switch will be replaced with a super high voltage power IGBT.