• Title/Summary/Keyword: Double sampling

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Confidence Intervals for the Difference of Binomial Proportions in Two Doubly Sampled Data

  • Lee, Seung-Chun
    • Communications for Statistical Applications and Methods
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    • v.17 no.3
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    • pp.309-318
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    • 2010
  • The construction of asymptotic confidence intervals is considered for the difference of binomial proportions in two doubly sampled data subject to false-positive error. The coverage behaviors of several likelihood based confidence intervals and a Bayesian confidence interval are examined. It is shown that a hierarchical Bayesian approach gives a confidence interval with good frequentist properties. Confidence interval based on the Rao score is also shown to have good performance in terms of coverage probability. However, the Wald confidence interval covers true value less often than nominal level.

A3V 10b 33 MHz Low Power CMOS A/D Converter for HDTV Applications (HDTV 응용을 위한 3V 10b 33MHz 저전력 CMOS A/D 변환기)

  • Lee, Kang-Jin;Lee, Seung-Hoon
    • Journal of IKEEE
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    • v.2 no.2 s.3
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    • pp.278-284
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    • 1998
  • This paper describes a l0b CMOS A/D converter (ADC) for HDTV applications. The proposed ADC adopts a typical multi-step pipelined architecture. The proposed circuit design techniques are as fo1lows: A selective channel-length adjustment technique for a bias circuit minimizes the mismatch of the bias current due to the short channel effect by supply voltage variations. A power reduction technique for a high-speed two-stage operational amplifier decreases the power consumption of amplifiers with wide bandwidths by turning on and off bias currents in the suggested sequence. A typical capacitor scaling technique optimizes the chip area and power dissipation of the ADC. The proposed ADC is designed and fabricated in s 0.8 um double-poly double-metal n-well CMOS technology. The measured differential and integral nonlinearities of the prototype ADC show less than ${\pm}0.6LSB\;and\;{\pm}2.0LSB$, respectively. The typical ADC power consumption is 119 mW at 3 V with a 40 MHz sampling rate, and 320 mW at 5 V with a 50 MHz sampling rate.

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Design of a Vision Chip for Edge Detection with an Elimination Function of Output Offset due to MOSFET Mismatch (MOSFET의 부정합에 의한 출력옵셋 제거기능을 가진 윤곽검출용 시각칩의 설계)

  • Park, Jong-Ho;Kim, Jung-Hwan;Lee, Min-Ho;Shin, Jang-Kyoo
    • Journal of Sensor Science and Technology
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    • v.11 no.5
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    • pp.255-262
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    • 2002
  • Human retina is able to detect the edge of an object effectively. We designed a CMOS vision chip by modeling cells of the retina as hardwares involved in edge detection. There are several fluctuation factors which affect characteristics of MOSFETs during CMOS fabrication process and this effect appears as output offset of the vision chip which is composed of pixel arrays and readout circuits. The vision chip detecting edge information from input image is used for input stage of other systems. Therefore, the output offset of a vision chip determine the efficiency of the entire performance of a system. In order to eliminate the offset at the output stage, we designed a vision chip by using CDS(Correlated Double Sampling) technique. Using standard CMOS process, it is possible to integrate with other circuits. Having reliable output characteristics, this chip can be used at the input stage for many applications, like targe tracking system, fingerprint recognition system, human-friendly robot system and etc.

Empirical Bayesian Misclassification Analysis on Categorical Data (범주형 자료에서 경험적 베이지안 오분류 분석)

  • 임한승;홍종선;서문섭
    • The Korean Journal of Applied Statistics
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    • v.14 no.1
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    • pp.39-57
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    • 2001
  • Categorical data has sometimes misclassification errors. If this data will be analyzed, then estimated cell probabilities could be biased and the standard Pearson X2 tests may have inflated true type I error rates. On the other hand, if we regard wellclassified data with misclassified one, then we might spend lots of cost and time on adjustment of misclassification. It is a necessary and important step to ask whether categorical data is misclassified before analyzing data. In this paper, when data is misclassified at one of two variables for two-dimensional contingency table and marginal sums of a well-classified variable are fixed. We explore to partition marginal sums into each cells via the concepts of Bound and Collapse of Sebastiani and Ramoni (1997). The double sampling scheme (Tenenbein 1970) is used to obtain informations of misclassification. We propose test statistics in order to solve misclassification problems and examine behaviors of the statistics by simulation studies.

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The Signal-to-Noise Ratio Enhancement of the Satellite Electro-Optical Imager using Noise Analysis Methods (영상센서신호의 잡음분석을 이용한 위성용 전자광학탑재체의 신호대잡음비 개선 방법)

  • Park, Jong-Euk;Lee, Kijun
    • Korean Journal of Remote Sensing
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    • v.33 no.2
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    • pp.159-169
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    • 2017
  • The Satellite Electro-Optic Payload System needsspecial requirements with the conditions of limited power consumption and the space environment of solar radiation. The acquired image quality should be mainly depend on the GSD (Ground Sampled Distance), SNR (Signal to Noise Ratio), and MTF (Modulation Transfer Function). On the well-manufactured sensor level, the thermal noise is removed on ASP (Analog Signal Processing) using the CDS (Corrective Double Sampling); the noise signal from the image sensor can be reduced from the offset signals based on the pre-pixels and the dark-pixels. The non-uniformity shall be corrected with gain, offset, and correction parameter of the image sensor pixel characteristic on the sensor control system. This paper describes the SNR enhancement method of the satellite EOS payload using the mentioned noise remove processes on the system design and operation, which is verified by tests and simulations.

CMOS ROIC for MEMS Acceleration Sensor (MEMS 가속도센서를 위한 CMOS Readout 회로)

  • Yoon, Eun-Jung;Park, Jong-Tae;Yu, Chong-Gun
    • Journal of IKEEE
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    • v.18 no.1
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    • pp.119-127
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    • 2014
  • This paper presents a CMOS readout circuit for MEMS(Micro Electro Mechanical System) acceleration sensors. It consists of a MEMS accelerometer, a capacitance to voltage converter(CVC) and a second-order switched-capacitor ${\Sigma}{\Delta}$ modulator. Correlated-double-sampling(CDS) and chopper-stabilization(CHS) techniques are used in the CVC and ${\Sigma}{\Delta}$ modulator to reduce the low-frequency noise and DC offset. The sensitivity of the designed CVC is 150mV/g and its non-linearity is 0.15%. The duty cycle of the designed ${\Sigma}{\Delta}$ modulator output increases about 10% when the input voltage amplitude increases by 100mV, and the modulator's non-linearity is 0.45%. The total sensitivity is 150mV/g and the power consumption is 5.6mW. The proposed circuit is designed in a 0.35um CMOS process with a supply voltage of 3.3V and a operating frequency of 2MHz. The size of the designed chip including PADs is $0.96mm{\times}0.85mm$.

Acceleration of the Multi-Level Fast Multipole Algorithm using Double Interpolation Technique (이중 보간 기법을 이용한 MLFMA 가속기법)

  • Yun, Dal-Jae;Kim, Hyung-Ju;Lee, Jae-In;Yang, Seong-Jun;Yang, Woo-Yong;Bae, Jun-Woo;Myung, Noh-Hoon
    • Journal of the Korea Institute of Military Science and Technology
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    • v.22 no.3
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    • pp.311-319
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    • 2019
  • This paper proposes an acceleration of the multi-level fast multipole algorithm(MLFMA) by using a double interpolation method. The MLFMA has been primarily used to conduct scattering analysis of electrically large targets, e.g. stealth aircraft. In the MLFMA, radiation functions of each basis functions are first precomputed, and then aggregated. After transfer calculations for the aggregations, each interaction is disaggregated, and then received in the testing function. The key idea of the proposed method is to decrease the sampling rates of the radiation and receiving functions. The computational complexity of the unit sphere integration in terms of the testing functions is thus highly alleviated. The remaining insufficient sampling rate is then complemented by using additional interpolation. We demonstrate the performance of the proposed method through radar cross-section(RCS) calculations for realistic aircraft.

A CMOS Switched-Capacitor Interface Circuit for MEMS Capacitive Sensors (MEMS 용량형 센서를 위한 CMOS 스위치드-커패시터 인터페이스 회로)

  • Ju, Min-sik;Jeong, Baek-ryong;Choi, Se-young;Yang, Min-Jae;Yoon, Eun-jung;Yu, Chong-gun
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2014.10a
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    • pp.569-572
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    • 2014
  • This paper presents a CMOS switched-capacitor interface circuit for MEMS capacitive sensors. It consist of a capacitance to voltage converter(CVC), a second-order ${\Sigma}{\Delta}$ modulator, and a comparator. A bias circuit is also designed to supply constant bias voltages and currents. This circuit employes the correlated-double-sampling(CDS) and chopper-stabilization(CHS) techniques to reduce low-frequency noise and offset. The designed CVC has a sensitivity of 20.53mV/fF and linearity errors less than 0.036%. The duty cycle of the designed ${\Sigma}{\Delta}$ modulator output increases about 5% as the input voltage amplitude increases by 100mV. The designed interface circuit shows linearity errors less than 0.13%, and the current consumption is 0.73mA. The proposed circuit is designed in a 0.35um CMOS process with a supply voltage of 3.3V. The size of the designed chip including PADs is $1117um{\times}983um$.

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Design of a Comparator with Improved Noise and Delay for a CMOS Single-Slope ADC with Dual CDS Scheme (Dual CDS를 수행하는 CMOS 단일 슬로프 ADC를 위한 개선된 잡음 및 지연시간을 가지는 비교기 설계)

  • Heon-Bin Jang;Jimin Cheon
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.16 no.6
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    • pp.465-471
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    • 2023
  • This paper proposes a comparator structure that improves the noise and output delay of a single-slope ADC(SS-ADC) used in CMOS Image Sensor (CIS). To improve the noise and delay characteristics of the output, a comparator structure using the miller effect is designed by inserting a capacitor between the output node of the first stage and the output node of the second stage of the comparator. The proposed comparator structure improves the noise, delay of the output, and layout area by using a small capacitor. The CDS counter used in the single slop ADC is designed using a T-filp flop and bitwise inversion circuit, which improves power consumption and speed. The single-slope ADC also performs dual CDS, which combines analog correlated double sampling (CDS) and digital CDS. By performing dual CDS, image quality is improved by reducing fixed pattern noise (FPN), reset noise, and ADC error. The single-slope ADC with the proposed comparator structure is designed in a 0.18-㎛ CMOS process.

Design of digital clock level translator with 50% duty ratio from small sinusoidal input (작은 정현파입력의 50% Duty Ratio 디지털 클럭레벨 변환기 설계)

  • Park, Mun-Yang;Lee, Jong-Ryul;Kim, Ook;Song, Won-Chul;Kim, Kyung-Soo
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.23 no.8
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    • pp.2064-2071
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    • 1998
  • A new digital clock level translator has been designed in order to produce a clock source of the internal logic circuits. The translator output has 50% duty ratio from small sinusoidal input such as TCXO which oscillates itself in poratable components. The circuit consists of positive and negative comparators, RS latch, charge pump, and reference vol- tage generator. It detects pulse width of the output waveform and feedbacks the control signal to the input com-parator. It detects pulse width of the output waveform and feedbacks the control signal to the input com-parator reference, producing output waveform with valid 50% duty ratio of the digital signal level. The designed level translator can be used as a sampling clock source of ADC, PLL and the colck source of the clock synthesizer. The circuit wasdesigned in a 0.8.mu.m analog CMOS technology with double metal, double poly, and BSIM3 circuit simulation model. From our experimental results, a stable operating characteristics of 50 +3% duty ratio was obtained from the sinusoidal input wave of 370 mV.

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