• 제목/요약/키워드: Distribution of Life

검색결과 3,999건 처리시간 0.031초

자동차 가속수명 시험과 신뢰성 성장관리 기술 개발 (Accelerated Life Test and Reliability Growth Management Technique Within a Car Program)

  • Jung, Won
    • 한국산업정보학회논문지
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    • 제7권2호
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    • pp.33-39
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    • 2002
  • Accelerated life testing of a car is used to get information quickly on its life distribution. Test cars are no under severe conditions and fail sooner than under usual conditions. A model is fitted to the accelerated failure times and then extrapolated to estimate the life distribution under usual conditions. This paper presents an accelerated test md the reliability growth theory, and applies it to some subsystems of cars during their prototype and pilot testing. The data presented illustrates explicitly the prediction of the reliability growth in the product development cycle. The application of these techniques is a part of the product assurance function that plays an important role in product reliability improvement.

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미세변동공정관리를 위한 가속수명시험관리도 설계 (Design of ALT Control Chart for Small Process Variation)

  • 김종걸;엄상준
    • 대한안전경영과학회지
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    • 제14권3호
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    • pp.167-174
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    • 2012
  • In the manufacturing process the most widely used $\bar{X}$ chart has been applied to control the process mean. Also, Accelerated Life Test(ALT) is commonly used for efficient assurance of product life in development phases, which can be applied in production reliability acceptance test. When life data has lognormal distribution, through censored ALT design so that censored ALT data has asymptotic normal distribution, $ALT\bar{X}$ control chart integrating $\bar{X}$ chart and ALT procedure could be applied to control the mean of process in the manufacturing process. In the situation that process variation is controlled, $Z_p$ control chart is an effective method for the very small fraction nonconforming of quality characteristic. A simultaneous control scheme with $ALT\bar{X}$ control chart and $Z_p$ control chart is designed for the very small fraction nonconforming of product lifetime.

저역필터 어셈블리에 대한 신뢰성시험 결과의 해석 (Analysis of reliability test results of low-pass filter assembly)

  • 백재욱
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제14권1호
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    • pp.45-51
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    • 2014
  • Thermal shock tests at two stress levels were performed to see the life (cycles) of LPF ASSY (low pass filter assembly) at normal stress level. In this case Coffin-Manson relationship is generally used to describe the relationship between the temperature difference and the life, together with the Weibull distribution describing the life at each stress level. So for given data Coffin-Manson is fitted to predict the life at normal stress level. However, different types of models are appropriate for this type of test. Hence, a more appropriate model such as General log-linear model which can also incorporate the duration at the highest and lowest temperatures and acceleration time will be introduced.

A Time Truncated Two-Stage Group Sampling Plan for Weibull Distribution

  • Aslam, Muhammad;Jun, Chi-Hyuck;Rasool, Mujahid;Ahmad, Munir
    • Communications for Statistical Applications and Methods
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    • 제17권1호
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    • pp.89-98
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    • 2010
  • In this paper, a two-stage group sampling plan based on the time truncated life test is proposed for the Weibull distribution. The design parameters such as the number of groups and the acceptance number in each stage are determined by satisfying the producer's and consumer's risks simultaneously when the group size and the test duration are specified. The acceptable reliability level is expressed by the ratio of the true mean life to the specified life. It was demonstrated from the comparison with single-stage group sampling plans that the proposed plan can reduce the average sample number or improve the operating characteristics.

Estimation of a Bivariate Exponential Distribution with a Location Parameter

  • 홍연웅;권용만
    • 한국데이터정보과학회:학술대회논문집
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    • 한국데이터정보과학회 2002년도 춘계학술대회
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    • pp.89-95
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    • 2002
  • This paper considers the problem of estimating paramaters of the bivariate exponential distribution with a loaction parameter for a two-component shared parallel system using component data from system-level life test terminated at the time of the prespecified number of system failure. In the system-level life testing, there are three patterns of failure types; 1) both component failed 2) both component censored 3) one is failed and the other is censored. In the third case, we assume that the failure time might be known or unknown. The maximum likelihood estimators are obtained for the case of known/unknown failure time when the other component is censored.

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Optimal Bayesian design for discrimination of acceleration models in the exponential distribution

  • Park, Choon-Il
    • 대한수학회지
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    • 제31권4호
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    • pp.709-715
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    • 1994
  • The aim of of the study is a powerful test for the discrimination and therefore an optimal desin for that purpose. This problem is studied by Chernoff ([5]) and used in Chernoff ([6]) for accelerated life tests using the exponential distribution for life times. The approach used here is similar to that suggested by Lauter ([10]) and used in Chaloner ([3]) and Chaloner and Larntz ([4]) where it is motivated using Bayesian arguments. The approach taken in this paper the loss function $L(\cdot)$ evaluating a test procedure and a design d.

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