• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.19 no.1
• /
• pp.149-155
• /
• 2015

This paper proposes 5-MS/s 10-bit digital-to-analog converter(DAC) with the improved linearity. The proposed DAC consists of a 10-bit R-2R-based DAC, an output buffer using a differential voltage amplifier with rail-to-rail input range, and a band-gap reference circuit for the bias voltage. The linearity of the 10-bit R-2R DAC is improved as the resistor of 2R is implemented by including the turn-on resistance of an inverter for a switch. The output voltage range of the DAC is determined to be $2/3{\times}VDD$ from an rail-to-rail output voltage range of the R-2R DAC using a differential voltage amplifier in the output buffer. The proposed DAC is implemented using a 1-poly 8-metal 130nm CMOS process with 1.2-V supply. The measured dynamic performance of the implemented DAC are the ENOB of 9.4 bit, SNDR of 58 dB, and SFDR of 63 dBc. The measured DNL and INL are less than +/-0.35 LSB. The area and power consumption of DAC are $642.9{\times}366.6{\mu}m^2$ and 2.95 mW, respectively.

• Journal of electromagnetic engineering and science
• /
• v.17 no.1
• /
• pp.39-43
• /
• 2017

In this paper, a systematic and statistical calibration technique was implemented to calibrate a high-speed signal converting system containing multiple digital-to-analog converters (DACs). The systematic error (especially the imbalance between DACs) in the current combining network of the multi-DAC system was modeled and corrected by calculating the path coefficients for individual DACs with wideband reference signals. Furthermore, by applying a Kalman filter to suppress noise from quantization and clock jitter, accurate coefficients with minimum noise were identified. For correcting an arbitrary waveform generator with two DACs, a co-simulation platform was implemented to estimate the system degradation and its corrected performance. Simulation results showed that after correction with 4.8 Gbps QAM signal, the signal-to-noise-ratio improved by approximately 4.5 dB and the error-vector-magnitude improved from 4.1% to 1.12% over 0.96 GHz bandwidth.

• Journal of the Semiconductor & Display Technology
• /
• v.3 no.1
• /
• pp.1-7
• /
• 2004

In this paper, we have developed the DC parameters test system which inspects the properties of DC parameters for semiconductor products. The developed system is interfaced by IBM-PC. It is consisted of CPLD part, ADC(Analog-to-Digital Converter), DAC(Digital-to-Analog Converter), voltage/current source, variable resistor and measurement part. In the proposed system, we have designed the constant voltage source and the constant current source in a part. In the comparison of results, the results of the simulation are very similar to the ones of the implementation.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
• /
• 2011.10a
• /
• pp.448-451
• /
• 2011

SoC에서 칩 내부의 온도를 측정하기 위한 proportional-to-absolute-temperature (PTAT) 회로와 sensing 된 아날로그 신호를 디지털로 변환하기 위해 4-bit analog-to-digital converter (ADC)로 구성된 temperature sensor를 제안한다. CMOS 공정에서 vertical PNP 구조를 이용하여 PTAT 회로가 설계되었다. 온도변화에 둔감한 ADC를 구현하기 위해 아날로그 회로를 최소로 사용하는 successive approximation (SA) ADC가 이용되었다. 4-bit SA ADC는 capacitor DAC와 time-domain 비교기를 이용함으로 전력소모를 최소화하였다. 제안된 temperature sensor는 2.5V $0.25{\mu}m$ 1-poly 9-metal CMOS 공정을 이용하여 설계되었고, $50{\sim}150^{\circ}C$ 온도 범위에서 동작한다. Temperature sensor의 면적과 전력 소모는 각각 $130{\times}390\;um^2$과 868 uW이다.

• Proceedings of the IEEK Conference
• /
• 2004.06b
• /
• pp.569-572
• /
• 2004

This paper presents a 12-Bit 250MHz CMOS current-mode Digital to Analog Converter(DAC) with current scalers and dividers. It consist of 4 MSB current scaler, 4 MLSB current divider, and 4 LSB current divider. The simulation results show a conversion rate of 250MHz, DNL/INL of ${\pm}5LSB/{\pm}7LSB$, die area of $0.55mm^2$ and Power dissipation of 27mW at 3.3V

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
• /
• 2015.10a
• /
• pp.420-423
• /
• 2015

This paper proposes a method of non-linearity error detection and calibration for binary-weighted charge-driven DACs. In general, the non-linearity errors of DACs often occur due to the mismatch of layout designs or process variation, even when careful layout design methods and process calibration are adopted. Since such errors can substantially degrade the SNDR performance of DAC, it is crucial to accurately measure the errors and calibrate the design mismatches. The proposed method employs 2 identical DAC circuits. The 2 DACs are sweeped, respectively, by using 2 digital input counters with a fixed difference. A comparator identifies any non-linearity errors larger than an acceptable discrepancy. We also propose a calibration method that can fine-tune the DAC's capacitor sizes iteratively until the comparator finds no further errors. Simulations are presented, which show that the proposed method is effective to detect the non-linearity errors and calibrate the capacitor mismatches of a 12-bit DAC design of binary-weighted charge-driven structure.

• Proceedings of the IEEK Conference
• /
• 1999.11a
• /
• pp.689-692
• /
• 1999

This paper describes a 10-bit 75-MHz CMOS current-mode DAC designed for 0.8${\mu}{\textrm}{m}$ double-poly double-metal CMOS technology. This D/A converter is implemented using a current cell matrix that can drive a resistive load without output buffer. In the DAC. a current source is proposed to reduce the linearity error caused by the threshold-voltage variations over a wafer and the glitch energy caused by the time lagging, The integral and differential linearity error are founded to be within $\pm$0.35 LSB and $\pm$0.31 LSB respectively. The maximum conversion rate is about 80 MS/s. The total power dissipation is 160 ㎽ at 75 MS/s conversion rate.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.40 no.11
• /
• pp.83-94
• /
• 2003

In this paper. a highly linear and low glitch CMOS current mode digital-to-analog converter (DAC) by self calibration bias circuit is proposed. The architecture of the DAC is based on a current steering 6＋4 segmented type and new switching scheme for the current cell matrix, which reduced non-linearity error and graded error. In order to achieve a high performance DAC . novel current cell with a low spurious deglitching circuit and a new inverse thermometer decoder are proposed. The prototype DAC was implemented in a 0.35${\mu}{\textrm}{m}$ n-well CMOS technology. Experimental result show that SFDR is 60 ㏈ when sampling frequency is 32MHz and DAC output frequency is 7.92MHz. The DAC dissipates 46 mW at a 3.3 Volt single power supply and occupies a chip area of 1350${\mu}{\textrm}{m}$ ${\times}$750${\mu}{\textrm}{m}$.

• Journal of Advanced Navigation Technology
• /
• v.16 no.5
• /
• pp.839-845
• /
• 2012

This paper deals with the design and development of the remote control and measurement systems by Embedded Web Server. The remote control and measurement systems are implemented by Cortex M-3 ARM micro-controller. The user application software for the control and measurement system user, and the firmware software of device drivers for peripherals such as a digital input/output device, AD/DAC(Analog to Digital/Digital to Analog Converter), LCD, and temperature/humidity sensor are developed in Eclipse environment using Codesourcery C, Java script, and HTML. The experimental result of the proposed control and measurement systems implemented in this paper is evaluated via real-time experiments, which works well as designed.

• Journal of information and communication convergence engineering
• /
• v.10 no.2
• /
• pp.187-193
• /
• 2012

A 1 GHz CMOS fast-lock phase-locked loop (PLL) is proposed to support the quick wake-up time of mobile consumer electronic devices. The proposed fast-lock PLL consists of a conventional charge-pump PLL, a frequency-to-digital converter (FDC) to measure the frequency of the input reference clock, and a digital-to-analog converter (DAC) to generate the initial control voltage of a voltage-controlled oscillator (VCO). The initial control voltage of the VCO is driven toward a reference voltage that is determined by the frequency of the input reference clock in the initial mode. For the speedy measurement of the frequency of the reference clock, an FDC with a parallel architecture is proposed, and its architecture is similar to that of a flash analog-to-digital converter. In addition, the frequency-to-voltage converter used in the FDC is designed simply by utilizing current integrators. The circuits for the proposed fast-lock scheme are disabled in the normal operation mode except in the initial mode to reduce the power consumption. The proposed PLL was fabricated by using a 0.18-${\mu}m$ 1-poly 6-metal complementary metal-oxide semiconductor (CMOS) process with a 1.8 V supply. This PLL multiplies the frequency of the reference clock by 10 and generates the four-phase clock. The simulation results show a reduction of up to 40% in the worstcase PLL lock time over the device operating conditions. The root-mean-square (rms) jitter of the proposed PLL was measured as 2.94 ps at 1 GHz. The area and power consumption of the implemented PLL are $400{\times}450{\mu}m^2$ and 6 mW, respectively.