• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.11a
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• pp.533-536
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• 2001

Single crystal cubic silicon carbide(3C-SiC) thin film were deposited on Si(100) substrate up to a thickness of 4.3 $\mu\textrm{m}$ by APCVD(atmospheric pressure chemical vapor deposition) method using hexamethyildisilane(HMDS) at 1350$^{\circ}C$. The HMDS flow rate was 0.5 sccm and the carrier gas flow rate was 2.5 slm. The HMDS flow rate was important to get a mirror-like. The growth rate of the 3C-SiC films was 4.3 $\mu\textrm{m}$/hr. The 3C-SiC epitaxical layers on Si(100) were characterized by XRD(X-ray diffraction), raman scattering and RHEED(reflection high-energy electron diffraction), respectively The 3C-SiC distinct phonons of TO(transverse optical) near 796 cm$\^$-1/ and LO(longitudinal optical) near 974${\pm}$1 cm$\^$-1/ were recorded by raman scattering measurement. The deposition films were identified as the single crystal 3C-SiC phase by XRD spectra(2$\theta$=41.5$^{\circ}$). Also, with increase of films thickness, RHEED patterns gradually changed from a spot pattern to a streak pattern

• Macromolecular Research
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• v.14 no.6
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• pp.588-595
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• 2006

The morphology, structure and melting behaviour of cold-crystallized isotactic polystyrene (iPS) were studied by differential scanning calorimetry (DSC), wide angle X-ray diffraction (WAXD) and small angle X-ray scattering (SAXS). The polymer was found to crystallize according to the dual-lamellar stack model. The two populations of lamellae, along with a melting-recrystallization phenomenon, determined the appearance of multiple melting peaks in DSC traces. The annealing peak was attributed to the relaxation of a rigid amorphous phase, rather than to the melting of crystalline material.

• Journal of the Korean Vacuum Society
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• v.2 no.2
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• pp.171-180
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• 1993

X-ray photoelectron diffraction (XPD) is used to characterize the crystallographically cleaved GaAs(110) surface. By using polar and azimuthal scans of the usual angle-resolved x-ray photoelectron spectroscopy, we get the reconstruction geometry of the clean GaAs(110) surface from the intensity ratio of Ga 3d core-level peaks. The reconstruction parameters are determined by fitting the diffraction pattern with the single scattering cluster (SSC) model, and the results show similar tendencies to those obtained by other techniques.

• Journal of Welding and Joining
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• v.33 no.1
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• pp.30-34
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• 2015

Residual stresses are inherently introduced into the engineering components during manufacturing including rolling, forging, bending and welding processes. Excessive residual stresses are known to be detrimental to the proper integrity and performance of components. Neutron diffraction has become a well-established technique for the determination of residual stresses in welds. The deep penetration capability of neutrons into most metallic materials makes neutron diffraction a powerful tool for the residual stress measurements through the thickness of the weld specimen. Furthermore, the unique volume-averaged bulk characteristic of the scattering beam and mapping capability in three dimensions is suitable for the engineering purpose. In this presentation, the neutron diffraction measurements of the residual stresses will be introduced and measurement results will highlighted in thick weld plates.

• Korean Journal of Materials Research
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• v.14 no.5
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• pp.348-352
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• 2004

The mechanical alloying (MA) effect in immiscible V-Cu system with positive heat of mixing was studied by not only the neutron and X-ray diffraction but also the analysis of DSC spectra. The total energy, ΔHt accumulated during MA for the mixture of $V_{50}$ $Cu_{50}$ / powders increased with milling time and approached the saturation value of 14 kJ/mol after 120 h of milling. It can be seen that the free energy difference between the amorphous phase and the pure V and Cu powders with an atomic ratio 5:5 is estimated to be 11 kJ/mol by Miedema et al. This is thermodynamically taken as one of the evidences for the amorphization. The structural changes of V-Cu MA powders were characterized by the X-ray diffraction and neutron diffraction. We take a full advantage of a negligibly small scattering length of the V atom in the neutron diffraction measurement. The neutron diffraction data definitely indicate that the amorphization proceeds gradually but incompletely even after 120 h of MA and bcc-Cu Bragg peaks appears after 60 h of MA.

• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.363-366
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• 1998

High frequency scattered fields by a double impedence wedge are computed. In the procedure of the computation, arbitrary impedence faces and wedge angles are considered. The diffraction coefficients for the single, double and triple diffraction mechanism are founded. The second-order and third-order diffracted fields are approximated via the extended spectral ray method and the modified Pauli-Clemmow method of the steepest descent. The maliuzhinets function which is very difficult to obtain accurate value is approximated by the Volakis's asymtotic expression. Numerical computations are performed for the various wedge angles and surface impedence values.

• Journal of the Optical Society of Korea
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• v.2 no.2
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• pp.58-63
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• 1998

Cross-talk effects in high-density volume holographic interconnections are investigated using perturbative iteration method of the integral form of Maxwell's wave equation. In this method, the paraxial approximation and negligence of backward scattering introduced in conventional coupled mode theory is not assumed. Interaction geometries consisting of non-coplanar light waves and multiple index gratings are studied. Arbitrary light polarization is considered. Systematic analysis of cross-talk effects due to multiple index gratings is performed in increasing level of diffraction orders corresponding to successive iterations. Some numerical examples are given for first and third order diffraction.

• Journal of the Korean Ceramic Society
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• v.40 no.6
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• pp.513-518
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• 2003

La/sub 2/3-x/Li/sub 3x/□/sub 1/3-2x/TiO₃ compounds with x=0.13 and 0.12 were prepared by slow cooling (x=0.13) and rapid quenching (x=0.12) into the liquid nitrogen after sintering at 1350℃ for 6 h. Their crystal structure has been determined by Rietveld refinement of both the powder neutron and X-ray diffraction data. From neutron diffraction data, we found that the main phase was not tetragonal (P4/mmm), but trigonal (R3cH). The refinement of neutron diffraction for the slow cooled samples were in a good agreement with a new model; a mixture of trigonal (R3cH, 45.7 wt％), tetragonal (p4/mmm, 37.0 wt％), and Li/sub 0.57/Ti/sub 0.86/O₂(pbnm, 17.2 wt%), but the quenched sample was found not to contain tetragonal (p4/mmm). X-ray diffraction data couldn't be well fitted because of the Poor scattering factor of lithium ions and the similar reflection patterns among trigonal (R3cH), tetragonal (p4/mmm), and cubic (Pm3m). We also knew that one transport bottlenecks is destroyed by one La vacancy in the case of trigonal (R3cH).

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.22 no.5
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• pp.123-128
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• 2022

Applying rigorous modal transmission-line theory (MTLT), the properties of resonant diffraction gratings under conical light incidence is investigated. The mode vectors pertinent to resonant diffraction under conical mounting vary less with incident angle than those associated with diffraction gratings in classical mounting. Furthermore, as the evanescent diffracted waves drive the leaky modes responsible for the resonance effects, the conical mounting imbues diffraction gratings with larger angular tolerance than their classical counterparts. Based on these concepts, the angular-spectral and wavelength-spectral performance of resonant diffraction gratings in conical and classical mounts by numerical calculations with spectra found for conical incidence are quantified. These results will be useful in various applications demanding resonant diffraction gratings that are efficient and physically sparse.

• Journal of the Korean Magnetics Society
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• v.20 no.4
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• pp.160-166
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• 2010

X-ray resonant magnetic scattering (XRMS) allows us to extract magnetic depth profiles in magnetic multilayers and magnetization distribution in magnetic nanostructures in element-specific manner using x-ray reflectivity and diffraction. XRMS is explained with a brief introduction and examples of magnetic structures and magnetic switching mechanism in magnetic multilayers and nanostructures.