• Proceedings of the KIEE Conference
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• 1998.07e
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• pp.1598-1600
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• 1998

When dielectric surface electric field exceed any electric field strength on air, corona discharge is occurred from the dielectric surface. This paper presents corona discharge phenomena on the dielectric in high field were studied under application of ${\pm}DC$ voltage, constitute of the point to plane 20mm gap. The results obtained in experimental are summarized as follow :(1) Corona pulse is appeared periodically after first corona pulse is occurred and the number of corona pulse increases with the instantaneous applied voltage but peak value is not changed greatly.(2)Applied voltage to beccrite and characteristics and peak value of current are almost a straight line. That kind of tendency accorded with characteristics of beccrite resistance.(3)In case of Positive corona, Positive streamers, were progressed greatly to plane electrodes but In case of negative corona, negative streamers smaller than that of Positive corona.

• Korean Journal of Materials Research
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• v.12 no.5
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• pp.347-352
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• 2002

A transparent dielectric of the $PbO-B_2O_3-SiO_2-A1_2O_3$ system which was a low melting glass has been used for PDP (Plasma Display Panel), but it has a problem which is a reaction to be occurred between a transparent dielectric layer and electrodes (Ag, ITO) after firing. This research was conducted for ion migration of $Ag^+\$ and $Sn^ {2+}$ during firing three different frits of low melting glass. The result showed that yellowing phenomena occurred through a chemical reaction between $Ag^+\$and $Sn^ {2+}$ at 550~58$0^{\circ}C$ for 20~60 min. In addition, it was confirmed that the migration of $Sn^{2+}$ from ITO electrode made a strong effect on the yellowing phenomena.

• Electrical & Electronic Materials
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• v.1 no.1
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• pp.54-61
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• 1988

This paper was a study on dielectric phenomena of the specimen, Polypropylene films which were annealled in air and quenched in liquid nitrogen after aging for 5[hr] in water of 100[.deg.C]. The specimen was measured in temperature range of 15-120[.deg.C] and in frequency range of 30-1x 10$^{6}$ [HZ]. As the results of the study, it was confirmed that the tacticity of specimen was isotactic structure, and the degree of cryatallinity of the specimens calculated by means of Natta's method from XRD (X-ray Diffraction) spectrum was 55[%]. And for dielectric relaxation, .betha. peak-the tan .delta. (spectrum around 20[.deg.C])-attributed due to amorphous regions, and .alpha. peak - the tan .delta. spectrum around 90[.deg.C]-due to crystalline regions. It was identified that the degree of crystallinity of the specimen quenched in the liquid nitrogen was increased to 55-65[%], and that of the specimen annealled in the air was decreased to 55-50[%]. And activation energy from dielectric loss spectra was obtained 34.5[kcal/mole] for .alpha. peak and 80.5[kcal/mole] for .betha. peak, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.168-169
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• 2006

The physical properties of DMPC monolayer were made for dielectric relaxation phenomena by the detection of the surface pressures and displacements current. The phospolipid monolayer of dielectric relaxation takes a little time and depend on the molecular area.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.14 no.10
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• pp.802-807
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• 2001

The (S $r_{0.85}$C $a_{0.15}$)Ti $O_{3}$(SCT) thin films are deposited on Pt-coated electrode (Pt/TiN/ $SiO_2$/Si) using RF sputtering method. The composition of SCT thin films deposited on Si substrate at woom temperature is close to stoichiometry(1.102 in A/B ratio). The maximum dielectric constant of SCT thin films is obtained by annealing at 600[$^{\circ}C$]. The capacitance characteristics had a stable value within $\pm$4[%]. The drastic decrease of dielectric constant and increase of dielectric loss in SCT thin films is observed above 200[kHz]. SCT thin films used in this study show the phenomena of dielectric relaxation with the increase of frequencey.cey.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1989.06a
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• pp.63-65
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• 1989

Piezoelectric BaTiO$_3$-polymer composite were investigated for dielectric and piezoelectric properties with the barium titanate active particle size. Under the condition of the same density and ceramic volume ratio of composite, the dielectric and piezoelectric constant of composite are increasing as the ceramic particle size in composite are increasing. The surface layer model was quoted to explain these phenomena in our system and experimentally confirmed. The connectivity parameter of modified cube model of composite was calculated from the dielectric constant variation as their particle size. The connectivity parameter X and Y were 77.8% and 98.9% respectively. It means that the barium titanate particle distribution in composite nearly approach to the parallel mode. It was experimentally confirmed that the surface layer has low dielectric and nonferroelectric properties. Dielectric constant and thickness of surface layer were calculated from the equivalent circuit of composite.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07b
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• pp.822-825
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• 2003

Maxwell displacement current (MDC) measurement has been employed to study the dielectric property of Langmuir-films. A method for determining the dielectric relaxation time $\tau$ of floating monolayers on water surface is presented. WC flowing across monolayers is analyzed using a rod-like molecular model. It is revealed that the dielectric relaxation time $\tau$ of monolayers in the isotropic polar orientational phase is determined using a liner relationship between the monolayer compression speed ${\alpha}$ and the molecular area Am. Compression speed ${\alpha}$ was about 30, 40, 50mm/min.

• The Transactions of the Korean Institute of Electrical Engineers
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• v.37 no.12
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• pp.872-878
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• 1988

During the past few years, a great deal of attention has been directed to the application of superconductivity to the electrical systems such as superconducting power transmission lines, superconducting magnet energy storage and so on. Yet in order to develop the practical model of these electrical equiqments utilizing suprconductivety and other phenomena at cryogenic temperautre, it is necessary to know the dielectric behaviour of insulating materials at cryogenic temperature in view of reliability, safety and economy of these machines. Investigation of dielectric properties of cryogenic liquids is very important due to the dual role of those as the dielectric and cooling medium. In this study, we investigated results measured over several kinds of dielectric characteristics of liquid nitrogen taking into consideration for application of high Tc superconductor. Dependence of breakdown voltage of gap width, polarity and pressure is reported in this paper and time delay characteristics of breakdown is also the subject of this discussion.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.52 no.10
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• pp.436-440
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• 2003

The (S $r_{0.85}$C $a_{0.15}$)Ti $O_3$(SCT) thin films were deposited on Pt-coated electrode(Pt/TiN/ $SiO_2$/Si) using RF sputtering method according to the deposition condition. The optimum conditions of RF power and Ar/ $O_2$ ratio were 140[W] and 80/20, respectively. Deposition rate of SCT thin films was about 18.75[$\AA$/min] at the optimum condition. The composition of SCT thin films deposited on Si substrate is close to stoichiometry (1.102 in A/B ratio). The capacitance characteristics had a stable value within $\pm$4[%]. The drastic decrease of dielectric constant and increase of dielectric loss in SCT thin films were observed above 200[kHz]. SCT thin films used in this study showed the phenomena of dielectric relaxation with the increase of frequency.ncy.

• Journal of the Semiconductor & Display Technology
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• v.5 no.4 s.17
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• pp.5-9
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• 2006

The SCT thin films are deposited on Pt-coated electrode($Pt/TiN/SiO_2/Si$) using RF sputtering method with Sr/Ca ratio. The maximum grain of thin films is obtained by ratio of Ca at 15 mol%. The dielectric constant was increased with increasing the ratio of Ca, while it was decreased if the ratio of Ca exceeded over 15 mol%. The dielectric constant changes almost linearly in temperature ranges of $-80{\sim}+90$. All SCT thin films used in this study show the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200 kHz. The current-voltage characteristics of SCT thin films showed the increasing leakage current as the measuring temperature increases.