• Journal of the Korean Vacuum Society
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• v.5 no.2
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• pp.161-168
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• 1996

For the improvement of microelectronic thin film interconnection materials, dielectric passivation effects on the electromigration phenomena were studied. Using Al-1%Si, various shaped patterns were fabricated and dielectric passivation layers of several structures were deposited on the $SiO_2$ layer. Lifetime of straight pattern showed 2~5 times longer than the other patterns that had various line width and area. It is believed that the flux divergence due to the structural inhomogeneity and so the current crowding effects shorten the lifetime of thin film interconnections. The lifetime of thin film interconnections seems to depend on both the passivation materials and the passivation thickness. PSG/$SiO_2$ dielectric passivation layers showed longer lifetime than $Si_3N_4$ dielectric passivation layers. This results from the PSG on $SiO_2$ layer reduces stress and from the improvement of resistance to the moisture and to the mobile ion such as sodium. This is also believed that the lifetime of thin film interconnections seems to depend on the passivation thickness in case of the same deposition materials.

• Journal of the Semiconductor & Display Technology
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• v.23 no.2
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• pp.60-64
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• 2024

The threshold voltage shift in thin-film transistors (TFTs) is modeled using stretched-exponential (SE) and stretched-hyperbola (SH) functions. These models are derived by introducing empirical parameters into reaction rate equations that describe defect generation or charge trapping caused by hydrogen diffusion in the dielectric or interface. Separately, the dielectric relaxation phenomena are also described by the same reaction rate equations based on defect diffusion. Dielectric relaxation was initially modeled using the SE model, and various models have been proposed using fractional calculus. In this study, the characteristics of the threshold voltage shift and the dielectric relaxation phenomena are compared and analyzed to explore the applicability of analytical models used in the field of dielectric relaxation, in addition to the conventional SE and SH models.

• Korean Journal of Materials Research
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• v.9 no.4
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• pp.398-403
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• 1999

Studies on the electrical treeing deterioration and dielectric breakdown phenomena in the polymeric insulator of polyethylene and epoxy resin were carried out. Block type samples with needle-plane electrode geometry were electrically stressed and the tree pattern from the needle tip was observed. In LDPE the density of electrical tree was very high and its pattern was bush type. For the case of XLPE, branched tree was observed. As temperature and SN content increased, the dielectric breakdown voltage decreased and the treeing phenomena became more complicated. Fan type cracks were observed around the conducting tree path in the brittle DGEBA/MDA system.

• Journal of Electrical Engineering and Technology
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• v.10 no.2
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• pp.647-652
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• 2015

A fully coupled finite element analysis (FEA) technique was developed for analyzing the discharge phenomena and dielectric liquid flow while considering surface charge density effects in dielectric flow guidance. In addition, the simulated speed of surface charge propagation was compared and verified with the experimental results shown in the literature. Recently, electrohydrodynamics (EHD) techniques have been widely applied to enhance the cooling performance of electromagnetic systems by utilizing gaseous or liquid media. The main advantage of EHD techniques is the non-contact and low-noise nature of smart control using an electric field. In some cases, flow can be achieved using only a main electric field source. The driving sources in EHD flow are ionization in the breakdown region and ionic dissociation in the sub-breakdown region. Dielectric guidance can be used to enhance the speed of discharge propagation and fluidic flow along the direction of the electric field. To analyze this EHD phenomenon, in this study, the fully coupled FEA was composed of Poisson's equation for an electric field, charge continuity equations in the form of the Nernst-Planck equation for ions, and the Navier-Stokes equation for an incompressible fluidic flow. To develop a generalized numerical technique for various EHD phenomena that considers fluidic flow effects including dielectric flow guidance, we examined the surface charge accumulation on a dielectric surface and ionization, dissociation, and recombination effects.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07b
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• pp.1248-1251
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• 2005

In PDP, a transparent dielectric is formed on a front glass substrate so as to cover bus electrodes (Ag). During the fabrication process, sometimes, a transparent dielectric reacts with bus (Ag) electrode in the range of $560-600^{\circ}C$, and the reaction gives the dielectric its yellow coloration, what is called "yellowing phenomena". In this paper, we investigated the reaction between bus electrode and transparent dielectric covered with different frit content in Ag paste.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.2
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• pp.343-348
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• 2007

The physical properties of DMPC monolayer were made for dielectric relaxation phenomena by the detection of the surface pressures and displacements current. Lipid thin films were deposited by accumulation and the current was measured after the electric bias across the manufactured MIM device. It is found that the phospolipid monolayer of dielectric relaxation takes a little time and depend on the molecular area. When electric bias is applied across the manufactured MIM device by the deposition condition of phospolipid mono-layer, it wasn't breakdown when the higher electric field to impress by increase of deposition layers.

• Proceedings of the KIEE Conference
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• 1999.11d
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• pp.994-996
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• 1999

Hygrothermal aging at the elevated temperature induces the long-term degradation of the epoxy resin. We investigated the effects of hydrothermal stress on the dielectric breakdown phenomena of epoxy composite filled with natural zeolite. The cured specimens absorbed the moisture in the autoclave at $120^{\circ}C$. $T_g$ of the deteriorated composite by moisture absorption decreased. The dielectric breakdown strength decreased with the moisture absorption cycle. It was concluded that the thermal stress and the high water-vapour-pressure deteriorated the natural zeolite filled epoxy resin system, consequently and the tree growth rate increased.

• Journal of Korea Society of Industrial Information Systems
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• v.8 no.2
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• pp.1-6
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• 2003

A theoretical method for the TE polarized electromagnetic scattering on a periodic strip grating over a grounded dielectric slab is considered. The numerical results for an analysis of the plane wave scattering from the structure are presented such as normalized mode amplitude and relative reflected power against normalized dielectric slab height, relative reflected power against angle of incidence and distribution of strip current density. Detailed discussions on the Bragg blazing phenomena observed in the geometry are give.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.22 no.4
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• pp.605-610
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• 1997

An analysis method for the electromagnetic scattering of a Tm polarized plane wave from a periodic strip grating over a grounded dielectric slab is considered from the viewpoint of reflection grating problem. The parameters of strip gratings showing Bargg and Off-Bragg blazing phenomena at the frequency of 10GHz are derived teoretically. The strip grating structure is implemented using Aluminum plate(groung conductor), paraffin(dielectric material.epsilon.$_{r}$=2.24), and copper(strip conductor0.08m thickness). The experimental results(reflection power) of Bragg as well as Off-Bragg blazing phenomenon for TM polarized plane wave have been compared with the theoretical results and fairly good agreements between theory and experiment have been observed.d.

• 전기의세계
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• v.23 no.3
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• pp.60-66
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• 1974

This paper is to study on the phenomena that the compound dielectric strength through double layers of air-insulating oil dielectrics is much lower than that of air dielectrics only. the change of the dielectric strength by the variance of air gap depends on the characteristics of air gap discharge and, in case of commercial voltage, the degree of dependance is greeter than in case of direct current voltage.