• Title/Summary/Keyword: Dielectric Characteristics

Search Result 2,350, Processing Time 0.036 seconds

Dielectric Polymers for OTFT Application

  • Choi, Sung-Lan;Kim, Yeon-Ok;Kim, Hong-Doo
    • Journal of Information Display
    • /
    • v.11 no.3
    • /
    • pp.95-99
    • /
    • 2010
  • A series of new dielectric polymers with phenyl, epoxy, and carboxylicacid functional groups was prepared via free-radical polymerization. The effect of such dielectric polymers with various functional groups on the performance of OTFT was investigated. The nonpolar groups of terpolymer made the surface of the dielectric layer more hydrophobic and improved the crystal growth of pentacene on the gate insulator, resulting in higher mobility. By controlling the functional group, the electric characteristics of OTFT performance was varied, with $0.00017-0.15\;cm^2/V{\cdot}s$ mobility.

Simulation on Surface Tracking Pattern using the Dielectric Breakdown Model

  • Kim, Jun-Won;Roh, Young-Su
    • Journal of Electrical Engineering and Technology
    • /
    • v.6 no.3
    • /
    • pp.391-396
    • /
    • 2011
  • The tracking pattern formed on the dielectric surface due to a surface electrical discharge exhibits fractal structure. In order to quantitatively investigate the fractal characteristics of the surface tracking pattern, the dielectric breakdown model has been employed to numerically generate the surface tracking pattern. In dielectric breakdown model, the pattern growth is determined stochastically by a probability function depending on the local electric potential difference. For the computation of the electric potential for all points of the lattice, a two-dimensional discrete Laplace equation is solved by mean of the successive over-relaxation method combined to the Gauss-Seidel method. The box counting method has been used to calculate the fractal dimensions of the simulated patterns with various exponent $\eta$ and breakdown voltage $\phi_b$. As a result of the simulation, it is found that the fractal nature of the surface tracking pattern depends strongly on $\eta$ and $\phi_b$.

Fabrication and Properties of SCT Thin Film by RF Sputtering Method (RF 스퍼터링법에 의한 SCT 박막의 제조 및 특성)

  • 김진사;김충혁
    • The Transactions of the Korean Institute of Electrical Engineers C
    • /
    • v.52 no.10
    • /
    • pp.436-440
    • /
    • 2003
  • The (S $r_{0.85}$C $a_{0.15}$)Ti $O_3$(SCT) thin films were deposited on Pt-coated electrode(Pt/TiN/ $SiO_2$/Si) using RF sputtering method according to the deposition condition. The optimum conditions of RF power and Ar/ $O_2$ ratio were 140[W] and 80/20, respectively. Deposition rate of SCT thin films was about 18.75[$\AA$/min] at the optimum condition. The composition of SCT thin films deposited on Si substrate is close to stoichiometry (1.102 in A/B ratio). The capacitance characteristics had a stable value within $\pm$4[%]. The drastic decrease of dielectric constant and increase of dielectric loss in SCT thin films were observed above 200[kHz]. SCT thin films used in this study showed the phenomena of dielectric relaxation with the increase of frequency.ncy.

Dielectric and Electric Properties of Maleate Copolymer LB Films (Maleate계 공중합체 LB막의 전기 및 유전 특성)

  • 유승엽;정상범;박재철;권영수
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 1996.11a
    • /
    • pp.397-400
    • /
    • 1996
  • We investigated electric and dielectric properties of MIM device using Maleate Copolymer LB films. The thickness of maleate copolymer LB film by ellipsometry measurements and X-ray diffraction pattern was about 27~30[ ]. The maleate copolymer 13 film have the property of insulator like organic ultra-thin film. The electric conduction was Schottky current measured by I-V characteristics, and the conductivity was 10$^{-15}$ ~10$^{-14}$ [S/cm]. Dielectric constant was about 5.0~6.0 by various measurement: I-V, frequency-depenent dielectric properties. Schottky barrier was about 0.9 ~1.0(eV). By relation between log I and 1/T, activation energy baa 0.74(eV). Frequency-depenent dielectric properties wart orientational polarization by the dipole.

  • PDF

A study on Dielectric Properties usig PMN Ceramics with $MnO_2$ substitution ($MnO_2$치환된 PMN계 세라믹스의 유전특성)

  • Ji, S.H.;You, D.H.;Lee, Y.H.;Kim, Y.I.;Park, K.H.;Lee, D.C.
    • Proceedings of the KIEE Conference
    • /
    • 1997.07d
    • /
    • pp.1537-1539
    • /
    • 1997
  • In this study, the dielectric properties of $Pb(Mg_{1/3}Nb_{2/3})O_3-PbTiO_3$ Ceramics have been investigated as a addition of the amount of $MnO_2(0{\leq}x{\leq}0.9wt%)$. The Temperature-dependant dielectric characteristics of 0.9PMN-0.1PT relaxor ferroelectric system were improved by enhencing the extent of the diffuse phase transition(DPT). The maximum dielectric permittivity decreased by substitution $MnO_2$ and the dielectric loss decreased with increasing $MnO_2$ substitution amount. It is expected decreasing in inner heat energy for temperature with increasing $MnO_2$ substitution.

  • PDF

Effects of Sr/Ca Ratio of SCT thin film by RF Sputtering Method (RF 스퍼터링법에 의한 SCT 박막의 Sr/Ca 비율 영향)

  • Kim, Jin-Sa;Oh, Yong-Cheul
    • Journal of the Semiconductor & Display Technology
    • /
    • v.5 no.4 s.17
    • /
    • pp.5-9
    • /
    • 2006
  • The SCT thin films are deposited on Pt-coated electrode($Pt/TiN/SiO_2/Si$) using RF sputtering method with Sr/Ca ratio. The maximum grain of thin films is obtained by ratio of Ca at 15 mol%. The dielectric constant was increased with increasing the ratio of Ca, while it was decreased if the ratio of Ca exceeded over 15 mol%. The dielectric constant changes almost linearly in temperature ranges of $-80{\sim}+90$. All SCT thin films used in this study show the phenomena of dielectric relaxation with the increase of frequency, and the relaxation frequency is observed above 200 kHz. The current-voltage characteristics of SCT thin films showed the increasing leakage current as the measuring temperature increases.

  • PDF

Dielectric Relaxation Characteristics of Phospholipid Membrane (인지질막의 유전완화 특성)

  • 이경섭;조수영;박석순;정헌상;최영일
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 1998.06a
    • /
    • pp.173-176
    • /
    • 1998
  • We experimentally investigated the dielectric relaxation phenomena of a liquid crystal monolayers by the Displacement current techique and displacement current flowing across monolayers is analyzed using rod-like molecular model. It is revealed that the dielectric reaxation time $\tau$ of monolaters in the isotropic polar orientational phase is determined using a linear relashionship between the monolayers compression speed $\alpha$ and the molecular area. The dielectric relaxation time of phospholipid monolayers was examined on the basis of the analysis developed here.

  • PDF

Dielectric Relaxation Characteristics of Biology Thin Film (생체박막의 유전완화특성)

  • Song, Jin-Won;Cho, Su-Young;Lee, Kyung-Sup;Sin, Hun-Gyu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2003.05c
    • /
    • pp.107-110
    • /
    • 2003
  • In this paper, We introduced that the method for determing the dielectric relaxation time $\tau$ of floating monolayers on water interface. Displacement current flowing across monolayers is analyzed using a rod-like molecular model. It is revealed that the dielectric relaxation time $\tau$of monolayers in the isotropic polar orientational phase is determined using a linear relationship between the monolayer compression speed $\alpha$ and the molecular area Am. here Displacement current gives a peak at A = Am. The dielectric relaxation time $\tau$ of organic monolayers was examined on the basis of the analysis developed here.

  • PDF

Effects of RTA on the Properties of SBNO Thin Film (SBNO 박막의 특성에 미치는 RTA 영향)

  • Kim, Jin-Sa
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.25 no.11
    • /
    • pp.926-929
    • /
    • 2012
  • The $Sr_{0.7}Bi-{2.3}Nb_2O_9$(SBNO) thin films were deposited on Si substrate by RF magnetron sputtering method at $300^{\circ}C$ of substrate temperature. And the SBNO thin films were annealed at $650{\sim}800^{\circ}C$ using RTA (rapid thermal annealing). The grain of SBNO thin films were increased with the increase of annealing temperature. The dielectric constant (100) of SBNO thin film was obtained by RTA above $750^{\circ}C$. The voltage dependence of dielectric loss showed a value within 0.03 in voltage ranges of -5~+5 V. Also, the dielectric constant characteristics showed a stable value with the increase of frequency.

Linear and Nonlinear Dielectric Ceramics for High-Power Energy Storage Capacitor Applications

  • Peddigari, Mahesh;Palneedi, Haribabu;Hwang, Geon-Tae;Ryu, Jungho
    • Journal of the Korean Ceramic Society
    • /
    • v.56 no.1
    • /
    • pp.1-23
    • /
    • 2019
  • Dielectric materials with inherently high power densities and fast discharge rates are particularly suitable for pulsed power capacitors. The ongoing multifaceted efforts on developing these capacitors are focused on improving their energy density and storage efficiency, as well as ensuring their reliable operation over long periods, including under harsh environments. This review article summarizes the studies that have been conducted to date on the development of high-performance dielectric ceramics for employment in pulsed power capacitors. The energy storage characteristics of various lead-based and lead-free ceramics belonging to linear and nonlinear dielectrics are discussed. Various strategies such as mechanical confinement, self-confinement, core-shell structuring, glass incorporation, chemical modifications, and special sintering routes have been adopted to tailor the electrical properties and energy storage performances of dielectric ceramics. In addition, this review article highlights the challenges and opportunities associated with the development of pulsed power capacitors.