• 품질경영학회지
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• 제31권1호
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• pp.132-141
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• 2003

As the technology has improved and demands of customers have varied, a lot of products are getting diverse and intricate. Consequently, the enterprise that produce products have to simultaneously consider the various variables for the very products. There are some scheme, such as Multivariate control chart and Demerit control chart, designed to simultaneously monitor the variables in the process. In this paper, we present an effective method for process control using the Demerit-CUSUM control chart in the process where nonconforming units or nonconformities are occured by various types. In addition, we show interpretation method for abnormal signal in order to quickly detect the assignable causes as Demerit-CUSUM control chart signals abnormality. we compare performance of Demerit control chart and Demerit-CUSUM control chart using example again used in the existing studies, and present result of performance accoriding to changing sample size and parameter.

• 산업경영시스템학회지
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• 제32권1호
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• pp.94-101
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• 2009

Complex Products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. Demerit systems are very effective systems to monitoring the different types of defects. So, classical demerit control chart used to monitor counts of several different types of defects simultaneously in complex products. S.M. Na et al.(2003) proposed the Demerit-CUSUM for the improvement of the demerit control chart performance and Nembhard, D. A. et al.(2001) and G.Y Cho et al.(2004) developed a Demerit control chart using the EWMA technique and evaluated the performance of the control chart. In this paper, we present an effective method for process control using the Demerit-CUSUM with fast initial response. Moreover, we evaluate exact performance of the Demerit-CUSUM control chart with fast initial response, Demerit-CUSUM and Demerit-EWMA according to changing sample size or parameters.

• 산업경영시스템학회지
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• 제33권2호
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• pp.9-17
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• 2010

Complex products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. So, demerit systems are very effective systems to monitor the different types of defects. Recently, Kang et al.(2009) proposed the revised Demerit-CUSUM for the evaluation of the Demerit-CUSUM control chart performance exactly. In this paper, we present an advanced Demerit control chart using the double EWMA technique. The double EWMA technique is very efficient and strong method for process control where defects and nonconformities occur with various defect types. Moreover, we compare exact performance of Demerit-CUSUM, Demerit-EWMA and Demerit-DEWMA control chart according to changing sample size or mean shifts magnitude. By the result, we confirm that the performance of Demerit-DEWMA control chart is more than the performance of the Demerit-CUSUM and Demerit-EWMA control chart.

• 한국데이터정보과학회:학술대회논문집
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• 한국데이터정보과학회 2004년도 춘계학술대회
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• pp.7-14
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• 2004

In this paper, we present an effective method for process control using the Demerit-EWMA control chart in the process where nonconforming units or nonconformities are occurred by various types. We compare performance of Demerit control chart, Demerit-CUSUM control chart and Demerit-EWMA control chart based on the average run length.

• Journal of the Korean Data and Information Science Society
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• 제15권2호
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• pp.431-439
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• 2004

In this paper, we present an effective method for process control using the Demerit-EWMA control chart in the process where nonconforming units or nonconformities are occurred by various types. We compare performance of Demerit control chart, Demerit-CUSUM control chart and Demerit-EWMA control chart based on the average run length(ARL).