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Evaluation of Demerit-CUSUM Control Chart Performance Using Fast Initial Response  

Kang, Hae-Woon (Dept. of Industrial Engineering, Hanyang University)
Kang, Chang-Wook (Dept. of Information and Industrial Engineering, Hanyang University)
Baik, Jae-Won (Dept. of Industrial Engineering, Hanyang University)
Nam, Sung-Ho (Dept. of Manufacturing Convergence R&D, Korea Institute of Industrial Technology)
Publication Information
Journal of Korean Society of Industrial and Systems Engineering / v.32, no.1, 2009 , pp. 94-101 More about this Journal
Abstract
Complex Products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. Demerit systems are very effective systems to monitoring the different types of defects. So, classical demerit control chart used to monitor counts of several different types of defects simultaneously in complex products. S.M. Na et al.(2003) proposed the Demerit-CUSUM for the improvement of the demerit control chart performance and Nembhard, D. A. et al.(2001) and G.Y Cho et al.(2004) developed a Demerit control chart using the EWMA technique and evaluated the performance of the control chart. In this paper, we present an effective method for process control using the Demerit-CUSUM with fast initial response. Moreover, we evaluate exact performance of the Demerit-CUSUM control chart with fast initial response, Demerit-CUSUM and Demerit-EWMA according to changing sample size or parameters.
Keywords
Demerit-CUSUM Control Chart; Statistical Process Control(SPC); Fast Initial Response;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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1 Chang, F. M., Chen, L. H., Chen, Y. L., and Huang, C. Y.; "Approximate distribution of demerit statistic-A bounding approach," Computational Statistics and Data Analysis, 52(7) : 3300-3309, 2008   DOI   ScienceOn
2 Chimka, J. R., and Arispe, P. V.; "New Demerit Control Limits for Poisson Distributed Defects," Quality Engineering, 18(4) : 461-467, 2006   DOI   ScienceOn
3 Nembhard, D. A., and Nembhard, H. B.; "A Demerit Control Chart for Autocorrelated Data," Quality Engineering, 13(2) : 179-190, 2001   DOI   ScienceOn
4 Lu, C. W., and Reynolds, M. R.; "EWMA control charts for monitoring the mean of autocorrelated processes," Journal of Quality Technology, 31(2) : 166-188, 1999   ScienceOn
5 Dodge, H. F., and Torrey, M. N.; "A Check Inspection and Demerit Rating Plan," Journal of Quality Technology, 9(3) : 146-156, 1997
6 Chang, J. T., and Fricker, R. D.; "Detecting when a monotonically increasing mean has crossed a threshold," Journal of Quality Technology, 31(2) : 217-234, 1999   ScienceOn
7 Na, S. M., Kang, C. W., and Sim, S. B.; "A Study of Demerit-CUSUM Control Chart and Interpretation Method," Journal of the Korean Society for Quality Managements, 31(1) : 132-141, 2003   과학기술학회마을
8 Montgomery, D. C.; Introduction to Statistical Quality Control, 5th Edition, John Wiley & Sons, Inc., New York: 300-416, 2005
9 Vargas, V. C., Lopes, L. F., and Souza, A. M.; "Comparative study of the perfermance of the CuSum and EWMA control charts," Computers & Industrial Engineering, 46(4) : 707-724, 2004   DOI   ScienceOn
10 Jones, L. A., Woodall, W. H., and Conerly, M. D.; "Exact Properties of Demerit Control Charts," Journal of Quality Technology, 31(2) : 207-216, 1999   ScienceOn
11 Cho, G. Y., and Jeon, Y. M.; "A Study of Demerit-EWMA Control Charts," Journal of the Korean Data & Information Science Society, 15(2) : 431-439, 2004   과학기술학회마을   ScienceOn
12 Lucas, J. M., and Crosier, R. B.; "Fast Initial Response for CUSUM Quality-Control Schemes," Technometrics, 24(3) : 199-205, 1982   DOI   ScienceOn
13 Hawkins, D. M.; "Cumulative Sum Control Charting : An Underutilized SPC Tool," Quality Engineering, 5(3) : 463-477, 1993   DOI   ScienceOn
14 Chimka, J. R., and Vanessa Cabrera Arispe, P.; "Type II Errors of Demerit Control Charts," Quality Engineering, 19(3) : 207-214, 2007   DOI   ScienceOn