• Journal of the Semiconductor & Display Technology
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• v.13 no.3
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• pp.1-6
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• 2014

Visual defect inspection for electronics parts manufacturing processes is comprised of 2 steps - automatic visual inspection by machine and inspection by human inspectors. It is necessary that spatial points which were detected by the machine should be adequately clustered for subsequent human inspection. This research deals with the spatial clustering algorithm for the purpose of process productivity improvement. Distribution based clustering is newly developed and experimentally confirmed to show better clustering efficiency than existing algorithm - area based clustering.

• Journal of Korea Multimedia Society
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• v.15 no.9
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• pp.1149-1155
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• 2012

In this paper, we propose cause diagnosis method of semiconductor defects from semiconductor industrial images. Our method constructs feature database (DB) of defect images. Then, defect and input images are subdivided by uniform block. And the block similarity is measured using histogram kai-square distance after color histogram calculation. Then, searched blocks in each image are merged into connected objects using clustering. Finally, the most similar defect image from feature DB is searched with the defect cause by measuring cluster similarity based on features of each cluster. Our method was validated by calculating the search accuracy of n output images having high similarity. With n = 1, 2, 3, the search accuracy was measured to be 100% regardless of defect categories. Our method could be used for the industrial applications.

• Journal of Information Processing Systems
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• v.13 no.6
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• pp.1467-1486
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• 2017

Fuzzy co-clustering is sensitive to noise data. To overcome this noise sensitivity defect, possibilistic clustering relaxes the constraints in FCM-type fuzzy (co-)clustering. In this paper, we introduce a new possibilistic fuzzy co-clustering algorithm based on information bottleneck (ibPFCC). This algorithm combines fuzzy co-clustering and possibilistic clustering, and formulates an objective function which includes a distance function that employs information bottleneck theory to measure the distance between feature data point and feature cluster centroid. Many experiments were conducted on three datasets and one artificial dataset. Experimental results show that ibPFCC is better than such prominent fuzzy (co-)clustering algorithms as FCM, FCCM, RFCC and FCCI, in terms of accuracy and robustness.

• Journal of the Korea Society of Computer and Information
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• v.23 no.9
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• pp.81-86
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• 2018

Software defect severity is very important in projects with limited historical data or new projects. But general software defect prediction is very difficult to collect the label information of the training set and cross-project defect prediction must have a lot of data. In this paper, an unclassified data set with defect severity is clustered according to the distribution ratio. And defect severity-based prediction model is proposed by way of labeling. Proposed model is applied CLAMI in JM1, PC4 with the least ambiguity of defect severity-based NASA dataset. And it is evaluated the value of ACC compared to original data. In this study experiment result, proposed model is improved JM1 0.15 (15%), PC4 0.12(12%) than existing defect severity-based prediction models.

• Nuclear Engineering and Technology
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• v.50 no.6
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• pp.907-914
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• 2018

In this article, we conducted molecular dynamics simulations to investigate the effect of applied strain and temperature on irradiation-induced damage in alpha-zirconium. Cascade simulations were performed with primary knock-on atom energies ranging between 1 and 20 KeV, hydrostatic and uniaxial strain values ranging from -2% (compression) to 2% (tensile), and temperatures ranging from 100 to 1000 K. Results demonstrated that the number of defects increased when the displacement cascade proceeded under tensile uniaxial hydrostatic strain. In contrast, compressive strain states tended to decrease the defect production rate as compared with the reference no-strain condition. The proportions of vacancy and interstitial clustering increased by approximately 45% and 55% and 25% and 32% for 2% hydrostatic and uniaxial strain systems, respectively, as compared with the unstrained system, whereas both strain fields resulted in a 15-30% decrease in vacancy and interstitial clustering under compressive conditions. Tensile strains, specifically hydrostatic strain, tended to produce larger sized vacancy and interstitial clusters, whereas compressive strain systems did not significantly affect the size of defect clusters as compared with the reference no-strain condition. The influence of the strain system on radiation damage became more significant at lower temperatures because of less annealing than in higher temperature systems.

• Nuclear Engineering and Technology
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• v.55 no.6
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• pp.2298-2304
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• 2023

Titanium alloys are expected to become one of the candidate materials for nuclear-powered spacecraft due to their excellent overall performance. Nevertheless, atomistic mechanisms of the defect accumulation and evolution of the materials due to long-term exposure to irradiation remain scarcely understood by far. Here we investigate the heavy irradiation damage in a-titanium with a dose as high as 4.0 canonical displacements per atom (cDPA) using atomistic simulations of Frenkel pair accumulation. Results show that the content of surviving defects increases sharply before 0.04 cDPA and then decreases slowly to stabilize, exhibiting a strong correlation with the system energy. Under the current simulation conditions, the defect clustering fraction may be not directly dependent on the irradiation dose. Compared to vacancies, interstitials are more likely to form clusters, which may further cause the formation of 1/3<1210> interstitial-type dislocation loops extended along the (1010) plane. This study provides an important insight into the understanding of the irradiation damage behaviors for titanium.

• The Journal of the Convergence on Culture Technology
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• v.9 no.2
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• pp.561-568
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• 2023

Various defects occur in concrete structures due to internal and external environments. If there is a defect, it is important to efficiently identify and maintain it because there is a problem with the structural safety of concrete. However, recent deep learning research has focused on cracks in concrete, and studies on exfoliation and contamination are lacking. In this study, focusing on exfoliation and contamination, which are difficult to label, four models were developed and their performance evaluated through unlabelling method, filtering method, the convergence of transfer learning based k-means clustering. As a result of the analysis, the convergence model classified the defects in the most detail and could increase the efficiency compared to direct labeling. It is hoped that the results of this study will contribute to the development of deep learning models for various types of defects that are difficult to label in the future.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.32 no.3
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• pp.99-109
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• 2009

Negative binomial yield model for semiconductor manufacturing consists of two parameters which are the average number of defects per die and the clustering parameter. Estimating the clustering parameter is quite complex because the parameter has not clear closed form. In this paper, a Bayesian approach using Markov Chain Monte Carlo is proposed to estimate the clustering parameter. To find an appropriate estimation method for the clustering parameter, two typical estimators, the method of moments estimator and the maximum likelihood estimator, and the proposed Bayesian estimator are compared with respect to the mean absolute deviation between the real yield and the estimated yield. Experimental results show that both the proposed Bayesian estimator and the maximum likelihood estimator have excellent performance and the choice of method depends on the purpose of use.

• KIISE Transactions on Computing Practices
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• v.22 no.12
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• pp.681-686
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• 2016

Software defect prediction is an important factor in efficient project management and success. The severity of the defect usually determines the degree to which the project is affected. However, existing studies focus only on the presence or absence of a defect and not the severity of defect. In this study, we proposed an ensemble model using FCM based on defect severity. The severity of the defect of NASA data set's PC4 was reclassified. To select the input column that affected the severity of the defect, we extracted the important defect factor of the data set using Random Forest (RF). We evaluated the performance of the model by changing the parameters in the 10-fold cross-validation. The evaluation results were as follows. First, defect severities were reclassified from 58, 40, 80 to 30, 20, 128. Second, BRANCH_COUNT was an important input column for the degree of severity in terms of accuracy and node impurities. Third, smaller tree number led to more variables for good performance.

• Journal of Korean Institute of Industrial Engineers
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• v.40 no.3
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• pp.257-266
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• 2014

The semiconductor manufacturing industry is managed by a number of parameters from the FAB which is the initial step of production to package test which is the final step of production. Various methods for prediction for the quality and yield are required to reduce the production costs caused by a complicated manufacturing process. In order to increase the accuracy of quality prediction, we have to extract the significant features from the large amount of data. In this study, we propose the method for extracting feature from the cell level data of probe test process using OPTICS which is one of the density-based clustering to improve the prediction accuracy of the quality of the assembled chips that will be placed in a package test. Two features extracted by using OPTICS are used as input variables of quality prediction model because of having position information of the cell defect. The package test progress for chips classified to the correct quality grade by performing the improved prediction method is expected to bring the effect of reducing production costs.