• Journal of the Korean Vacuum Society
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• v.19 no.3
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• pp.177-183
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• 2010

We report on the deposition of ZnO films using a metal organic chemical vapor deposition (MOCVD) as a function of pushing pressure and kind of reactant such as oxygen gas and water A diethylzinc (DEZ) is supplied and controlled by Ar pushing pressure through bubbling system. Oxygen gas and water are used as reactant in order to form oxidation. We knew that the surface roughness is related in the process conditions such as reactant kind and DEZ flow rate. A substrate temperature has little role of surface roughness with $O_2$ reactant. However, $H_2O$ reactant makes it to increase over the 20 times. We could get the maximum roughness of 39.16 nm at the 90 sccm of DEZ Ar flow rate, the 8 Pa of $H_2O$ vapor pressure, and the $140^{\circ}C$ of substrate temperature. In this paper, we investigated the ZnO films for the application to the light absorption layer of solar cell layer.

• Korean Journal of Materials Research
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• v.20 no.9
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• pp.463-466
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• 2010

We studied the initial reaction mechanism of Zn precursors, namely, di-methylzinc ($Zn(CH_3)_2$, DMZ) and diethylzinc ($Zn(C_2H_5)_2$, DEZ), for zinc oxide thin-film growth on a Si (001) surface using density functional theory. We calculated the migration and reaction energy barriers for DMZ and DEZ on a fully hydroxylized Si (001) surface. The Zn atom of DMZ or DEZ was adsorbed on an O atom of a hydroxyl (-OH) due to the lone pair electrons of the O atom on the Si (001) surface. The adsorbed DMZ or DEZ migrated to all available surface sites, and rotated on the O atom with low energy barriers in the range of 0.00-0.13 eV. We considered the DMZ or DEZ reaction at all available surface sites. The rotated and migrated DMZs reacted with the nearest -OH to produce a uni-methylzinc ($-ZnCH_3$, UMZ) group and methane ($CH_4$) with energy barriers in the range of 0.53-0.78 eV. In the case of the DEZs, smaller energy barriers in the range of 0.21-0.35 eV were needed for its reaction to produce a uni-ethylzinc ($-ZnC_2H_5$, UEZ) group and ethane ($C_2H_6$). Therefore, DEZ is preferred to DMZ due to its lower energy barrier for the surface reaction.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.26 no.2
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• pp.109-113
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• 2013

ZnO thin films were synthesized on Si substrates by MOCVD using diethyl zinc as a precursor. Effects of $O_2$/DEZ gas mixing ratio on the growth rate, surface morphology, preferred orientation, and electrical properties of the ZnO thin films were investigated with SEM, XRD, and Hall measurement. The surface reflectance variations of ZnO thin films were analyzed using laser-photometer apparatus. As the $O_2$/DEZ mixing ratio increased, growth rate and $I_{(002)}/I_{(101)}$ in XRD of ZnO thin films decreased, and the crystal structure was changed from columnar to planar structure. All ZnO films deposited at various CVD conditions exhibited c-axis (002) plane preferred orientation. The electrical properties of ZnO thin films mainly depended on the carrier mobility.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.178-178
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• 2010

We have deposited aluminum-doped ZnO thin films on borosilicate glass by atomic layer deposition. Diethylzinc (DEZ) and dimethylaluminum isopropoxide (DMAIP) were used as the metal precursor and the Al-dopant, respectively. Water was used as an oxygen source. DMAIP was successfully used as an aluminum precursor for chemical vapor deposition and ALD. All deposited films showed n-type conduction. The resistivity decreased to a minimum and then increased with increasing the aluminum content. The carrier concentration increased and the carrier mobility decreased with increasing the DMAIP to DEZ pulse ratio. The average optical transmittance was nearly 80 % in the visible part of the spectrum. The absorption edge moved to the shorter wavelength region with increasing the DMAIP to DEZ pulse ratio. Our results indicate that DMAIP is suitable for Al doping of ZnO films.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.49-49
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• 2011

실리콘 태양전지에 사용되는 ZnO 박막의 특성은 적외선과 가시광선 영역에서 높은 투과도 (>80%)와 낮은 비저항(<10-2) 외에 산란(scattering)에 의한 빛의 광학적 경로(optical path) 증가로 활성층(active layer)에서의 광 흡수도 증가 및 입사광의 재반사를 방지할 수 있는 표면 형상(morphology)의 제어가 중요하다. 일반적으로 우선 배향성(preferred orientation)이 <0002>방향으로 texturing된 ZnO박막보다 <1120>방향으로 texturing된 박막이 더 우수한 광 산란 효과를 보인다. 따라서, 이 논문에서는 유기화학증착공정으로 증착한 ZnO 박막의 texture 형성에 있어 박막 증착 온도 및 원료로 사용하는 DEZ(Diethylzinc)와 H2O의 상대농도 변화에 따른 texture 방향의 변화에 대해 고찰하였다. 반응기내의 압력을 0.67 torr로고정하고 기판온도를 $90^{\circ}C$에서 $170^{\circ}C$까지 $20^{\circ}C$간격으로 증가시키고, $120^{\circ}C$에서 H2O/DEZ의 비를 0.1에서 4까지 변화시켰다. 기판온도가 증가함에 따라 ZnO박막의 texture 방향은 <0002>에서 <1120> 방향으로 변화하였다. 또한 $120^{\circ}C$에서 H2O/DEZ 비가 증가함에 따라 ZnO 박막의 texture 방향은 <0002>에서 <1120> 방향으로 변화하였다. 이에 따른 광투과, 광산란 특성과 전기적 특성의 변화를 조사하였다.

• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.312.1-312.1
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• 2016

We have deposited ZnO thin films by ultraviolet (UV) enhanced atomic layer deposition using diethylznic (DEZ) and water (H2O) as precursors with UV light. The atomic layer deposition relies on alternating dose of the precursor on the surface and subsequent chemisorption of the precursors with self-limiting growth mechanism. Though ALD is useful to deposition conformal and precise thin film, the surface reactions of the atomic layer deposition are not completed at low temperature in many cases. In this experiment, we focused on the effects of UV radiation during the ALD process on the properties of the inorganic thin films. The surface reactions were found to be complementary enough to yield uniform inorganic thin films and fully react between DEZ and H2O at the low temperature by using UV irradiation. The UV light was effective to obtain conductive ZnO film. And the stability of TFT with UV-enhanced ZnO was improved than ZnO by thermal ALD method. High conductive UV-enhanced ZnO film have the potential to applicability of the transparent electrode.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2015.05a
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• pp.103-104
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• 2015

정확한 두께와 조성 제어, 훌륭한 재현성의 박막을 형성할 수 있는 Atomic layer deposition 방법으로 증착시킨 ZnO 박막은 여러 분야에 적용될 수 있기 때문에 최근 많은 주목을 받고 있다. ALD-ZnO 박막을 형성하기 위하여 가장 흔히 사용되는 전구체 (precursor)와 반응체 (reactant)는 DEZ(DiethylZinc)와 $H_2O$이다. 그러나 DEZ 전구체를 사용한 ALD-ZnO 박막은 낮은 열적 안정성이 문제로 지적되어져 왔으며, 또한 여러 분야의 적용 및 산업화를 위해서는 높은 증착률, 큰 범위의 전기적 저항, 높은 투과도가 필요로 한다. 본 연구에서는 atomic layer deposition 기법을 통해 열적 안정성을 가진 새로운 전구체인 DEZDMEA ($Et_2Zn:NEtMe_2$)을 사용하여 ZnO 박막을 증착하였다. DEZDMEA ($Et_2Zn:NEtMe_2$) 및 $H_2O$ 주입 시간에 따른 증착률와 전기적 성질, 투과도를 조사하였다.

• 한국신재생에너지학회:학술대회논문집
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• 2011.05a
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• pp.121.2-121.2
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• 2011

Aluminum-doped Zinc Oxide (AZO) is considered as an excellent candidate to replace Indium Tin Oxide (ITO), which is widely used as transparent conductive oxide (TCO) for electronic devices such as liquid crystal displays (LCDs), organic light emitting diodes (OLEDs) and organic solar cells (OSCs). In the present study, AZO thin film was applied to the transparent electrode of a channel-shaped flexible organic solar cell using a low-temperature selective-area atomic layer deposition (ALD) process. AZO thin films were deposited on Poly-Ethylene-Naphthalate (PEN) substrates with Di-Ethyl-Zinc (DEZ) and Tri-Methyl-Aluminum (TMA) as precursors and $H_2O$ as an oxidant for the atomic layer deposition at the deposition temperature of $130^{\circ}C$. The pulse time of TMA, DEZ and $H_2O$, and purge time were 0.1 second and 20 second, respectively. The electrical and optical properties of the AZO films were characterized as a function of film thickness. The 300 nm-thick AZO film grown on a PEN substrate exhibited sheet resistance of $87{\Omega}$/square and optical transmittance of 84.3% at a wavelength between 400 and 800 nm.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.166.2-166.2
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• 2014

In this work, we demonstrated a facile and effective method for deposition of metal tetraphenylporphyrin (MTPP) thin film by a combined a thermal evaporation (TE) and atomic layer deposition (ALD). For the deposition of Zn-TPP thin film, Tetraphenylporphyrin (TPP) and diethyl zinc (DEZ) were used as organic and inorganic materials, respectively. Optimum conditions for the deposition of Zn-TPP thin film were established systematically: (1) the exposure time of DEZ as inorganic precursor and (2) the substrate temperature were adjusted, respectively. As a result, we verified that the surface reaction between organic semiconductor (TPP) and metal atom (Zn) was ALD process. In addition, we calculated activation energy by using Arrhenius equation for the substrate temperature versus area change rate of pyrrolic nitrogen. The surface and interface reactions between TPP with Zn were investigated by X-ray photoelectron spectroscopy, Raman spectroscopy, UV-vis spectroscopy, and scanning electron microscopy. These results show a facile and well-controllable fabrication technique for the metal-organic thin film for future electronic applications.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.201.2-201.2
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• 2013

원자층 증착법(ALD)을 통해 최적의 Al doped ZnO (AZO)박막을 얻기 위해 기판온도와 Al도핑농도 등의 공정변수를 조절하여 최적의 성막 조건 연구특성을 분석하였다. 증착당시 Zn와 Al의 precursors는 diethylzinc(DEZ), trimethylaluminum(TMA)을 각각 사용하였으며, reactants로는 Deionized water를 사용하였다. DEZ와 TMA의 증착비율을 통하여 1%에서 12%까지 Al의 도핑농도를 조절하였다. 이후 Hall effect measurement를 이용하여 기판온도와 Al도핑농도에 따른 AZO박막의 운반자 농도, 이동도, 저항을 분석했고, X-ray diffraction을 통하여 물리적 구조의 변화를 관측했다. 공정 최적화를 통하여 Al도핑농도의 변화가 AZO박막의 전기적 특성에 미치는 영향을 해석하였다. 또한, 공정의 최적화 이후 AZO박막을 나노 구조체 석영(quartz)기판위에 250도의 온도에서 Al ~3%의 농도로 10nm부터 150nm까지의 두께로 증착하였다. SEM 분석을 통해 나노 구조체 기판에 균일한 AZO 박막이 형성되었는지 확인하였고, AZO박막의 두께에 따른 전기적 특성 및 광 투과도를 측정한 결과 나노구조체 석영 기판위에 증착된 AZO박막은 가시광선 영역에서 80%이상의 광 투과도를 보였으며 ${\sim}10^{-3}{\Omega}cm$의 저항을 보였다.