• 제목/요약/키워드: DC sputtering deposition

검색결과 352건 처리시간 0.028초

에너지 반환회로를 갖는 비대칭 펄스형 DC 플라즈마 전원장치에 관한 연구 (A Study on Asymmetric Pulsed DC Plasma Power Supply with Energy Recovery Circuit)

  • 추대혁;유성환;김준석;한기준
    • 전력전자학회논문지
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    • 제18권6호
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    • pp.593-600
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    • 2013
  • The asymmetric pulsed DC reactive magnetron sputtering system is widely used for the high quality plasma sputtering process such as a thin film deposition. In asymmetric pulsed DC power supply a reverse voltage is applied to the target periodically to minimize arc discharging effect. When sputtering in the mid-frequency range (20-350 kHz), the periodic target voltage reversals suppress arc formation at the target and provide long-term process stability. Thus, high quality, defect-free coatings of these materials can now be deposited at competitive rates. In this paper, a new style asymmetric pulsed DC power supply including mid-transformer is presented. In the proposed, an energy recovery circuit is adopted to reduce the mutual inductance of the transformer. As a result, the system dynamics of the voltage control loop is increased highly and the non-linear voltage boosting effect of the conventional system is removed. This work was proved through simulation and laboratory based experimental study.

DC 마그네트론 스퍼터링 장치의 영구자석에 의한 자기장의 2차원 해석적 해 (Two-dimensional Analytic Solution of the Magnetic Field for the Ferrites of DC Magnetron Sputtering Device)

  • 유동훈;권득철;이종규;윤남식;김정형;신용현
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제54권7호
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    • pp.326-331
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    • 2005
  • We obtain analytical expressions the magnetic field of ferrites for DC magnetron sputtering device, which has been widely used for vacuum thin film deposition, and suggested the equation on maximum radius of the magnetic field by analytic solution. Also, the analytic results are compared with some calculations using magnetization elements of right-angled hexahedron.

The microstructure of polycrystalline silicon thin film that fabricated by DC magnetron sputtering

  • Chen, Hao;Park, Bok-Kee;Song, Min-Jong;Park, Choon-Bae
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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    • pp.332-333
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    • 2008
  • DC magnetron sputtering was used to deposit p-type polycrystalline silicon on n-type Si(100) wafer. The influence of film microstructure properties on deposition parameters (DC power, substrate temperature, pressure) was investigated. The substrate temperature and pressure have the important influence on depositing the poly-Si thin films. Smooth ploy-Si films were obtained in (331) orientation and the average grain sizes are ranged in 25-30nm. The grain sizes of films deposited at low pressure of 10mTorr are a little larger than those deposited at high pressure of 15mTorr.

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DC 마그네트론 스퍼터법에 의한 ITO 투명전도막 특성 (Properties of ITO Transparent Conducting Film by DC Magnetron Sputtering Method)

  • 박강일;김병섭;임동건;박기엽;곽동주
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 춘계학술대회 논문집 센서 박막재료 반도체 세라믹
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    • pp.95-98
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    • 2003
  • Tin doped indium oxide(ITO) films, which is widely used as a transparent conductor in optoelectronic devices such as solar cell, liquid crystal display, plasma display panel, thermal heater, and other sensors, were prepared by using the capacitively coupled DC magnetron sputtering method. The influence of the substrate temperature, working gas pressure and deposition time on the electrical, optical and morphological properties were investigated experimentally. ITO films with the optimum growth conditions showed resistivity of $2.36{\times}10^{-4}(\Omega}-cm$ and transmittance of 86.28% for a film 680nm thick in the wavelength range of the visible spectrum.

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Fabrications of Y-ZrO$_2$ buffer layers of coated conductors using dc-sputtering

  • K. C. Chung;Lee, B. S.;S. M. Lim;S. I. Bhang;D. Youm
    • 한국초전도ㆍ저온공학회논문지
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    • 제5권3호
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    • pp.11-14
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    • 2003
  • The detailed conditions of dc-sputtering for depositions of yttria-stabilized ZrO$_2$ (YSZ) films were investigated, while the films were grown on the CeO$_2$ template layers on biaxially textured Ni-tapes. The window of oxygen pressures for proper growth of YSZ films, which was dependent on sputtering powers, was determined by sufficient oxidations of the YSZ films and the de-oxidation of the target surface, which was required for rapid sputtering. The window turned out to be fairly wide under certain values of argon pressure. When the sputtering power was raised, the deposition rate increased without narrowing the window. The fabricated YSZ films showed good texture qualities and surface morphologies.

유리성형용 카본금형의 표면조도에 미치는 고출력 스퍼터링 조건의 영향 (The Effect of High Power Sputtering Conditions on Surface Roughness of Carbon Mold for Glass Forming )

  • 주성후;양재웅
    • 한국응용과학기술학회지
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    • 제41권1호
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    • pp.46-57
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    • 2024
  • In this study, the various process conditions for high-power DC Magnetron Sputtering (DCMS) on the surface roughness of carbon thin films were investigated. The optimal conditions for Si/C coating were 40min for deposition time, which does not deviate from normal plasma, to obtain the maximum deposition rate, and the conditions for the best surface roughness were -16volt bias voltage and 400watt DC power with 1.3x10-3torr chamber pressure. Under these optimal conditions, an excellent carbon thin film with a surface roughness of 1.62nm and a thickness of 724nm was obtained. As a result of XPS analysis, it was confirmed that the GLC structure (sp2 bonding) was more dominant than the DLC structure (sp3 bonding) in the thin film structure of the carbon composite layer formed by DC sputtering. Except in infrequent cases of relatively plasma instability, the lower bias voltage and applied power induces smaller surface roughness value due to the cooling effect and particle densification. For the optimal conditions for Graphite/C composite layer coating, a roughness of 36.3 nm and a thickness of 711 nm was obtained under the same conditions of the optimal process conditions for Si/C coating. This layer showed a immensely low roughness value compared to the roughness of bare graphite of 242 nm which verifies that carbon coating using DC sputtering is highly effective in modifying the surface of graphite molds for glass forming.

ITO 박막의 DC 마그네트론 스퍼터링 진공 증착 (The DC magnetron sputtering vacuum deposition of indium tin oxide thin film)

  • 허창우
    • 한국정보통신학회논문지
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    • 제14권4호
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    • pp.935-938
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    • 2010
  • 현재까지 개발된 투명전극재료 중에는 ITO가 가장 투명하면서 전기도 잘 통하고 생산성도 좋다. 투명전극은 비저항이 $1{\times}10^{-3}{\Omega}/cm$이하, 면저항이 $10^3{\Omega}/sq$이하로 전기전도성이 우수하고 380에서 780nm의 가시광선 영역에서의 투과율이 80%이상이라는 두 가지 성질을 만족시키는 박막이다. 본 연구에서는 스퍼터링 진공 증착 장치를 이용하여 투명 도전막(ITO: Indium Tin Oxide)을 제작하고 제작된 ITO 박막의 광 및 전기 그리고 물성적 특성을 조사하여 최상의 공정 조건을 확립하였다. 본 실험에서는 $In_2O_3:SnO_2$ 의 조성비는 90:10 wt% 인 타겟의 특성이 우수하였고, Ar:$O_2$의 분압비는 100:1 및 42:8의 조건이 적당하였으며, 온도는 $200^{\circ}C$ 가장 우수한 특성을 얻을 수 있었다. 본 연구에서 제작한 박막은 광 투과도가 90% 이상, 비저항이 $300\;{\mu}{\Omega}cm$ 이하의 특성을 갖게되어 이미지센서, 태양전지, 액정 텔레비젼등 빛의 통과와 전도성등 두가지 특성에 동시에 만족 될만한 성능을 가질 수 있음을 확인하였다.

TiN 나노 박막을 코팅한 AL7075-T7351 알루미늄 합금의 트라이볼로지 특성에 관한 연구 (A Study on the Tribological Characteristics of AL7075-T7351 Aluminum Alloy Coated with TiN Nano Thin Film)

  • 김광수;임성훈;김도현;박형준;허선철
    • 한국산업융합학회 논문집
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    • 제26권5호
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    • pp.743-750
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    • 2023
  • Aluminum alloy is a material widely used in the aircraft industry. However, since it has relatively low hardness, strength and tribological properties, it is necessary to improve these properties. In this paper, a TiN thin film was coated on the surface of AL7075-T7351 using DC magnetron sputtering. The coating was performed by setting different deposition pressure, deposition time, and applied power. Then, the tribological properties of the thin film were investigated. As a result of the experiment, the hardness of the thin film was higher than that of the base material, and the specimen with the highest hardness had excellent friction coefficient, wear amount, and adhesive strength characteristics. Through this study, it was confirmed that the tribological characteristics of aluminum alloy can be improved by depositing thin films using DC magnetron sputtering.

DC 마그네트론 스퍼터링을 이용한 IZO 박막의 제조와 특성 연구 (Preparation and Characterization of IZO Thin Films grown by DC Magnetron Sputtering)

  • 박창하;이학준;김현범;김동호;이건환
    • 한국표면공학회지
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    • 제38권5호
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    • pp.188-192
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    • 2005
  • Indium zinc oxide (IZO) thin films were deposited on glass substrate by dc magnetron sputtering. The effects of oxygen flow rate and deposition temperature on electrical and optical properties of the films were investigated. With addition of small amount of oxygen gas, the characteristic properties of amorphous IZO films were improved and the specific resistivity was about $4.8{\times}10^{-4}\Omega{\cdot}cm$. Change of structural properties according to the deposition temperature was observed with XRD, SEM, and AFM. Films deposited above $300^{\circ}C$ were found to be polycrystalline. Surface roughness of the films was increased due to the formation of grains on the surface. Electrical conductivity became deteriorated for polycrystalline IZO films. Consequently, high quality IZO films could be prepared by do sputtering with $O_{2}/Ar{\simeq}0.03$ and deposition temperature in range of $150\~200^{\circ}C$; a specific resistivity of $3.4{\times}10^{-4}{\Omega}{\cdot}cm$, an optical transmission over $90\%$ at wavelength of 550 nm, and a rms value of surface roughness about $3{\AA}$.

Optimal Sputtering Parameters of Transparent Conducting ITO Films Deposited on PET SUbstates

  • Kim, Hyun-Hoo;Shin, Sung-ho
    • Transactions on Electrical and Electronic Materials
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    • 제1권2호
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    • pp.23-27
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    • 2000
  • Indium in oxide(ITO) films have been deposited on PET and glass substrates by DC reactive magnetron sputtering without post-deposition thermal treatment, The high quality for microstructure, electrical and optical properties of the as-deposited ITO films on unheated substrates is dominated by the sputtering parameters, The influence of the working gas pressure, DC power and oxygen partial pressure has been systematically investigated, The lowest DC power, and oxygen partial pressure has been systematically investigated, The lowest resistivity of ITO films deposited on PET substrates was 6$\times$10$^{-4}$ $\Omega$cm. It has been obtained at a working pressure of 3 mTorr and DC power of 30 W. The sheet resistance and optical transmittance of these film were 22 $\Omega$/square and 84% respectively. The best values of figures of merit for the electrical and optical characteristics such as T/ $R_{sh}$ and $T^{10}$ / $R_{sh}$ are approximately 38.1 and 7.95($\times$10$^{-3}$ $\Omega$$^{-1}$ ), respectively.

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