• Title/Summary/Keyword: DC magnetron

검색결과 839건 처리시간 0.031초

Influence of Plasma Discharge Power on the Electrical and Optical Properties of Aluminum Doped Zinc Oxide Thin Films

  • Moon, Yeon-Keon;Park, Jong-Wan
    • 한국재료학회지
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    • 제16권6호
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    • pp.346-350
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    • 2006
  • Al-doped ZnO (AZO) thin films were grown on type of glass#1737 substrates by DC magnetron sputtering. The structural, electrical and optical properties of the films were investigated as a function of various plasma discharge power. The obtained films were polycrystalline with a hexagonal wurtzite structure and preferentially oriented in the (002) crystallographic direction. The lowest resistivity was $6.0{\times}10^{-4}{\Omega}cm$ with the carrier concentration of $2.69{\times}10^{20}cm^{-3}$ and Hall mobility of 20.43 $cm^2/Vs$. The average transmittance in the visible range was above 90%.

Split sputter mode: a novel sputtering method for flat-panel display manufacturing

  • Pieralisi, Fabio;Hanika, Markus;Scheer, Evelyn;Bender, Marcus
    • Journal of Information Display
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    • 제12권2호
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    • pp.89-92
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    • 2011
  • Advanced static DC magnetron sputtering methods based on the magnet wobbling technique were investigated to achieve highly uniform and homogeneous metallization layers. The novel split sputter mode (SSM) method, wherein the deposition process is divided into two distinct steps, enables the AKT rotary cathode technology to provide excellent layer properties, while keeping a high production throughput. The effectiveness of theSSMtechnique was demonstrated through copper-coated large-area substrates.

Sputtered ITO(glass)의 열처리 효과 (Thermal treatment effects of sputtered ITO(glass))

  • 김호수;정순원;구경완
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집
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    • pp.554-557
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    • 2001
  • Indium Tin Oxide(ITO) thin films have been fabricated by the dc magnetron sputtering technique with a target of a mixture In$_2$O$_3$(90mo1%) and SnO$_2$(10mo1%). We prepared ITO thin films with substrate temperature 200 to 400$^{\circ}C$ and annealing temperature 200 to 500$^{\circ}C$ food polycrystalline-structured ITO films with a low electrical resistivity of 3.4${\times}$10$\^$-4/ Ω$.$cm have been obtained. The visible light transmittance of all obtained films was over 80 %.

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박막 태양전지의 전면층 적용을 위한 회전원통형 타겟이 장착된 DC Magnetron sputtering에서 ZnO:Al 박막 성장 조건 최적화에 관한 연구

  • 박형식;이원백;장경수;정성욱;김동석;이준신
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.312-312
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    • 2010
  • 기존의 박막태양전지 전면층으로 활용하는 Asahi glass는 증착공정 중에 발생하는 수소 플라즈마로 인해 FTO 기판의 투명전도막이 손상되어 태양전지의 효율 저하가 문제가 되었다. 이를 해결하기 위해 본 논문에서는 FTO 기판의 전면층을 대신하여 ZnO:Al 박막증착을 하기 위해서 회전원통형의 타겟이 장착된 DC magnetron sputtering을 가지고 성장을 시켰는데 증착하는데 있어 중요한 공정변수인 압력 및 온도 조건의 가변을 통해 이를 최적화하여 전면층에 활용하고 자 한다. 그래서 3mtorr의 압력과 $230^{\circ}C$의 온도 조건에서 두께가 약 $1{\mu}m$일 경우, $6.5{\times}10^{-4}{\Omega}cm$의 비저항과 함께 약 85% 이상의 투과도를 나타냈다. 이것은 ZnO:Al 박막이 압력과 온도의 영향에 따라 투명전도막에 많은 영향을 끼치는 것을 알 수 있었다.

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H13 공구강의 전처리에 따른 Mo-Cu-N 코팅의 기계적 특성 (Mechanical Properties of MoN-Cu Coatings according to Pre-treatment of AISI H13 Tool Steel)

  • 박현준;문경일;김상섭
    • 한국표면공학회지
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    • 제53권6호
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    • pp.343-350
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    • 2020
  • The degradation of mechanical properties of nitride coatings to steel substrates is one of the main challenges for industrial applications. In this study, plasma nitriding treatment was used in order to increase the mechanical properties of Mo-Cu-N coating to the H13 tool steel. The nanostructured Mo-Cu-N coating was deposited using pulsed DC magnetron sputtering method with a single alloy Mo-Cu target. Mechanical properties of MoN-Cu coated samples after nitriding were found to be relatively better than non-nitrided MoN-Cu coating.

Control of Deposition Parameters in ITO Films: Figure of Merit

  • Kim, H.H.;Park, C.H.;M.J. Cho;K.J. Lim;J.H. Shin;Park, K.J.
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집
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    • pp.398-401
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    • 2001
  • Indium tin oxide films were deposited on unheated PET substrates by DC reactive magnetron sputtering of In-Sn (90-10 wt%) metallic alloy target. Electrical and optical properties of as-deposited films were systematically studied by control of the deposition parameters such as working pressure, DC power, and oxygen partial pressure. The figures of merit are important factors that summarize briefly the relationship between electrical and optical properties of transparent conducting films. The formulae of T/R$\sub$sh/ and T$\^$10//R$\sub$sh/ are expressed as a function of transmittance and sheet resistance. The best values of those figures of merit were approximately 38.6 and 8.95 (x10$\^$-3/Ω$\^$-1/), respectively.

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DC Bias가 인가된 ICPHFCVD를 이용한 탄소나노튜브의 수직 배향과 전계방출 특성 (Vertical Growth of CNTs by Bias-assisted ICPHFCVD and their Field Emission Properties)

  • 김광식;류호진;장건익
    • 한국세라믹학회지
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    • 제39권2호
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    • pp.171-177
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    • 2002
  • 본 연구에서는 DC bias가 인가된 유도결합형 플라즈마 열선 화학기상증착법을 이용하여 580$^{\circ}C$의 저온에서 탄소나노튜브를 수직 배향시켰다. 성장된 탄소나노튜브의 기판으로는 강화유리 위에 촉매층으로 Ni과 전도층으로 Cr을 300/200 ${\AA}$(Ni/Cr) 증착된 것으로 R-F magnetron sputtering을 이용하여 제작하였다. 성장 시 RF power와 DC bias power는 150W와 80W이며 텅스텐 필라멘트 power는 7∼8 A로 인가하였다. 성장된 탄소나노튜브는 속이 비어 있는 다중벽으로 이루어 졌으며 성장된 탄소나노튜브 끝단에는 금속 촉매로 보이는 Ni이 존재하는 것을 알 수 있었다. 탄소나노튜브는 흑연화도가 우수하며 그에 따라 탄소나노튜브의 전계 방출 특성도 우수하게 평가되었다. 성장된 탄소나노튜브의 구동 전압은 약 3 V/${\mu}m$이었다.

인라인 스퍼터 시스템을 이용한 펄스의 주파수 변화에 따른 NbOx 박막 특성에 관한 연구 (A Study on the Characteristics of NbOx Thin Film at Various Frequencies of Pulsed DC Sputtering by In-Line Sputter System)

  • 엄지미;오현곤;권상직;박정철;조의식;조일환
    • 한국전기전자재료학회논문지
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    • 제26권1호
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    • pp.44-48
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    • 2013
  • Niobium oxide($Nb_2O_5$) films were deposited on p-type Si wafers at room temperature using in-line pulsed-DC magnetron sputtering system with various frequencies. The different duty ratios were obtained by varying the frequency of pulsed DC power from 100 to 300 kHz at the fixed reverse time of $1.5{\mu}s$. From the thickness of the sputtered $NbO_x$ films, it was possible to obtain much higher deposition rate in case of pulsed-DC sputtering than RF sputtering. However, the similar leakage currents and structural characteristics were obtained from the metal-insulator-semiconductor(MIS) structure fabricated with the $NbO_x$ films and the x-ray photoelectron spectroscopy(XPS) results in spite of the different deposition rates. From the experimental results, the $NbO_x$ films sputtered by pulsed-DC sputtering are expected to be used in the fabrication process instead of RF sputtering.