• Title/Summary/Keyword: D-optimality criterion

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Sensitivity Analysis with Optimal Input Design and Model Predictive Control for Microalgal Bioreactor Systems (미세조류 생물반응기 시스템의 민감도분석을 위한 최적입력설계 및 모델예측제어)

  • Yoo, Sung Jin;Oh, Se-Kyu;Lee, Jong Min
    • Korean Chemical Engineering Research
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    • v.51 no.1
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    • pp.87-92
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    • 2013
  • Microalgae have been suggested as a promising feedstock for producing biofuel because of their potential of lipid production. In this study, a first principles ODE model for microalgae growth and neutral lipid synthesis proposed by Surisetty et al. (2010) is investigated for the purpose of maximizing the rate of microalgae growth and the amount of neutral lipid. The model has 6 states and 12 parameters and follows the assumption of Droop model which explains the growth as a two-step phenomenon; the uptake of nutrients is first occurred in the cell, and then use of intra-cellular nutrient to support cells growth. In this study, optimal input design using D-optimality criterion is performed to compute the system input profile and sensitivity analysis is also performed to determine which parameters have a negligible effect on the model predictions. Furthermore, model predictive control based on successive linearization is implemented to maximize the amount of neutral lipid contents.

Design of Step-Stress Accelerated Life Tests for Weibull Distributions with a Nonconstant Shape Parameter

  • Kim, C. M.;D. S. Bai
    • Journal of the Korean Statistical Society
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    • v.28 no.4
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    • pp.415-433
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    • 1999
  • This paper considers the design of step-stress accelerated life tests for the Weibull distribution with a nonconstant shape parameter under Type I censoring. It is assumed that scale and shape parameters are log-linear functions of (possibly transformed) stress and that a cumulative exposure model holds for the effect of changing stress. The asymptotic variance of the maximum likelihood estimator of a stated quantile at design stress is used as an optimality criterion. The optimum three step-stress plans are presented for selected values of design parameters and the effects of errors in pre- estimates of the design parameters are investigated.

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Bilevel-programming based failure-censored ramp-stress ALTSP for the log-logistic distribution with warranty cost

  • Srivastava, P.W.;Sharma, D.
    • International Journal of Reliability and Applications
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    • v.17 no.1
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    • pp.85-105
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    • 2016
  • In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

Accelerated life test plan under modified ramp-stress loading with two stress factors

  • Srivastava, P.W.;Gupta, T.
    • International Journal of Reliability and Applications
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    • v.18 no.2
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    • pp.21-44
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    • 2017
  • Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

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Efficient designs in conjoint analysis (컨조인트 분석에서 효율적인 문항 설계)

  • Chung, Jong Hee;Lim, Yong B.
    • Journal of Korean Society for Quality Management
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    • v.46 no.1
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    • pp.27-38
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    • 2018
  • Purpose: A large number of attributes with mixed levels are often considered in the conjoint analysis. In the cases where attributes have two or three levels, we research on the efficient design of survey questionnaire to estimate all the main effect and two factor interaction effects with a reasonable size of it. Methods: To reduce the number of questions in a questionnaire, the balanced incomplete block mixed level factorial design with minimum aberration was proposed by Lim and Chung (2016). Based on the number of questions and that of the respondents in that design, D-optimality criterion is adopted to find efficient designs where the main effect and two factor interaction effects are estimated. Results: The list of the number of questions and that of the respondents in efficient designs for survey questionnaire are recommended based on the D-efficiency of each design and the proposed selection criteria for the number of both questions and the respondents. By analyzing all the respondents survey data generated by the simulation study, we find the proper model. Conclusion: The proposed methods of designing survey questionnaires seem to perform well in the sense that how often the proper model is found in a simulation study where all the respondents survey data are generated by the simulation model.

Efficient Approximation Method for Constructing Quadratic Response Surface Model

  • Park, Dong-Hoon;Hong, Kyung-Jin;Kim, Min-Soo
    • Journal of Mechanical Science and Technology
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    • v.15 no.7
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    • pp.876-888
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    • 2001
  • For a large scaled optimization based on response surface methods, an efficient quadratic approximation method is presented in the context of the trust region model management strategy. If the number of design variables is η, the proposed method requires only 2η+1 design points for one approximation, which are a center point and tow additional axial points within a systematically adjusted trust region. These design points are used to uniquely determine the main effect terms such as the linear and quadratic regression coefficients. A quasi-Newton formula then uses these linear and quadratic coefficients to progressively update the two-factor interaction effect terms as the sequential approximate optimization progresses. In order to show the numerical performance of the proposed method, a typical unconstrained optimization problem and two dynamic response optimization problems with multiple objective are solved. Finally, their optimization results compared with those of the central composite designs (CCD) or the over-determined D-optimality criterion show that the proposed method gives more efficient results than others.

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Optimum failure-censored step-stress partially accelerated life test for the truncated logistic life distribution

  • Srivastava, P.W.;Mittal, N.
    • International Journal of Reliability and Applications
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    • v.13 no.1
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    • pp.19-35
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    • 2012
  • This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.

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