• Journal of KIISE:Computer Systems and Theory
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• v.29 no.12
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• pp.680-686
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• 2002

In deep-submicron (BSM) design, coupling effects between wires on the bus cause serious problems such as crosstalk delay, noise, and power consumption. Most of the previous works on bus encoding are targeted either to minimize tile power consumption on bus or to minimize the crosstalk delay, but not both. In this paper, we propose a new bus encoding algorithm that minimizes the power consumption on bus and eliminates the crosstalk delay simultaneously. We formulate and solve the problem by minimizing a weighted sum of the self transition and cross-coupled transition activities on bus From experiments using a set of benchmark designs. it is shown that the proposed encoding technique consumes at least 15% less power over the existing techniques, while completely eliminating the crosstalk delay.

• Proceedings of the Korean Information Science Society Conference
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• 2007.10b
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• pp.264-268
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• 2007

연결선(interconnect) 사이의 간섭으로 발생하는 crosstalk 지연시간(delay)을 제거하기 위한 두 가지의 방법을 제안 한다. (1) 체계적인 코드를 생성해내는 방법으로 crosstalk 지연시간(delay) 유발 경우를 두 가지의 종류로 분류하여 각각에 대해 버스(bus) 비트 수의 증가에 따른 analytic 한 코드 생성 공식을 유도하였다; (2) 부-버스(sub-bus) 간에 발생하는 crosstalk 지연시간(delay)을 기존의 방법에 비해 보다 효율적으로 제거하는, 즉 추가적인 차단 라인 (또는 complement 비트 라인)를 감소시키는 방법을 제안 한다. 두 연구 결과는 연결선 상의 데이터 전송에 따른 신뢰성, 지연시간 및 전력 소모 증가를 유발하는 crosstalk를 차단하는 엔코딩 기법으로 유용하게 사용될 것으로 보인다.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.36 no.12B
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• pp.1548-1555
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• 2011

In ultra-deep submicron technology, minimization of propagation delay and power consumption on buses is one of the most important design objectives in system-on-chip (SOC) design. Crosstalk between adjacent wires on the bus may create a significant portion of propagation delay. Elimination or minimization of such faults is crucial to the performance and reliability of SOC designs. Most of the previous works on bus encoding are targeted either to minimize the bus switching or minimize the crosstalk delay, but not both. This paper proposes a new bus encoding scheme which can adaptively select one of functions "invert" and "logic-convert" according the number of bus switching on an encoded 4-bit cluster. This scheme leads to minimization of both crosstalk and bus switching. In experiment result, our proposed encoding technique consumes about 25% less power over the previous, while completely eliminating the crosstalk delay.

• Proceedings of the IEEK Conference
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• 2004.06b
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• pp.577-580
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• 2004

Our paper focus on crosstalk noise problem, especially crosstalk glitch that occurs when victim is stable state and aggressor is transitive state. This generated glitch weigh with the functional reliability if the glitch is considerable. In this paper, we use buffer insertion, down sizing, buffer insertion with up-sizing methods concurrently. These methodologies use filtering effects which gates that have bigger noise margin than glitch width eliminates glitch. In addition, we do limited optimization in boundary of node's slack. Therefore, the operated node's changes are for nothing in other node's slack.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2011.06a
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• pp.983-984
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• 2011

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2011.06a
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• pp.1085-1086
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• 2011

• Journal of the Korean Society for Precision Engineering
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• v.21 no.11
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• pp.75-82
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• 2004

A metrological atomic force microscope (M-AFM) was developed fur the length measurements of nanometer range, through the modification of a commercial AFM. To eliminate nonlinearity and crosstalk of the PZT tube scanner of the commercial AFM, a two-axis flexure hinge scanner employing built-in capacitive sensors is used for X-Y motion instead of PZT tube scanner. Then two-dimensional displacement of the scanner is measured using two-axis heterodyne laser interferometer to ensure the meter-traceability. Through the measurements of several specimens, we could verify the elimination of nonlinearity and crosstalk. The uncertainty of length measurements was estimated according to the Guide to the Expression of Uncertainty in Measurement. Among several sources of uncertainty, the primary one is the drift of laser interferometer output, which occurs mainly from the variation of refractive index of air and the thermal stability. The Abbe error, which is proportional to the measured length, is another primary uncertainty source coming from the parasitic motion of the scanner. The expanded uncertainty (k =2) of length measurements using the M-AFM is √(4.26)$^2$+(2.84${\times}$10$^{-4}$ ${\times}$L)$^2$(nm), where f is the measured length in nm. We also measured the pitch of one-dimensional grating and compared the results with those obtained by optical diffractometry. The relative difference between these results is less than 0.01 %.