• Title/Summary/Keyword: Copper Electroplating

Search Result 157, Processing Time 0.026 seconds

Texture Formation of Eletroplated Nickel and Nickel Alloy on Cu Substrate (구리 기판에 전착시킨 니켈과 니켈합금의 집합조직 형성)

  • Kim, Jae-Geun;Lee, Sun-Wang;Kim, Ho-Jin;Hong, Gye-Won;Lee, Hee-Gyoun
    • Progress in Superconductivity
    • /
    • v.7 no.2
    • /
    • pp.145-151
    • /
    • 2006
  • Nickel and nickel-tungsten alloy were electroplated on a cold rolled and heat treated copper(Cu) substrate. 4 mm-thick high purity commercial grade Cu was rolled to various thicknesses of 50, 70, 100 and 150 micron. High reduction ratio of 30% was applied down to 150 micron. Rolled texture was converted into cube texture via high temperature heat treatment at $400-800^{\circ}C$. Grain size of Cu was about 50 micron which is much smaller compared to >300 micron for the Cu prepared using smaller reduction pass of 5%. 1.5 km-long 150 micron Cu was fabricated with a rolling speed of 33 m/min and texture of Cu was uniform along length. Abnormal grain growth and non-cube texture appeared for the specimen anneal above $900^{\circ}C$. 1-10 micron thick Ni and Ni-W film was electroplated onto an annealed cube-textured Cu or directly on a cold rolled Cu. Both specimens were annealed and the degree of texture was measured. For electroplating of Ni on annealed Cu, Ni layer duplicated the cube-texture of Cu substrate and the FWHM of in plane XRD measurement for annealed Cu layer and electroplated layer was $9.9^{\circ}\;and\;13.4^{\irc}$, respectively. But the FWHM of in plane XRD measurement of the specimen which electroplated Ni directly on cold rolled Cu was $8.6^{\circ}$, which is better texture than that of nickel electroplated on annealed Cu and it might be caused by the suppression of secondary recrystallization and abnormal grain growth of Cu at high temperature above $900^{\circ}C$ by electroplated nickel.

  • PDF

Focusing effect of a Metallic Layer according to the Cooling Condition and Height in a Severe Accident (중대사고시 금속용융물층의 냉각 조건과 높이가 열속 집중 현상에 미치는 영향)

  • Moon, Je-Young;Chung, Bum-Jin
    • Journal of Energy Engineering
    • /
    • v.24 no.1
    • /
    • pp.78-87
    • /
    • 2015
  • Focusing effect of a metallic layer in a severe accident depending on the aspect ratios and cooling conditions of top plate and side wall was investigated. Experiments were carried out for Rayleigh numbers and aspect ratio in the range of $8.49{\times}10^7{\sim}5.43{\times}10^9$, 0.135~0.541 respectively. In order to achieve high Rayleigh numbers, the heat transfer experiments were replaced by mass transfer experiments based on the heat and mass transfer analogy. A sulfuric acid-copper sulfate ($H_2SO4-CuSO_4$) electroplating system was adopted as the mass transfer system. The experimental results agreed well with the Rayleigh-Benard natural convection correlations of Dropkin and Somerscales and Globe and Dropkin. When compared with the standard Rayleigh-Benard problem, the cooling by the side wall is even higher than the top. For a shorter height, the interaction between the heated and cooled plumes increases due to decrease of the height. Thus, the heat transfer increases.

High Speed Cu Filling into Tapered TSV for 3-dimensional Si Chip Stacking (3차원 Si칩 실장을 위한 경사벽 TSV의 Cu 고속 충전)

  • Kim, In Rak;Hong, Sung Chul;Jung, Jae Pil
    • Korean Journal of Metals and Materials
    • /
    • v.49 no.5
    • /
    • pp.388-394
    • /
    • 2011
  • High speed copper filling into TSV (through-silicon-via) for three dimensional stacking of Si chips was investigated. For this study, a tapered via was prepared on a Si wafer by the DRIE (deep reactive ion etching) process. The via had a diameter of 37${\mu}m$ at the via opening, and 32${\mu}m$ at the via bottom, respectively and a depth of 70${\mu}m$. $SiO_2$, Ti, and Au layers were coated as functional layers on the via wall. In order to increase the filling ratio of Cu into the via, a PPR (periodic pulse reverse) wave current was applied to the Si chip during electroplating, and a PR (pulse reverse) wave current was applied for comparison. After Cu filling, the cross sections of the vias was observed by FE-SEM (field emission scanning electron microscopy). The experimental results show that the tapered via was filled to 100% at -5.85 mA/$cm^2$ for 60 min of plating by PPR wave current. The filling ratio into the tapered via by the PPR current was 2.5 times higher than that of a straight via by PR current. The tapered via by the PPR electroplating process was confirmed to be effective to fill the TSV in a short time.

A Study on The Effect of Current Density on Copper Plating for PCB through Electrochemical Experiments and Calculations (전기화학적 해석을 통한 PCB용 구리도금에 대한 전류밀도의 영향성 연구)

  • Kim, Seong-Jin;Shin, Han-Kyun;Park, Hyun;Lee, Hyo-Jong
    • Journal of the Microelectronics and Packaging Society
    • /
    • v.29 no.1
    • /
    • pp.49-54
    • /
    • 2022
  • The copper plating process used to fabricate the submicron damascene pattern of Cu wiring for Si wafer was applied to the plating of a PCB pattern of several tens of microns in size using the same organic additives and current density conditions. In this case, the non-uniformity of the plating thickness inside the pattern was observed. In order to quantitatively analyze the cause, a numerical calculation considering the solution flow and electric field was carried out. The calculation confirmed that the depletion of Cu2+ ions in the solution occurred relatively earlier at the bottom corner than the upper part of the pattern due to the plating of the sidewall and the bottom at the corner of the pattern bottom. The diffusion coefficient of Cu2+ ions is 2.65 10-10 m2/s, which means that Cu2+ ions move at 16.3 ㎛ per second on average. In the cases of small damascene patterns, the velocity of Cu2+ ions is high enough to supply sufficient ions to the inside of the patterns, while sufficient time is required to replenish the exhausted copper ions in the case of a PCB pattern having a size of several tens of microns. Therefore, it is found that the thickness uniformity can be improved by reducing the current density to supply sufficient copper ions to the target area.

Crystallographic Effects of Anode on the Mechanical Properties of Electrochemically Deposited Copper Films (아노드의 결정성에 따른 전기도금 구리박막의 기계적 특성 연구)

  • Kang, Byung-Hak;Park, Jieun;Park, Kangju;Yoo, Dayoung;Lee, Dajeong;Lee, Dongyun
    • Korean Journal of Materials Research
    • /
    • v.26 no.12
    • /
    • pp.714-720
    • /
    • 2016
  • We performed this study to understand the effect of a single-crystalline anode on the mechanical properties of as-deposited films during electrochemical deposition. We used a (111) single- crystalline Cu plate as an anode, and Si substrates with Cr/Au conductive seed layers were prepared for the cathode. Electrodeposition was performed with a standard 3-electrode system in copper sulfate electrolyte. Interestingly, the grain boundaries of the as-deposited Cu thin films using single-crystalline Cu anode were not distinct; this is in contrast to the easily recognizable grain boundaries of the Cu thin films that were formed using a poly-crystalline Cu anode. Tensile testing was performed to obtain the mechanical properties of the Cu thin films. Ultimate tensile strength and elongation to failure of the Cu thin films fabricated using the (111) single-crystalline Cu anode were found to have increased by approximately 52 % and 37 %, respectively, compared with those values of the Cu thin films fabricated using apoly-crystalline Cu anode. We applied ultrasonic irradiation during electrodeposition to disturb the uniform stream; we then observed no single-crystalline anode effect. Consequently, it is presumed that the single-crystalline Cu anode can induce a directional/uniform stream of ions in the electrolyte that can create films with smeared grain boundaries, which boundaries strongly affect the mechanical properties of the electrodeposited Cu films.

PA study on selective emitter structure and Ni/Cu plating metallization for high efficiency crystalline silicon solar cells (결정질 실리콘 태양전지의 고효율 화를 위한 Selective emitter 구조 및 Ni/Cu plating 전극 구조 적용에 관한 연구)

  • Kim, Minjeong;Lee, Jaedoo;Lee, Soohong
    • 한국신재생에너지학회:학술대회논문집
    • /
    • 2010.06a
    • /
    • pp.91.2-91.2
    • /
    • 2010
  • The use of plated front contact for metallization of silicon solar cell may alternative technologies as a screen printed and silver paste contact. This technologies should allow the formation of contact with low contact resistivity a high line conductivity and also reduction of shading losses. The better performance of Ni/Cu contacts is attributed to the reduced series resistance due to better contact conductivity of Ni with Si and subsequent electroplating of Cu on Ni. The ability to pattern narrower grid lines for reduced light shading combined with the lower resistance of a metal silicide contact and improved conductivity of plated deposit. This improves the FF as the series resistance is deduced. This is very much required in the case of low concentrator solar cells in which the series resistance is one of the important and dominant parameter that affect the cell performance. A selective emitter structure with highly dopes regions underneath the metal contacts, is widely known to be one of the most promising high-efficiency solution in solar cell processing. This paper using selective emitter structure technique, fabricated Ni/Cu plating metallization cell with a cell efficiency of 17.19%.

  • PDF

Influence of brass laminate volume fraction on electromechanical properties of externally laminated coated conductor tapes

  • Bautista, Zhierwinjay M.;Shin, Hyung-Seop;Lee, Jae-Hun;Lee, Hunju;Moon, Seung-Hyun
    • Progress in Superconductivity and Cryogenics
    • /
    • v.18 no.3
    • /
    • pp.6-9
    • /
    • 2016
  • The enhancement of mechanical properties of coated conductor (CC) tapes in practical application are usually achieved by reinforcing through lamination or electroplating metal layers on either sides of the CC tape. Mechanical or electromechanical properties of the CC tapes have been largely affected by the lamination structure under various loading modes such as tension, bending or even cyclic. In this study, the influence of brass laminate volume fraction on electromechanical properties of RCE-DR processed Gadolinium-barium-copper-oxide (GdBCO) CC tapes was investigated. The samples used were composed of single-side and both-side laminate of brass layer to the Cu-stabilized CC tape and their $I_c$ behaviors were compared to those of the Cu-stabilized CC tape without external lamination. The stress/strain dependences of $I_c$ in laminated CC tapes under uniaxial tension were analyzed and the irreversible stress/strain limits were determined. As a result, the increase of brass laminate volume fraction initially increased the irreversible strain limit and became gradual. The corresponding irreversible stress limit, however, showed no difference even though the brass laminate volume fraction increased to 3.4. But the irreversible load limit linearly increased with the brass laminate volume fraction.

Electrodialysis of metal plating wastewater with neutralization pretreatment: Separation efficiency and organic removal

  • Park, Yong-Min;Choi, Su-Young;Park, Ki-Young;Kweon, Jihyang
    • Membrane and Water Treatment
    • /
    • v.11 no.3
    • /
    • pp.179-187
    • /
    • 2020
  • Electrodialysis has been applied for treatment of industrial wastewater including metal electroplating. The wastewater from metal plating industries contains high concentrations of inorganics such as copper, nickel, and sodium. The ions in the feed were separated due to the electrical forces in the electrodialysis. The concentrate compartment is exposed to the elevated concentrations of the ions and yielded inorganic precipitations on the cation exchange membranes. The presence of organic matter in the metal plating wastewater affects complex interfacial reactions, which determines characteristics of inorganic scale fouling. The wastewater from a metal plating industry in practice was collected and the inorganic and organic compositions of the wastewater were analyzed. The performance of electrodialysis of the raw wastewater was evaluated and the effects of adjusting pH of the raw water were also measured. The integrated processes with neutralization and electrodialysis showed great removal of heavy metals sufficient to discharge to aquatic ecosystem. The organic matter in the raw water was also reduced by the neutralization, which might enhance removal performance and alleviate organic fouling in the integrated system.

Electromagnetic Microactuators with the Electroplated Planar Coil Driven by Radial Magnetic Field (방사형 자기장 내의 전기도금된 평면코일을 이용한 전자기형 마이크로 액추에이터)

  • Ryu, Ji-Cheol;Gang, Tae-Gu;Jo, Yeong-Ho
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.25 no.1
    • /
    • pp.16-24
    • /
    • 2001
  • This paper presents an electromagnetic microactuator using the copper coil electroplated on the p+silicon diaphragm. The microactuator generates a vertical motion of the diaphragm using the radial direction, we propose a new actuator structure with twin magnets. The microactuator field in the radial direction, we propose a new actuator structure with twin magnets. The microactator shows a values of resonant frequency and quality factor in the ranges of 10.51${\pm}$0.22kHz and 46.6${\pm}$3.3, respectively. The twin magnet microactuator generates the maximum peak-to-peak amplitude of 4.4$\mu\textrm{m}$ for the AC rms current of 26.8mA, showing 2.4 times larger amplitude than the single magnet microactuator.

MEMS-BASED MICRO FLUXGATE SENSOR USING SOLENOID EXCITATION AND PICK-UP COILS (MEMS 공정 제작방법에 의한 솔레노이드형 여자 코일과 검출코일을 사용한 마이크로 플럭스게이트 센서)

  • 나경원;박해석;심동식;최원열;황준식;최상인
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2002.07a
    • /
    • pp.172-176
    • /
    • 2002
  • This paper describes a MEMS-based micro-fluxgate magnetic sensing element using Ni$\_$0.8/Fe$\_$0.2/ film formed by electroplating. The micro-fluxgate magnetic sensor composed of a thin film magnetic core and micro-structured solenoids for the pick-up and the excitation coils, is developed by using MEMS technologies in order to take advantage of low-cost, small size and lower power consumption in the fabrication. A copper with 20um width and 3um thickness is electroplated on Cr(300${\AA}$)/Au(1500${\AA}$) films for the pick-up(42turn) and the excitation(24turn) coils. In order to improve the sensitivity of the sensing element, we designed the magnetic core into a rectangular-ring shape to reduce the magnetic flux leakage. An electroplated permalloy film with the thickness of 3 $\mu\textrm{m}$ is obtained under 2000Gauss to induce magnetic anisotropy. The magnetic core has the high DC effective permeability of ∼1,100 and coercive field of -0.1Oe. The fabricated sensing element using rectangular-ring shaped magnetic film has the sensitivity of about 150V/T at the excitation frequency of 2MHz and the excitation voltage of 4.4Vp-p. The power consumption is estimated to be 50mW.

  • PDF