• Proceedings of the Korean Operations and Management Science Society Conference
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• 2005.05a
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• pp.723-729
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• 2005

Traditional statistical process control(SPC) applied to discrete part industry in the form of control charts can look for and eliminate assignable causes by process monitoring. On the other hand, engineering process control(EPC) applied to the process industry in the form of feedback control can maintain the process output on the target by continual adjustment of input variable. This study presents controlling and monitoring rules adopted variable sampling interval(VSI) to change sampling intervals in a predetermined fashion on the predicted process levels for integrated EPC and SPC systems. Twelve rules classified by EPC schemes(MMSE, constrained PI, bounded or deadband adjustment policy) and type of sampling interval combined with EWMA chart of SPC are proposed under IMA(1,1) disturbance model and zero-order (responsive) dynamic system. The properties of twelve control rules under three patterns of process change(sudden shift, drift and random shift) are evaluated and discussed through simulation and control rules for integrated VSI EPC and SPC systems are recommended.

• Proceedings of the KIEE Conference
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• 2007.04a
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• pp.134-136
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• 2007

Sequential Function Chart(SFC) is very easy to grasp the sequential flow of control logic and has the compatability for a maintenance, In process control, when an error is occurred, to execute other routine by force, we control the process by remote control. In this paper, we proposed the method of select sequence control by remote control in process control designed by Sequential Function Chart(SFC).

• 제어로봇시스템학회:학술대회논문집
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• 1994.10a
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• pp.1.2-6
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• 1994

A state or the arts in Japanese chemical process control is reviewed based on experience in applying advanced process control schemes to several industrial chemical processes. The applications validate model predictive control (MPC), the most popular advanced control scheme in the process control community, as, indeed, a powerful and practical control algorithm. However, at the same time, it is elucidated that MPC can solve only the control algorithm part of the problem and one needs chemical and systems engineering aspects to solve the entire problem. By illustrating several industrial process control problems, the need for chemical engineering aspects as well as the future direction for process control are addressed, especially in light or current attitudes toward product quality.

• Proceedings of the Safety Management and Science Conference
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• 2011.11a
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• pp.535-549
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• 2011

Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue. In this paper, we investigate on research trend of control charts under non-normal distribution with very small percent defective and perturbation, and propose some variable-transformation methods applicable to CUSUM control charts in non-normal process.

• International Journal of Quality Innovation
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• v.5 no.1
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• pp.52-67
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• 2004

Successful implementation of statistical process control techniques requires for operational definitions and precise measurements. Nevertheless, very often analysts can dispose of process data available only by linguistic terms, that would be a waste to neglect just because of their intrinsic vagueness. Thus a hybrid approach, which integrates fuzzy set theory and common statistical tools, sounds useful in order to improve effectiveness of statistical process control in such a case. In this work, a fuzzy approach is adopted to manage linguistic information, and the use of a Chi-squared control chart is proposed to monitor process performance.

• The Korean Journal of Applied Statistics
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• v.21 no.2
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• pp.247-264
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• 2008

This paper considers the integrated process control procedure for detecting special causes in an ARIMA(0,1,1) process that is being adjusted automatically after each observation using a minimum mean squared error adjustment policy. It is assumed that a special cause can change the process mean and the process variance. We derive expressions for the process deviation from target for a variety of different process parameter changes, and introduce a control chart, based on the generalized likelihood ratio, for detecting special causes. We also propose the integrated process control scheme bases on the future loss. The future loss denotes the cost that will be incurred in a process remaining interval from a true out-of-control signal.

• Industrial Engineering and Management Systems
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• v.8 no.3
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• pp.139-147
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• 2009

Control charts are used to distinguish between chance and assignable causes in the variability of quality characteristics. When a control chart signals that an assignable cause is present, process engineers must initiate a search for the assignable cause of the process disturbance. Identifying the time of a process change could lead to simplifying the search for the assignable cause and less process down time, as well as help to reduce the probability of incorrectly identifying the assignable cause. The change point estimation by likelihood theory and the built-in change point estimation in a control chart have been discussed until now. In this article, we discuss two kinds of process change point estimation when the CUSUM ($\bar{x}$, s) control chart for monitoring process mean and variance simultaneously is operated. Throughout some numerical experiments about the performance of the change point estimation, the change point estimation techniques in the CUSUM ($\bar{x}$, s) control chart are considered.

• Proceedings of the Safety Management and Science Conference
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• 2013.04a
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• pp.547-556
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• 2013

Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue. In this paper, we investigate on research trend of control charts under non-normal distribution.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.39 no.1
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• pp.116-122
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• 2016

Recently, the production cycle in manufacturing process has been getting shorter and different types of product have been produced in the same process line. In this case, the control chart using coefficient of variation would be applicable to the process. The theory that random variables are located in the three times distance of the deviation from mean value is applicable to the control chart that monitor the process in the manufacturing line, when the data of process are changed by the type of normal distribution. It is possible to apply to the control chart of coefficient of variation too. ${\bar{x}}$, s estimates that taken in the coefficient of variation have just used all of the data, but the upper control limit, center line and lower control limit have been settled by the effect of abnormal values, so this control chart could be in trouble of detection ability of the assignable value. The purpose of this study was to present the robust control chart than coefficient of variation control chart in the normal process. To perform this research, the location parameter, ${\bar{x_{\alpha}}}$, $s_{\alpha}$ were used. The robust control chart was named Tim-CV control chart. The result of simulation were summarized as follows; First, P values, the probability to get away from control limit, in Trim-CV control chart were larger than CV control chart in the normal process. Second, ARL values, average run length, in Trim-CV control chart were smaller than CV control chart in the normal process. Particularly, the difference of performance of two control charts was so sure when the change of the process was getting to bigger. Therefore, the Trim-CV control chart proposed in this paper would be more efficient tool than CV control chart in small quantity batch production.

• Proceedings of the Safety Management and Science Conference
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• 2005.11a
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• pp.493-504
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• 2005

Statistical Process Control and Process Adjustment theory is gaining recognition in the process industries where the process frequently experiences a shift mean. This paper aims to study, the theory difference between Statistical Process Control and Process Adjustment in simple terms and presents a case study that demonstrates successful integration of Statistical Process Control and Process Adjustment theory for a product in drifting industry.