• Industrial Engineering and Management Systems
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• 제4권2호
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• pp.158-164
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• 2005

Kusukawa and Ohta presented the $CS_{CQ-r}$ chart to monitor the process defect $rate{\lambda}$ in high-yield processes that is derived from the count of defects. The $CS_{CQ-r}$ chart is more sensitive to $monitor{\lambda}$ than the CQ (Cumulative Quantity) chart proposed by Chan et al.. As a more superior chart in high-yield processes, we propose a Synthetic chart that is the integration of the CQ_-r chart and the $CS_{CQ-r}$chart. The quality characteristic of both charts is the number of units y required to observe r $({\geq}2)$ defects. It is assumed that this quantity is an Erlang random variable from the property that the quality characteristic of the CQ chart follows the exponential distribution. In use of the proposed Synthetic chart, the process is initially judged as either in-control or out-of-control by using the $CS_{CQ-r}$chart. If the process was not judged as in-control by the $CS_{CQ-r}$chart, the process is successively judged by using the $CQ_{-r}$chart to confirm the judgment of the $CS_{CQ-r}$chart. Through comparisons of ARL (Average Run Length), the proposed Synthetic chart is more superior to monitor the process defect rate in high-yield processes to the stand-alone $CS_{CQ-r}$ chart.

• Industrial Engineering and Management Systems
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• 제7권2호
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• pp.101-112
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• 2008

As charts to monitor the process fraction defectives, P, in the high-yield processes, Mishima et al. (2002) discussed a synthetic chart, the Synthetic CS chart, which integrates the CS (Confirmation Sample)$_{CCC(\text{Cumulative Count of Conforming})-r}$ chart and the CCC-r chart. The Synthetic CS chart is designed to monitor quality characteristics in real-time. Recently, Kotani et al. (2005) presented the EWMA (Exponentially Weighted Moving-Average)$_{CCC-r}$ chart, which considers combining the quality characteristics monitored in the past with one monitored in real-time. In this paper, we present an alternative chart that is more superior to the $EWMA_{CCC-r}$ chart. It is an integration of the $EWMA_{CCC-r}$ chart and the CCC-r chart. In using the proposed chart, the quality characteristic is initially judged as either the in-control state or the out-of-control state, using the lower and upper control limits of the $EWMA_{CCC-r}$ chart. If the process is not judged as the in-control state by the $EWMA_{CCC-r}$ chart, the process is successively judged, using the $EWMA_{CCC-r}$ chart. We compare the ANOS (Average Number of Observations to Signal) of the proposed chart with those of the $EWMA_{CCC-r}$ chart and the Synthetic CS chart. From the numerical experiments, with the small size of inspection items, the proposed chart is the most sensitive to detect especially the small shifts in P among other charts.

• 한국경영과학회:학술대회논문집
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• 한국경영과학회 2006년도 추계학술대회
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• pp.560-570
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• 2006

This paper proposes a selectively cumulative sum (S-CUSUM) control chart with variable sampling intervals (VSI) for detecting shifts in the process mean. The basic idea of the VSI S-CUSUM chart is to adjust sampling intervals and to accumulate previous samples selectively in order to increase the sensitivity. The VSI S-CUSUM chart employs a threshold limit to determine whether to increase sampling rate as well as to accumulate previous samples or not. If a standardized control statistic falls outside the threshold limit, the next sample is taken with higher sampling rate and is accumulated to calculate the next control statistic. If the control statistic falls within the threshold limit, the next sample is taken with lower sampling rate and only the sample is used to get the control statistic. The VSI S-CUSUM chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L-consecutive control statistics fall outside the threshold limit. The number L is a decision variable and is called a 'control length'. A Markov chain model is employed to describe the VSI S-CUSUM sampling process. Some useful formulae related to the steady state average time-to signal (ATS) for an in-control state and out-of-control state are derived in closed forms. A statistical design procedure for the VSI S-CUSUM chart is proposed. Comparative studies show that the proposed VSI S-CUSUM chart is uniformly superior to the VSI CUSUM chart or to the Exponentially Weighted Moving Average (EWMA) chart with respect to the ATS performance.

• 벤처창업연구
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• 제7권2호
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• pp.151-156
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• 2012

본 논문에서 우리는 동시에 볼 수 있는 수정된 3개의 관리도를 제안하였다. 첫번째 곤리도는 샘플 데이터로만 그려진 관리도이다. 두번째 관리도는 처음 관리도에 상하한 규격을 포함한 관리도이다. 세번째 관리도는 목표값이 포함되고 오랜 기간 동안의 데이터로 계산된 알려진 평균과 표준편차로 계산된 상 하한 관리선이 포함된 관리도이다. 3개의 관리도를 동시에 보면 즉시 공정의 문제점을 알아낼 수 있는 정점이 있다. 이 논문에서 제안된 방법이 현장에서 활용되어 도움을 주길 희망한다.

• 산업경영시스템학회지
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• 제34권2호
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• pp.1-8
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• 2011

This paper proposes a variable sampling interval multivariate $T^2$ control chart with sampling at fixed times, where samples are taken at specified equally spaced fixed time points and additional samples are allowed between these fixed times when indicated by the preceding $T^2$ statistics. At fixed sampling points, the $T^2$ statistics are composed of all quality characteristics and a part of quality characteristics are selected to obtain $T^2$ statistics at additional sampling points. A Markov chain approach is used to evaluate the performance of the proposed chart. Numerical studies for the performance of the proposed chart show that the proposed chart reduces the observations obtained from a process and detects the assignable cause of a process with low correlated quality characteristics quickly.

• 산업경영시스템학회지
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• 제38권1호
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• pp.15-20
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• 2015

Control charts are generally used for process control, but the role of traditional control charts have been limited in case of a non-contaminated process. Traditional ${\bar{x}}$-s control chart has not been activated well for such a problem because of trying to control processes as center line and control limits changed by the contaminated value. This paper suggests modified ${\bar{x}}$-s control chart based on robust estimation. In this paper, we consider the trimmed mean of the sample means and the trimmed mean of the sample standard deviations. By comparing with ARL value, the responding results are decided. The comparison resultant results of traditional control chart and modified control chart are contrasted.

• 경영과학
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• 제31권3호
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• pp.27-39
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• 2014

We derive a generalized statistic form of Q control chart, which is especially suitable for short run productions and start-up processes, for the detection of process mean shifts. The generalization means that the derived control chart statistic concurrently uses within lot variability and between lot variability to explain the process variability. The latter variability source is noticeably prevalent in lot type production processes including semiconductor wafer fabrications. We first obtain the generalized Q control chart statistic when both the process mean and process variance are unknown, which represents the case of implementing statistical process control charting for short run productions and start-up processes. Also, we provide the corresponding generalized Q control chart statistics for the rest of three cases of previous Q control chart statistics : (1) both the process mean and process variance are known (2) only the process mean is unknown and (3) only the process variance is unknown.

• Journal of the Korean Data and Information Science Society
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• 제10권1호
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• pp.233-241
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• 1999

본 논문에서는 공정평균을 관리하기 위한 관리도로서 지수가중 이동평균(EWMA)관리도를 고려하였다. 기존의 표본평균에 기초한 관리도의 비로버스트성 (non-robustness)에 근거하여 공정평균의 로버스트 추정량인 M-추정량에 기초한 지수가중 이동평균 관리도를 제안하였다. 제안된 관리도의 성능을 기존의 관리도와 비교해 보기 위하여 다양한 상황에서 모의실험을 행하였으며, 실험결과 제안된 관리도의 우수성이 입증되었다.

• 한국산업정보학회논문지
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• 제7권4호
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• pp.53-58
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• 2002

이 논문에서 개별 관측치를 이용한 Shewhart 관리도와 CRL 관리도로 이루어지는 수정된 합성 관리도를 구성한다. Shewhart X 관리도를 적용하여 관리한계선을 벗어나지 않으면 CRL 관리도를 적용하여 한 번 더 공정의 이상유무를 판단하는 2중 감지 공정관리기법을 고려한다. 합성 관리도에서 공정변화를 지적하는 감지력으로 평균 런의 길이()를 이용한다. 논문에서 제안된 수정된 합성 관리도는 We와 Spedding(2000a)이 제안한 합성 관리도와 Shewhart X 관리도보다 우수하며, EWM 관리도와는 성능면에서 매우 유사하다. 또한 공정변화가 0.75$\sigma$보다 클 때는 수정된 합성 관리도가 우수하다는 것을 확인할수 있다. 제시된 X-CRL 관리도를 평가하기 위해 조건부 확률을 계산하여 기존의 관리도와 비교한다.

• Industrial Engineering and Management Systems
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• 제12권2호
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• pp.112-117
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• 2013

The $\overline{x}$ control chart for the process mean and either the R or s control chart for the process dispersion have been used together to monitor the manufacturing processes. However, it has been pointed out that this procedure is flawed by a fault that makes it difficult to capture the behavior of process condition visually by considering the relationship between the shift in the process mean and the change in the process dispersion because the respective characteristics are monitored by an individual control chart in parallel. Then, the ($\overline{x}$, s) control chart has been proposed to enable the process managers to monitor the changes in the process mean, process dispersion, or both. On the one hand, identifying which process parameters are responsible for out-of-control condition of process is one of the important issues in the process management. It is especially important in the ($\overline{x}$, s) control chart where some parameters are monitored at a single plane. The previous literature has proposed the multiple decision method based on the statistical hypothesis tests to identify the parameters responsible for out-of-control condition. In this paper, we propose how to identify parameters responsible for out-of-control condition using the information criterion. Then, the effectiveness of proposed method is shown through some numerical experiments.