• Transactions on Electrical and Electronic Materials
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• v.17 no.6
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• pp.317-328
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• 2016

Over the past few decades, CMOS current comparators have been used in a wide range of applications, including analogue circuits, MVL (multiple-valued logic) circuits, and various electronic products. A current comparator is generally used in an ADC (analog-to-digital) converter of sensors and similar devices, and several techniques and approaches have been implemented to design the current comparator to improve performance. To this end, this paper presents a bibliographical survey of recently-published research on different current comparator topologies for low-power and high-speed applications. Moreover, several aspects of the CMOS current comparator are discussed regarding the design implementation, parameters, and performance comparison in terms of the power dissipation and operational speed. This review will serve as a comparative study and reference for researchers working on CMOS current comparators in low-power and high-speed applications.

• Journal of Sensor Science and Technology
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• v.26 no.3
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• pp.155-159
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• 2017

The analog-to-digital converter (ADC) is an important component in various fields of sensor signal processing. This paper presents an expandable flash analog-to-digital converter (E-flash ADC) for sensor signal processing using a comparator, a subtractor, and a multiplexer (MUX). The E-flash ADC was simulated and designed in $0.35-{\mu}m$ standard complementary metal-oxide semiconductor (CMOS) technology. For operating the E-flash ADC, input voltage is supplied to the inputs of the comparator and subtractor. When the input voltage is lower than the reference voltage, it is outputted through the MUX in its original form. When it is higher than the reference voltage, the reference voltage is subtracted from the input value and the resulting voltage is outputted through the MUX. Operation of the MUX is determined by the output of the comparator. Further, the output of the comparator is a digital code. The E-flash ADC can be expanded easily.

• The Journal of the Korea Contents Association
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• v.15 no.10
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• pp.636-646
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• 2015

In information society, the need to detect document duplication and plagiarism is increasing. Many studies have progressed to meet such need, but there are limitations in increasing document duplication detection quality due to technological problem of natural language processing. Recently, some studies tried to increase the quality by applying syntatic-semantic analysis technique. But, the studies have the problem comparing syntactic-semantic trees. This paper develops a syntactic-semantic tree comparator, designs and implements a discriminator of similar documents using the comparator. To evaluate the system, we analyze the correlation between human discrimination and system discrimination with the comparator. This analysis shows that the proposed discrimination has good performance. We need to define the document type and improve the processing technique appropriate for each type.

• Journal of IKEEE
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• v.15 no.3
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• pp.205-210
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• 2011

A novel hysteresis tunable monolithic comparator circuit based on a 0.35 ${\mu}m$ CMOS process is suggested in this paper. To tune the threshold voltage of the hysteresis in the comparator circuit, two external digital bits are used with supply voltage of 3.3V. The threshold voltage of the suggested comparator circuit is controlled by 234mV by change of 4 digital control bits in the simulation, which is a close agreement to the analytic calculation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.3
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• pp.1-9
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• 2009

In this paper proposed a new method which adaptively eliminates comparator offsets using the threshold voltage shift by the Fowler-Nordheim stress. The method evaluates the sign of comparator offset and gives the FN stress to the stronger MOSFETs of the comparator, leading to offset reduction. We have used an appropriate stressing operation, named 'stress-packet', in order to converge the offset value to zero. We applied the method to the latch-type comparator which is prevalently used for DRAM bitline sense amplifier, and verified through experiments that offsets of the latch-type comparators are nearly eliminated with the stress-packet operations. We also discuss about the reliability issues that must be guaranteed for field application of this method.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.6
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• pp.695-702
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• 2015

A 1-V 1.6-GS/s 5.58-ENOB flash ADC with a high-speed time-domain comparator is proposed. The proposed time-domain comparator, which consumes low power, improves the comparison capability in high-speed operations and results in the removal of preamplifiers from the first-stage of the flash ADC. The time interpolation with two factors, implemented using the proposed time-domain comparator array and SR latch array, reduces the area and power consumption. The proposed flash ADC has been implemented using a 65-nm 1-poly 8-metal CMOS process with a 1-V supply voltage. The measured DNL and INL are 0.28 and 0.41 LSB, respectively. The SNDR is measured to be 35.37 dB at the Nyquist frequency. The FoM and chip area of the flash ADC are 0.38 pJ/c-s and $620{\times}340{\mu}m^2$, respectively.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2017.10a
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• pp.429-432
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• 2017

In this paper, a full - wave rectifying harvesting circuit with a high-performance comparator is designed. Designed circuits are divided into Negative Voltage Converter and Active Diode stages. The comparator included in the active diode stage is implemented as a 3-stage type and divided into pre-amplification, decision circuit, and output buffer stages. The main purpose of this comparator is to reduce the propagation delay and improve the voltage and power efficiency of the harvesting circuit. The proposed circuit is designed with magna $0.35{\mu}m$ CMOS process and its operation is verified by simulation. The chip area of the designed energy harvesting circuit is $900{\mu}m{\times}712{\mu}m$.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.5
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• pp.212-221
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• 1996

A CMOS comparator is designed for low voltage and low power operations. The proposed comparator consists of a preadmplifier followed by a regenerative latch. The preasmplifier reduces the power consumption to a half with the power-down mode and the dynamic offsets of the latch, which is affected by each device mismatch, is statistically analyzed. The circuit is designed and simulated using a 0.8.mu.m n-well CMOS process and the dissipated power is 0.16mW at a 20MHz clock speed based on a 3V supply.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.57 no.6
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• pp.1017-1021
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• 2008

A calculable potential transformer(PT) with nominal ratio error in wide range of -10% to +10% has been developed on basis of theoretical calculation of ratio error by the number of windings. The developed PT can be used to evaluate the linearity and accuracy of the PT comparator by comparing both the theoretical and experimental values of the PT which have exactly same ratio errors in nominal and calculated values. The PT has been applied for calibration and correction of the PT comparator up to wide ratio error range of -10% to +10%. This portable PT is very convenient to carry to the power industry for the on-site calibration of the PT comparator.

• Proceedings of the IEEK Conference
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• 2004.06b
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• pp.351-354
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• 2004

This thesis presents Bipolar transistor with SAVEN(Self-Aligned VErtical Nitride) structure as a high-speed device which is essential for high-speed system such as optical storage system or mobile communication system, and proposes 0.8${\mu}m$ BiCMOS Process which integrates LDD nMOS, LDD pMOS and SAVEN bipolar transistor into one-chip. The SPICE parameters of LDD nMOS, LDD pMOS and SAVEN Bipolar transistor are extracted, and comparator operating at 500MHz sampling frequency is designed with them. The small Parasitic capacitances of SAVEN bipolar transistor have a direct effect on decreasing recovery time and regeneration time, which is helpful to improve the speed of the comparator. Therefore the SAVEN bipolar transistor with high cutoff frequency is expected to be used in high-speed system.