• Title/Summary/Keyword: Carrier leakage

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Highly Linear and Efficient Microwave GaN HEMT Doherty Amplifier for WCDMA

  • Lee, Yong-Sub;Lee, Mun-Woo;Jeong, Yoon-Ha
    • ETRI Journal
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    • v.30 no.1
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    • pp.158-160
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    • 2008
  • A highly linear and efficient GaN HEMT Doherty amplifier for wideband code division multiple access (WCDMA) repeaters is presented. For better performance, the adaptive gate bias control of the peaking amplifier using the power tracking circuit and the shunt capacitors is employed. The measured one-carrier WCDMA results show an adjacent channel leakage ratio of -43.2 dBc at ${\pm}2.5$-MHz offset with a power added efficiency of 40.1% at an average output power of 37 dBm, which is a 7.5 dB back-off power from the saturated output power.

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Safety Assessment of LNG Transferring System subjected to gas leakage using FMEA and FTA

  • Lee, Jang-Hyun;Hwang, Seyun;Kim, Sungchan
    • Journal of Advanced Research in Ocean Engineering
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    • v.3 no.3
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    • pp.125-135
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    • 2017
  • The paper considers the practical application of the FMEA(Failure Mode and Effect Analysis) method to assess the operational reliability of the LNG(Liquefied Natural Gas) transfer system, which is a potential problem for the connection between the LNG FPSO and LNG carrier. Hazard Identification (HAZID) and Hazard operability (HAZOP) are applied to identify the risks and hazards during the operation of LNG transfer system. The approach is performed for the FMEA to assess the reliability based on the detection of defects typical to LNG transfer system. FTA and FMEA associated with a probabilistic risk database to the operation scenarios are applied to assess the risk. After providing an outline of the safety assessment procedure for the operational problems of system, safety assessment example is presented, providing details on the fault tree of operational accident, safety assessment, and risk measures.

A Study on the Gettering in Czochralski-grown Single Crystal Silicon Wafer (Czochralski 법으로 성장시킨 실리콘 단결정 Wafer에서의 Gettering에 관한 연구)

  • 양두영;김창은;한수갑;이희국
    • Journal of the Korean Ceramic Society
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    • v.29 no.4
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    • pp.273-282
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    • 1992
  • The effects of intrinsic and extrinsic gettering on the formation of microdefects in the wafer and on the electrical performance at near-surfaces of three different oxygen-bearing Czochralski silicon single crystal wafers were investigated by varying the combinations of the pre-heat treatments and the phosphorus diffusion through the back-surface of the wafers. The wafers which had less than 10.9 ppma of oxygen formed no gettering zones irrespective of any pre-heat treatments, while the wafers which had more than 14.1 ppma of oxygen and were treated by Low+High pre-heat treatments generated the gettering zone comprising oxygen precipitates, staking faults, and dislocation loops. The effects of extrinsic gettering by phosphorus diffusion were evident in all samples such that the minority carrier lifetimes were increased and junction leakage currents were decreased. However, the total gettering effects among the different pre-heat treatments did not necessarily correspond to the gettering structure revealed by synchrotron radiation section topograph.

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A Study on the Effect of Plasma Deuterium Treatment on Reliability of Poly-Silicon Thin Film Transistors (중수소 프라즈마 처리가 다결정 실리콘 TFT의 안정성에 미치는 영향에 관한 연구)

  • Sohn Song Ho;Bae S. C.;Kim Donghwan
    • Korean Journal of Materials Research
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    • v.14 no.7
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    • pp.516-521
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    • 2004
  • We applied a deuterium plasma treatment to the surface of polycrystalline silicon films using PECVD and observed the change with AFM, XRD, ET-IR, and SIMS measurement. A bias temperature stressing (BTS) test was carried out to evaluate the reliability of the thin-film transistors (TFT). TFTs with channel lengths as small as 2 ${\mu}m$ were electrically stressed fer up to 1000 sec at room temperature. From the parameter variation such as s-factor, leakage current and on/off ratio, we suggest that the deuterium plasma treatment suppress the hot carrier effect and improve the stability of TFTs.

A implementation of predistorter using the Series Diode Linearizer for RF Amplifiers (RF전력증폭기에 직렬다이오드선형화기를 이용한 전치보상기 구현)

  • Won, Yong-Kyu;Yun, Man-Soo;Lee, Sang-Cheol;Chung, Chan-Soo
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.52 no.1
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    • pp.28-34
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    • 2003
  • In this paper, a predistortion linearizer using series diode is proposed for linearizing the power amplifier in microwave radio systems. The power amplifier should be operated near saturation region to achieve high efficiency. But at this region, amplitude and phase distortions of the amplifier remarkably increase with the increase of input power and cause a significant adjacent channel interference. The linearizer is composed of a series diode with a parallel capacitor, which provides positive amplitude and negative phase deviations with the increasing input power. This type of linearizer using the nonlinearity of diode has improved the C/I(Carrier to Intermodulation Distortion) ratio well. By applying this linearizer to two-tone 880MHz power amplifier, adjacent channel leakage power is improved up to 5dBm.

Computer Simulation for High Voltage Thyristor Fabrication (고전압 사이리스터 제작을 위한 Computer Simulation)

  • Kim, Sang-Cheol;Kim, Eun-dong;Kim, Nam-kyun;Bahng, Wook
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.243-246
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    • 2001
  • Thyristor devices have 3-dimensional complicated structure and were sensitive to temperature characteristics. Therefore, it was difficult to optimize thyristor devices design. We have to consider many design parameter to characterize, and trade-off relations. The important parameters to design thyristor devices are cathode structure, effective line width, cathode-emitter shunt structure, gate structure, doping profile and carrier lifetime. So, we must consider that these design parameters were not acted separately. However, there are many difficulties to determine optimized design parameters by experiment. So, We used specific design software to design thyristor devices, and estimated the thyristor devices characteristics.

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Electrical Stress in High Permittivity TiO2 Gate Dielectric MOSFETs

  • Kim, Hyeon-Seag;S. A. Campbell;D. C. Gilmer
    • Electrical & Electronic Materials
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    • v.11 no.10
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    • pp.94-99
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    • 1998
  • Suitable replacement materials for ultrathin SiO2 in deeply scaled MOSFETs such as lattice polarizable films, which have much higherpermittivities than SiO2, have bandgaps of only 3.0 to 4.0 eV. Due to these small bandgaps, the reliability of these films as a gate insulator is a serious concern. Ramped voltage, time dependent dielectric breakdown, and hot carrier effect measurements were done on 190 layers of TiO2 which were deposited through the metal-organic chemical vapor deposition of titanium tetrakis-isopropoxide (TTIP). Measurements of the high and low frequency capacitance indicate that virtually no interface state are created during constant current injection stress. The increase in leakage upon electrical stress suggests that uncharged, near-interface states may be created in the TiO2 film near the SiO2 interfacial layer that allow a tunneling current component at low bias.

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Improvement of carrier mobility on Silicon-Germanium on Insulator MOSFEI devices with a Si-strained layer (Si-strained layer를 가지는 Silicon-Germanium on Insulator MOSFET에서의 이동도 개선 효과)

  • Cho, Won-Ju;Koo, Hyun-Mo;Lee, Woo-Hyun;Koo, Sang-Mo;Chung, Hong-Bay
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.7-8
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    • 2006
  • The effects of heat treatment on the electrical properties of SGOI were examined. We proposed the optimized heat treatments for improving the interfacial electrical properties in SGOI-MOSFET. By applying the additional pre-RTA(rapid thermal annealing) before gate oxidation and post-RTA after dopant activation, the driving current, the transconductance, and the leakage current were improved significantly.

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Low-operating voltage Pentacene FETs with High dielectric constant polymeric gate dielectrics and its hyteresis behavior

  • Park, Chan-Eon
    • Proceedings of the Polymer Society of Korea Conference
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    • 2006.10a
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    • pp.168-168
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    • 2006
  • Low-operating voltage organic field-effect transistors (OFETs) have been realized with high dielectric constant (${\kappa}$) polymer such as cyanoethylated poly vinyl alcohol (CR-V, ${\kappa}=12$). Since the $high-{\kappa}$polymers are likely to contain water and ionic impurities, large hysteresis and considerable leakage current are frequently observed in OFETs. To solve these problems, we cross-linked the CR-V by using a cross-linking agent. Cross-linked CR-V dielectrics showed high dielectric constant of 11.1 and good insulating properties, resulting in a high capacitance ($81nF/cm^{2}$ at 1MHz) at 120 nm of dielectric thickness. Pentacene FETs with cross-linked CR-V dielectrics exhibited high carrier mobility ($0.72\;cm^{2}/Vs$), small subthreshold swing (185 mV/dec) and little hysteresis at low-operating voltage (${\Leq}-3V$).

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Theory vs. Experiment of Static Characteristics of Contrarotating Hydrostatic Journal Bearing with Overhung-Type Loads (외팔형 하중지지 이중 반전 정압 베어링의 정특성 이론 및 실험 연구)

  • 이용복;김창호;권오관;최동훈;이강복
    • Tribology and Lubricants
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    • v.12 no.3
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    • pp.92-99
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    • 1996
  • Energy-efficient contrarotating propeller systems have been recently reviewed as one of alternative means in marine car-carrier applications. Contrarotating rotors preclude the usage of conventional plain journal bearings due to the lack of load carrying capacity. A new multi-recess hydrostatic contrarotating journal beating test facility has been designed and installed to test the static load carrying capacity. Measurements of flow rates and orbits have been investigated by testings on a overhung-type contrarotating rotor system which is supported by a hydrostatic journal bearing. Numerical results of static equilibria were compared with test results. Various contrarotating speed combinations, and supply pressure conditions were selected. The numerical predictions of orbit centers and flow rates are generally accurate.