• Title/Summary/Keyword: Calibration uncertainty

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Validation and measurement uncertainty of HPLC method for simultaneous determination of 10 dyes in adulterated Phellodendron

  • Lim, Suji;Yun, Choong-In;Ko, Kyung Yuk;Kim, Young-Jun
    • Korean Journal of Food Science and Technology
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    • v.53 no.4
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    • pp.391-398
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    • 2021
  • As global interest in herbal medicines has increased, the adulteration of herbal medicines has become a critical safety issue. Adulteration with dyes to improve the appearance of low-quality products is of particular concern. This study aimed to develop a high-performance liquid chromatography (HPLC) method to detect dyes added as adulterants to Phellodendron. Samples were analyzed on a C18 column using 50 mM ammonium acetate and acetonitrile as the mobile phase. All calibration curves showed good linearity (r2 ≥0.9999) over the five-point concentration range (1-50 mg/kg). Limit of detection ranged from 0.04-0.35 mg/kg, and limit of quantification ranged from 0.11-1.07 mg/kg. The repeatability and reproducibility for these measurements were 94.2-103.3% and 96.6-103.8% for accuracy and 0.14-2.28 RSD (%) and 0.80-2.37 RSD (%) for precision. Moreover, the measurement uncertainty of the low, medium, and high concentrations for 10 dyes was considered. Thus, this HPLC method is suitable for detecting color adulteration of Phellodendron.

Validation, Measurement Uncertainty, and Determination of Bixin and Norbixin in Processed Foods of Animal Resources Distributed in Korea

  • Ga-Yeong Lee;Choong-In Yun;Juhee Cho;Young-Jun Kim
    • Food Science of Animal Resources
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    • v.43 no.6
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    • pp.949-960
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    • 2023
  • This research aimed to validate a high-performance liquid chromatography method for the quantitative determination of bixin and norbixin in various foods. The Diode Array Detector (495 nm) technique was used. Method was validated for specificity, linearity, limit of detection (LOD), limit of quantification (LOQ), precision, and accuracy, and the measurement uncertainty was assessed. The calibration curve showed excellent linearity (r2≥0.9999) over the tested concentration range of 0.2-25 mg/L. The LOD and LOQ were 0.03-0.11 and 0.02-0.05 mg/L for bixin and norbixin, respectively. The intra-and inter-day accuracies and precisions were 88.0±1.3-97.0±0.5% and 0.2%-2.6% relative SD (RSD) for bixin and 88.2±0.8-105.8±0.8% and 0.3%-2.7% RSD for norbixin, respectively. Inter-laboratory validation for accuracy and precision was conducted in three laboratories, and these results all met the AOAC guidelines. In addition, the relative expanded uncertainty (<22%) satisfied the CODEX recommendation. Furthermore, products distributed in Korea were monitored for annatto extracts using the proposed method to demonstrate its application. The developed analytical method is reliable for quantifying bixin and norbixin in various foods.

Measurements of Two-dimensional Gratings Using a Metrological Atomic Force Microscope and Uncertainty Evaluation (길이 표준 소급성을 갖는 원자간력 현미경을 이용한 2차원 격자 시편 측정과 불확도 평가)

  • Kim, Jong-Ahn;Kim, Jae-Wan;Kang, Chu-Shik;Eom, Tae-Bong
    • Journal of the Korean Society for Precision Engineering
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    • v.24 no.9
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    • pp.68-75
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    • 2007
  • The pitch and orthogonality of two-dimensional (2D) gratings have been measured by using a metrological atomic force microscope (MAFM) and measurement uncertainty has been analyzed. Gratings are typical standard artifacts for the calibration of precision microscopes. Since the magnification and orthogonality in two perpendicular axes of microscopes can be calibrated simultaneously using 2D gratings, it is important to certify the pitch and orthogonality of 2D gratings accurately for nano-metrology using precision microscopes. In the measurement of 2D gratings, the MAFM can be used effectively for its nanometric resolution and uncertainty, but a new measurement scheme was required to overcome some limitations of current MAFM such as nonnegligible thermal drift and slow scan speed. Two kinds of 2D gratings, each with the nominal pitch of 300 nm and 1000 nm, were measured using line scans for the pitch measurement of each direction. The expanded uncertainties (k = 2) of measured pitch values were less than 0.2 nm and 0.4 nm for each specimen, and those of measured orthogonality were less than 0.09 degree and 0.05 degree respectively. The experimental results measured using the MAFM and optical diffractometer were coincident with each other within the expanded uncertainty of the MAFM. As a future work, we also proposed another scheme for the measurements of 2D gratings to increase the accuracy of calculated peak positions.

Development of Line Standards Measurement System Using an Optical Microscope (광학 현미경을 이용한 선표준물 측정 시스템 개발)

  • Kim, Jong-Ahn;Kim, Jae-Wan;Kang, Chu-Shik;Eom, Tae-Bong
    • Journal of the Korean Society for Precision Engineering
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    • v.26 no.8
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    • pp.72-78
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    • 2009
  • We developed a line standards measurement system using an optical microscope and measured two kinds of line standards. It consists of three main parts: an optical microscope module including a CCD camera, a stage system with a linear encoder, and a measurement program for a microscopic image processing. The magnification of microscope part was calibrated using one-dimensional gratings and the angular motion of stage was measured to estimate the Abbe error. The threshold level in line width measurement was determined by comparing with certified values of a line width reference specimen, and its validity was proved through the measurement of another line width specimen. The expanded uncertainty (k=2) was about 100 nm in the measurements of $1{\mu}m{\sim}10{\mu}m$ line width. In the comparison results of line spacing measurement, two kinds of values were coincide within the expanded uncertainty, which were obtained by the one-dimensional measuring machine in KRISS and the line standards measurement system. The expanded uncertainty (k=2) in the line spacing measurement was estimated as $\sqrt{(0.098{\mu}m)^2+(1.8{\times}10^{-4}{\times}L)^2}$. Therefore, it will be applied effectively to the calibration of line standards, such as line width and line spacing, with the expanded uncertainty of several hundreds nanometer.

Evaluation of measurement uncertainty for quantitative determination of chlorite and chlorate in fresh-cut vegetables using ion chromatography

  • Jung, Sungjin;Kim, Dasom;Lee, Gunyoung;Yun, Sang Soon;Lim, Ho Soo;Jung, Young Rim;Kim, Hekap
    • Korean Journal of Food Science and Technology
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    • v.49 no.6
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    • pp.591-598
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    • 2017
  • This study aimed to evaluate the measurement uncertainty for the quantitative determination of chlorite and chlorate in ready-to-eat fresh-cut vegetables using ion chromatography with a hydroxide-selective column. One gram of the homogenized sample in deionized water was sonicated and centrifuged at 8,500 rpm. The supernatant was purified by passing it through a Sep-Pak tC18 cartridge, followed by chromatographic determination using a Dionex IonPac AS27 column. The linearity of the calibration curves, recovery, repeatability, and reproducibility of the method were satisfactory. The method detection limit was estimated to be approximately 0.5 mg/kg. Each uncertainty component was evaluated separately, and the combined and expanded uncertainty values were calculated at the 95% confidence level. The measured concentrations for 3 mg/kg of chlorite and chlorate standard materials were $3.18{\pm}0.32$ and $3.10{\pm}0.42mg/kg$, respectively. These results confirmed the reliability of the developed method for measuring the two chlorine-based oxyanions in fresh-cut vegetables.

Absolute Test for a 4-inch Flat and Its Measurement Uncertainty (4인치 평면의 절대 측정 및 측정불확도 계산)

  • Kim, Su-Young;Song, Jae-Bong;Yang, Ho-Soon;Rhee, Hyug-Gyo
    • Korean Journal of Optics and Photonics
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    • v.28 no.6
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    • pp.339-345
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    • 2017
  • The flatness of a reference flat plays an important role, from the calibration of an interferometer to the reference for a semiconductor or flat-panel display, etc. Especially if we order the flatness measurement outside Korea, we may spend more time and money. In this paper, we measured the flatness of a reference flat using a three-flat test, which is one of the absolute measurement methods, and calculated its measurement uncertainty. In the three-flat test we adopted, each flat is tested against another flat, with three unknown flats, using an interferometer. Among several three-flat tests, we adopted Griesmann's method which has a low measurement uncertainty and is less dependent on the experimental equipment. As a result, the measurement uncertainty was found to be less than 0.5 nm rms, which is very accurate for high-tech industrial applications.

Measurements of Two-dimensional Gratings Using a Metrological Atomic Force Microscope with Uncertainty Evaluation

  • Kim, Jong-Ahn;Kim, Jae-Wan;Kang, Chu-Shik;Eom, Tae-Bong
    • International Journal of Precision Engineering and Manufacturing
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    • v.9 no.2
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    • pp.18-22
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    • 2008
  • The pitch and orthogonality of two-dimensional (2-D) gratings were measured using a metrological atomic force microscope (MAFM), and the measurement uncertainty was analyzed. Gratings are typical standard devices for the calibration of precision microscopes, Since the magnification and orthogonality in two perpendicular axes of microscopes can be calibrated simultaneously using 2-D gratings, it is important to certify the pitch and orthogonality of such gratings accurately for nanometrology. In the measurement of 2-D gratings, the MAFM can be used effectively for its nanometric resolution and uncertainty, but a new measurement scheme is required to overcome limitations such as thermal drift and slow scan speed. Two types of 2-D gratings with nominal pitches of 300 and 1000 nm were measured using line scans to determine the pitch measurement in each direction. The expanded uncertainties (k = 2) of the measured pitch values were less than 0.2 and 0.4 nm for each specimen, and the measured orthogonality values were less than $0.09^{\circ}$ and $0.05^{\circ}$, respectively. The experimental results measured using the MAFM and optical diffractometer agreed closely within the expanded uncertainty of the MAFM. We also propose an additional scheme for measuring 2-D gratings to increase the accuracy of calculated peak positions, which will be the subject of future study.

Uncertainty Evaluation of VOC Measurement in Air (대기중 VOC측정의 불확도 명가)

  • 허귀석;유연미;이진홍
    • Proceedings of the Korea Air Pollution Research Association Conference
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    • 2003.05b
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    • pp.89-90
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    • 2003
  • 대기중의 휘발성 유기화합물(VOC)측정의 중요성이 날로 커지고 있어 많은 연구자들의 관심을 갖고 이에 대한 연구와 측정이 이루어지고 있다. 대기중의 VOC는 0.1 ∼ 10 ppb수준의 매우 미량으로 존재하고 있어 정확한 측정이 어려운 경우가 많다. 시료의 채취과정에서 부터 분석과정, 그리고 calibration과정등 많은 측정 불확도 요인이 있어 이를 잘 파악하지 않을 경우 측정결과의 신뢰성이 크게 떨어질 수 있다. 그러므로, 본 연구에서는 이러한 측정 불화도 요인을 체계적으로 파악하여 정확한 VOC측정을 위해서 어떠한 측정 불확도 요인이 중요하고, 이러한 주요 측정불확도 요인을 최소화하기 위해서는 어떠한 점을 주의하여야 하는지를 조사하고저 하였다. (중략)

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Uncertainty of Calibration using TVC for RF Multimeter (열전압변환기를 이용한 고주파전압계의 교정과 측정불확도)

  • 박정규;박석주;이환상;장경승;박명선
    • Proceedings of the Korea Electromagnetic Engineering Society Conference
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    • 2001.11a
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    • pp.310-314
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    • 2001
  • 측정의 소급성과 신뢰성을 확보한다는 전제하에 오차의 개념을 버리고 측정시의 측정불확도를 분석하는 것이 측정과학에 있어서 세계적인 추세이다. 본 논문에서는 전달표준인 열전압변환기를 사용하여 고주파전압계의 정밀 교정에서 불확도를 산출하기 위하여 수학적 모델을 설정하고 측정에 관계되는 모든 불확도 요인을 분석하였다. 케이블의 영향과 열전대감지기와 직류전압계의 상관관계, 직류소스, RF소스, 감쇠기, 반사계수와 DUT 등 측정에 있어서 관계되는 모든 불확도요인을 분석하여 확장불확도를 산출하였다.

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Evaluation for Ratio Error of Voltage Transformer Comparator using Standard Resistors (표준저항기를 이용한 전압변성기 비교기의 비오차 평가)

  • Han, Sang-Gil;Kim, Yoon-Hyoung;Jung, Jae-Kap;Han, Sang-Ok
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.57 no.4
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    • pp.412-416
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    • 2008
  • We have developed the calibration technique of the VT comparator using nonreactive standard resistors, which evaluates both accuracy and linearity of the VT comparator by comparing experimental values with theoretical values. The correction values of VT comparator obtained by using both our method and wide ratio error VT are consistent within the expanded uncertainty. Furthermore the specification for ratio error of VT comparator have been revaluated.