• Title/Summary/Keyword: Boosted-Clock Charge Pump

Search Result 4, Processing Time 0.015 seconds

A DC-DC Converter Design with Internal Capacitor for TFT-LCD Driver IC (TFT -LCD 구동 IC용 커패시터 내장형 DC-DC 변환기 설계)

  • Lim Gyu-Ho;Kang Hyung-Geun;Lee Jae-Hyung;Sohn Ki-Sung;Cho Ki-Seok;Baek Seung-Myun;Sung Kwan-Young;Li Long-Zhen;Park Mu-Hun;Ha Pan-Bong;Kim Young-Hee
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.10 no.7
    • /
    • pp.1266-1274
    • /
    • 2006
  • A non-overlap boosted-clock charge pump(NBCCP) with internal pumping capacitor, an advantageous circuit from a minimizing point of TFT-LCD driver IC module, is proposed in this paper. By using the non-overlap boosted-clock swinging in 2VDC voltage, the number of pumping stages is reduced to half and a back current of pumping charge from charge pumping node to input stage is also prevented compared with conventional cross-coupled charge pump with internal pumping capacitor. As a result, pumping current of the proposed NBCCP circuit is increased more than conventional cross-coupled charge pump, and a layout area is decreased. A proposed DC-DC converter for TFT-LCD driver IC is designed with $0.18{\mu}m$ triple-well CMOS process and a test chip is in the marking.

A VPP Generator Design for a Low Voltage DRAM (저전압 DRAM용 VPP Generator 설계)

  • Kim, Tae-Hoon;Lee, Jae-Hyung;Ha, Pan-Bong;Kim, Young-Hee
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2007.10a
    • /
    • pp.776-780
    • /
    • 2007
  • In this paper, the charge pump circuit of a VPP generator for a low voltage DRAM is newly proposed. The proposed charge pump is a 2-stage cross coupled charge pump circuit. The charge transfer efficiency is improved, and Distributed Clock Inverter is located in each charge pump stage to reduce clock period so that the pumping current is increased. In addition, the precharge circuit is located at Gate node of charge transfer transistor to solve the problem which is that the Gate node is maintained high voltage because the boosted charge can't discharge, so device reliability is decreased. The simulation result is that pumping current, pumping efficiency and power efficiency is improved. The layout of the proposed VPP generator is designed using $0.18{\mu}m$ Triple-Well process.

  • PDF

Design of Low-Area DC-DC Converter for 1.5V 256kb eFlash Memory IPs (1.5V 256kb eFlash 메모리 IP용 저면적 DC-DC Converter 설계)

  • Kim, YoungHee;Jin, HongZhou;Ha, PanBong
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
    • /
    • v.15 no.2
    • /
    • pp.144-151
    • /
    • 2022
  • In this paper, a 1.5V 256kb eFlash memory IP with low area DC-DC converter is designed for battery application. Therefore, in this paper, 5V NMOS precharging transistor is used instead of cross-coupled 5V NMOS transistor, which is a circuit that precharges the voltage of the pumping node to VIN voltage in the unit charge pump circuit for the design of a low-area DC-DC converter. A 5V cross-coupled PMOS transistor is used as a transistor that transfers the boosted voltage to the VOUT node. In addition, the gate node of the 5V NMOS precharging transistor is made to swing between VIN voltage and VIN+VDD voltage using a boost-clock generator. Furthermore, to swing the clock signal, which is one node of the pumping capacitor, to full VDD during a small ring oscillation period in the multi-stage charge pump circuit, a local inverter is added to each unit charge pump circuit. And when exiting from erase mode and program mode and staying at stand-by state, HV NMOS transistor is used to precharge to VDD voltage instead of using a circuit that precharges the boosted voltage to VDD voltage. Since the proposed circuit is applied to the DC-DC converter circuit, the layout area of the 256kb eFLASH memory IP is reduced by about 6.5% compared to the case of using the conventional DC-DC converter circuit.

Start-up Voltage Generator for 250mV Input Boost Converters (250mV 입력 부스트 컨버터를 위한 스타트업 전압 발생기)

  • Yang, Byung-Do
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.18 no.5
    • /
    • pp.1155-1161
    • /
    • 2014
  • This paper proposes a start-up voltage generator for reducing the minimum input supply voltage of DC-DC boost converters to 250mV. The proposed start-up voltage generator boosts 250mV input voltage to over 500mV to charge the capacitor for starting the boost converter. After the boost converter operates initially with the supply voltage charged in the capacitor, it uses its boosted output voltage for the supply voltage. Therefore, after the start-up operation, the proposed DC-DC boost converter works as the same as the conventional one. The proposed start-up voltage generator reduces the threshold voltage of the transistors by adjusting the body voltage at a low input voltage. This causes the higher clock frequency and the larger current to a Dickson charge-pump for boosting the input voltage. The proposed start-up voltage generator was implemented with a $0.18{\mu}m$ CMOS process. Its clock frequency and output voltage were 34.5kHz and 522mV at 250mV input voltage, respectively.