• Title/Summary/Keyword: Bandgap

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Reviews and Proposals of Low-Voltage DRAM Circuit Design (저전압 DRAM 회로 설계 검토 및 제안)

  • Kim, Yeong-Hui;Kim, Gwang-Hyeon;Park, Hong-Jun;Wi, Jae-Gyeong;Choe, Jin-Hyeok
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.4
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    • pp.251-265
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    • 2001
  • As the device scaling proceeds, the operating voltage(VDD) of giga-bit DRAMs is expected to be reduced to 1.5V or down, fir improving the device reliability and reducing the power dissipation. Therefore the low-voltage circuit design techniques are required to implement giga-bit DRAMs. In this work, state-of-art low-voltage DRAM circuit techniques are reviewed, and four kinds of low-voltage circuit design techniques are newly proposed for giga-bit DRAMs. Measurement results of test chips and SPICE simulation results are presented for the newly proposed circuit design techniques, which include a hierarchical negative-voltage word-line driver with reduced subthreshold leakage current, a two-phase VBB(Back-Bias Voltage) generator, a two-phase VPP(Boosted Voltage) generator and a bandgap reference voltage generator.

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A study on characteristics of $In_xGa_{1-x}As(0.03\leqx\leq0.11)$ epilayer by photoreflectance measuerment (Photoreflectance 측정에 의한 $In_xGa_{1-x}As(0.03\leqx\leq0.11)$ 에피층의 특성 연구)

  • 김인수;손정식;이철욱;배인호;임재영;한병국;신영남
    • Journal of the Korean Vacuum Society
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    • v.7 no.4
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    • pp.334-340
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    • 1998
  • Photoreflectance (PR) measurents have been performed on $In_xGa_{1-x}As/GaAs$ grown by molecular beam epitaxy (MBE). Bandgap $(E_0)$ of $In_xGa_{1-x}As$ epilayer measured from PR was separated as heavy-hole $(E_0(HH))$ and light-hole $(E_0(LH))$ by strain effect. The compositions and the strains of epilayer were obtained from the energy value of $E_0(HH)$ and from energy difference of $E_0(HH)$ and $E_0(LH)$, respectively. In addition, the PR signal of $E_0(LH)$ was diminished below 160 K. The interface electric field (E) of InGaAs/GaAs was increased from $0.75{\times}10^5$ V/cm to $2.66{\times}10^5$ V/cm as In composition increased, which was calculated from Franz-Keldysh oscillation (FKO) peaks. As the temperature dependence of the PR signal at x=0.09 sample, we obtained Varshni and Bose-Einstein coefficients.

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EBG Structure Using Bridge Line in the Signal Transmission Plane (신호 전달 평면의 브릿지 라인을 이용한 EBG 구조)

  • Kim, Byung-Ki;Ha, Jung-Rae;Lee, June-Sang;Bae, Hyeon-Ju;Kwon, Jong-Hwa;Nah, Wan-Soo
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.21 no.7
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    • pp.786-795
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    • 2010
  • In this paper, we propose a new EBG structure that the two unit cells are connected by the bridge line in signal transmission plane. The SSN of the power plane is reduced effectively by via holes and bridge lines connecting the unit cells. The superior signal transfer characteristic is shown between the signal lines in the signal transmission plane. The proposed EBG structure contains 1.2 GHz cut-off frequency and less than -30 dB suppression in the 8.3 GHz broad bandwidth. In addition, To improve the SI(Signal Integrity) in signal transmission plane keeping the same bandstop frequency range, the optimized location of the reference plane is proposed.

Fabrication of UV Sensor Based on ZnO Hierarchical Nanostructure Using Two-step Hydrothermal Growth (2단계 수열합성을 이용한 ZnO 계층 나노구조 기반 UV 센서 제작)

  • Woo, Hyeonsu;Kim, Geon Hwee;Kim, Suhyeon;An, Taechang;Lim, Geunbae
    • Journal of Sensor Science and Technology
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    • v.29 no.3
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    • pp.187-193
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    • 2020
  • Ultraviolet (UV) sensors are widely applied in industrial and military fields such as environmental monitoring, medicine and astronomy. Zinc oxide (ZnO) is considered as one of the promising materials for UV sensors because of its ease of fabrication, wide bandgap (3.37 eV) and high chemical stability. In this study, we used the hydrothermal growth of ZnO to form two types of ZnO nanostructures (Nanoflower and nanorod) and applied them to a UV sensor. To improve the performance of the UV sensor, the hydrothermal growth was used in a two-step process for fabricating ZnO hierarchical nanostructures. The fabricated ZnO hierarchical nanostructure improved the performance of the UV sensor by increasing the ratio of volume to surface area and the number of nanojunctions compared to one-step hydrothermal grown ZnO nanostructure. The UV sensor based on the ZnO hierarchical nanostructure had a maximum photocurrent of 44 ㎂, which is approximately 3 times higher than that of a single nanostructure. The UV sensor fabrication method presented in this study is simple and based on the hydrothermal solution process, which is advantageous for large-area production and mass production; this provides scope for extensive research in the field of UV sensors.

LED visible light communication and their application (LED 가시광 통신시스템과 그 응용)

  • Chung, Wan-Young;Kim, Jong-Jin;Kwon, Tae-Ha
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2010.05a
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    • pp.226-229
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    • 2010
  • LED(Light Emitting Diode) is an emitting device which energy is same to the bandgap of p-type and n-type semiconductor junction. Recently high brightness LED is used in fish-luring light and traffic signal light alternative of normal light bulb, and widely used in the area of display pannel. Moreover nowadays LED has been used as a back light of LCD display. Recently, visible light communication(VLC) using LED, that allow two-way serial data communication between LEDs over a distance of sveral centimeters or meters, has been widely studied in the area of digital information transmission along with illumination and display. In this paper, we present LED communication system and their applications.

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Infrared Imaging and a New Interpretation on the Reverse Contrast Images in GaAs Wafer (GaAs 웨이퍼의 적외선 영상기법 및 콘트라스트 반전 영상에 대한 새로운 해석)

  • Kang, Seong-jun
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.20 no.11
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    • pp.2085-2092
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    • 2016
  • One of the most important properties of the IC substrate is that it should be uniform over large areas. Among the various physical approaches of wafer defect characterization, special attention is to be payed to the infrared techniques of inspection. In particular, a high spatial resolution, near infrared absorption method has been adopted to directly observe defects in semi-insulating GaAs. This technique, which relies on the mapping of infrared transmission, is both rapid and non-destructive. This method demonstrates in a direct way that the infrared images of GaAs crystals arise from defect absorption process. A new interpretation is presented for the observed reversal of contrast in the infrared absorption of nonuniformly distributed deep centers, related to EL2, in semi-insulating GaAs. The low temperature photoquenching experiment has demonstrated in a direct way that the contrast inverse images of GaAs wafers arise from both absorption and scattering mechanisms rather than charge re-distribution or local variation of bandgap.

Optical and structural properties of ZnMgO thin films by RF co-sputtering (RF magnetron sputtering으로 성장된 ZnMgO박막의 구조적, 광학적 특성 분석)

  • Kang, Si-Woo;Kim, Young-Yi;Ahn, Cheol-Hyoun;Cho, Hyung-Koun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.178-178
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    • 2007
  • II-VI의 넓은 밴드갭 (3.37 eV)을 가지는 ZnO는 solar cells, transparent conductive electrodes, ultraviolet light emitters, and chemical sensors 등에 응용되고 있다. 특히 고효율 ZnO계 발광 소자 구현을 위하여 MgO (7.7eV), CdO (2.0eV) 등의 고용을 통한 밴드갭을 엔지니어링 하며, 단파장 영역의 광원을 확보하기 위하여 MgO 첨가를 통한 밴드갭 에너지를 증가시키는 방향으로의 연구가 활발하다. 그러나 ZnO의 wurtzite 구조와 MgO의 rocksalt 구조의 상이한 결정구조로 인하여 Mg의 고용한계는 4 at. %, 4.1 eV 알려져 있다. 본 실험에서는 p-type Si (100), c-sapphire (0002)과 GaN 기판 위에 MgO (99.999 %)와 ZnO (99.999 %) 두가지 타겟을 사용하여 RF co-스퍼터링법으로 ZnMgO 박막을 증착 하였다. 이때 ZnO 타겟의 power 밀도는 고정 시키고 MgO 타겟의 power 밀도를 변화 시키며 Mg의 함량을 조절하여 그에 따른 광학적 구조적 특성의 변화를 연구 하였다. 성장된 ZnMgO 박막은 MgO 타겟의 power 밀도가 증가할 때 Mg의 함량이 10 at. %까지 증가 하며, 그에 따른 표면의 거칠기 및 입계 크기가 감소하며, 박막의 성장속도 또한 감소함을 SEM과 AFM을 통하여 알 수 있었다. XRD를 동하여 ZnMgO 박막의 (0002) peak의 위치는 $34.50^{\circ}{\sim}34.7^{\circ}$로 오른쪽으로 이동하며, c-축으로 성장하였음을 알 수 있다. PL과 UV룰 동하여, Mg의 함량이 증가 할수록 박막의 밴드갭 에너지는 3.2 eV에서 4.1 eV 로 증가하였다.

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Realization of p-type Conduction in Antimony Doped ZnO Thin Films by PLD (PLD를 이용한 Antimony가 도핑된 p 형 ZnO 박막의 구현)

  • Bae, Ki-Ryeol;Lee, Dong-Wook;Elanchezhiyan, J.;Lee, Won-Jae;Bae, Yun-Mi;Shin, Byoung-Chul;Kim, Il-Soo;Shan, F.K.
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.10
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    • pp.814-820
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    • 2009
  • Antimony (Sb) doped ZnO thin films (0.1 at.%) were deposited on sapphire (0001) substrates at various temperatures (200 - 600$^{\circ}C$) by using pulsed laser deposition technique. All the thin films have been characterized by X-ray diffractometer, atomic force microscopy and spectrophotometer to investigate their structural, morphological and optical properties, respectively. Hall measurements were also carried out to identify the electrical properties of the thin films. These thin films were constituted in wurtzite structure with the preferential orientation of (002) diffraction plane and had as high as 80% optical transmission in the visible range. The bandgap energy also was determined by spectrophotometer which was around 3.28 eV. Hall measurements results revealed that the Sb dope ZnO thin film (0.1 at.%) grown at $500^{\circ}C$ exhibited p-type conduction with a carrier concentration of $8.633\times10^{16}\;cm^{-3}$, a mobility of $1.41\;cm^2/V{\cdot}s$ and a resistivity of $51.8\;\Omega{\cdot}cm$. We have successfully achieved p-type conduction in antimony doped ZnO thin films with low doping level even though the electrical properties are not favorable. This paper suggests the feasibility of p-type doping with large-size-mismatched dopant by using pulsed laser deposition.

Synthesis of functional ZnO nanoparticles and their photocatalytic properties

  • Nam, Sang-Hun;Kim, Myoung-Hwa;Lee, Sang-Duck;Kim, Min-Hee;Boo, Jin-Hyo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.54-54
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    • 2010
  • Zinc oxide is metal oxide semiconductor with the 3.37 eV bandgap energy. Zinc oxide is very attractive materials for many application fields. Zinc Oxide has many advantages such as high conductivity and good transmittance in visible region. Also it is cheaper than other semiconductor materials such as indium tin oxide (ITO). Therefore, ZnO is alternative material for ITO. ZnO is attracting attention for its application to transparent conductive oxide (TCO) films, surface acoustic wave (SAW), films bulk acoustic resonator (FBAR), piezoelectric materials, gas-sensing, solar cells and photocatalyst. In this study, we synthesized ZnO nanoparticles and defined their physical and chemical properties. Also we studied about the application of ZnO nanoparticles as a photocatalyst and try to find a enhancement photocatalytic activity of ZnO nanorticles.. We synthesized ZnO nanoparticles using spray-pyrolysis method and defined the physical and optical properties of ZnO nanoparticles in experiment I. When the ZnO are exposed to UV light, reduction and oxidation(REDOX) reaction will occur on the ZnO surface and generate ${O_2}^-$ and OH radicals. These powerful oxidizing agents are proven to be effective in decomposition of the harmful organic materials and convert them into $CO_2$ and $H_2O$. Therefore, we investigated that the photocatalytic activity was increased through the surface modification of synthesized ZnO nanoparticles. In experiment II, we studied on the stability of ZnO nanoparticles in water. It is well known that ZnO is unstable in water in comparison with $TiO_2$. $Zn(OH)_2$ was formed at the ZnO surface and ZnO become inactive as a photocatalyst when ZnO is present in the solution. Therefore, we prepared synthesized ZnO nanoparticles that were immersed in the water and dried in the oven. After that, we measured photocatalytic activities of prepared samples and find the cause of their photocatalytic activity changes.

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CIGS 박막 반응메카니즘 및 생성공정의 이해

  • Kim, U-Gyeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.24-24
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    • 2010
  • Chalcopyrite $Cu(In,Ga)Se_2$ (CIGS) 화합물 반도체는 고효율 박막태양전지의 광 흡수층으로 사용되는 물질 중 가장 우수한 효율 (19.9%, NREL 2008)을 보유하고 있다. CIGS는 직접천이형 에너지밴드갭 (direct bandgap)을 가지고 있고, 광흡수계수가 $1{\times}10^5\;cm^{-1}$로서 반도체 중 서 가장 흡수율이 높은 재료에 속하여 두께 $1{\sim}2\;{\mu}m$의 박막으로도 고효율의 태양전지 제조가 가능하고, 또한 장기적으로 전기광학적 안정성이 매우 우수한 특성을 지니고 있다. 현재 고효율 CIGS 셀생성을 위해 널리 사용되고 있는 CIGS 흡수층 성장공정은 "co-evaporation(동시증발법)"과 2-step 공정이라 불리는 "sputter-selenization(스퍼터-셀렌화)" 방법이다. 동시증발법은 개별원소 Cu, In, Ga, Se 들을 고진공 분위기에서 고온 ($550{\sim}600^{\circ}C$)기판위에 증착하는 방법으로 소면적에서 가장 좋은 효율(~20%)을 보이는 공정이다. 하지만, 고온, 고진공 공정조건과 대면적 증착시 온도 및 조성 불균일 등의 문제점 등으로 상용화에 어려움이 있다. 스퍼터-셀렌화 공정은 1단계에서 스퍼터링 방식으로 CuGaIn 전구체를 증착하고, 2단계에서 고온($550{\sim}600^{\circ}C$)하에 $H_2Se$ 혹은 Se vapor와 반응시켜 CIGS를 생성한다. 일본의 Showa Shell와 Honda Soltec 등에 의해 이미 상업화 되었듯이, 저비용 대면적으로 상업화 가능성이 높은 공정으로 평가되고 있다. 하지만, 2단계에서 사용되는 $H_2Se$ 및 Se vapor의 유독성, 기상 Se과 금속전구체 간의 느린 셀렌화 반응속도, 셀렌화반응 후 생성된 CIGS 박막 두께방향으로의 Ga 불균일분포, 생성된 CIGS/Mo 계면 접착력 저하등의 문제점들이 해결되어야만 상업화에 성공할 수 있을 것이다. 본 Tutorial에서는 CIGS 물질의 열역학 상평형과 반응메카니즘에 대해 설명하고, 다양한 생성 공정들을 소개할 것이다.

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