• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.334.2-334.2
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• 2016

Silicon nitride (SiNx:H) films are generally used as passivation layer on solar cell and they are usually made by plasma enhanced chemical vapor deposition (PECVD). In this study, we investigated the properties of silicon nitride (SiNx:H) films made by PECVD. Effects of mixture ratio of process gases with silane (SiH4) and ammonia (NH3) on the passivation qualities of silicon nitride film are evaluated. Passivation properties of SiNx:H are focused by making antireflection properties identical with thickness and refractive index controlled. The absorption coefficient of each film was evaluated by spectrometric ellipsometery and the minority carrier lifetimes were evaluated by quasi-steady-state photo-conductance (QSSPC) measurement. The optical properties were obtained by UV-visible spectrophotometer. The interface properties were measured by capacitance-voltage (C-V) measurement and the film components were identified by Fourier transform infrared spectroscopy (FT-IR) and Rutherford backscattering spectroscopy detection (RBS) - elastic recoil detection (ERD).

• Journal of the Korean Society for Nondestructive Testing
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• v.29 no.6
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• pp.591-602
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• 2009

The Compton backscatter technique has been applied to lap-joint in aircraft structure in order to determine mass loss due to exfoliative corrosion of the aluminum alloy sheet skin. The mass loss of each layer has been estimated from Compton backscatter A-scan including the aluminum sheet, the corrosion layer, and the sealant. A Compton backscattering imaging system has been also developed to obtain a cross-sectional profile of corroded lap-splices of aging aircraft using a specially designed slit-type camera. The camera is to focus on a small scattering volume inside the material from which the backscattered photons are collected by a collimated scintillator detector for interpretation of material characteristics. The cross section of the layered structure is scanned by moving the scattering volume through the thickness direction of the specimen. The theoretical model of the Compton scattering based on Boltzmann transport theory is presented for quantitative characterization of exfoliative corrosion through deconvolution procedure using a nonlinear least-square error minimization method. It produces practical information such as location and width of planar corrosion in layered structures of aircraft, which generally cannot be detected by conventional NDE techniques such as the ultrasonic method.

• Journal of the Korean Society for Nondestructive Testing
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• v.21 no.6
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• pp.658-662
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• 2001

The classification of surface flaw types was performed on the basis of angular dependence of backscattered ultrasound. The copper line adhered on the surface, cower line filled in groove, pure groove and the normal edge were adopted as various surface flaw patterns of glass specimen. A backward longitudinal profile was formed probably by the longitudinal wane scattering at and near 1st critical angle. The wave trains at the peak angles of the backward radiation profiles showed different shapes according to the superposition ratio of scattered and leaky waves. The asymmetry of the backward radiation profile arose due to the scattering effect of flaw. The additive resonance effect of copper line appeared in the left side of the profile. The peak angles of both the longitudinal and radiation profiles were shifted toward small angle by the scattering effect.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.16 no.8 s.99
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• pp.797-802
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• 2005

In this paper, we design a UHF band RFID tag antenna which is conjugate matched to an impedance of a chip and also mountable on conductive materials. The proposed tag antenna is very compact($50{\times}30{\times}4mm$) with a modified PIFA shape. The proposed tag antenna has an advantage of easy matching to various chip input impedances. The performance of the antenna is evaluated by monitoring RCS in the reader direction. The RCS of the designed tag is $-10.2\;dBm^2$ when the chip is shorted and is $-21\;dBm^2$ when the chip impedance is a complex conjugate of the antenna impedance.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.15 no.8
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• pp.765-774
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• 2004

In this paper, a novel approximate solution for scattering by a very thin planar homogeneous dielectric scatterer with an arbitrary shape is formulated. This solution is based on a volumetric integral equation and is expressed in terms of Fourier transform. It is shown that the obtained solution is reduced to an exact solution for an infinite dielectric slab. For 2D, or 3D scatterers, the formulation is verified numerically. Especially fur edge-on TM polarized wave incidence a closed-form solution of backscattering from a thin dielectric half-plane is formulated, which is very accurate for wide range of normalized surface impedance except very low impedances(│η│〈0.5).

• Ocean Science Journal
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• v.42 no.1
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• pp.1-8
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• 2007

Acoustic volume backscattering strength data were collected and Conductivity Temperature Depth (CTD) measurements were conducted in the southern Yellow Sea in summer 2005 and 2006. The high temporal and vertical resolution acoustic data measured with a 307 kHz Acoustic Doppler Current Profiler (ADCP) and a 250 kHz acoustic Doppler profile (ADP) had dominant diel variation, which resulted from vertical migration of sound scatterers. Some scatterers congregating in the bottom layer in the daytime migrated upward at dusk, and migrated downward into the bottom layer at dawn. The migration speeds were estimated. More than 33 days data show that the diel migration varies with time. The feature of migration measured with ADCP and ADP is consistent to some extent with what is described in the study on vertical migration of zooplankton in the southern Yellow Sea with conventional net samples.

• Proceedings of the KSRS Conference
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• 2003.11a
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• pp.1002-1004
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• 2003

A ground-based, C-band full polarimetric mobile Scatterometer system has been developed in Malaysia with collaboration between Malaysian Centre for Remote Sensing (MACRES) and Multimedia University (MMU). The main purpose of this system is to measure and monitor backscattering coefficient, ${\sigma }^0$, for earth terrain such as paddy fields, forest and soil surfaces. This paper describes the preliminary results on radar backscatter measurement from paddy field using the mobile C-band Scatterometer system. The measurement campaign was conducted at Sungai Burung area in April 2003. Real time data were collected using four polarization modes (HH, HV, VV and VH), at various incidence angles ranging from 0$^0$ to 60$^0$. The measurement data show consistent results as compared to other reports, which verify the capability of this Scatterometer system as a useful tool for remote sensing.

• Journal of the Korean Vacuum Society
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• v.10 no.1
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• pp.61-66
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• 2001

$WO_3$ films were multicoated on the microscope slide glass and ITO-coated glass using a tungsten alkoxide type solution by the sol-gel deposition process. The effect of dipping and processing parameters on the structure, optical and electrochemical properties of the film were also investigated. Coating using alkoxide solution was very uniformed for low dipping speed of 0.005 m/s, but thickness variations across the sample became apparent for dipping speeds greater than 0.007 m/s. Electrochemical coloration experiments showed that films fired at lower temperatures color more easily than film fired to > $200^{\circ}C$. Rutherford backscattering spectroscopy studies revealed that $K^+$ ions were uniformly distributed throughout the $WO_3$layer in the colored sample.

• Proceedings of the KSRS Conference
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• 2005.10a
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• pp.741-744
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• 2005

A numerical scattering model for artificial metal structure based on physical optics approximation is developed to identify the height of phase center, and the result is compared with interferometric SAR DEM. The interferometric SAR data were gathered by AIRSAR during PACRIM- II campaign on Jeju Island. Power transmission towers on piedmont pasture along the slopes of Mt. Halla look like elliptic risings in TOPSAR DEM. The heights of risings are quantitatively analyzed using a scattering model in the way of achieving the height of phase centers of power transmission towers. A numerical algorithm is developed on the basis of physical optics approximation. The structure of power transmission tower was decomposed into hundreds of rectangular metal plates, of which the scattering matrix is known in analytic form, and the calculated scattering fields were summed coherently. The effect of direct backscattering component, ground-scatterer component and scatterer-ground component are decomposed and computed individually for each rectangular metal plate. The $\Deltak-radar$ equivalent was used to calculate height of phase center of the scatterer. The heights of a selected power transmission tower and scattering algorithm results give existence and location of the transmission towers but not actual tower heights.

• Proceedings of the Materials Research Society of Korea Conference
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• 2003.03a
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• pp.174-174
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• 2003

Highly (111)-oriented PZT [Pb(Zrl-xTix)O3] thin films in the Zr-rich rhombohedral phase-field were successfully fabricated on Pt(111)/Ti/SiO2/Si substrates by combining PLD method with sol-gel process. These highly (111)-oriented films can be used as model systems for polarized Raman scattering study of PZT in the rhombohedral-Phase field because the (111)-direction is the principal off-center axis of the rhombohedral ferroelectricity. For this purpose, we have fabricated PZT films employing two distinctive compositions : one with Zr/Ti = 90/10 (abbreviated as PZT90/10) and the other with Zr/Ti= 60/40 (PZT60/40). The PZT90/10 film belongs to the octahedrally distorted FR(LT) phase with a cell-doubled structure, whereas the PZT60/40 is in the high-temperature FR(HT) phase-field at room temperature. To clearly separate E(TO) phonon modes from Al(TO) modes of the (111)-oriented rhombohedral film, we have suitably devised Z(X,Y)Z and Z(X,X)Z backscattering geometries for E(TO) and Al (TO), respectively. The polarized scattering experiment demonstrated that both types of (111)-oriented rhombohedral films closely followed the Raman selection rule.