• The Transactions of The Korean Institute of Electrical Engineers
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• v.61 no.1
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• pp.99-103
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• 2012

The electromagnetic topology and the BLT equation has been used as useful techniques to analyze coupling effects of huge devices. But in the case of systems including complex parts, applying the BLT equation can be difficult to manifest the complex parts with analytic solutions. To resolve this problem, a numerical method can be used to parts of the whole system in advance. In this paper, a microstrip line filter is analyzed using the BLT equation combined with numerical solutions. Consequently, achieved graphs from the BLT equation show good agreements with graphs obtained using a numerical method only.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.9
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• pp.1643-1647
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• 2007

Recently, there is a need for research concerning the technologies and precaution methods against electronic bomb assaults. There lays perplex constitution and much coupling phenomenon in this type of system, and thus requires much time and memory in order to translate the system with the existing translation methods. Applying the EMT (Electromagnetic Topology) would prove much more efficient. In this paper, EMT has been applied to the circuit-like micro system, previously employed in micro systems. Also, each section has been interpreted using the BLT (Baum, Liu, Tesche) equation using the EMT, then reconstructed, consequentially interpreting an entire system. In this paper, a simple circuit containing active and passive elements based on a CPW has been interpreted employing the BLT equation, and has been proven by experiment using the circuit simulation, a simulation officially recognized for its accuracy in interpreting small structures. The interpretation results have been presented by an S-parameter, and by comparing the interpretation results attained through the BLT equation and that from common simulation to that from experimentation, that the BLT equation turned out to be the most reliable interpretation method could be found.

• 한국정보통신설비학회:학술대회논문집
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• 2006.08a
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• pp.166-169
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• 2006

High Frequency에서 회로를 해석할 때 기존의 Full-wave Analysis Method와는 다른 Topological Analysis Method에 기반한 BLT equation을 도입하여 새로운 해석을 시도해본다. 이 해석방법은 기존의 방법과는 다르게 회로를 junction과 node로 구분하여 회로 방정식을 만들어 해석을 하는 새로운 방식이다. 이 논문에서는 간단한 회로를 제작하여 BLT equation과 기존의 Simulation Tool을 사용한 해석과 실제 실험결과와 비교하면서 BLT equation을 검증하고, 실제적인 적용 회로를 선정하여 해석을 시도하였다.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.18 no.9
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• pp.1023-1029
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• 2007

In this paper, we propose the method to solve the BLT equations using Laguerre polynomials in time domain. The solution of BLT equations is obtained by recursive, differential and integral properties of Laguerre polynomials. The verification of the proposed method is tested by applying it to the two-wired transmission line with resistors and capacitors, which is illuminated by the electromagnetic plane wave pulse. And the result is compared with the corresponding transient responses obtained from inverse fast Fourier transform(IFFT) of the frequency domain solutions of BLT equations.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.236-236
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• 2008

(Bi,La)$Ti_3O_{12}$(BLT) thin film is one of the most attractive materials for ferroelectric random access memory (FRAM) applications due to its some excellent properties such as high fatigue endurance, low processing temperature, and large remanent polarization [1-2]. The authors firstly investigated and reported the damascene process of chemical mechanical polishing (CMP) for BLT thin film capacitor on behalf of plasma etching process for fabrication of FRAM [3]. CMP process could prepare the BLT capacitors with the superior process efficiency to the plasma etching process without the well-known problems such as plasma damages and sloped sidewall, which was enough to apply to the fabrication of FRAM [2]. BLT-CMP characteristics showed the typical oxide-CMP characteristics which were related in both pressure and velocity according to Preston's equation and Hernandez's power law [2-4]. Good surface roughness was also obtained for the densification of multilevel memory structure by CMP process [3]. The well prepared BLT capacitors fabricated by CMP process should have the sufficient ferroelectric properties for FRAM; therefore, in this study the electrical properties of the BLT capacitor fabricated by CMP process were analyzed with the process parameters. Especially, the effects of CMP pressure, which had mainly affected the removal rate of BLT thin films [2], on the electrical properties were investigated. In order to check the influences of the pressure in eMP process on the ferroelectric properties of BLT thin films, the electrical test of the BLT capacitors was performed. The polarization-voltage (P-V) characteristics show a decreased the remanent polarization (Pr) value when CMP process was performed with the high pressure. The shape of the hysteresis loop is close to typical loop of BLT thin films in case of the specimen after CMP process with the pressures of 4.9 kPa; however, the shape of the hysteresis loop is not saturated due to high leakage current caused by structural and/or chemical damages in case of the specimen after CMP process with the pressures of 29.4 kPa. The leakage current density obtained with positive bias is one order lower than that with negative bias in case of 29.4 kPa, which was one or two order higher than in case of 4.9 kPa. The high pressure condition was not suitable for the damascene process of BLT thin films due to the defects in electrical properties although the better efficiency of process. by higher removal rate of BLT thin films was obtained with the high pressure of 29.4 kPa in the previous study [2].

• Journal of Electrical Engineering and Technology
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• v.8 no.2
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• pp.364-370
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• 2013

In the current paper, we propose a new modeling algorithm to analyze the coupling between an incident electromagnetic field (EMF) and a twisted conducting line, which is a kind of non-uniform line. Typically, analysis of external field coupling to a uniform transmission line (TL) is implemented by the Baum-Liu-Tesche (BLT) equation so that the induced load responses can be obtained. However, it is difficult to apply this method to the analysis of a twisted conducting line. To overcome this limitation, we used a chain matrix composed of ABCD parameters. The proposed algorithm expands the dimension of the previous chain matrix to consider the EMF coupling effectiveness of each twisted pair, which is then applied to multi-conductor transmission line (MTL) theory. In addition, we included a comparative study that involves the results of each method applied in the conventional BLT equation and new proposed algorithm in the uniform two-wire TL case to verify the proposed method.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.25 no.9
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• pp.919-929
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• 2014

In recent, the requirements for the safety to the effects of high power electromagnetic wave have been increased along with the development of electricity and electronic equipments. The small sized electronic devices and the various components have been analyzed by using the full-EM simulation and solving a complete set of Maxwell equation. However, the deterministic approach has a drawback and much limitation in the electromagnetic analysis of an electrically large cavity with a high complexity of the structure. In this paper, statistical theory and topological modeling method are combined to analyze the large cavity with a complex structure. In particular, the PWB(Power Balance) method and BLT(Baum-Liu-Tesche) equation are combined and employed to solve the frequency response to the large-scaled cavity with remarkably reduced time-consumption. For instance, a PCB substrate inside box of box are considered as a large structure with a complexity.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.21 no.7
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• pp.734-743
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• 2010

In this paper, we analyzed the EMP coupling for the nonuniform transmission lines, such as twisted cables, using the chain matrix algorithm and the multi-conductor analysis. The BLT method is widely used for the EMP coupling analysis of the transmission line, however, it is difficult to apply to the nonuniform transmission lines. In order to analyze the EMP coupling of nonuniform transmission lines, the whole nonuniform transmission line is divided into incremental uniform line sections of the finite numbers, and the coupling in each small sections is now summed up to get the EMP coupling effect of the entire nonuniform transmission line. To verify the proposed EMP coupling analysis method, the result of the EMP coupling simulation is compared with the solution of BLT equations for a uniform transmission line case. The proposed method is applied to the twisted cable over ground in case of being illuminated by the HEMP in order to analyze the EMP coupling.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.24 no.3
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• pp.337-347
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• 2013

It is generally well-known that the inevitable high power electromagnetic wave affects the malfunction and disorder of electronic equipments and serious damages in electronic communication systems. Hence, it is necessary to take measures against high power electromagnetic(HPEM) wave for protecting electronic devices as well as human resources. The topological analysis based on Baum-Liu-Tesche(BLT) equation simplifying the moving path of electromagnetic and the observation points and Power Balance Method(PWB) employing statistical electromagnetic analysis are introduced to analyze relatively electrically large cavity with little time consumption. In addition to the PWB method, full wave results for cylindrical cavity with apertures and incident plane wave are presented for comparison with time-consumption rate according to the cavity size.

• Journal of Electrical Engineering and Technology
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• v.4 no.3
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• pp.396-400
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• 2009

In this paper, electromagnetic topology (EMT) was used to analyze the electromagnetic compatibility (EMC) of RF circuits including passive and active components. It is difficult to obtain usable results for problems relating to electromagnetic coupling in complex systems when using conventional numerical or experimental methods. Thus it is necessary to find a new methodology for analyzing EMC problems in complicated electromagnetic environments. In order to consider the nonlinear characteristics of active components, a SPICE diode model was used. A power detector circuit and the receiver circuit of a radio control (RC) car were analyzed and experimented in order to verify the validity of this method.