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Frequency Response Analysis on PCB in Dual Resonant Cavity by Using Stochastical and Topological Modeling

확률론과 위상학적 모델링을 이용한 이중 공진구조 내의 PCB 주파수 응답해석

  • Jung, In-Hwan (Department of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University) ;
  • Lee, Jae-Wook (Department of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University) ;
  • Lee, Young-Seung (Electronics and Telecommunications Research Institute) ;
  • Kwon, Jong-Hwa (Electronics and Telecommunications Research Institute) ;
  • Cho, Choon-Sik (Department of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University)
  • 정인환 (한국항공대학교 항공전자 및 정보통신공학부) ;
  • 이재욱 (한국항공대학교 항공전자 및 정보통신공학부) ;
  • 이영승 (한국전자통신연구원) ;
  • 권종화 (한국전자통신연구원) ;
  • 조춘식 (한국항공대학교 항공전자 및 정보통신공학부)
  • Received : 2014.07.07
  • Accepted : 2014.09.11
  • Published : 2014.09.30

Abstract

In recent, the requirements for the safety to the effects of high power electromagnetic wave have been increased along with the development of electricity and electronic equipments. The small sized electronic devices and the various components have been analyzed by using the full-EM simulation and solving a complete set of Maxwell equation. However, the deterministic approach has a drawback and much limitation in the electromagnetic analysis of an electrically large cavity with a high complexity of the structure. In this paper, statistical theory and topological modeling method are combined to analyze the large cavity with a complex structure. In particular, the PWB(Power Balance) method and BLT(Baum-Liu-Tesche) equation are combined and employed to solve the frequency response to the large-scaled cavity with remarkably reduced time-consumption. For instance, a PCB substrate inside box of box are considered as a large structure with a complexity.

최근 전자기기의 활용도가 높아짐에 따라 전자기파에 대한 안정성이 요구되었다. 소형화 전자기기 및 다양한 전자부품들은 맥스웰 방정식 (Maxwell Equation)으로 해석되었으나, 복잡도가 높은 대형 구조물에 대한 전자기파 안정성이 요구되는 현시점에 맥스웰 방정식은 여러 한계점을 가지고 있다. 본 논문에서는 복잡한 대형 구조물을 확률론과 위상학적 모델링을 연동하여 해석하고자 한다. 특히, 확률론을 바탕으로 한 해석 방법인 PWB(Power Balance) Method와 BLT(Baum-Liu-Tesch) 방정식을 연동하여 대형 구조물의 주파수 응답을 풀이할 경우, 해석시간이 상당히 줄어드는 장점이 있다. 본 논문에서는 복잡한 대형구조물의 예로 이중 공진구조 내부에 PCB가 존재하는 경우를 고려해 보았다.

Keywords

References

  1. I. Junqua, J. -P. Parmantier, and M. Ridel, "Modeling of high frequency coupling inside oversized structures by asymptotic and PWB methods", in Proc. Int. Conf. Electromagn. Adv. Appl., pp. 68-71, 2011.
  2. 정인환, 이재욱, 이영승, 권종화, "PWB Method와 BLT 방정식을 연동한 거대구조 해석 응용", 한국전자파학회지 전자파기술, 25(3), pp. 24-33, 2014년 5월.
  3. David H. Staelin, Ann W. Morgenthaler, and Jin Au Kong, Electromagnetic Waves, Prentice Hall PTR, 1994.
  4. D. Hill, Electromagnetic Fields in Cavities: Deterministic and Statistical Theories, IEEE Press, 2009.
  5. D. Mansson, R. Thottappillil, and M. Backstrom, "Methodology for classifying facilities with respect to intentional EMI", IEEE Trans. Electromagn. Compat., vol. 51, no. 1, pp. 46-52, Feb. 2009. https://doi.org/10.1109/TEMC.2008.2010327
  6. I. Junqua, J-P. Parmantier, and F. Issac, "A network formulation of the power balance method for high-frequency coupling", Electromagnetics, vol. 25, no. 7-8, pp. 603-622, 2005. https://doi.org/10.1080/02726340500214845
  7. D. A. Hill, "Plane wave integral representation for fields in reverberation chambers", IEEE Trans. Electromagn. Compat., vol. 40, no. 3, pp. 209-217, Aug. 1998. https://doi.org/10.1109/15.709418
  8. A. H. Panaretos, C. A. Balanis, and C. R. Birtcher, "Shielding effectiveness and statistical analysis of cylindrical scale fuselage model", IEEE Trans. Electromagn. Compat., vol. 42, no. 2, pp. 361-366, May 2005.
  9. F. M. Tesche, C. M. Butler, "On the addition of EM field propagation and coupling effects in the BLT equation", College of Engineering & Science, Note 588, Dec. 2003.
  10. Brian C. Wadell, Transmission Line Design Handbook, Artech House, 1991.
  11. Marco Leone, Hermann L. Singer, "On the coupling of an external electromagnetic field to a printed circuit board trace", IEEE Trans. on Electromagn. Compat., vol. 47, no. 4, pp. 418-424, Nov. 1999.