• 제목/요약/키워드: Automated Optical Inspection

검색결과 19건 처리시간 0.032초

Automated Optical Inspection 시스템의 이미지 획득과정을 전산모사하는 Vision Inspector 개발 (Development of Vision Inspector for Simulating Image Acquisition in Automated Optical Inspection System)

  • 정상철;고낙훈;김대찬;서승원;최태일;이승걸
    • 한국광학회:학술대회논문집
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    • 한국광학회 2008년도 하계학술발표회 논문집
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    • pp.403-404
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    • 2008
  • This report described the development of Vision Inspector program which can simulate numerically the image acquisition process of Machine Vision System for automatic optical inspection of any products. The program consists of an illuminator, a product to be inspected, and a camera with image sensor, and the final image obtained by ray tracing.

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광학용 유리자동검사기 개발에 관한 연구 (A Study on the development of Automated Optical Glass Inspection System)

  • 구마끼
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 1998년도 춘계학술대회 논문집
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    • pp.82-87
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    • 1998
  • Laser printer, faximile and copy machine are a few examples of OA(office automation) system. In such a system, the reflecting mirror has been employed for transmitting a target image to optical device. Therefore, to develope a good quality of optical system, the quality control of optical mirror was required. In recent years, considerable efforts have been directed toward the development of automated optical glass inspection system because the inspection is eye-fatigue and monotonous job for humans to perform. In this paper, we propose a inspection system applying algorithm of image processing for detecting defects of optical glass such as pinhole, scratch. From the experiments, the proposed inspection system shows reliable results.

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광선 추적법에 의한 자동 광검사 장비의 결상 과정 전산모사 (Ray Tracing-based Simulation of Image Formation in an Equipment for Automated Optical Inspection)

  • 정상철;이윤석;김대찬;오범환;박세근;이일항;이승걸;박성찬;최태일
    • 한국광학회지
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    • 제20권4호
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    • pp.223-229
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    • 2009
  • 자동 광검사 장비의 검사 영상 획득과정을 전산모사하는 시뮬레이터를 개발하였다. 시뮬레이터는 광선 추적법을 기반으로 조명 광학계, 검사 대상체 및 결상 광학계의 3가지 모듈로 구성하였다. 각 모듈이 갖는 광학적 특성을 실제와 일치시키기 위해, 다양한 물리적 모델과 실측 결과를 반영하여 주요 인자들의 종류와 범위를 결정하였다. 전산모사 결과의 타당성은 논리적인 검증과정과 실험 결과와의 비교를 통해 확인할 수 있었다.

Path Planning of Automated Optical Inspection Machines for PCB Assembly Systems

  • Park Tae-Hyoung;Kim Hwa-Jung;Kim Nam
    • International Journal of Control, Automation, and Systems
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    • 제4권1호
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    • pp.96-104
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    • 2006
  • We propose a path planning method to improve the productivity of AOI (automated optical inspection) machines in PCB (printed circuit board) assembly lines. The path-planning problem is the optimization problem of finding inspection clusters and the visiting sequence of cameras to minimize the overall working time. A unified method is newly proposed to determine the inspection clusters and visiting sequence simultaneously. We apply a hybrid genetic algorithm to solve the highly complicated optimization problem. Comparative simulation results are presented to verify the usefulness of the proposed method.

초음파 이송 장치의 광소자 픽업 메커니즘에 관한 연구 (A study on Optical Element Pick-up Mechanism of Ultrasonic Transport System)

  • 정상화;김광호;신상문;이상희;김주환
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2006년도 춘계학술대회 논문집
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    • pp.327-328
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    • 2006
  • Recently, as the infocomindustry is developed, the semiconductor industry as well as the optical industry such as the optical communication and the optical instrument is developed rapidly. The transmission, storage and processing of information has been reaching an limit because amounts of information increase rapidly. The more quickly the optical communication is developed, the more sharply the demand of optical elements increase. The transport and inspection process is time consuming and the error rate is high, because this process are not automated in case of an optical lens. In this paper, the pick-up system that can hold optical elements and be transferred by the ultrasonic transport system is developed. The inspection system that distinguishes between the existence and the nonexistence of a defect is connected easily to pick-up system. The pick-up system separates the optical glass lens by results of the inspection. The automation program is developed by visual c++ programming.

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3축 전동테이블을 이용한 레이저 스캐너의 측정 및 레지스트레이션 자동화 (Automation of laser scanning and registration of measured data using a 3-axis motorized stage)

  • 손석배;김승만;이관행
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2001년도 춘계학술대회논문집C
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    • pp.134-139
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    • 2001
  • Laser scanners are widely used for reverse engineering and inspection of freeform parts in industry such as motors, electronic products, dies and molds. Due to the lack of measuring software and positioning device, the laser scanning processes have been erroneous and inconsistent. In order to automate measuring processes, an automated scan plan generation software and a proprietary hardware are developed. In this paper, an automated laser scanning system using a 3-axis motorized stage is proposed. In the scan planning step, scan directions, paths, and the number of scans are generated considering optical and mechanical parameters. In the scanning step, the generated scan plan is downloaded into the laser scanner and the motorized stage and the points on the surface are captured automatically. Finally, the point data set is analyzed to evaluate the performance of the system.

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자동 광검사 장비용 조명광학계 설계를 위한 국부적인 조명각 분포의 분석 (Analysis of Local Distribution of Illuminating Angles for Designing Illuminators of Automated Optical Inspector)

  • 김승용;정상철;김대찬;주동익;최태일;이백규;오범환;이승걸
    • 한국광학회:학술대회논문집
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    • 한국광학회 2009년도 창립 20주년기념 특별학술발표회
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    • pp.300-301
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    • 2009
  • In order to design a special illuminator required for an automated optical inspection system, distributions of illuminating angles and intensities of illuminating rays incident on a specimen surface are taken into consideration. This methodology is tried to optimize coaxial illuminating systems by using the specially-coded program.

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SMT 검사기를 위한 불량유형의 자동 분류 방법 (Defect Classification of Components for SMT Inspection Machines)

  • 이재설;박태형
    • 제어로봇시스템학회논문지
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    • 제21권10호
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    • pp.982-987
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    • 2015
  • The inspection machine in SMT (Surface Mount Technology) line detects the assembly defects such as missing, misalignment, loosing, or tombstone. We propose a new method to classify the defect types of chip components by processing the image of PCB. Two original images are obtained from horizontal lighting and vertical lighting. The image of the component is divided into two soldering regions and one packaging region. The features are extracted by appling the PCA (Principle Component Analysis) to each region. The MLP (Multilayer Perceptron) and SVM (Support Vector Machine) are then used to classify the defect types by learning. The experimental results are presented to show the usefulness of the proposed method.

영상기반 자동결함 검사시스템에서 재현성 향상을 위한 결함 모델링 및 측정 기법 (Robust Defect Size Measuring Method for an Automated Vision Inspection System)

  • 주영복;허경무
    • 제어로봇시스템학회논문지
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    • 제19권11호
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    • pp.974-978
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    • 2013
  • AVI (Automatic Vision Inspection) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because different images are provided. This is caused by possible variations from the image acquisition process including optical factors, nonuniform illumination, random noises, and so on. For this reason, conventional area based defect measuring methods have problems of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome this problem, utilizing volume information that is completely ignored in the area based defect measuring method. The results show that our proposed method dramatically improves the robustness and consistency of defect size measurement.

인쇄회로기판의 패턴 검사용 조명장치 설계 (Design of a lighting system for PCB visual pattern inspection)

  • 나현찬;노병옥;유영기;조형석
    • 대한기계학회논문집A
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    • 제21권1호
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    • pp.1-11
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    • 1997
  • Austomated visual inspection(AVI) capability has become an important key component in the automated manufacturing system. In such a visual inspection system an intensity(or color) image of a scene is quickly affected by optical property of objects, condition and roughness of surface, lens and filters, image sensor property and lighting system. In particular, the lighting system disign is the most important factor, since it affects overall performance of the visual system. For fast and cheap automated visual inspection system it is important to obtain the good image quality which results from careful attention to the design of the lighting system. In this paper, the lighting subsystem of AVI system is analysed for the inspection of printed circuit board(PCB) patterns. The spectral reflectance of materials, which are composed of PCB, is measured for choosing the light source. The reflection property is theoretically obtained by a reflection model and also obtained by experiments which measure intensity with varying the viewing direction of image sensor and the lighting direction of illuminator. The illumination uniformity of a ring-type illuminator. The lighting system is designed based upon the experimental results and theoretial analysis.