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http://dx.doi.org/10.3807/KJOP.2009.20.4.223

Ray Tracing-based Simulation of Image Formation in an Equipment for Automated Optical Inspection  

Jung, Sang-Chul (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC))
Lee, Yoon-Suk (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC))
Kim, Dae-Chan (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC))
Park, Se-Geun (Optics and Photonics Elite Research Academy (OPERA), Inha University)
O, Beom-Hoan (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC))
Lee, El-Hang (Optics and Photonics Elite Research Academy (OPERA), Inha University)
Lee, Seung-Gol (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC))
Park, Sung-Chan (Department of Electro Physics, School of Advanced Sciences, Dankook University)
Choi, Tae-Il (SAMSUNG ELECTRO-MECHANICS CO., LTD.)
Publication Information
Korean Journal of Optics and Photonics / v.20, no.4, 2009 , pp. 223-229 More about this Journal
Abstract
This paper describes the development of a simulator which can numerically calculate an image to be acquired in a machine vision system for automated optical inspection. The simulator is based on a ray tracing technique and composed of three modules which are an illuminating system, a specimen and an imaging system. Kinds of model parameters for modules and their values are carefully chosen from the direct measurement and the observation of related phenomena. Finally, the validity of the simulator is evaluated by logical analysis and by comparison with measured images.
Keywords
Automated Optical Inspection; Machine vision; Illumination; PCB;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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