Ray Tracing-based Simulation of Image Formation in an Equipment for Automated Optical Inspection |
Jung, Sang-Chul
(SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC))
Lee, Yoon-Suk (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC)) Kim, Dae-Chan (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC)) Park, Se-Geun (Optics and Photonics Elite Research Academy (OPERA), Inha University) O, Beom-Hoan (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC)) Lee, El-Hang (Optics and Photonics Elite Research Academy (OPERA), Inha University) Lee, Seung-Gol (SEM Co. -Inha Univ. Precision Inspection and Measurement Center (PIMC)) Park, Sung-Chan (Department of Electro Physics, School of Advanced Sciences, Dankook University) Choi, Tae-Il (SAMSUNG ELECTRO-MECHANICS CO., LTD.) |
1 | D. Martin, 'A practical guide to machine vision lighting,' available at http://www.advancedillumination.com |
2 | W. H. Press, Numerical Recipes In C : The Art of Scientific Computing (Cambridge University Press, New York, NY, USA, 1997), pp. 290-296 |
3 | F. Pernkopfa and P. O'Learyb, 'Image acquisition techniques for automatic visual inspection of metallic surfaces,' NDT and E International 36, 609-617 (2003) DOI ScienceOn |
4 | R. Seurin, F. Merienne, and P. Gorria, 'Machine vision system for specular surface inspection: use of simulation process as a tool for design and optimization,' available at http://vision.u-bourgogne.fr/Le2i/ |
5 | S.-C. Park, 'Tools for optics,' Optical Science and Technology 10, 23-27 (2006) |
6 | T. Sakamoto, 'Ray trace algorithms for GRIN media,' Appl. Opt. 26, 2943-2946 (1987) DOI |
7 | M. Rea, J. van Derlofske, and Dr. William, 'Illumination fundamentals,' available at http://www.opticalres.com/lt/illuminationfund (2000) |
8 | H. Zerfhau-Dreihofer, U. Haack, T. Weber, and D. Wendt, 'Light source modeling for automotive lighting devices,' Proc. SPIE 4775, 58-66 (2002) DOI |
9 | A. L. Dubovikov, S. S. Repin, and S. N. Natarovskii, 'Features of the use of LEDs in artificial-vision systems,'J. Opt. Technol. 72, 40-42 (2005) DOI |
10 | A. Ryer, 'Light measurement handbook,' Newburyport, MA: international light, available at http://www.intl-light.com/handbook/ (1998) |
11 | X. D. He, K. E. Torrance, F. X. Sillion, and D. P. Greenberg, 'A comprehensive physical model for light reflection,' Computer Graphics 25, 175-186 (1991) DOI |
12 | N.-H. Ko, D.-S. Park, Y.-S. Kim, T. I. Choi, S.-G. Park, B. H. O, E.-H. Lee, and S. G. Lee, 'Measurement and analysis of light scattering of Au pads on PCB surface to extract scattering parameters,' Hankook Kwanghak Hoeji (Korean J. Opt. Photon.) 20, 134-140 (2009) 과학기술학회마을 DOI ScienceOn |